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Results for “Radiation Hardness Assurance”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 127 records · Page 7
All sourcesNASA NTRSDOE OSTI
NASA NTRS2021

Systems Engineering and Assurance Modeling (SEAM): A Web-Based Solution for Integrated Mission Assurance

We present an overview of the Systems Engineering and Assurance Modeling (SEAM) platform, a web-browser-based tool which is designed to help engineers evaluate the radiation vulnerabilities and develop an assurance approach for electronic parts in space systems. The SEAM framework consists of three interconnected modeling tools, a SysML compatible system description tool, a Goal Structuring Notation (GSN) visual argument tool, and Bayesian Net and Fault Tree extraction and export tools. The SysML and GSN sections also have a coverage check application that ensures that every radiation fault identified on the SysML side is also addressed in the assurance case in GSN. The SEAM platform works on space systems of any degree of radiation hardness but is especially helpful for assessing radiation performance in systems with commercial-off-the-shelf (COTS) electronic components.

SEAM↗
NASA NTRS1990

1990 IEEE Annual Conference on Nuclear and Space Radiation Effects, 27th, Reno, NV, July 16-20, 1990, Proceedings

Various papers on nuclear and space radiation effects are presented. The general topics addressed include: basic mechanisms of radiation effects, dosimetry and energy-dependent effects, hardness assurance and testing techniques, single-event upset and latchup, isolation technologies, device and integrated circuit effects and hardening, spacecraft charging and electromagnetic effects.

Fleetwood, Daniel M.↗
NASA NTRS1991

1991 IEEE Annual Conference on Nuclear and Space Radiation Effects, 28th, San Diego, CA, July 15-19, 1991, Proceedings

Various papers on nuclear science are presented. The general topics addressed are: basic mechanisms of radiation effects, dosimetry and energy-dependent effects, isolation technologies, device radiation response and hardening, microcircuit radiation response and hardening, single-event phenomena, hardness assurance and testing techniques, spacecraft charging, space environments and effects.

Millward, Douglas G.↗
NASA NTRS2015

Preliminary Radiation Testing of a State-of-the-Art Commercial 14nm CMOS Processor/System-on-a-Chip

Hardness assurance test results of Intel state-of-the-art 14nm “Broadwell” U-series processor / System-on-a-Chip (SoC) for total ionizing dose (TID) are presented, along with exploratory results from trials at a medical proton facility. Test method builds upon previous efforts [1] by utilizing commercial laptop motherboards and software stress applications as opposed to more traditional automated test equipment (ATE).

microprocessor↗
NASA NTRS1995

Hardness Assurance and Testing Techniques for High Resolution (12- to 16-bit) Analog-to-Digital Converters

Discussed are hardness assurance and testing techniques to test and evaluate total dose radiation degradation of high resolution A/D converters. Because high-speed, high-resolution converters are critical parts in a digital signal processing or data acquisition system, the evaluation of performance in the early design phase is very important. Converters from three manufacturers are evaluated.

Analog-to-Digital↗
NASA NTRS2008

Considerations for IC and Component Selection for Space Systems

This viewgraph presentation addresses the integrated cycling and component selection technologies for aerospace systems. The topics include: 1) Semiconductors: The Evolution of ICs - Availability and Technology; 2) IC Selection Requirements - three fields of thought, "The Good", "The Bad" and "The Ugly"; 3) Reliability and Radiation; 4) Radiation Perspective-Four methods of selecting ICs for space systems, Guaranteed hardness, historical ground-based radiation data, historical flight usage, and unknown assurance; 5) Understanding Risk, including risk trade space and ASICs and FPGA sample selection criteria.

LaBel, Kenneth A.↗
NASA NTRS1995

The Impact on Space Radiation Requirements and Effects on ASIMS

The evolution of highly miniaturized electronic and mechanical systems will be accompanied by new problems and issues regarding the radiation response of these systems in the space environment. In this paper we discuss some of the more prominent radiation problems brought about by miniaturization. For example, autonomous micro-spacecraft will require large amounts of high density memory, most likely in the form of stacked, multichip modules of DRAM's, that must tolerate the radiation environment. However, advanced DRAM's (16 to 256 Mbit) are quite susceptible to radiation, particularly single event effects, and even exhibit new radiation phenomena that were not a problem for older, less dense memory chips. Another important trend in micro-spacecraft electronics is toward the use of low-voltage microelectronic systems that consume less power. However, the reduction in operating voltage also caries with it an increased susceptibility to radiation. In the case of application specific integrated microcircuits (ASIM's), advanced devices of this type, such as high density field programmable gate arrays (FPGA's) exhibit new single event effects (SEE), such as single particle reprogramming of anti-fuse links. New advanced bipolar circuits have been shown recently to degrade more rapidly in the low dose rate space environment than in the typical laboratory total dose radiation test used to qualify such devices. Thus total dose testing of these parts is no longer an appropriately conservative measure to be used for hardness assurance. We also note that the functionality of micromechanical Si-based devices may be altered due to the radiation-induced deposition of charge in the oxide passivation layers.

Barnes, C.↗
NASA NTRS2015

Preliminary Radiation Testing of a State-of-the-Art Commercial 14nm CMOS Processor - System-on-a-Chip

Hardness assurance test results of Intel state-of-the-art 14nm Broadwell U-series processor System-on-a-Chip (SoC) for total dose are presented, along with first-look exploratory results from trials at a medical proton facility. Test method builds upon previous efforts by utilizing commercial laptop motherboards and software stress applications as opposed to more traditional automated test equipment (ATE).

