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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 127 records · Page 7
All sourcesNASA NTRSDOE OSTI
NASA NTRS2014

A Testbed for Implementing Prognostic Methodologies on Cryogenic Propellant Loading Systems

Prognostics technologies determine the health state of a system and predict its remaining useful life. With this information, operators are able to make maintenance-related decisions, thus effectively streamlining operational and mission-level activities. Experimentation on testbeds representative of critical systems is very useful for the maturation of prognostics technology; precise emulation of actual fault conditions on such a testbed further validates these technologies. In this paper we present the development of a pneumatic valve testbed, initial experimental results and progress towards the maturation and validation of component-level prognostic methods in the context of cryogenic refueling operations. The pneumatic valve testbed allows for the injection of time-varying leaks with specified damage progression profiles in order to emulate common valve faults. The pneumatic valve testbed also contains a battery used to power some pneumatic components, enabling the study of the effects of battery degradation on the operation of the valves.

Prognositcs↗
NASA NTRS1980

MIL-M-38510/470 test vectors: Fault detection efficiency measurement via hardware fault simulation

The stuck fault detection efficiency of the test vectors developed for the MIL-M-38510/470 NASA was measured using a hardware stuck fault simulator for the 1802 microprocessor. Thirty-nine stuck faults were not detected out of a total of 874 injected into the combinatorial and sequential parts of the microprocessor. Since undetected faults can create catastrophic errors in equipment designed for high reliability applications, it is recommended that the MIL-M-38510/470 NASA be enhanced with additional test vectors so as to achieve 100% stuck fault detection efficiency.

Timoc, C. C.↗
NASA NTRS2014

Application of Model-based Prognostics to a Pneumatic Valves Testbed

Pneumatic-actuated valves play an important role in many applications, including cryogenic propellant loading for space operations. Model-based prognostics emphasizes the importance of a model that describes the nominal and faulty behavior of a system, and how faulty behavior progresses in time, causing the end of useful life of the system. We describe the construction of a testbed consisting of a pneumatic valve that allows the injection of faulty behavior and controllable fault progression. The valve opens discretely, and is controlled through a solenoid valve. Controllable leaks of pneumatic gas in the testbed are introduced through proportional valves, allowing the testing and validation of prognostics algorithms for pneumatic valves. A new valve prognostics approach is developed that estimates fault progression and predicts remaining life based only on valve timing measurements. Simulation experiments demonstrate and validate the approach.

prediction↗
NASA NTRS1991

A general software reliability process simulation technique

The structure and rationale of the generalized software reliability process, together with the design and implementation of a computer program that simulates this process are described. Given assumed parameters of a particular project, the users of this program are able to generate simulated status timelines of work products, numbers of injected anomalies, and the progress of testing, fault isolation, repair, validation, and retest. Such timelines are useful in comparison with actual timeline data, for validating the project input parameters, and for providing data for researchers in reliability prediction modeling.

Tausworthe, Robert C.↗
NASA NTRS1990

NASA systems autonomy demonstration project: Advanced automation demonstration of Space Station Freedom thermal control system

The NASA Systems Autonomy Demonstration Project (SADP) was initiated in response to Congressional interest in Space station automation technology demonstration. The SADP is a joint cooperative effort between Ames Research Center (ARC) and Johnson Space Center (JSC) to demonstrate advanced automation technology feasibility using the Space Station Freedom Thermal Control System (TCS) test bed. A model-based expert system and its operator interface were developed by knowledge engineers, AI researchers, and human factors researchers at ARC working with the domain experts and system integration engineers at JSC. Its target application is a prototype heat acquisition and transport subsystem of a space station TCS. The demonstration is scheduled to be conducted at JSC in August, 1989. The demonstration will consist of a detailed test of the ability of the Thermal Expert System to conduct real time normal operations (start-up, set point changes, shut-down) and to conduct fault detection, isolation, and recovery (FDIR) on the test article. The FDIR will be conducted by injecting ten component level failures that will manifest themselves as seven different system level faults. Here, the SADP goals, are described as well as the Thermal Control Expert System that has been developed for demonstration.

