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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 127 records · Page 7
All sourcesNASA NTRSDOE OSTI
NASA NTRS1985

Laboratory studies of atomic collision processes of importance in planetary atmospheres

A series of differential cross sections for angular scattering and charge transfer was measured. These studies employ position-sensitive detectors (PSD's) to collect collision products scattered over a wide range of angles; and the research program includes investigation of differential cross sections for total angular scattering, charge transfer, stripping, and other collisions. All of these processes can be studied with the same basic apparatus, but minor modifications in the equipment details and in the data acquisition programs and techniques are required for each individual experiment.

Stebbings, R. F.↗
NASA NTRS1985

Differential scattering cross sections for collisions of 0.5-, 1.5-, and 5.0-keV helium atoms with He, H2, N2, and O2

This paper reports the first results of an experimental program established to provide cross section data for use in modeling various atmospheric processes. Absolute cross sections, differential in the scattering angle, have been measured for collisions of 0.5-, 1.5-, and 5.0-keV helium atoms with He, H2, N2, and O2 at laboratory scattering angles between 0.1 deg and 5 deg. The results are the sums of cross sections for elastic and inelastic scattering of helium atoms; charged collision products are not detected. Integration of the differential cross section data yields integral cross sections consistent with measurements by other workers. The apparatus employs a position-sensitive detector for both primary and scattered particles and uses a short target cell with a large exit aperture to ensure a simple and well-defined apparatus geometry.

Newman, J. H.↗
NASA NTRS1986

Soft X-ray photoemission with the SSX-100 spectrometer

Photoemission and SEXAFS experiments were conducted using a double crystal monochromator at the Stanford Synchrotron Radiation Laboratory. Photoelectrons were detected using a Surface Science Laboratories SSX-100 electron analyzer, which employs a magnetic/electrostatic lens, hemispherical geometry, and a two-dimensional position-sensitive detector. In the kinetic energy range of interest (1000-2000 eV), a significant improvement in count rate was observed over a single channel cylindrical mirror analyzer system. Ten second scans of the KLL silicon Auger peak manifold were recorded at a large number of photon energies for subsequent determination of SEXAFS spectra.

Hecht, M. H.↗
NASA NTRS1987

Concept of an Opto-electronic Accelerometer System (OAS)

An accelerometer based on a spring-suspended reference mass and its precise relative motion measurement by means of 3 two-dimensional position sensitive detectors (PSD) is described. A breadboard model achieves a resolution (longterm linearity) of 25 nm in one direction. Due to the physical principle of the PSD, the second layer is slightly less sensitive than the top layer; accordingly for gravity gradient detection the more sensitive layer is selected for the Z/X component detection. At 10 Hz sampling rate an acceleration gradient of under 10 to the minus 12th power g (i.e., 0.01 E or 0.001 Gal/km) is considered to be detectable.

Kunkel, B.↗
NASA NTRS1990

High-revolution gamma-ray imaging from the moon

An observatory is suggested for exploiting unique lunar features to perform sensitive, subarcsecond cosmic X-ray and gamma-ray imaging. The observatory would be built in an evolutionary manner and would eventually include several different position-sensitive detector systems which together would cover a broad energy range and address a wide variety of astrophysical problems. High angular resolution would be obtained by using a mobile crane on the flat lunar mare regions to move a coded aperture mask for source tracking with detector/mask separations of up to 5 kilometers.

Mahoney, William A.↗
NASA NTRS1992

Gas ionization solar spectral monitor (GISSMO)

We are currently developing an instrument free from optical components to measure the full-disk solar spectrum in the extreme ultraviolet regime covering wavelengths from 75-500 A. The instrument, which will be launched aboard a NASA Black Brant sounding rocket in September 1992, consists of a windowless noble gas ionization cell followed by a toroidal electrostatic analyzer to spatially disperse photoelectrons as a function of their energies. A microchannel plate based position sensitive detector will be used to detect individual electrons, indirectly returning the solar EUV spectrum.

Vickers, James S.↗
NASA NTRS1997

Angular Alignment Testing of Laser Mirror Mounts Under Temperature Cycling

A number of commercial and custom-built laser mirror mounts were tested for angular alignment sensitivity during temperature cycling from room temperature (20 C) to 40 C. A Nd:YAG laser beam was reflected off a mirror that was held by the mount under test and was directed to a position-sensitive detector. Horizontal and vertical movement of the reflected beam was recorded, and the angular movement, as a function of temperature (coefficient of thermal tilt (CTT)) was calculated from these data. In addition, the amount of hysteresis in the movement after cycling from room temperature to 40 C and back was determined. All commercial mounts showed greater angular movement than the simpler National Aeronautics and Space Administration Lidar Atmospheric Sensing Experiment (NASA LASE) custom mirror mounts.

