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The purpose of this test was to characterize the LTC2054HVMPS5 (LTC2054) parameter degradation for total ionizing dose (TID) response. In the test, the device was exposed to low dose rate (LDR) irradiations using gamma radiation to account for the effects of enhanced low dose rate sensitivity (ELDRS) on the bipolar device.
Teledyne’s PE99155 point-of-load buck regulator was tested to evaluate an applicationspecific question about the start-up behavior of the device. This test determined if accumulated total ionizing dose (TID) affected any start-up voltage transient characteristics. Testing was based on pass/fail criterial for the magnitude of the output voltage to ensure the safety of downstream electronics. Two sets of radiation tests were performed. The first group of PE99155s used a high dose rate (HDR) irradiation to 25 krad(Si). A second group of PE99155s used high dose rate irradiation to 30 krad(Si).
Dark current degradation, origins, and annealing behavior after x-ray irradiation are studied in a P-type, hole collecting, backside-illuminated image sensor currently being developed at STMicroelectronics and based on deep-trenched photo-MOS pixels. Different biasing conditions during irradiation, i.e. grounded or biased and sequenced, are compared. The dark current increase with total ionizing dose (TID) and the dark current annealing behavior seem to be driven by the backside interface between the P-epitaxy of the pixels and the ONO stack. Despite still being under development, this pixel architecture already exhibits both very good electro-optical performance and a better radiation hardness than pinned photodiode-based CMOS Image sensors that benefit from the same advanced CIS processing technologies. At high total dose range, the photogate challenges custom Radiation-Hardened-by-Design photodiodes by exhibiting a comparable radiation tolerance while bringing new features such as high-resolution or Correlated Double Sampling.
We present results and analysis investigating the effects of radiation on a variety of candidate spacecraft electronics to heavy ion and proton induced single event effects (SEE), proton-induced displacement damage dose (DDD), and total ionizing dose (TID).
Tamper-indicating devices (TIDs), also known as seals, play a crucial role in various sectors including international nuclear safeguards, arms control, domestic security, and commercial products, by ensuring that monitored or high-value items are not accessed undetected. These devices do not block access but alert to unauthorized tampering. With adversaries' capabilities evolving, there's a pressing need for seals to advance in terms of effectiveness (e.g., better tamper indication and unique identification), and new technology can improve the efficiency of installation and verification. Passive loop seals, widely used in international nuclear safeguards to ensure that continuity of knowledge is maintained on declared items, face stringent International Atomic Energy Agency (IAEA) requirements that surpass those met by commercial products. The metal cup seal (Figure 1, left), a staple IAEA seal, is robust but requires significant resources for post-use verification – specifically, the seal’s unique identity can only be verified at IAEA headquarters after removal from facilities. Further, the seal has been in use for decades and seal types should periodically be replaced to counter adversarial efforts for defeating seals. In 2020, the IAEA outlined about 40 requirements for a new passive loop seal, aiming for in-situ verification, minimal external tool use, unique identification (UID), and clear tamper indication. In response, research and development efforts focused on creating a new passive loop seal that meets these criteria and in 2022 the IAEA announced the completion of the Field Verifiable Passive Loop Seal (FVPS) (Figure 1, right). Concurrently to the IAEA’s efforts, Sandia National Laboratories (SNL) and Oak Ridge National Laboratory (ORNL) designed, developed, and tested two seal versions – Puck and Puck/SAW, with Puck based on the IAEA’s requirements and including a novel visually-obvious tamper response, and Puck/SAW adding additional beneficial capabilities like the ability to receive a unique identifier from a standoff distance and monitoring the wire integrity. Puck/SAW was specifically designed and developed to address sealing applications in dry spent fuel storage facilities, where the number of sealed spent fuel containers results in heavy verification burden and inspector safety issues related to radiation exposure. These efforts are described in this Executive Summary.
