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At least 1,369 records · Page 76

In-situ monitoring of electrohydrodynamic inkjet printing via scalar diffraction for printed droplets

Electrohydrodynamic inkjet (e-jet) printing is a technique which utilizes electrical forces to generate droplets in micro/nano scale using conductive inks. Currently, there is no procedure in place to measure the printed patterns without taking the sample away from the printer setup. Removal of the substrate from the printing stage during the e-jet printing process prevents any additional work from being performed on the sample. We investigated the application of scalar diffraction for the in-situ measurement and digital reconstruction of opaque material printed on transparent substrates. Measurement and characterization of the printed material can be achieved in-situ to alter printing condition in process for quality assurance. In order to accomplish the sample reconstruction, a digital recording of a scalar diffraction pattern in the image plane was employed in this paper with a magnification of 5× with the help of a combination of lenses. The reconstructed images were then compared to images captured by an offline high-resolution microscope. The findings indicated a submicron accuracy of the feature radii and the locations of feature centers. In addition to the quantitative measurements, this method also allows for the operator to view the overall form of the printed patterns. Our findings demonstrate an effective approach for in-situ monitoring of e-jet printing and printed patterns, which could pave the way for the industrial application in printing testing field.

42 ENGINEERING↗

The effect of low-temperature aging on the microstructure and deformation of uranium- 6 wt% niobium: An in-situ neutron diffraction study

The mechanical properties of uranium-niobium alloys evolve with aging at relatively low temperatures due to subtle microstructural changes. In-situ neutron diffraction measurements during aging of a monoclinic U-6Nb alloy at temperatures to 573 K were performed to monitor these changes. Further, in-situ neutron diffraction studies during deformation of U-6Nb in the as-quenched state and after aging for two and eight hours at 473 K were completed to assess the influence of microstructural evolution on mechanical properties. With heating, large anisotropic changes in lattice parameter were observed followed by relaxation with time at the aging temperature. The lattice parameters return to nearly their initial values with cooling. Finally, the active plastic deformation mechanisms including, in order of occurrence, shape-memory de-twinning, mechanical twinning, and slip-mediated deformation do not change with prior aging. However, the resistance to motion of the as-quenched martensitic twin boundaries increases following aging, resulting in the observed increase in initial yield strength.

36 MATERIALS SCIENCE↗

In operando X-ray diffraction strain measurement in Ni 3 Sn 2 – Coated inverse opal nanoscaffold anodes for Li-ion batteries

Volume changes associated with the (de)lithiation of a nanostructured Ni 3 Sn 2 coated nickel inverse opal scaffold anode create mismatch stresses and strains between the Ni 3 Sn 2 anode material and its mechanically supporting Ni scaffold. By using in operando synchrotron x-ray diffraction measurements, elastic strains in the Ni scaffold are determined during cyclic (dis)charging of the Ni 3 Sn 2 anode. These strains are characterized using both the center position of the Ni diffraction peaks, to quantify the average strain, and the peak breadth, which describes the distribution of strain in the measured volume. Upon lithiation (half-cell discharging) or delithiation (half-cell charging), compressive strains and peak breadth linearly increase or decrease, respectively, with charge. The evolution of the average strains and peak breadths suggests that some irreversible plastic deformation and/or delamination occurs during cycling, which can result in capacity fade in the anode. The strain behavior associated with cycling of the Ni 3 Sn 2 anode is similar to that observed in recent studies on a Ni inverse-opal supported amorphous Si anode and demonstrates that the (de)lithiation-induced deformation and damage mechanisms are likely equivalent in both anodes, even though the magnitude of mismatch strain in the Ni 3 Sn 2 is lower due to the lower (de)lithiation-induced contraction/expansion.

25 ENERGY STORAGE↗

Spatially-resolved lithiation dynamics from operando X-ray diffraction and electrochemical modeling of lithium-ion cells

In this study, energy dispersive X-ray diffraction is used to profile the time evolution of ordered Li x C 6 phases in solid electrodes of lithium-ion cells charged at rates between 0.2 and 4.7C (where 1C corresponds to full discharge in 1 h). The methods for quantifying lithium concentration in these phases from the acquired diffraction patterns are described. Compact expressions for time-dependent concentration gradients in the solid electrodes using orthogonal polynomial expansions are presented. Experimentally, these gradients persisted in lithiated graphite electrodes even after the cells rested at open-circuit for over 9 h. A multiphase electrochemical model of graphite intercalation captured many of the observed behaviors, including the progression of phase transitions and the persistent gradients at zero current. However, the magnitude of concentration gradients in both the oxide cathode and graphite anode is underestimated by the model, even at moderate currents.