Bullock, K. T.↗
NASA NTRS1999

Effects of Melt Processing on Evolution of Structure in PEEK

We report on the effects of melt processing temperature on structure formation in Poly(ether-ether-ketone), PEEK. Real time Small Angle X-ray Scattering, SAXS, and thermal analysis are used to follow the melting behavior after various stages of processing. Assignment of peaks to structural entities within the material, the relative perfection of the crystals, and the possibility of their reorganization, are all influenced by the melt processing history. With the advent of high intensity synchrotron sources of X-radiation, polymer scientists gain a research tool which, when used along with thermal analysis, provides additional structural information about the crystals during growth and subsequent melting. PEEK is an engineering thermoplastic polymer with a very high glass transition temperature (145 C) and crystal melting point (337 C). PEEK has been the subject of recent studies by X-ray scattering in which melt and cold crystallization were followed in real-time. X-ray scattering and thermal studies have been used to address the formation of dual endothermic response which has been variously ascribed to lamellar insertion, dual crystal populations, or melting followed by re-crystallization. Another important issue is whether all of the amorphous phase is located in interlamellar regions, or alternatively whether some is located in "pockets" away from the crystalline lamellar stacks. The interpretation of scattering from lamellar stacks varies depending upon whether such amorphous pockets are formed. Some groups believe all of the amorphous phase is interlamellar. This leads to selection of a smaller thickness for the crystals. Other groups suggest that most amorphous phase is not interlamellar, and this leads to the suggestion that the crystal thickness is larger than the amorphous layer within the stacks. To investigate these ideas, we used SAXS and Differential Scanning Calorimetry to compare results of single and dual stage melt crystallization of PEEK using a treatment scheme involving annealing/crystallization at T(sub a1) followed by annealing at T(sub a2) where either T(sub a1) < T(sub a2) or T(sub a1) > T(sub a2). We proposed a model to explain multiple melting endotherms in PPS, treated according to one or two-stage melt or cold crystallization. Key features of this model are that multiple endotherms: (1) are due to reorganization/recrystallization after cold crystallization; and, (2) are dominated by crystal morphology after melt crystallization at high T. In other words, multiple distinct crystal populations are formed by the latter treatment, leading to observation of multiple melting. PEEK 45OG pellets (ICI Americas) were the starting material for this study. Films were compression molded at 400 C, then quenched to ice water. Samples were heated to 375 C in a Mettler FP80 hot stage and held for three min. to erase crystal seeds before cooling them to T(sub a1) = 280 C . Samples were held at T(sub a2) for a period of time, then immediately heated to 360 C. In the second treatment samples were held at T(sub a1) = 31 C for different crystallization times t(sub c) then cooled to 295 C and held 15 min. In situ (SAXS) experiments were performed at the Brookhaven National Synchrotron Light Source with the sample located inside the Mettler hot stage. The system was equipped with a two-dimensional position sensitive detector. The sample to detector distance was 172.7 cm and the X-ray wavelength was 1.54 Angstroms. SAXS data were taken continuously during the isothermal periods and during the heating to 360 C at 5 C/min. Each SAXS scan was collected for 30 sec. Since the samples were isotropic, circular integration was used to increase the signal to noise ratio. After dual stage melt crystallization with T(sub a1) < T(sub a2) the lower melting endotherm arises from holding at T(sub a1). During cooling a broad distribution of crystals forms, and the low-melting tail is perfected during T(sub al). Heating to T(sub a2) melts these imperfect crystals and allows others with greater average long spacing to form in their place. After dual stage crystallization with T(sub a1) > T(sub a2), the amount of space remaining for additional growth at T(sub a2) depends upon the holding time at T(sub a1). The long period of crystals formed at T(sub a2) is smaller than that formed at T(sub a1) due to growth in a now-restricted geometry. Perfection of crystals is seen as an increase of the intensity of the population scattering at higher s, while the intensity of the population scattering at lower s stays constant. During heating from below to above the minor endotherm, we see rapid decrease of the intensity of the X-ray scattering corresponding to the population of crystals scattering in the shoulder. Another important observation is that after the sample is annealed at 295 C, the shoulder intensity is restored once again. The population scattering at higher s remains longer before it disappears in the sample treated to the second stage of melt crystallization, compared to the sample crystallized with a single stage. This could be interpreted as an effect of continued perfection of the less perfect population, which is also reflected in the increased melting temperature of the smaller endotherm as the holding time at 295 C increases. In the corresponding DSC scans we see a shift in the area and the peak temperature of the lower melting endotherm with an increase of the annealing time.