Lawrence Livermore National Laboratory (LLNL) produced approximately 1 mg units of purified Pu from the parent New Brunswick Laboratory (NBL) certified reference materials (CRM) 137, 136 and 138 isotopic standards for the NBL Program Office (NBL PO) as detailed in the revised project plan. As stated in the plan, three representative units of each material were dispensed at the same time to be characterized at LLNL and provide informational values for the quantity of Pu and progeny nuclides in each unit. NBL PO intends to collect and evaluate isotopic measurement data from multiple laboratories and certify these materials as new isotopic standards C137A, C136A, and C138A, respectively. Soon after production eleven units of each analytical standard were shipped to other analytical laboratories for the certification effort, and 121, 119, and 119 units of C137A, C136A and C138A, respectively were shipped to Mickey Finch at Y12 NBL distribution center in November 2024 (30-gallon drum, TID 003777 PRL 7000005043). Residual purified Pu from the effort is being stored indefinitely in B332 at LLNL. Detailed methods can be found in the production plan, and this report describes and documents aspects of the production effort that are not in or were modified from the original production plan.
Poster showing TID data on AFRL Ga2O3 MOSFETs, the mechanisms behind the effects, and some simulations in TCAD
The Air Force Research Laboratory (AFRL) has developed a passive broadband radio frequency (RF) receiver, called a Sounder Receiver (SoRcer), as an ionospheric diagnostic instrument. These systems can produce ionospheric specifications to characterize the local ionosphere. The specifications from the SoRcers can then be used to inform data-assimilation models; monitor diurnal, seasonal, or other cyclical changes; and detect irregularities or abnormalities in the ionosphere, such as traveling ionospheric disturbances (TIDs), sporadic E, and spread F.
The response of ionization to a gravity wave moving through the ionosphere is studied. Hydrodynamic equations are used, and local thermodynamic equilibrium is imposed for simplicity. The treatment involves a perturbation analysis, and the background medium is assumed to be time stationary, horizontally stratified, and known. It is shown that ionization may be locally resonant at each level for certain frequencies and directions, for which condition neutral and ionized particles are considered closely or critically coupled. The phase direction for this critical coupling is always downward in the absence of a magnetic field. A magnetic field results in two resonant directions for the same frequency, and these directions are mostly downward. Observed TID's associated with gravity waves may be indicative of such resonances. It is also noted that strong coupling may occur to neutral acoustic waves at high altitudes. Previous investigations restrict their use of momentum equations to the diffusion equation. The analysis also shows that such restrictions result in the neglect of terms arising from momentum transport due to any background ambipolar diffusion velocity and wave motion. These terms are mostly relevant at higher altitudes.
Wavelike perturbations in the ionosphere are known as traveling ionospheric disturbances (TID's). For the detection of wavelike perturbations in neutral density, velocity, and temperature, it is necessary to employ satellite-borne experiments. Experiments conducted with the aid of satellites so far provide little evidence that wavelike perturbations in the neutrals and the ions are correlated. The present investigation is concerned with a detailed examination of the wavelike perturbations observed during a representative Atmosphere Explorer C satellite orbit. Details regarding the analyzed data are discussed along with the employed data processing procedures. Attention is given to coherent relationships between the ion variations and the neutral variations over a wide range of scale sizes and over global distances.
Measurements of neutral densities, temperatures and ion density and temperature by the Atmosphere Explorer C and E satellites exhibit fluctuations made up of coherent waves of scale size from hundreds to thousands of kilometers. The fluctuations in the AE-C data are found at times of low magnetic activity to extend from the auroral region in one hemisphere across the equator to the corresponding region in the other hemisphere with little change in apparent wavelength. The fluctuations in the AE-E data similarly exhibit at times of low magnetic activity nearly uniform wave structure encircling the equatorial belt. Typical examples of waves of more than 1000 km apparent wavelength in both the AE-C and AE-E data are presented. These observations during quiet times may be explained by a system of quasi-stationary waves excited by the auroral belts that are distributed about the Earth possibly with tidal or sub-tidal periods and scale lengths determined by the structure of the belts. According to this interpretation, Traveling Ionospheric Disturbance (TID's) are manifestations of transient wave systems moving past a ground observatory that result from changes in magnetic activity with periods and scale sizes associated with the regions of enhanced auroral activity. Some evidence suggesting tidal-like stationary waves from the Millstone Hill incoherent scatter radar is presented.
The primary objective of the Microelectronics Space Radiation Effects Program (MSREP) at the Jet Propulsion Laboratory (JPL) is to assist NASA in the selection of radiation hardened microelectronic parts for insertion in NASA space systems through radiation testing and research. Prior to presenting examples of the research and testing on Single Event Effects (SEE) and Total Ionizing Dose (TID) effects, the space radiation environment and radiation requirements for the CRAFT/Cassini program, a typical JPL space project, are discussed.