25 ENERGY STORAGE↗

Investigation of the fatigue crack behavior of 304 stainless steels using synchrotron X-ray tomography and diffraction: Influence of the martensite fraction and role of inclusions

Here, the effect of fatigue on the microstructure of four-point bend specimens of three variations of 304 stainless steels (Commercial 304, 304H, and 304 L) was investigated using synchrotron x-ray tomography and diffraction. X-ray tomography revealed the formation of the fatigue-induced microvoids and crack while the diffraction data was used to quantify the amount of deformation-induced martensite found after fatigue in all samples. Transmission electron microscopy evidenced the role of the precipitates/inclusions on the microvoid formation. It was found to depend on their chemical nature. The shape of the precipitates/inclusions was also found to have an effect on the microvoid shape.

304 stainless steel↗

Mechanism of chlorine-induced stress corrosion cracking of two 304 SS heats in simulated marine environment through in situ X-ray tomography and diffraction: Role of deformation induced martensite and crack branching

In this work, In-situ synchrotron x-ray tomography and diffraction experiments were conducted on two heats of 304SS undergoing chlorine-induced stress-corrosion-cracking (CISCC) in a simulated marine environment. The role of deformation induced martensite on CISCC was investigated through diffraction analysis where no significant amount of martensite was found to form during CISCC, indicating that it may not play a significant role in affecting the process. Tomography combined with stress-intensity analysis revealed the influence of stress-intensity on branching types with single crack growth, micro-branching, and macro-branching. Post experimental electron microscopy characterization revealed the presence of FeCl 2 , CrCl 2 , and NiCl 2 ·6H 2 O compounds at the crack, which infers a dissolution mechanism during the experiment. A dissolution mechanism highlighting the synergy between stress and corrosion was proposed to explain chlorine-induced stress-corrosion-cracking and crack branching.

36 MATERIALS SCIENCE↗

Comparison of dislocation content measured with transmission electron microscopy and micro-Laue diffraction based streak analysis

The subsurface dislocation content in a Ti-5Al-2.5Sn (wt%) uniaxial tension sample deformed at ambient temperature was characterized by peak streak analysis of micro-Laue diffraction patterns collected non-destructively by differential aperture X-raymicroscopy, and with focused ion beam transmission electron microscopy of material in the same volume. This comparison reveals that micro-Laue diffraction streak analysis based on an edge dislocation assumption can accurately identify the dominant dislocation slip system history (Burgers vector and plane observed by TEM), despite the fact that dislocations have predominantly screw character. As a result, other dislocations identified by TEM were not convincingly discernible from the peak streak analysis.

72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS↗

Measurement of Poly-Si Film Thickness on Textured Surfaces by X-Ray Diffraction in Poly-Si/SiOx Passivating Contacts for Monocrystalline Si Solar Cells

Polycrystalline Silicon on tunneling silicon oxide (poly-Si/SiOx) passivating contacts have shown great potential for the next-generation monocrystalline Si (c-Si) industrial photovoltaic technology. However, these cells typically suffer from strong parasitic absorption in the thick front poly-Si layer, which is designed to reduce metal-induced recombination. In previous work, we demonstrated an improved short-circuit current density, Jsc, by thinning the front poly-Si film in an SF6 plasma using the front metal grids as a self-aligned mask, but the sub - 100 nm thick poly-Si film is difficult to measure on an alkaline textured surface. Conventional optical techniques such as spectroscopic ellipsometry cannot be used due to the high scattering nature of the random pyramids. At poly-Si thicknesses below 50 nm, secondary electron microscopy (SEM) has difficulty distinguishing the poly-Si from the underlying c-Si substrate. Here, we demonstrate X-ray diffraction as an effective method to quantitatively measure the front poly-Si thickness. The thickness calculated from the diffraction peak height of the Si(111) crystallographic plane agrees well with the cross-section SEM analysis and simulations using SunSolve. We show that by thinning the front poly-Si from 200 to 60 nm, Jsc increased by 2.4 mA/cm2, while maintaining the same Voc. This led to an absolute efficiency gain of 1.73%. In addition, we also discuss possible reasons for the premature loss of passivation before the removal of all poly-Si, which prevented an even higher gain in Jsc.

