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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 127 records · Page 7

Marked exacerbation of orthostatic intolerance after long- vs. short-duration spaceflight in veteran astronauts

OBJECTIVE: The incidence of postflight orthostatic intolerance after short-duration spaceflight is about 20%. However, the incidence after long-duration spaceflight was unknown. The purpose of this study was to test the hypothesis that orthostatic intolerance is more severe after long-duration than after short-duration flight. METHODS: We performed tilt tests on six astronauts before and after long-duration (129-190 days) spaceflights and compared these data with data obtained during stand tests before and after previous short-duration missions. RESULTS: Five of the six astronauts studied became presyncopal during tilt testing after long-duration flights. Only one had become presyncopal during stand testing after short-duration flights. We also compared the long-duration flight tilt test data to tilt test data from 20 different astronauts who flew on the short-duration Shuttle missions that delivered and recovered the astronauts to and from the Mir Space Station. Five of these 20 astronauts became presyncopal on landing day. Heart rate responses to tilt were no different between astronauts on long-duration flights and astronauts on short-duration flights, but long-duration subjects had lower stroke volumes and cardiac outputs than short-duration presyncopal subjects, suggesting a possible decrease in cardiac contractile function. One subject had subnormal norepinephrine release with upright posture after the long flight but not after the short flight. Plasma volume losses were not greater after long flights. CONCLUSION: Long-duration spaceflight markedly increases orthostatic intolerance, probably with multiple contributing factors.

STS Shuttle Project↗

NREL/NASA Internal Short-Circuit Instigator in Lithium Ion Cells

NREL has developed a device to test one of the most challenging failure mechanisms of lithium-ion (Li-ion) batteries -- a battery internal short circuit. Many members of the technical community believe that this type of failure is caused by a latent flaw that results in a short circuit between electrodes during use. As electric car manufacturers turn to Li-ion batteries for energy storage, solving the short circuit problem becomes more important. To date, no reliable and practical method exists to create on-demand internal shorts in Li-ion cells that produce a response that is relevant to the ones produced by field failures. NREL and NASA have worked to establish an improved ISC cell-level test method that simulates an emergent internal short circuit, is capable of triggering the four types of cell internal shorts, and produces consistent and reproducible results. Internal short circuit device design is small, low-profile and implantable into Li-ion cells, preferably during assembly. The key component is an electrolyte-compatible phase change material (PCM). The ISC is triggered by heating the cell above PCM melting temperature (presently 40 degrees C -- 60 degrees C). In laboratory testing, the activated device can handle currents in excess of 300 A to simulate hard shorts (< 2 mohms). Phase change from non-conducting to conducting has been 100 percent successful during trigger tests.

25 ENERGY STORAGE↗

Nuclear shell structure governs short-range nucleon pairing

Atomic nuclei are intricate quantum systems in which nucleons (protons and neutrons) are held together by the strong nuclear force. At very short distances, nucleons can momentarily form high-momentum pairs—known as short-range-correlated pairs—that shape the high-momentum structure of nuclear matter. Studying how nucleons form short-range-correlated pairs provides a rare experimental window into the short-distance behaviour of the strong interaction. Here, in this study, we use the scattering of high-energy electrons from 40 Ca, 48 Ca and 54 Fe, chosen for their distinct shell structures, to probe the formation of short-range-correlated pairs. Unexpectedly, we find that short-range-correlated pairing depends far more on the specific quantum orbitals occupied by protons and neutrons than on the nuclear mass or neutron–proton imbalance. This dependence is much stronger than that predicted by theoretical models. Our results point to a need for new angular-momentum quantum selection rules governing short-range nucleon pairing and reveal a deep connection between long-range nuclear shell structure and short-range interactions.

