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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 127 records · Page 7
All sourcesNASA NTRSDOE OSTI
NASA NTRS1987

Results from the vehicle charging and potential experiment on STS-3

The Vehicle Charging and Potential Experiment formed part of the scientific experiments comprising the NASA Office of Space Sciences-1 pallet flown at an altitude of 250 km and an orbital inclination of 40 deg on the third flight of the Space Shuttle Orbiter in March 1982. Details of the objectives, the instrumentation of the experiment, and some preliminary results from the individual instruments are presented. The experiment studied passive vehicle charging using thermal plasma probes, and it is concluded that apart from moderate v x B (L)-induced electrical potential resulting from the large size and restricted plasma contact area, the Space Shuttle Orbiter behaved similarly to smaller spacecraft orbiting in the same ionospheric region. However, an unexpected passive orbital result was the detection of enhanced plasma density in the vicinity of the Orbiter under restricted orbital conditions, apparently composed of contaminant molecular species and with an electron component having a temperature considerably higher than the ambient ionosphere electrons. The active vehicle charging experiments were performed by using a 100 mA/1 keV electron beam emitted out of the payload bay. Charging measurements made during short electron beam pulse emissions provide an upper limit of about 1 mF for the Orbiter capacitance. Steady-state charging measurements showed that for the vehicle attitudes covered by the mission, the induced electrical potential was normally only a few volts, except during some nighttime conditions when it rose above 40 V.

Banks, P. M.↗
NASA NTRS1986

Use of a 35mm camera for remote surface cleanliness verification

Non-contact or remote monitoring of surfaces for both particle and molecular contaminants is required for verification of surface cleanliness on many program subsystems. The capability of a 35mm camera to satisfy this need is presented. The many limitations imposed by standard available lens systems are compared to actual required sensitivities. Methods of optimizing camera systems for specific applications and descriptions of support systems for extending the range of usefulness of the recorded data are also provided. Although this general concept is not new, significant improvements in the technique involving the use of polarized light and diffraction effects have resulted in a more efficient utilization of information recorded on the film.

Crutcher, E. R.↗
NASA NTRS1989

Returned Solar Max hardware degradation study results

The Solar Maximum Repair Mission returned with the replaced hardware that had been in low Earth orbit for over four years. The materials of this returned hardware gave the aerospace community an opportunity to study the realtime effects of atomic oxygen, solar radiation, impact particles, charged particle radiation, and molecular contamination. The results of these studies are summarized.

Triolo, Jack J.↗
NASA NTRS1989

Effects of the contamination environment on surfaces and materials

In addition to the issues that have always existed, demands are being placed on space systems for increased contamination prevention/control. Optical surveillance sensors are required to detect low radiance targets. This increases the need for very low scatter surfaces in the optical system. Particulate contamination levels typically experienced in today's working environments/habits will most likely compromise these sensors. Contamination (molecular and particulate) can also affect the survivability of space sensors in both the natural and hostile space environments. The effects of di-octyl phthalate (DOP) on sensors are discussed.

Maag, Carl R.↗
NASA NTRS1989

A noncontacting scanning photoelectron emission technique for bonding surface cleanliness inspection

Molecular contamination of bonding surfaces can drastically affect the bond strength that can be achieved and therefore the structural integrity and reliability of the bonded part. The presence of thin contaminant films on bonding surfaces can result from inadequate or incomplete cleaning methods, from oxide growth during the time between cleaning (such as grit blasting) and bonding, or from failure to properly protect cleaned surfaces from oils, greases, fingerprints, release agents, or deposition of facility airborne molecules generated by adjacent manufacturing or processing operations. Required cleanliness levels for desired bond performance can be determined by testing to correlate bond strength with contaminant type and quantity, thereby establishing the degree of contamination that can be tolerated based on the strength that is needed. Once the maximum acceptable contaminant level is defined, a method is needed to quantitatively measure the contaminant level on the bonding surface prior to bonding to verify that the surface meets the established cleanliness requirement. A photoelectron emission technique for the nondestructive inspection of various bonding surfaces, both metallic and nonmetallic, to provide quantitative data on residual contaminant levels is described. The technique can be used to scan surfaces at speeds of at least 30 ft/min using a servo system to maintain required sensor to surface spacing. The fundamental operation of the photoelectron emission sensor system is explained and the automated scanning system and computer data acquisition hardware and software are described.