14nm↗
NASA NTRS1981

Annual Conference on Nuclear and Space Radiation Effects, 18th, University of Washington, Seattle, WA, July 21-24, 1981, Proceedings

Single event upset phenomena are discussed, taking into account cosmic ray induced errors in IIL microprocessors and logic devices, single event upsets in NMOS microprocessors, a prediction model for bipolar RAMs in a high energy ion/proton environment, the search for neutron-induced hard errors in VLSI structures, soft errors due to protons in the radiation belt, and the use of an ion microbeam to study single event upsets in microcircuits. Basic mechanisms in materials and devices are examined, giving attention to gamma induced noise in CCD's, the annealing of MOS capacitors, an analysis of photobleaching techniques for the radiation hardening of fiber optic data links, a hardened field insulator, the simulation of radiation damage in solids, and the manufacturing of radiation resistant optical fibers. Energy deposition and dosimetry is considered along with SGEMP/IEMP, radiation effects in devices, space radiation effects and spacecraft charging, EMP/SREMP, and aspects of fabrication, testing, and hardness assurance.

Tasca, D. M.↗
NASA NTRS2001

Total dose performance of radiation hardened voltage regulators and references

Total dose test of commercially available radiation hardened bipolar voltage regulators and references show reduced sensitivity to dose rate and varying sensitivity to bias under pressure. Behavior of critical parameters in different dose rate and bias conditions is compared and the impact to hardness assurance methodology is discussed.

radiation total dose low dose rate bias effects re↗
NASA NTRS2024

Solid State Drive Radiation Assurance With Active Testing

Single-event effects (SEE) and total ionizing dose (TID) data are presented for several automotive- and industrial-grade solid-state drives, and the effects of different active test configurations on hardness assurance are explored.

dose↗
NASA NTRS1996

Total Dose Effects and Hardness Assurance for Optocouplers

The operation and efficiency of optocouplers depend on a number of different factors, and the way that these factors are degraded by radiation must be properly understood in order to apply these devices in space systems.

optocouplers optocoupler efficiency LED degradatio↗
NASA NTRS2019

Modern Hardness Assurance: A Brand New Game Except When it Isn't

Mission success criteria at the device level and required device operation/availability can determine the risk posed by the radiation effects for a given device in a given environment, but rarely are the same from one mission to another. A large portion of New Space / SmallSat missions to date have benefitted from relatively short mission durations and chosen orbits that have less severe particle populations than their larger counterparts. As mission objectives grow and become reliant on their chosen devices operating for longer lives and in more harsh environments, requirements need to reflect the changing scope but not hinder design adoptions from previously successful missions that provide new capabilities. This presentation describes notable differences in radiation environments, the requirement changes that come with choice of orbit, and prioritizations for mission success criteria to be determined by the designers of the system and subsystems. Test methodologies based on radiation effect categories are explained briefly; when they are needed. Similarity data (and its limitations) are discussed so that caveats and short-comings are understood. Reliability and assurance quantification may not always be possible, but determining where risks are taken and how to classify them is the essential topic for the intended practice: to establish radiation requirements with the goal of getting to mission success.

Campola, Michael J.↗
NASA NTRS2012

Characterization of Radiation Hardened Bipolar Linear Devices for High Total Dose Missions

Radiation hardened linear devices are characterized for performance in combined total dose and displacement damage environments for a mission scenario with a high radiation level. Performance at low and high dose rate for both biased and unbiased conditions is compared and the impact to hardness assurance methodology is discussed.

Enhanced Low Dose Rate Sensitivity (ELDRS)↗
NASA NTRS1980

Annual Conference on Nuclear and Space Radiation Effects, 17th, Cornell University, Ithaca, N.Y., July 15-18, 1980, Proceedings

The conference covered the radiation effects on devices, circuits, and systems, physics and basic radiation effects in materials, dosimetry and radiation transport, spacecraft charging, and space radiation effects. Other subjects included single particle upset phenomena, systems-generated electromagnetic pulse phenomena, fabrication of hardened components, testing techniques, and hardness assurance.

Mcgarrity, J. M.↗
NASA NTRS2007

IC and Component Selection for Space Systems

This viewgraph presentation reviews the integrated circuit (IC) and selections of the IC components for space systems. Included in the discussion are a overview of semiconductors and the evolution of integrated circuit. It also reviews the three different viewpoints of the IC selection: technical, programmatic, and risk. From a radiation perspective there are four criteria for selecting ICs for space systems: guaranteed hardness, historical ground-based data, historical flight usage, and unknown assurance.

Label, Kenneth A.↗
NASA NTRS2019

Bringing Single-Event Effects Down to Earth

In the 47 years since single-event effects were first observed in spacecraft electronics, radiation experts have developed an effective methodology supported by a nationwide infrastructure. A highly skilled workforce of radiation engineers has developed test facilities and methods, modeling and simulation techniques, and mitigation and design strategies to ensure space missions meet their performance and reliability requirements even in the harsh radiation environments of space. Now, increasing performance demands of space missions, the continued disruptive evolution of microcircuit technologies and growth and changes of the space industry have combined with an aging infrastructure are placing increasing strain on the radiation effects community, and the community is responding.

Single-event effects↗