Nguyen, D. [Thomas Jefferson National Accelerator ↗

Short fatigue crack behavior in notched 2024-T3 aluminum specimens

Single-edge, semi-circular notched specimens of Al 2024-T3, 2.3 mm thick, were cyclicly loaded at R-ratios of 0.5, 0.0, -1.0, and -2.0. The notch roots were periodically inspected using a replica technique which duplicates the bore surface. The replicas were examined under an optical microscope to determine the initiation of very short cracks and to monitor the growth of short cracks ranging in length from a few tens of microns to the specimen thickness. In addition to short crack growth measurements, the crack opening displacement (COD) was measured for surface cracks as short as 0.035 mm and for through-thickness cracks using the Interferometric Strain/Displacement Gage (ISDG), a laser-based optical technique. The growth rates of short cracks were faster than the long crack growth rates for R-ratios of -1.0 and -2.0. No significant difference between short and long crack growth rates was observed for R = 0.0. Short cracks had slower growth rates than long cracks for R = 0.5. The crack opening stresses measured for short cracks were smaller than those predicted for large cracks, with little difference appearing for positive R-ratios and large differences noted for negative R-ratios.

Lee, J. J.↗

Preliminary analysis and design optimization of the short spacer truss of Space Station Freedom

The analysis, dynamic simulation, and design optimization of the short spacer truss of the Space Station Freedom are presented in this report. The short spacer truss will be positioned between the integrated equipment assembly (IEA) and another truss, called the long spacer truss, in the Space Station Freedom. During its launch in the Space Shuttle, the truss will be subjected to considerable in-span distributed inertia loads due to shuttle accelerations. The short spacer truss, therefore, has been modeled as a space frame to account for flexural response. Several parameters have been assumed, since the design specifications are in the process of development; hence the results presented should be considered preliminary. However, the automated analysis and design capabilities that have been developed can readily be used to generate an optimum design of the short spacer truss once the actual specifications have been determined. This report includes static and dynamic analyses of the short spacer truss, which have been obtained with the linear elastic code LE-HOST (in these analyses, LE-HOST data files have been automated to facilitate their future use for different design specifications of the short spacer truss); the dynamic animation of the short spacer truss, which has been carried out by using the results of the dynamic analysis and a post-processing feature of the modeling code PATRAN; and the optimum-weight design of the spacer truss, which was obtained under prescribed stress, displacement, and frequency constraints by using the design code COMETBOARDS. Examination of the analysis and design results revealed that the design could be improved if the configuration of the short spacer truss were modified to a certain extent. A modified configuration, which may simplify fabrication, has been suggested. The performance of this configuration has been evaluated and was found to be satisfactory under both static and dynamic conditions.

Gendy, A. S.↗

Estimating the Probability of Electrical Short Circuits from Tin Whiskers

To comply with lead-free legislation, many manufacturers have converted from tin-lead to pure tin finishes of electronic components. However, pure tin finishes have a greater propensity to grow tin whiskers than tin-lead finishes. Since tin whiskers present an electrical short circuit hazard in electronic components, simulations have been developed to quantify the risk of said short circuits occurring. Existing risk simulations make the assumption that when a free tin whisker has bridged two adjacent exposed electrical conductors, the result is an electrical short circuit. This conservative assumption is made because shorting is a random event that had an unknown probability associated with it. Note however that due to contact resistance electrical shorts may not occur at lower voltage levels. In our first article we developed an empirical probability model for tin whisker shorting. In this paper, we develop a more comprehensive empirical model using a refined experiment with a larger sample size, in which we studied the effect of varying voltage on the breakdown of the contact resistance which leads to a short circuit. From the resulting data we estimated the probability distribution of an electrical short, as a function of voltage. In addition, the unexpected polycrystalline structure seen in the focused ion beam (FIB) cross section in the first experiment was confirmed in this experiment using transmission electron microscopy (TEM). The FIB was also used to cross section two card guides to facilitate the measurement of the grain size of each card guide's tin plating to determine its finish .