light/electron beam induced current↗

A spherical harmonic transform approach to the indexing of electron back-scattered diffraction patterns

A new approach is proposed for the indexing of electron back-scattered diffraction (EBSD) patterns. The algorithm employs a spherical master EBSD pattern and computes its cross-correlation with a back-projected experimental pattern using the spherical harmonic transform (SHT). This approach is significantly faster than the recent dictionary indexing algorithm, but shares the latter’s robustness against noise. The underlying theory is presented, followed by example applications, one on a series of Ni EBSD data sets recorded with decreasing signal-to-noise ratio, the other on a large shot-peened Al data set. The dependence of indexing speed and memory usage on the SHT bandwidth is explored. The speed gains of the new algorithm are achieved by executing real-valued Fast Fourier Transforms, explicitly incorporating crystallographic symmetry in the cross-correlation computation, and using efficient loop ordering to improve the caching behavior. The algorithm produces a cross-correlation array in the zyz Euler space; an orientation refinement procedure is proposed based on analytical derivatives of the Wigner d functions. As a result, the new approach can be applied to any diffraction modality for which the scattered intensity can be represented on a spherical surface.

36 MATERIALS SCIENCE↗

Toward accurate measurement of electromagnetic field by retrieving and refining the center position of non-uniform diffraction disks in Lorentz 4D-STEM

Recent advancement in scanning transmission electron microscopy (STEM) allows the use of 4D-STEM, a technique that captures an electron diffraction pattern at each scan point in STEM, to measure electrostatic and magnetic potential and field in materials. However, accurate measurement, separation of the magnetic and electric signals, and removal of artifacts remain challenging, especially in the presence of complex non-uniform diffraction contrast within the disks. In this work, based on dynamic simulations of 4D-STEM patterns built upon superstructures consisting of millions of atoms to account for different sample thickness and edge geometries, we show how the shape and intensity distribution of the central disk are affected by multiple scattering. We propose a robust refinement procedure through iteration of the spin-sensitive peak position of the disk-center in the circular Hough transform filtered images from experimental Lorentz 4D-STEM dataset after minimizing the possible artifacts, such as those due to the change of thickness, dynamic scattering, and scanning process. We verify that caution must be taken as in practice the rigid-disk-shift model used to reconstruct induction maps can easily break down due to disk-protrusion when there exists a nonconstant phase gradient or thickness within the width of the probe. Through quantitative analysis and comparing experiment with calculation the effect of the non-spin-related intensity distribution inside the disk as well as that causes the disk shift due to the intensity-protrusion can be removed, and high-quality magnetic field mapping is possible.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

High-energy synchrotron X-ray diffraction measurements of simple bending of pseudoelastic NiTi shape memory alloy wires

Many technological applications of austenitic shape memory alloys (SMAs) involve cyclical mechanical loading and unloading in order to take advantage of pseudoelasticity. In this paper, we investigated the effect of mechanical bending of pseudoelastic NiTi SMA wires using high-energy synchrotron radiation X-ray diffraction (SR-XRD). Differential scanning calorimetry was performed to identify the phase transformation temperatures. Scanning electron microscopy images show that micro-cracks in compressive regions of the wire propagate with increasing bend angle, while tensile regions tend not to exhibit crack propagation. SR-XRD patterns were analyzed to study the phase transformation and investigate micromechanical properties. By observing the various diffraction peaks such as the austenite (200) and the martensite ( ${\bar 1}12$ ), ( ${\bar 1}03$ ), ( ${\bar 1}11$ ), and (101) planes, intensities and residual strain values exhibit strong anisotropy, depending upon whether the sample is in compression or tension during bending.