Georgiev, Georgi↗
NASA NTRS2004

Optical Tweezer Assembly and Calibration

An Optical Tweezer, as the name implies, is a useful tool for precision manipulation of micro and nano scale objects. Using the principle of electromagnetic radiation pressure, an optical tweezer employs a tightly focused laser beam to trap and position objects of various shapes and sizes. These devices can trap micrometer and nanometer sized objects. An exciting possibility for optical tweezers is its future potential to manipulate and assemble micro and nano sized sensors. A typical optical tweezer makes use of the following components: laser, mirrors, lenses, a high quality microscope, stage, Charge Coupled Device (CCD) camera, TV monitor and Position Sensitive Detectors (PSDs). The laser wavelength employed is typically in the visible or infrared spectrum. The laser beam is directed via mirrors and lenses into the microscope. It is then tightly focused by a high magnification, high numerical aperture microscope objective into the sample slide, which is mounted on a translating stage. The sample slide contains a sealed, small volume of fluid that the objects are suspended in. The most common objects trapped by optical tweezers are dielectric spheres. When trapped, a sphere will literally snap into and center itself in the laser beam. The PSD s are mounted in such a way to receive the backscatter after the beam has passed through the trap. PSD s used with the Differential Interference Contrast (DIC) technique provide highly precise data. Most optical tweezers employ lasers with power levels ranging from 10 to 100 miliwatts. Typical forces exerted on trapped objects are in the pico-newton range. When PSDs are employed, object movement can be resolved on a nanometer scale in a time range of milliseconds. Such accuracy, however, can only by utilized by calibrating the optical tweezer. Fortunately, an optical tweezer can be modeled accurately as a simple spring. This allows Hook s Law to be used. My goal this summer at NASA Glenn Research Center is the assembly and calibration of an optical tweezer setup in the Instrumentation and Controls Division (5520). I am utilizing a custom LabVIEW Virtual Instrument program for data collection and microscope stage control. Helping me in my assignment are the following people: Mentor Susan Wrbanek (5520), Dr. Baha Jassemnejad (UCO) and Technicians Ken Weiland (7650) and James Williams (7650). Without their help, my task would not be possible.

Collins, Timothy M.↗
NASA NTRS1997

Apparatus and method for high-speed characterization of surfaces

This invention permits rapid determination of a three-dimensional contour of an object. The apparatus directs a laser beam onto a point on an object, and the scattered light is received by a position sensitive detector (PSD). The location at which scattered light is received can be related to the displacement of the point on the object, using basic trigonometry. The laser beam is deflected non-mechanically, by passing it through a crystal whose index of refraction is varied in a controlled manner. By proper control of the index of refraction, one can scan the beam across a desired area of the object, without using any moving parts, and can therefore obtain complete information about the contour of the object. The device operates without making any conventional images, and is therefore much faster than comparable devices of the prior art. Also, the laser and beam deflector can be housed in a small optical head which enables the device to reach normally inaccessible areas. The device can compare the test object with a reference object, or it can compare two objects for differences.

Hooker, Jeffery A.↗
NASA NTRS2009

Target-Tracking Camera for a Metrology System

An analog electronic camera that is part of a metrology system measures the varying direction to a light-emitting diode that serves as a bright point target. In the original application for which the camera was developed, the metrological system is used to determine the varying relative positions of radiating elements of an airborne synthetic aperture-radar (SAR) antenna as the airplane flexes during flight; precise knowledge of the relative positions as a function of time is needed for processing SAR readings. It has been common metrology system practice to measure the varying direction to a bright target by use of an electronic camera of the charge-coupled-device or active-pixel-sensor type. A major disadvantage of this practice arises from the necessity of reading out and digitizing the outputs from a large number of pixels and processing the resulting digital values in a computer to determine the centroid of a target: Because of the time taken by the readout, digitization, and computation, the update rate is limited to tens of hertz. In contrast, the analog nature of the present camera makes it possible to achieve an update rate of hundreds of hertz, and no computer is needed to determine the centroid. The camera is based on a position-sensitive detector (PSD), which is a rectangular photodiode with output contacts at opposite ends. PSDs are usually used in triangulation for measuring small distances. PSDs are manufactured in both one- and two-dimensional versions. Because it is very difficult to calibrate two-dimensional PSDs accurately, the focal-plane sensors used in this camera are two orthogonally mounted one-dimensional PSDs.