Dominick, Jeffrey↗
NASA NTRS2009

Modeling, Detection, and Disambiguation of Sensor Faults for Aerospace Applications

Sensor faults continue to be a major hurdle for systems health management to reach its full potential. At the same time, few recorded instances of sensor faults exist. It is equally difficult to seed particular sensor faults. Therefore, research is underway to better understand the different fault modes seen in sensors and to model the faults. The fault models can then be used in simulated sensor fault scenarios to ensure that algorithms can distinguish between sensor faults and system faults. The paper illustrates the work with data collected from an electro-mechanical actuator in an aerospace setting, equipped with temperature, vibration, current, and position sensors. The most common sensor faults, such as bias, drift, scaling, and dropout were simulated and injected into the experimental data, with the goal of making these simulations as realistic as feasible. A neural network based classifier was then created and tested on both experimental data and the more challenging randomized data sequences. Additional studies were also conducted to determine sensitivity of detection and disambiguation efficacy to severity of fault conditions.

Balaban, Edward↗
NASA NTRS2009

Lightning Pin Injection Testing on MOSFETS

Lightning transients were pin-injected into metal-oxide-semiconductor field-effect transistors (MOSFETs) to induce fault modes. This report documents the test process and results, and provides a basis for subsequent lightning tests. MOSFETs may be present in DC-DC power supplies and electromechanical actuator circuits that may be used on board aircraft. Results show that unprotected MOSFET Gates are susceptible to failure, even when installed in systems in well-shielded and partial-shielded locations. MOSFET Drains and Sources are significantly less susceptible. Device impedance decreased (current increased) after every failure. Such a failure mode may lead to cascading failures, as the damaged MOSFET may allow excessive current to flow through other circuitry. Preliminary assessments on a MOSFET subjected to 20-stroke pin-injection testing demonstrate that Breakdown Voltage, Leakage Current and Threshold Voltage characteristics show damage, while the device continues to meet manufacturer performance specifications. The purpose of this research is to develop validated tools, technologies, and techniques for automated detection, diagnosis and prognosis that enable mitigation of adverse events during flight, such as from lightning transients; and to understand the interplay between lightning-induced surges and aging (i.e. humidity, vibration thermal stress, etc.) on component degradation.

Ely, Jay J.↗
NASA NTRS1991

In-flight demonstration of hybrid GPS/Loran RAIM

A receiver autonomous integrity monitoring (RAIM) scheme has been implemented in a real time, prototype hybrid GPS/LORAN receiver. A four-channel GPS receiver and an eight-channel LORAN-C receiver are used to obtain raw GPS and LORAN pseudorange measurements. The measurement data is sent to a microcomputer for position and integrity determination. Navigation data is presented to the pilot on a standard course deviation indicator with a data renewal rate of up to one update per second. Provisions are made to simulate signal malfunctions in real time by injecting step or ramp failures in the pseudorange measurements. A least-squares fault detection algorithm is presented for the detection of slowly growing measurement errors. The performance of the hybrid GPS/LORAN receiver has been demonstrated through actual flight tests. One of the flight tests is summarized in the paper.

Van Graas, Frank↗
NASA NTRS1990

Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system

A simulation study is described which predicts the susceptibility of an advanced control system to electrical transients resulting in logic errors, latched errors, error propagation, and digital upset. The system is based on a custom-designed microprocessor and it incorporates fault-tolerant techniques. The system under test and the method to perform the transient injection experiment are described. Results for 2100 transient injections are analyzed and classified according to charge level, type of error, and location of injection.

Carreno, Victor A.↗
NASA NTRS1990

An experimental study of fault propagation in a jet-engine controller

An experimental analysis of the impact of transient faults on a microprocessor-based jet engine controller, used in the Boeing 747 and 757 aircrafts is described. A hierarchical simulation environment which allows the injection of transients during run-time and the tracing of their impact is described. Verification of the accuracy of this approach is also provided. A determination of the probability that a transient results in latch, pin or functional errors is made. Given a transient fault, there is approximately an 80 percent chance that there is no impact on the chip. An empirical model to depict the process of error exploration and degeneration in the target system is derived. The model shows that, if no latch errors occur within eight clock cycles, no significant damage is likely to happen. Thus, the overall impact of a transient is well contained. A state transition model is also derived from the measured data, to describe the error propagation characteristics within the chip, and to quantify the impact of transients on the external environment. The model is used to identify and isolate the critical fault propagation paths, the module most sensitive to fault propagation and the module with the highest potential of causing external pin errors.