Gause, Raymond L.↗
NASA NTRS1989

Optical properties monitor: Experiment definition phase

The stability of materials used in the space environment will continue to be a limiting technology for space missions. The Optical Properties Monitor (OPM) Experiment provides a comprehensive space research program to study the effects of the space environment-both natural and induced-on optical, thermal and space power materials. The OPM Experiment was selected for definition under the NASA/OAST In-Space Technology Experiment Program. The results of the OPM Definition Phase are presented. The OPM Experiment will expose selected materials to the space environment and measure the effects with in-space optical measurements. In-space measurements include total hemispherical reflectance total integrated scatter and VUV reflectance/transmittance. The in-space measurements will be augmented with extensive pre- and post-flight sample measurements to determine other optical, mechanical, electrical, chemical or surface effects of space exposure. Environmental monitors will provide the amount and time history of the sample exposure to solar irradiation, atomic oxygen and molecular contamination.

Wilkes, Donald R.↗
NASA NTRS1990

Optical properties monitor: Experiment definition phase

The stability of materials used in the space environment will continue to be a limiting technology for space missions. The Optical Properties Monitor (OPM) Experiment provides a comprehensive space research program to study the effects of the space environment (both natural and induced) on optical, thermal and space power materials. The OPM Experiment was selected for definition under the NASA/OAST In-Space Technology Experiment Program. The results of the OPM Definition Phase are presented. The OPM experiment will expose selected materials to the space environment and measure the effects with in-space optical measurements. In-space measurements include total hemispherical reflectance total integrated scatter and VUV reflectance/transmittance. The in-space measurements will be augmented with extensive pre- and post-flight sample measurements to determine other optical, mechanical, electrical, chemical or surface effects of space exposure. Environmental monitors will provide the amount and time history of the sample exposure to solar irradiation, atomic oxygen and molecular contamination.

Wilkes, Donald R.↗
NASA NTRS1991

Chemical characterization of selected LDEF polymeric materials

Chemical characterization of selected polymeric materials which received exposure on the Long Duration Exposure Facility (LDEF) is reported. The specimens examined include silvered fluorinated ethylene propylene Teflon thermal blanket material, polysulfone, epoxy, polyimide matrix resin/graphite fiber reinforced composites, and several high performance polymer films. These specimens came from numerous LDEF locations, and thus received different environmental exposures. The results to date show no significant change at the molecular level in the polymer that survived exposure. Scanning electron and scanning tunneling microscopes show resin loss and a texturing of some specimens which resulted in a change in optical properties. The potential effect of a silicon-containing molecular contamination on these materials is addressed. The possibility of continued post-exposure degradation of some polymeric films is also proposed.

Young, Philip R.↗
NASA NTRS1990

New screening methodology to select low outgassing materials for cold, spaceborne optical instruments

Standardized techniques for outgassing tests are developed and set forth for use in the screening of materials for aerospace instruments with cooled sensors, optics, and/or detectors. Materials for optical instruments are discussed in terms of molecular outgassing, and material-outgassing test results are presented which relate to several test conditions. The existing outgassing standard is found to be inadequate, and revised outgassing standards related to four application levels are given. The test protocols are designed for the development of materials for optical instruments that operate in environments with temperatures below 20 C. Consideration is also given to potential molecular contamination in the space environment and to outgas screening of instruments with a variety of sensor/optics/detector temperatures. The standards are designed for use with existing outgassing-test data as well as contamination analyses relating to the instrument being tested.