Zhang, Baozhuo↗

Structure determination of two structural analogs, named 3-[1-(2-fluoro-4-biphenyl)ethyl]-6-(4-fluorophenyl)-1,2,4-triazolo[3,4-b]-1,3,4-thiadiazole (C23H16F2N4S) and 3-[1-(2-fluoro-4-biphenyl)ethyl]-6-(4-chlorophenyl)-1,2,4-triazolo[3,4-b]-1,3,4-thiadiazole (C23H16ClFN4S) by synchrotron X-ray powder diffraction

Two novel compounds, 3-[1-(2-fluoro-4-biphenyl)ethyl]-6-(4-fluorophenyl)-1,2,4-triazolo[3,4- b ]-1,3,4-thiadiazole (C 23 H 16 F 2 N 4 S) ( 1 ) and 3-[1-(2-fluoro-4-biphenyl)ethyl]-6-(4-chlorophenyl)-1,2,4-triazolo[3,4- b ]-1,3,4-thiadiazole (C 23 H 16 ClFN 4 S) ( 2 ), have been designed and synthesized as cytotoxic agents. The compounds were characterized by infrared, proton nuclear magnetic resonance, mass spectral data, elemental analysis and X-ray powder diffraction. The present study comprises spectral data and crystal structures of these novel compounds determined from synchrotron X-ray powder diffraction data. The structure solutions were obtained by simulated annealing. The final structures were achieved by Rietveld refinement using soft restraints for all bond lengths, bond angles, and planar groups. Both compounds crystallize in space group $P\bar 1$ , Z = 2, with the unit-cell parameters a = 6.37433(9), b = 11.3641(2), c = 14.09115(19) Å, α = 80.1740(8)°, β = 85.1164(8)°, γ = 80.9831(10)°, V = 991.55(3) Å 3 of compound ( 1 ) and a = 6.53736(6), b = 11.55725(15), c = 14.01373(13) Å, α = 80.3323(7)°, β = 84.8939(6)°, γ = 79.3954(8)°, V = 1024.08(2) Å 3 of compound ( 2 ). Structural analyses reveal that the title compounds are isostructural.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗

Powder X-ray diffraction of nintedanib esylate hemihydrate, (C 31 H 33 N 5 O 4 )(C 2 H 5 O 3 S)(H 2 O) 0.5

The crystal structure of nintedanib esylate hemihydrate was refined using synchrotron X-ray powder diffraction data and optimized using density functional theory techniques. Nintedanib esylate hemihydrate crystallizes in space groupP-1(#2) witha= 11.5137(1),b= 16.3208(4),c= 19.1780(5) Å,α= 69.0259(12),β= 84.4955(8),γ= 89.8319(6)°,V= 3347.57(3) Å 3 , andZ= 4 at 295 K. Hydrogen bonds are prominent in the crystal structure. The water molecule forms two medium-strength O–H⋯O hydrogen bonds to one of the esylate anions. The protonated nitrogen atom in each cation forms a N–H⋯O hydrogen bond to an esylate anion. The ring N–H groups form strong intramolecular N–H⋯O hydrogen bonds to carbonyl groups. The ring N–H groups form intramolecular N–H⋯O hydrogen bonds to esylate anions. Many C–H⋅⋅⋅O hydrogen bonds (and one C–H⋯N hydrogen bond), with aromatic C–H, methylene groups and methyl groups as donors, are present. The hydrogen bonding patterns of the two cations differ considerably. The powder pattern has been submitted to ICDD for inclusion in the Powder Diffraction File™ (PDF®)

Materials Science↗

Comparison of Dislocation Characterization by Electron Channeling Contrast Imaging and Cross-Correlation Electron Backscattered Diffraction

The characterization and quantification of dislocations is predominately carried out using transmission electron microscopy (TEM). Nevertheless, the sample preparation necessary for TEM foils can be cumbersome and possibly introduce defects. Two other techniques for characterizing and quantifying dislocations are electron channeling contrast imaging (ECCI) and cross-correlation electron backscattered diffraction (CC-EBSD). ECCI is similar to TEM in that specific imaging (channeling or diffraction) conditions need to be established, but is carried out in a scanning electron microscope on bulk samples, resulting in less complex sample preparation. CC-EBSD measures subtle changes in orientation measured from EBSD patterns to calculate elastic strains and the Nye tensor to deduce and map the total geometrically necessary dislocation (GND) content. Furthermore, this work presented here compares the capabilities of ECCI and CC-EBSD to map dislocations generated from nanoindentation.