Liebe, Carl↗
NASA NTRS2009

Computing Challenges in Coded Mask Imaging

This slide presaentation reviews the complications and challenges in developing computer systems for Coded Mask Imaging telescopes. The coded mask technique is used when there is no other way to create the telescope, (i.e., when there are wide fields of view, high energies for focusing or low energies for the Compton/Tracker Techniques and very good angular resolution.) The coded mask telescope is described, and the mask is reviewed. The coded Masks for the INTErnational Gamma-Ray Astrophysics Laboratory (INTEGRAL) instruments are shown, and a chart showing the types of position sensitive detectors used for the coded mask telescopes is also reviewed. Slides describe the mechanism of recovering an image from the masked pattern. The correlation with the mask pattern is described. The Matrix approach is reviewed, and other approaches to image reconstruction are described. Included in the presentation is a review of the Energetic X-ray Imaging Survey Telescope (EXIST) / High Energy Telescope (HET), with information about the mission, the operation of the telescope, comparison of the EXIST/HET with the SWIFT/BAT and details of the design of the EXIST/HET.

Skinner, Gerald↗
NASA NTRS2001

Comparisons of LET distributions measured in low-earth orbit using tissue-equivalent proportional counters and the position-sensitive silicon-detector telescope (RRMD-III)

Determinations of the LET distribution, phi(L), of charged particles within a spacecraft in low-Earth orbit have been made. One method used a cylindrical tissue-equivalent proportional counter (TEPC), with the assumption that for each measured event, lineal energy, y, is equal to LET and thus phi(L) = phi(y). The other was based on the direct measurement of LETs for individual particles using a charged-particle telescope consisting of position-sensitive silicon detectors called RRMD-III. There were differences of up to a factor of 10 between estimates of phi(L) using the two methods on the same mission. This caused estimates of quality factor to vary by a factor of two between the two methods.

Flight Experiment↗
NASA NTRS1985

A position sensitive phoswich hard X-ray detector system

A prototype position sensitive phoswich hard X-ray detector, designed for eventual astronomical usage, was tested in the laboratory. The scintillation crystal geometry was designed on the basis of a Monte Carlo simulation of the internal optics and includes a 3mm thick NaI(T1) primary X-ray detector which is actively shielded by a 20 mm thick CsI(T1) scintillation crystal. This phoswich arrangement is viewed by a number two inch photomultipliers. Measured values of the positional and spectral resolution of incident X-ray photons are compared with calculation.

Dean, A. J.↗
DOE OSTI2018

Position-Sensitive Spectrometric Module for Detecting Ionizing Radiation by Semiconductor Strip Detectors

A position-sensitive module for detecting ionizing radiation based on semiconductor strip detectors and a multichannel spectrometric route has been developed and implemented. The dynamic range of the detected charge generated by an ionizing particle in the detector is 5–250 fC. The position-sensitive module is a structurally complete device with the functions of amplifying the spectrometric signal, digitizing, buffering, preprocessing, and transmitting data to a computer.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗
DOE OSTI2015

High-Efficiency CdZnTe Position-Sensitive VFG Gamma-Ray Detectors for Safeguards Applications

The goal of this project is to incorporate a Cadmium-Zinc-Telluride (CdZnTe or CZT) detector (with 1% or better resolution) into a bench-top prototype for isotope identification and related safeguards applications. The bench-top system is based on a 2x2 array of 6x6x20 mm 3 position-sensitive virtual Frisch-grid (VFG) CZT detectors. The key features of the array are that it allows for the use of average-grade CZT material with a moderate content of defects, and yet it provides high energy resolution, 1% FWHM at 662 keV, large effective area, and low-power consumption. The development of this type of 3D detector and new instruments incorporating them is motivated by the high cost and low availability of large, > 1 cm 3 , CZT crystals suitable for making multi-pixel detectors with acceptable energy resolution and efficiency.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗
NASA NTRS1973

A position-sensitive X-ray detector for the HEAO-A satellite.

A position-sensitive, low-energy proportional counter system is described which will be used on the High-Energy Astronomical Observatory, Mission A, spacecraft. The associated system incorporates the capability to employ pulse-shape discrimination for background rejection and interpolation circuitry to locate the centroid of an X-ray event with an accuracy of approximately one eighth the cathode-wire spacing.

Held, D.↗