O'Donnell, T.↗
NASA NTRS1991

An analysis of LDEF-exposed silvered FEP teflon thermal blanket material

The characterization of selected silvered fluorinated ethylene propylene (FEP) teflon thermal blanket material which received 5 years and 9 months of exposure to the LEO environment on the Long Duration Exposure Facility is reported. X-ray photoelectron spectroscopy, infrared, and thermal analyses did not detect a significant change at the molecular level as the result of this exposure. However, various microscopic analyses revealed a roughening of the coating surface due to atomic oxygen erosion which resulted in some materials changing from specular reflectors of visible radiation to diffuse reflectors. The potential effect of silicon-containing molecular contamination on these materials is addressed.

Young, Philip R.↗
NASA NTRS1992

Chemical characterization of selected LDEF polymeric materials

The chemical characterization of selected polymeric materials which received exposure on the LDEF is reported. The specimens examined include silvered fluorinated ethylene propylene (FEP) teflon thermal blanket material, polysulfone matrix resin/graphite fiber reinforced composites, and several high performance polymer films. These specimens came from numerous LDEF locations and, thus, received different environmental exposures. The results of infrared, thermal, x ray photoelectron, and various solution property analyses have shown no significant change at the molecular level in the polymer that survived exposure. However, scanning electron and scanning tunneling microscopies show resin loss and a texturing of the surface of some specimens which resulted in a change in optical properties. The potential effect of a silicon containing molecular contamination on these materials is addressed. The possibility of continued post-exposure degradation of some polymeric films is also proposed.

Young, Philip R.↗
NASA NTRS1991

Characterization of selected LDEF polymer matrix resin composite materials

The characterization of selected graphite fiber reinforced epoxy (934 and 5208) and polysulfone (P1700) matrix resin composite materials which received 5 years and 10 months of exposure to the LEO environment on the Long Duration Exposure Facility is reported. Resin loss and a decrease in mechanical performance as well as dramatic visual effects were observed. However, chemical characterization including infrared, thermal, and selected solution property measurements showed that the molecular structure of the polymeric matrix had not changed significantly in response to this exposure. The potential effect of a silicon-containing molecular contamination of these specimens is addressed.

Young, Philip R.↗
NASA NTRS1991

New aspects relating to the behaviour of composites and adhesives in space

Some of the specialized testing procedures performed at the JPL Molecular Contamination Investigation Facility for the WideField Planetary Camera II (WFPC II) program for the screening of polymeric materials for outgassing properties are described. For WFPC II, a science performance goal of 1-percent photometric accuracy at 1470 A over an extended time (at least 30 days) has been established. Utilization of the newest technology using CCD detectors poses even more stringent requirements. Test results are presented, and data reduction and modeling techniques are discussed.

Carpenter, A.↗
NASA NTRS1992

An interim overview of LDEF materials findings

The flight and retrieval of the National Aeronautics and Space Administration's Long Duration Exposure Facility (LDEF) provided an opportunity for the study of the low-Earth orbit (LEO) environment and long-duration space environmental effects (SEE) on materials that is unparalleled in the history of the U.S. Space Program. The remarkable flight attitude stability of LDEF enables specific analyses of various individual and combined effects of LEO environmental parameters on identical materials on the same space vehicle. This paper provides an overview of the interim LDEF materials findings of the Principal Investigators and the Materials Special Investigation Group. In general, the LDEF data is remarkably consistent; LDEF will provide a 'benchmark' for materials design data bases for satellites in low-Earth orbit. Some materials were identified to be encouragingly resistant to LEO SEE for 5.8 years; other 'space qualified' materials displayed significant environmental degradation. Molecular contamination was widespread; LDEF offers an unprecedented opportunity to provide a unified perspective of unmanned LEO spacecraft contamination mechanisms. New material development requirements for long-term LEO missions have been identified and current ground simulation testing methods/data for new, durable materials concepts can be validated with LDEF results. LDEF findings are already being integrated into the design of Space Station Freedom.