Qualification procedures for complex integrated circuits are being developed under a U.S. government program known as Qualified Manufacturing Lines (QML). This effort is focused on circuits designed by IC manufacturers and has not addressed application specific IC's (ASIC's) designed at system houses. The qualification procedures described here are intended to be responsive to the needs of system houses who design their own ASIC's and have them fabricated at Silicon foundries. A particular focus of this presentation will be the use of the TID (total Ionizing Dose) Chip to evaluate CMOS foundry processes and to provide parameters for circuit simulators. This chip is under development as a standard chip for qualifying the total dose aspects of ASIC's. The benefits of standardization are that the results will be well understood and easy to interpret. Data is presented and compared for 1.6 micron and 3.0 micron CMOS. The data shows that 1.6 micron CMOS is significantly harder than 3.0 micron CMOS. Two failure modes are explored: (1) the radiation-induced degradation of timing delays; and (2) radiation-induced leakage currents.
Tilt/integral/derivative (TID) compensators for tunable feedback control systems offer advantages over proportional/integral/derivative compensators. Designed and adjusted more easily, and made to reject disturbances more strongly and less sensitive to variations in parameters of controlled system.
A low cost, flexible and modular spacecraft power system design was developed in response to a call for an architecture that could accommodate multiple missions in the small to medium load range. Three upcoming satellites will use this design, with one launch date in 1999 and two in the year 2000. The design consists of modular hardware that can be scaled up or down, without additional cost, to suit missions in the 200 to 600 Watt orbital average load range. The design will be applied to satellite orbits that are circular, polar elliptical and a libration point orbit. Mission unique adaptations are accomplished in software and firmware. In designing this advanced, adaptable power system, the major goals were reduction in weight volume and cost. This power system design represents reductions in weight of 78 percent, volume of 86 percent and cost of 65 percent from previous comparable systems. The efforts to miniaturize the electronics without sacrificing performance has created streamlined power electronics with control functions residing in the system microprocessor. The power system design can handle any battery size up to 50 Amp-hour and any battery technology. The three current implementations will use both nickel cadmium and nickel hydrogen batteries ranging in size from 21 to 50 Amp-hours. Multiple batteries can be used by adding another battery module. Any solar cell technology can be used and various array layouts can be incorporated with no change in Power System Electronics (PSE) hardware. Other features of the design are the standardized interfaces between cards and subsystems and immunity to radiation effects up to 30 krad Total Ionizing Dose (TID) and 35 Mev/cm(exp 2)-kg for Single Event Effects (SEE). The control algorithm for the power system resides in a radiation-hardened microprocessor. A table driven software design allows for flexibility in mission specific requirements. By storing critical power system constants in memory, modifying the system code for other programs is simple. These constants can be altered also by ground command, or in response to an anomolous event. All critical power system functions have backup hardware functions to prevent a software or computer glitch from propagating. A number of battery charge control schemes can be implemented by selecting the proper control terms in the code. The architecture allows the design engineer to tune the system response to various system components and anticipated load profiles without costly alterations. A design trade was made with the size, weight and power dissipation of the electronics versus the performance of the power bus to load variations. Linear, fine control is maintained with a streamlined electronics design. This paper describes the hardware design as well as the software control algorithm. The challenges of closing the system control loop digitally is discussed. Control loop margin and power system performance is presented. Lab measurements are shown and compared to the system response of a hardware model running actual flight software.
This portion of the Short Course is divided into two segments to separately address the two major proton-related effects confronting satellite designers: ionization effects and displacement damage effects. While both of these topics are deeply rooted in "traditional" descriptions of space radiation effects, there are several factors at play to cause renewed concern for satellite systems being designed today. For example, emphasis on Commercial Off-The-Shelf (COTS) technologies in both commercial and government systems increases both Total Ionizing Dose (TID) and Single Event Effect (SEE) concerns. Scaling trends exacerbate the problems, especially with regard to SEEs where protons can dominate soft error rates and even cause destructive failure. In addition, proton-induced displacement damage at fluences encountered in natural space environments can cause degradation in modern bipolar circuitry as well as in many emerging electronic and opto-electronic technologies. A crude, but nevertheless telling, indication of the level of concern for proton effects follows from surveying the themes treated in papers presented at this conference. The table lists themes found in the IEEE Transaction on Nuclear Science (TNS) December issue from the past year and compares them with the December issue's content a decade earlier. Ten years ago there were nine papers, or about 10% of the total, dealing with the four indicated topics. At that time, single event effects from protons were the primary concern, and these were thought to be possible only when a nuclear reaction initiated energetic recoil atoms. This is shown in the table as the 'traditional" SEE subject. A decade later, submissions addressing this topic had doubled, while papers devoted to displacement damage studies had increased from one to nine! More importantly, displacement damage effects in the natural space environments have become a concern for degradation in modern devices (other than solar cells), and this was not so ten years earlier.
