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Destructive single event effects (DSEE) are a main concern for pioneers attempting to use COTS (commercial-off-the-shelf) devices in space, so a COTS instrument full of such devices is particulary scary.
Single event functionality interrupt (SEFI) results are presented for Hynix SDRAMS. The SEFI response threshold is below LET 9.9 Mev-cm(exp 2)/mg and the saturated cross section is 6 x 10(exp -5)cm(exp 2). Dynamic SEFI identification was made, and in-situ recovery restored functionality. Verification results of the identification algorithm are presented. An observed high current radiation response is also presented.