Courey, Karim J.↗

Estimating the Probability of Electrical Short Circuits from Tin Whiskers

To comply with lead-free legislation, many manufacturers have converted from tin-lead to pure tin finishes of electronic components. However, pure tin finishes have a greater propensity to grow tin whiskers than tin-lead finishes. Since tin whiskers present an electrical short circuit hazard in electronic components, simulations have been developed to quantify the risk of said short circuits occurring. Existing risk simulations make the assumption that when a free tin whisker has bridged two adjacent exposed electrical conductors, the result is an electrical short circuit. This conservative assumption is made because shorting is a random event that had an unknown probability associated with it. Note however that due to contact resistance electrical shorts may not occur at lower voltage levels. In our first article we developed an empirical probability model for tin whisker shorting. In this paper, we develop a more comprehensive empirical model using a refined experiment with a larger sample size, in which we studied the effect of varying voltage on the breakdown of the contact resistance which leads to a short circuit. From the resulting data we estimated the probability distribution of an electrical short, as a function of voltage.

Courey, Karim J.↗

Developing an Empirical Model for Estimating the Probability of Electrical Short Circuits from Tin Whiskers

To comply with lead-free legislation, many manufacturers have converted from tin-lead to pure tin finishes of electronic components. However, pure tin finishes have a greater propensity to grow tin whiskers than tin-lead finishes. Since tin whiskers present an electrical short circuit hazard in electronic components, simulations have been developed to quantify the risk of said short circuits occurring. Existing risk simulations make the assumption that when a free tin whisker has bridged two adjacent exposed electrical conductors, the result is an electrical short circuit. This conservative assumption is made because shorting is a random event that had an unknown probability associated with it. Note however that due to contact resistance electrical shorts may not occur at lower voltage levels. In our first article we developed an empirical probability model for tin whisker shorting. In this paper, we develop a more comprehensive empirical model using a refined experiment with a larger sample size, in which we studied the effect of varying voltage on the breakdown of the contact resistance which leads to a short circuit. From the resulting data we estimated the probability distribution of an electrical short, as a function of voltage. In addition, the unexpected polycrystalline structure seen in the focused ion beam (FIB) cross section in the first experiment was confirmed in this experiment using transmission electron microscopy (TEM). The FIB was also used to cross section two card guides to facilitate the measurement of the grain size of each card guide's tin plating to determine its finish.

Courey, Karim J.↗

Internal configuration of prismatic lithium-ion cells at the onset of mechanically induced short circuit

The response of Li-ion cells to mechanically induced internal electrical shorts is an important safety performance metric design. We assume that the battery internal configuration at the onset of electrical short influences the subsequent response and can be used to gauge the safety risk. We subjected a series of prismatic Li-ion cells to lateral pinching using 0.25", 0.5", 1", 2" and 3" diameter steel balls until the onset of internal short. The external aluminum enclosure froze the internal cell configuration at the onset of short and enabled us to cross-section the cells, and take the cross-section images. The images indicate that an internal electric short is preceded by extensive strain partitioning in the cells, fracturing and tearing of the current collectors, and cracking and slipping of the electrode layers with multiple fault lines across multiple layers. These observations are at odds with a common notion of homogeneous deformation across the layers and strain hardening of electrodes that eventually punch through the separator and short the cell. The faults are akin to tectonic movements of multiple layers that are characteristic of granular materials and bonded aggregates. As a result, the short circuits occur after extensive internal faulting, which implies significant stretching and tearing of separators.

25 ENERGY STORAGE↗

Simultaneously improving mechanical properties and corrosion resistance of pure Ti by continuous ECAP plus short-duration annealing