42 ENGINEERING↗

Grains and Strains from Cepstral Analysis of 4D-STEM Nano-Diffraction Datasets

We report the availability of fast, high dynamic range pixel array detectors makes scanning convergent beam electron diffraction (CBED) a powerful tool for rapid, spatially resolved characterization of lattice structure over a wide range of length scales. However, to extract useful structural information from the large 4-dimensional datasets, especially for complex, 3D specimens, we must confront challenges with CBED intensity variations due to crystal mistilts and multiple scattering as well as challenges with precisely localizing diffracted disk centers.

36 MATERIALS SCIENCE↗

Relationship among the Crystal Structure, Texture, and Macroscopic Properties of Tetragonal (Pb,La)(Zr,Ti)O 3 Ferroelectrics Investigated by In Situ High-Energy Synchrotron Diffraction

In situ diffraction investigations have played an important role in experimentally revealing the mechanism of piezoelectric and ferroelectric properties. In this study, a pure tetragonal ferroelectric ceramic of La-doped PbZr 0.5 Ti 0.5 O 3 (LaPZT50) was investigated to eliminate the complex influence of phase coexistence. The electric field evolutions of the crystal structure, domain switching, and lattice deformation of the tetragonal phase have been revealed by in situ high-energy synchrotron X-ray diffraction. Furthermore, we found that the crystal structure of LaPZT50 is quite stable, showing a negligible change in the Pb–O bond length, unit cell volume, and spontaneous polarization upon application of an in situ external electric field. Importantly, the maximum macroscopic polarization of tetragonal LaPZT50 is defined by the 111-oriented grains. As determined by the intensity difference, the switching of non-180° domains plays a more significant role in contributing to the macroscopic strain than lattice deformation. These results further imply that the phase coexistence around the morphotropic phase boundary facilitates domain wall motion in the tetragonal phase and improves the ferroelectric and piezoelectric properties.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗

Solving the “Coloring Problem” in InPd 3– x Ag x ( x = 0–0.7) by Phase Diagrams Modeling and Diffraction Experiments

Here, a series of InPd 3–x Ag x (x = 0–1) compositions were synthesized by conventional high-temperature synthesis, and as-synthesized samples were characterized by powder X-ray diffraction experiments. Up to x = 0.7, InPd 3–x Ag x adopts the ternary substitutional variant of the InPd 3 structure (TiAl 3 -type), when x > 0.7, elemental Ag starts to segregate along with the main phase. Accurate structural characterization in InPd 3–x Ag x faces a critical challenge due to the narrow X-ray scattering contrast among constituents In, Pd, and Ag and nearly identical neutron scattering lengths of Pd and Ag. To overcome this “coloring problem”, a combination of calculation of phase diagrams modeling (CALPHAD) and diffraction techniques (X-ray and neutron) was employed. In the compositional range 0 ≤ x ≤ 0.7, InPd 3–x Ag x presents a ternary variant of the TiAl 3 -type structure, where Ag atoms selectively substitute one (the 2b Wyckoff site) of the two Pd sites in InPd 3 . Notably, in contrast to the isologous InPd 3–x Cu x (x = 0–1) system, Ag substitution does not form an ordered VRh 2 Sn-type structure at the limiting composition. The distinct site preference in InPd 3–x Ag x is elucidated by charge population analysis, electronic structure calculations, and orbital-resolved chemical bonding investigations, and the extent of substitution is supported by formation free energy calculations.

36 MATERIALS SCIENCE↗

Coupled Electronic and Nuclear Motions during Azobenzene Photoisomerization Monitored by Ultrafast Electron Diffraction

Ultrafast electron diffraction is a powerful technique that can resolve molecular structures with femtosecond and angstrom resolutions. We demonstrate theoretically how it can be used to monitor conical intersection dynamics in molecules. Specific contributions to the signal are identified which vanish in the absence of vibronic coherence and offer a direct window into conical intersection paths. A special focus is on hybrid scattering from nuclei and electrons, a process that is unique to electron (rather than X-ray) diffraction and monitors the strongly coupled nuclear and electronic motions in the vicinity of conical intersections. Furthermore, an application is made to the cis to trans isomerization of azobenzene, computed with exact quantum dynamics wavepacket propagation in a reactive two-dimensional nuclear space.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