Choi, Gwan Seung↗
NASA NTRS1990

DEPEND - A design environment for prediction and evaluation of system dependability

The development of DEPEND, an integrated simulation environment for the design and dependability analysis of fault-tolerant systems, is described. DEPEND models both hardware and software components at a functional level, and allows automatic failure injection to assess system performance and reliability. It relieves the user of the work needed to inject failures, maintain statistics, and output reports. The automatic failure injection scheme is geared toward evaluating a system under high stress (workload) conditions. The failures that are injected can affect both hardware and software components. To illustrate the capability of the simulator, a distributed system which employs a prediction-based, dynamic load-balancing heuristic is evaluated. Experiments were conducted to determine the impact of failures on system performance and to identify the failures to which the system is especially susceptible.

Goswami, Kumar K.↗
NASA NTRS1989

Transient fault behavior in a microprocessor: A case study

An experimental analysis is described which studies the susceptibility of a microprocessor based jet engine controller to upsets caused by current and voltage transients. A design automation environment which allows the run time injection of transients and the tracing from their impact device to the pin level is described. The resulting error data are categorized by the charge levels of the injected transients by location and by their potential to cause logic upsets, latched errors, and pin errors. The results show a 3 picoCouloumb threshold, below which the transients have little impact. An Arithmetic and Logic Unit transient is most likely to result in logic upsets and pin errors (i.e., impact the external environment). The transients in the countdown unit are potentially serious since they can result in latched errors, thus causing latent faults. Suggestions to protect the processor against these errors, by incorporating internal error detection and transient suppression techniques, are also made.

Duba, Patrick↗
NASA NTRS2006

Development and Flight Testing of a Neural Network Based Flight Control System on the NF-15B Aircraft

The Intelligent Flight Control System (IFCS) project at the NASA Dryden Flight Research Center, Edwards AFB, CA, has been investigating the use of neural network based adaptive control on a unique NF-15B test aircraft. The IFCS neural network is a software processor that stores measured aircraft response information to dynamically alter flight control gains. In 2006, the neural network was engaged and allowed to learn in real time to dynamically alter the aircraft handling qualities characteristics in the presence of actual aerodynamic failure conditions injected into the aircraft through the flight control system. The use of neural network and similar adaptive technologies in the design of highly fault and damage tolerant flight control systems shows promise in making future aircraft far more survivable than current technology allows. This paper will present the results of the IFCS flight test program conducted at the NASA Dryden Flight Research Center in 2006, with emphasis on challenges encountered and lessons learned.

Bomben, Craig R.↗
NASA NTRS1971

Ethiopian Tertiary dike swarms

Mapping of the Ethiopian rift and Afar margins revealed the existence of Tertiary dike swarms. The structural relations of these swarms and the fed lava pile to monoclinal warping of the margins partly reflect a style of continental margin tectonics found in other parts of the world. In Ethiopia, however, conjugate dike trends appear to be unusually strongly developed. Relation of dikes to subsequent margin faulting is ambiguous, and there are instances where the two phenomena are spatially separate and of differing trends. There is no evidence for lateral migration with time of dike injection toward the rift zone. No separate impingement of Red Sea, Gulf of Aden, and African rift system stress fields on the Ethiopian region can be demonstrated from the Tertiary dike swarms. Rather, a single, regional paleostress field existed, suggestive of a focus beneath the central Ethiopian plateau. This stress field was dominated by tension: there is no cogent evidence for shearing along the rift margins. A gentle compression along the rift floor is indicated. A peculiar sympathy of dike hade directions at given localities is evident.