Highlights: • Additional short-time annealing led to enhanced strength of UFG Ti due to texture strengthening. • UFG Ti showed improved corrosion resistance in artificial seawater compared with initial CG Ti. • Short-duration annealing enhanced corrosion resistance of UFG Ti due to stronger basal texture. - Abstract: This work investigated the effect of short-duration annealing on mechanical properties and corrosion behavior of bulk ultrafine-grained (UFG) pure Ti (grade 2) produced by high-efficiency equal-channel angular pressing (ECAP), serving the fast developing of marine industries. The initial coarse-grained (CG) Ti achieved higher strength after continuous ECAP at 420 °C for 4 passes, while additional short-duration annealing at 300 °C for 15 min of UFG Ti further led to extraordinary improvement of strength, which was associated with texture strengthening. The yield strength was increased from 362 MPa in as-received state to 561 MPa in post-ECAP annealed condition, and ultimate tensile strength from 450 MPa to 663 MPa. The ECAP-processed UFG Ti had better corrosion resistance in artificial seawater than the initial CG Ti. Short-duration annealing further improved the corrosion resistance of UFG Ti, which was related to stronger basal texture. The corrosion current density decreased from 68.37 nA cm{sup −2} for CG Ti in as-received condition to 41.77 nA cm{sup −2} for UFG Ti processed by ECAP plus short-duration annealing. The fraction of TiO{sub 2} within the surface oxide film for the post-ECAP annealed sample was increased. The bulk UFG Ti after post-ECAP short-duration annealing revealed an excellent combination of high strength, good ductility and superior corrosion resistance for marine applications.

36 MATERIALS SCIENCE↗

Markov state models from short non-equilibrium simulations—Analysis and correction of estimation bias

To begin, many state-of-the-art methods for the thermodynamic and kinetic characterization of large and complex biomolecular systems by simulation rely on ensemble approaches, where data from large numbers of relatively short trajectories are integrated. In this context, Markov state models (MSMs) are extremely popular because they can be used to compute stationary quantities and long-time kinetics from ensembles of short simulations, provided that these short simulations are in “local equilibrium” within the MSM states. However, over the last 15 years since the inception of MSMs, it has been controversially discussed and not yet been answered how deviations from local equilibrium can be detected, whether these deviations induce a practical bias in MSM estimation, and how to correct for them. In this paper, we address these issues: We systematically analyze the estimation of MSMs from short non-equilibrium simulations, and we provide an expression for the error between unbiased transition probabilities and the expected estimate from many short simulations. We show that the unbiased MSM estimate can be obtained even from relatively short non-equilibrium simulations in the limit of long lag times and good discretization. Further, we exploit observable operator model (OOM) theory to derive an unbiased estimator for the MSM transition matrix that corrects for the effect of starting out of equilibrium, even when short lag times are used. Finally, we show how the OOM framework can be used to estimate the exact eigenvalues or relaxation time scales of the system without estimating an MSM transition matrix, which allows us to practically assess the discretization quality of the MSM. Applications to model systems and molecular dynamics simulation data of alanine dipeptide are included for illustration. The improved MSM estimator is implemented in PyEMMA of version 2.3.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗

The millisecond magnetar central engine in short GRBs

One favored progenitor model for short duration gamma-ray bursts (GRBs) is the coalescence of two neutron stars (NS–NS). One possible outcome of such a merger would be a rapidly spinning, strongly magnetized neutron star (known as a millisecond magnetar). These magnetars may be “supra-massive,” implying that they would collapse to black holes after losing centrifugal support due to magnetic dipole spin down. By systematically analyzing the Burst Alert Telescope (BAT)-XRT light curves of all short GRBs detected by Swift, we test how consistent the data are with this central engine model of short GRBs. We find that the so-called “extended emission” feature observed with BAT in some short GRBs is fundamentally the same component as the “internal X-ray plateau” observed in many short GRBs, which is defined as a plateau in the light curve followed by a very rapid decay. Based on how likely a short GRB is to host a magnetar, we characterize the entire Swift short GRB sample into three categories: the “internal plateau” sample, the “external plateau” sample, and the “no plateau” sample. Based on the dipole spin-down model, we derive the physical parameters of the putative magnetars and check whether these parameters are consistent with expectations from the magnetar central engine model. The derived magnetar surface magnetic field B{sub p} and the initial spin period P{sub 0} fall into a reasonable range. No GRBs in the internal plateau sample have a total energy exceeding the maximum energy budget of a millisecond magnetar. Assuming that the beginning of the rapid fall phase at the end of the internal plateau is the collapse time of a supra-massive magnetar to a black hole, and applying the measured mass distribution of NS–NS systems in our Galaxy, we constrain the neutron star equation of state (EOS). The data suggest that the NS EOS is close to the GM1 model, which has a maximum non-rotating NS mass of M{sub TOV}∼2.37 M{sub ⊙}.

