Erratum: “High performance solution-deposited amorphous indium gallium zinc oxide thin film transistors by oxygen plasma treatment” [Appl. Phys. Lett. 100, 202106 (2012)]
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In the above paper, an analytical approach including a new solution to the differential diffusion equation in illuminated quasi-neutral regions (QNR) is exploited to calculate the short-circuit current density (J{sub sc}), open-circuit voltage (V{sub oc}), fill factor (FF), and efficiency (η) of light-trapping (LT) c-Si solar cells with a given structure. Comparisons with numerical results calculated by the Silvaco ATLAS device simulator in the same LT cells show that the analytical results are systematically overestimated. According to the authors, the inaccuracies in J{sub sc}, V{sub oc}, and η are due to the fact that assuming ideal collection from space-charge region (SCR) and using the superposition approximation introduce systematic errors into analytical models. In this comment, an analytical approach using reported solutions to the transport equations in QNR and SCR, where ideal collection from SCR is assumed and the superposition approximation is used, is shown to agree with both the Silvaco and PC1d numerical approaches in calculating J{sub sc}, V{sub oc}, and η, in the same LT devices as considered in the commented paper. Reasons for the inaccuracies detected in the commented paper are suggested.
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