Mohr, P. A.↗
NASA NTRS2019

New Test Rig to Measure Alternating Current Losses of Both Low and High Critical Temperature Superconductors

This paper presents the design, development, operation, and test capabilities of a proposed superconducting coil testbed to measure alternating current (AC) losses at the NASA Glenn Research Center. Superconducting AC losses are important in the design of electric stators and rotors, power transmission lines, transformers, fault current limiters, magnets, and superconducting energy storage (not batteries). The new liquid-hydrogen-based rig will allow superconducting testing across a wide range of test parameters, including injected current up to 400 A, frequency (0 to 400 Hz), magnetic field (0 to 0.6 T), phase angle between induced voltage and injected current (–180° to 180°), coil coolant temperature (18 to 28 K), and AC power loss (5 to 30 W). While the target application of interest is 20 K superconducting MgB2 (the only superconductor that can presently be made with low losses) stator coils for future electric machines, the rig can accommodate test articles (TAs) with straight wire, tape, cables, coils of any shape, any allowable combination of superconducting wire and fluid (e.g., yttrium barium copper oxide (YBCO) coils and liquid nitrogen), and AC or direct current (DC) testing. The new spin rig builds upon the existing Air Force spin rig through a more flexible mode of fluid control, a wider gap space (up to 10.2 cm) for TAs, and the ability to accommodate TAs over a wider range of operating temperatures (18 to 95 K) using liquid hydrogen, gaseous helium, or liquid nitrogen as the working fluid, thus supporting direct cooled machines below 77 K.

liquid hydrogen↗
NASA NTRS2000

Quantitative Analysis of Charge Injection and Discharging of Si Nanocrystals and Arrays by Electrostatic Force Microscopy

NASA requirements for computing and memory for microspacecraft emphasize high density, low power, small size, and radiation hardness. The distributed nature of storage elements in nanocrystal floating-gate memories leads to intrinsic fault tolerance and radiation hardness. Conventional floating-gate non-volatile memories are more susceptible to radiation damage. Nanocrystal-based memories also offer the possibility of faster, lower power operation. In the pursuit of filling these requirements, the following tasks have been accomplished: (1) Si nanocrystal charging has been accomplished with conducting-tip AFM; (2) Both individual nanocrystals on an oxide surface and nanocrystals formed by implantation have been charged; (3) Discharging is consistent with tunneling through a field-lowered oxide barrier; (4) Modeling of the response of the AFM to trapped charge has allowed estimation of the quantity of trapped charge; and (5) Initial attempts to fabricate competitive nanocrystal non-volatile memories have been extremely successful.

Bell, L. D.↗
NASA NTRS1991

A Dynamic Testing Complexity Metric

This paper introduces a dynamic metric that is based on the estimated ability of a program to withstand the effects of injected "semantic mutants" during execution by computing the same function as if the semantic mutants had not been injected. Semantic mutants include: (1) syntactic mutants injected into an executing program and (2) randomly selected values injected into an executing program's internal states. The metric is a function of a program, the method used for injecting these two types of mutants, and the program's input distribution; this metric is found through dynamic executions of the program. A program's ability to withstand the effects of injected semantic mutants by computing the same function when executed is then used as a tool for predicting the difficulty that will be incurred during random testing to reveal the existence of faults, i.e., the metric suggests the likelihood that a program will expose the existence of faults during random testing assuming faults were to exist. If the metric is applied to a module rather than to a program, the metric can be used to guide the allocation of testing resources among a program's modules. In this manner the metric acts as a white-box testing tool for determining where to concentrate testing resources. Index Terms: Revealing ability, random testing, input distribution, program, fault, failure.

Voas, Jeffrey↗
NASA NTRS2000

Quantitative analysis of charge injection and discharging of Si nanocrystals and arrays by electrostatic force microscopy

NASA requirements for computing and memory for microspacecraft emphasizes high density, low power, small size, and radiation hardness. The distributed nature of a storage elements in nanocrystal floating-gate memories leads to instrinsic fault tolerance and radiation-hardness. Nanocrystal-based memories also offer the possibility of a faster, lower power operation.

atomic↗