High-count rate effects in event processing for XRISM/ Resolve X-ray microcalorimeter: I. Ground test
The spectroscopic performance of an X-ray microcalorimeter is compromised at high count rates. We utilize the Resolve X-ray microcalorimeter onboard the XRISM satellite to examine the effects observed during high-count rate measurements and propose modeling approaches to mitigate them. We specifically address the following instrumental effects that impact performance: CPU limit, pile-up, and untriggered electrical cross-talk. Experimental data at high count rates were acquired during ground testing using the flight model instrument and a calibration X-ray source. In the experiment, data processing not limited by the performance of the onboard CPU was run in parallel, which cannot be done in orbit. This makes it possible to access the data degradation caused by limited CPU performance. We use these data to develop models that allow for a more accurate estimation of the aforementioned effects. To illustrate the application of these models in observation planning, we present a simulated observation of GX 13+1. Understanding and addressing these issues is crucial to enhancing the reliability and precision of X-ray spectroscopy in situations characterized by elevated count rates.