79 ASTRONOMY AND ASTROPHYSICS↗

Short GRB Host Galaxies. I. Photometric and Spectroscopic Catalogs, Host Associations, and Galactocentric Offsets

We present a comprehensive optical and near-infrared census of the fields of 90 short gamma-ray bursts (GRBs) discovered in 2005–2021, constituting all short GRBs for which host galaxy associations are feasible (≈60% of the total Swift short GRB population). We contribute 274 new multi-band imaging observations across 58 distinct GRBs and 26 spectra of their host galaxies. Supplemented by literature and archival survey data, the catalog contains 542 photometric and 42 spectroscopic data sets. The photometric catalog reaches 3σ depths of ≳24–27 mag and ≳23–26 mag for the optical and near-infrared bands, respectively. We identify host galaxies for 84 bursts, in which the most robust associations make up 56% (50/90) of events, while only a small fraction, 6.7%, have inconclusive host associations. Based on new spectroscopy, we determine 18 host spectroscopic redshifts with a range of z ≈ 0.15–1.5 and find that ≈23%–41% of Swift short GRBs originate from z > 1. We also present the galactocentric offset catalog for 84 short GRBs. Taking into account the large range of individual measurement uncertainties, we find a median of projected offset of ≈7.7 kpc, for which the bursts with the most robust associations have a smaller median of ≈4.8 kpc. Our catalog captures more high-redshift and low-luminosity hosts, and more highly offset bursts than previously found, thereby diversifying the population of known short GRB hosts and properties. In terms of locations and host luminosities, the populations of short GRBs with and without detectable extended emission are statistically indistinguishable. This suggests that they arise from the same progenitors, or from multiple progenitors, which form and evolve in similar environments. All of the data products are available on the Broadband Repository for Investigating Gamma-Ray Burst Host Traits website.

79 ASTRONOMY AND ASTROPHYSICS↗

Modulation of short waves by long waves

Wave-tank experiments were performed to investigate the cyclic short-wave energy changes, related in phase to an underlying long wave, which occur during active generation of the short-wave field by wind. Measurements of time series of the short-wave slope were made by a laser-optical system, where the basic long-wave parameters were controlled and wind speeds were accurately reproducible. The short-wave slope variances were found to exhibit cyclic variations that are related to the phase of the long wave. The variations result from two combined effects: (1) the short wave frequency is varied by the long-wave orbital velocity; (2) the energy of the short waves is modulated by the actions of aerodynamic and hydrodynamic couplings that operate on the short waves in a manner related to the long-wave phase.

Reece, A. M., Jr.↗

Marked Exacerbation of Orthostatic Intolerance After Long vs. Short-Duration Spaceflight in Veteran Astronauts

The incidence of postflight orthostatic intolerance following short-duration spaceflight is about 20%. However, the incidence following long-duration spaceflight is unknown. We performed tilt tests on six astronauts before and after their long-duration (129 - 190 days) spaceflights and compared these data to those obtained during stand tests before and after their previous short-duration missions and also to tilt test data from 20 different short-duration (8 - 16 days) flight astronauts. Five of these six became presyncopal during tilt testing after long-duration flights: only one had become presyncopal during stand testing after short-duration flights. Five of the twenty astronauts who flew on other short-duration flights, became presyncopal during upright tilt on landing day. Long-duration presyncopal subjects had lower stroke volumes, lower cardiac outputs and higher peripheral vascular resistance than short-duration presyncopal subjects, but their heart rate responses were not different. One subject had subnormal norepinephrine release with upright posture after a long but not short flight. Plasma volume losses were not greater after long flights. Long-duration spaceflight markedly increases orthostatic intolerance, probably related to altered autonomic function.