Stein, Brad A.↗
NASA NTRS1995

Changes in chemical and optical properties of thin film metal mirrors on LDEF

Thin films of the metals Cu, Ni, Pt, Au, Sn, Mo, and W deposited on fused silica flats were exposed at ambient temperature on the leading and trailing faces of the LDEF. Reflectances of these films were measured from 250 to 2500 nm and compared with controls. The exposed films were subjected to the LDEF external environment including atomic oxygen, molecular contamination, and solar ultraviolet. Major changes in optical and infrared reflectance were seen for Cu, Mo, Ni, and W films on the leading face of LDEF and are attributed to partial conversion of metal to metal oxide. Smaller changes in optical properties are seen on all films and are probably caused by thin contaminant films deposited on top of the metal. The optical measurements are correlated with film thickness measurements, x-ray photoelectron spectroscopy, optical calculations, and, in the case of Cu, with x-ray diffraction measurements. In a few cases, comparisons with results from a similar UAH experiment on STS-8 have been drawn.

Peters, Palmer N.↗
NASA NTRS1999

Design/Use of the Remotely Operated Bakeout Box Shutter (ROBBS)

A thermal vacuum box bakeout and certification allows orbital payloads to be cleaned and certified when the background TQCM measurements (a measure of how much molecular contamination is on a payload or chamber) are unacceptable or unmanageable in the standard thermal vacuum chamber. The box bakeout procedure is usually performed in 4 steps: bakeout the box, certify the box, bake out the payload, and finally certify the payload. In the procedure's current setup, the contaminant conduction hole ("lid") is initially open and a vacuum chamber break must occur between the bakeout and certification phases to close the box from the vacuum chamber. This exposure is necessary to allow the outgassed contaminants to escape the box's volume rapidly during bakeout phase, but payload certification isn't usually performed while the lid is still open, because it exposes the payload, TQCM, and box volume to chamber contaminants. The Remotely Operated Bakeout Box Shutter (ROBBS) is a new facility design and will allow the remote closure of the contamination hole while the chamber is still under vacuum, and with little or no time to do so.

Ottens, Brian P.↗
NASA NTRS1999

Science Data Report for the Optical Properties Monitor (OPM) Experiment

Long term stability of spacecraft materials when exposed to the space environment continues to be a major area of investigation. The natural and induced environment surrounding a spacecraft can decrease material performance and limit useful lifetimes. The Optical Properties Monitor (OPM) experiment provided the capability to perform the important flight testing of materials and was flown on the Russian Mir Station to study the long term effects of the natural and induced space environment on materials. The core of the OPM in-flight analysis was three independent optical instruments. These instruments included an integrating sphere spectral reflectometer, a vacuum ultraviolet spectrometer, and a Total Integrated Scatter instrument. The OPM also monitored selected components of the environment including molecular contamination. The OPM was exposed on the exterior of the Mir Docking Module for approximately 8-1/2 months. This report describes the OPM experiment, a brief background of its development, program organization, experiment description, mission overview including space environment definition, performance overview, materials data including flight and ground data, in-depth post flight analysis including ground analysis measurements and a summary discussion of the findings and results.

Wilkes, Donald R.↗
NASA NTRS2001

System Report for the Optical Properties Monitor (OPM) Experiment

This systems report describes how the Optical Properties Monitor (OPM) experiment was developed. Pertinent design parameters are discussed, along with mission information and system requirements to successfully complete the mission. Environmental testing was performed on the OPM to certify it for spaceflight. This testing included vibration, thermal vacuum, electromagnetic interference and conductance, and toxicity tests. Instrument and monitor subsystem performances, including the reflectometer, vacuum ultraviolet, total integrated scatter, atomic oxygen monitor, irradiance monitor, and molecular contamination monitor during the mission are discussed. The OPM experiment was launched aboard the Space Shuttle on mission STS-81 in January 1997 and transferred to the Mir space station. An extravehicular activity (EVA) was performed in April 1997 to attach the OPM experiment to the outside of the Mir/Shuttle Docking Module for space environment exposure. The OPM conducted in situ measurements of a number of material samples. These data may be found in the OPM Science Report. OPM was retrieved during an EVA in January 1998 and was returned to Earth on board the Space Shuttle on mission STS-89.

Hummer, L.↗