Microelectronic and photonic systems in the natural space environment are bombarded by a variety of charged particles including electrons, trapped protons, cosmic rays, and solar particles (protons and other heavy ions). These incident particles cause both ionizing and non-ionizing effects when traversing a device, and the effects can be either transient or permanent. The vast majority of the kinetic energy of an incident proton is lost to ionization, creating the single event effects (SEES) and total ionizing dose (TID) effects described in section IVA. However, the small portion of energy lost in non-ionizing processes causes atoms to be removed from their lattice sites and form permanent electrically active defects in semiconductor materials. These defects, i.e., "displacement damage," can significantly degrade device performance. In general, most of the displacement damage effects in the natural space environment can be attributed to protons since they are plentiful and extremely energetic (and therefore not readily shielded against). For this reason, we consider only proton induced displacement damage in this course. (Nevertheless, we identify solar cells as an important example of a case where both electron and proton damage can be important since only very light shielding is feasible.) The interested reader is encouraged to explore the three previous NSREC and RADECS short courses [Srou88a, Summ92, Hopk97] which also treat displacement damage issues for satellite applications. Part A of this segment of the short course introduces the space environment, proton shielding issues, and requirements specifications for proton-rich environments. In order to exercise the displacement damage analysis tools for on-orbit performance predictions, the requirements document must provide the relevant proton spectra in addition to the usual total ionizing dose-depth curves.
Microelectronic and photonic systems in the natural space environment are bombarded by a variety of charged particles including electrons, trapped protons, cosmic rays, and solar particles (protons and other heavy ions). These incident particles cause both ionizing and non-ionizing effects when traversing a device, and the effects can be either transient or permanent. The vast majority of the kinetic energy of an incident proton is lost to ionization, creating the single event effects (SEES) and total ionizing dose (TID) effects. However, the small portion of energy lost in non-ionizing processes causes atoms to be removed from their lattice sites and form permanent electrically active defects in semiconductor materials. These defects, i.e., "displacement damage," can significantly degrade device performance. In general, most of the displacement damage effects in the natural space environment can be attributed to protons since they are plentiful and extremely energetic (and therefore not readily shielded against). For this reason, we consider only proton induced displacement damage in this course. (Nevertheless, we identify solar cells as an important example of a case where both electron and proton damage can be important since only very light shielding is feasible.) The interested reader is encouraged to explore the three previous NSREC and RADECS short courses which also treat displacement damage issues for satellite applications. Part A of this segment of the short course introduces the space environment, proton shielding issues, and requirements specifications for proton-rich environments. In order to exercise the displacement damage analysis tools for on-orbit performance predictions, the requirements document must provide the relevant proton spectra in addition to the usual total ionizing dose-depth curves. Ion-solid interactions and the nature of the displacement damage they generate have been studied extensively for over half a century, yet they still remain a subject of investigation. In this section, a description of the mechanisms by which displacement damage is produced will be followed by a summary of the major consequences for device performance in a space environment. Often the degradation of a device parameter can be characterized by a damage factor (measured in a laboratory using monoenergetic protons) that is simply the change in a particular electrical or optical parameter per unit proton fluence. In addition, we will describe the concept of a non-ionizing energy loss rate (NIEL) which quantifies that portion of the energy lost by an incident ion that goes into displacements. It has been calculated as a function of proton energy, and is analogous to (and has the same units as) the linear energy transfer (LET) for ionizing energy. We will discover that, to first order, the calculated NIEL describes the energy dependence of the measured device damage factors. This observation provides the basis for predicting proton induced device degradation in a space environment based on both the calculated NIEL and relatively few laboratory test measurements. The methodology of such on-orbit device performance predictions will be described, as well as the limitations. Several classes of devices for which displacement damage is a significant (if not the dominant) mode of radiation induced degradation will be presented.