Fritsch-Yelle, Janice M.↗

Task I: A Computational Model for Short Wavelength Stall Inception and Development In Multi-Stage Compressors

A computational model is presented for simulating axial compressor stall inception and development via disturbances with length scales on the order of several (typically about three) blade pitches. The model was designed for multi-stage compressors in which stall is initiated by these short wavelength disturbances, also referred to as spikes. The inception process described is fundamentally nonlinear, in contrast to the essentially linear behavior seen in so-called modal stall inception . The model was able to capture the following experimentally observed phenomena: (1) development of rotating stall via short wavelength disturbances, (2) formation and evolution of localized short wavelength stall cells in the first stage of a mismatched compressor, (3) the switch from long to short wavelength stall inception resulting from the re-staggering of the inlet guide vane, (4) the occurrence of rotating stall inception on the negatively sloped portion of the compressor characteristic. Parametric investigations indicated that (1) short wavelength disturbances were supported by the rotor blade row, (2) the disturbance strength was attenuated within the stators, and (3) the reduction of inter-blade row gaps can suppress the growth of short wavelength disturbances. It is argued that each local component group (rotor plus neighboring stators) has its own instability point (i.e. conditions at which disturbances are sustained) for short wavelength disturbances, with the instability point for the compressor set by the most unstable component group.

Suder, Kenneth↗

Correlations of Prompt and Afterglow Emission in Swift Long and Short Gamma Ray Bursts

Correlation studies of prompt and afterglow emissions from gamma-ray bursts (GRBs) between different spectral bands has been difficult to do in the past because few bursts had comprehensive and intercomparable afterglow measurements. In this paper we present a large and uniform data set for correlation analysis based on bursts detected by the Swift mission. For the first time, short and long bursts can be analyzed and compared. It is found for both classes that the optical, X-ray and gamma-ray emissions are linearly correlated, but with a large spread about the correlation line; stronger bursts tend to have brighter afterglows, and bursts with brighter X-ray afterglow tend to have brighter optical afterglow. Short bursts are, on average, weaker in both prompt and afterglow emissions. No short bursts are seen with extremely low optical to X-ray ratio as occurs for 'dark' long bursts. Although statistics are still poor for short bursts, there is no evidence yet for a subgroup of short bursts with high extinction as there is for long bursts. Long bursts are detected in the dark category at the same fraction as for pre-Swift bursts. Interesting cases are discovered of long bursts that are detected in the optical, and yet have low enough optical to X-ray ratio to be classified as dark. For the prompt emission, short and long bursts have different average tracks on flux vs fluence plots. In Swift, GRB detections tend to be fluence limited for short bursts and flux limited for long events.

Gehrel, Neil↗

Improved Short-Circuit Protection for Power Cells in Series

A scheme for protection against short circuits has been devised for series strings of lithium electrochemical cells that contain built-in short-circuit protection devices, which go into a high-resistance, current-limiting state when heated by excessive current. If cells are simply connected in a long series string to obtain a high voltage and a short circuit occurs, whichever short-circuit protection device trips first is exposed to nearly the full string voltage, which, typically, is large enough to damage the device. Depending on the specific cell design, the damage can defeat the protective function, cause a dangerous internal short circuit in the affected cell, and/or cascade to other cells. In the present scheme, reverse diodes rated at a suitably high current are connected across short series sub-strings, the lengths of which are chosen so that when a short-circuit protection device is tripped, the voltage across it does not exceed its rated voltage. This scheme preserves the resetting properties of the protective devices. It provides for bypassing of cells that fail open and limits cell reversal, though not as well as does the more-expensive scheme of connecting a diode across every cell.

Davies, Francis↗