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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 145 records · Page 8
All sourcesNASA NTRSDOE OSTI
NASA NTRS2006

Single Event Effects Test Results for the Actel ProASIC Plus and Altera Stratix-II Field Programmable Gate Arrays

This work describes radiation testing of Actel's ProASIC Plus and Altera's Stratix-II FPGAs. The Actel Device Under Test (DUT) was a ProASIC Plus APA300-PQ208 nonvolatile, field reprogrammable device which is based on a 0.22micron flash-based LVCMOS technology. Limited investigation has taken place into flash based FPGA technologies, therefore this test served as a preliminary reference point for various SEE behaviors. The Altera DUT was a Stratix-II EP2S60F1020C4. Single Event Upset (SEU) and Single Event Latchup (SEL) were the focus of these studies. For the Actel, a latchup test was done at an effective LET of 75.0 MeV-sq cm/mg at room temperature, and no latchup was detected when irradiated to a total fluence of 1 x 10(exp 7) particles/sq cm. The Altera part was shown to latchup at room temperature.

heavy ions↗
NASA NTRS2007

Radiation Hardened Electronics for Extreme Environments

The Radiation Hardened Electronics for Space Environments (RHESE) project consists of a series of tasks designed to develop and mature a broad spectrum of radiation hardened and low temperature electronics technologies. Three approaches are being taken to address radiation hardening: improved material hardness, design techniques to improve radiation tolerance, and software methods to improve radiation tolerance. Within these approaches various technology products are being addressed including Field Programmable Gate Arrays (FPGA), Field Programmable Analog Arrays (FPAA), MEMS Serial Processors, Reconfigurable Processors, and Parallel Processors. In addition to radiation hardening, low temperature extremes are addressed with a focus on material and design approaches.

Keys, Andrew S.↗
NASA NTRS2008

Technology Developments in Radiation-Hardened Electronics for Space Environments

The Radiation Hardened Electronics for Space Environments (RHESE) project consists of a series of tasks designed to develop and mature a broad spectrum of radiation hardened and low temperature electronics technologies. Three approaches are being taken to address radiation hardening: improved material hardness, design techniques to improve radiation tolerance, and software methods to improve radiation tolerance. Within these approaches various technology products are being addressed including Field Programmable Gate Arrays (FPGA), Field Programmable Analog Arrays (FPAA), MEMS, Serial Processors, Reconfigurable Processors, and Parallel Processors. In addition to radiation hardening, low temperature extremes are addressed with a focus on material and design approaches. System level applications for the RHESE technology products are discussed.

Keys, Andrew S.↗
NASA NTRSDate not supplied

Efficient Mirrorlet Array Based Integral Field Spectrometer (IFS) for HWO

Habitable World Observatory (HWO) is a NASA strategic mission recommended by 2020 astronomical decadal survey. Integral field spectrometers play an important role to verify if the observed exoplanet is habitable. The traditional lenslet array based IFS has the advantage of simplicity and compactness. However, it does not use detector pixels efficiently in order to prevent wavelength crosstalk among adjacent spectra. The efficient lenslet/mirrorlet IFS combines the advantages from both lenslet based and imager slicer based IFSes—keeping lenslet IFS’s simplicity and compactness, and adding slicer IFS’s detector efficiency. This paper discusses the principle of efficient lenslet/mirrorlet IFS, design philosophy, and efficient spectral trace layout ideals. It uses HWO NIR IFS requirement as an example to provide an efficiency mirrorlet IFS optical design. The high detector efficiency not only reduces needed detector pixel numbers, but also reduces the high communication rate demanding for such a large multiple instrument mission.

Qian Gong↗
NASA NTRS2015

Using Classical Reliability Models and Single Event Upset (SEU) Data to Determine Optimum Implementation Schemes for Triple Modular Redundancy (TMR) in SRAM-Based Field Programmable Gate Array (FPGA) Devices

Space applications are complex systems that require intricate trade analyses for optimum implementations. We focus on a subset of the trade process, using classical reliability theory and SEU data, to illustrate appropriate TMR scheme selection.

Field Programmable Gate Array (FPGA)↗
NASA NTRS2006

Upset Characterization of the PowerPC405 Hard-core Processor Embedded in Virtex-II Pro Field Programmable Gate Arrays

Shown in this presentation are recent results for the upset susceptibility of the various types of memory elements in the embedded PowerPC405 in the Xilinx V2P40 FPGA. For critical flight designs where configuration upsets are mitigated effectively through appropriate design triplication and configuration scrubbing, these upsets of processor elements can dominate the system error rate. Data from irradiations with both protons and heavy ions are given and compared using available models.

radiation effects↗
NASA NTRS2018

Xilinx Kintex-UltraScale Field Programmable Gate Array Single Event Effects (SEE) Heavy-Ion Test Report

This is an independent investigation that evaluates the single event destructive and transient susceptibility of the Xilinx Kintex-UltraScale device. Design/Device susceptibility is determined by monitoring the device under test (DUT) for Single Event Transient (SET) and Single Event Upset (SEU) induced faults by exposing the DUT to a heavy ion beam. Potential Single Event Latch-up (SEL) is monitored throughout heavy-ion testing by examining device current. This device does not have embedded mitigation. Hence, user implemented mitigation is investigated using Synopsys mitigation tools.

Single Event Transient (SET)↗
NASA NTRS2004

Self-Recovery Experiments in Extreme Environments Using a Field Programmable Transistor Array

Temperature and radiation tolerant electronics, as well as long life survivability are key capabilities required for future NASA missions. Current approaches to electronics for extreme environments focus on component level robustness and hardening. However, current technology can only ensure very limited lifetime in extreme environments. This paper describes novel experiments that allow adaptive in-situ circuit redesign/reconfiguration during operation in extreme temperature and radiation environments. This technology would complement material/device advancements and increase the mission capability to survive harsh environments. The approach is demonstrated on a mixed-signal programmable chip (FPTA-2), which recovers functionality for temperatures until 28 C and with total radiation dose up to 250kRad.

space vehicle electronics↗
NASA NTRS2018

NASA Electronic Parts and Packaging Field Programmable Gate Array Single Event Effects Test Guideline Update

The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic versus mission specific device evaluation, single event latch-up (SEL) test and analysis, SEE response visibility enhancement during radiation testing, mitigation evaluation (embedded and user-implemented), unreliable design and its affects to SEE Data, testing flushable architectures versus non-flushable architectures, intellectual property core (IP Core) test and evaluation (addresses embedded and user-inserted), heavy-ion energy and linear energy transfer (LET) selection, proton versus heavy-ion testing, fault injection, mean fluence to failure analysis, and mission specific system-level single event upset (SEU) response prediction. Most sections within the guidelines manual provide information regarding best practices for test structure and test system development. The scope of this manual addresses academic versus mission specific device evaluation and visibility enhancement in IP Core testing.

Field Programmable Gate Array (FPGA)↗
NASA NTRS2018

NASA Electronic Parts and Packaging (NEPP) Field Programmable Gate Array (FPGA) Single Event Effects (SEE) Test Guideline Update

The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic versus mission specific device evaluation, single event latch-up (SEL) test and analysis, SEE response visibility enhancement during radiation testing, mitigation evaluation (embedded and user-implemented), unreliable design and its affects to SEE Data, testing flushable architectures versus non-flushable architectures, intellectual property core (IP Core) test and evaluation (addresses embedded and user-inserted), heavy-ion energy and linear energy transfer (LET) selection, proton versus heavy-ion testing, fault injection, mean fluence to failure analysis, and mission specific system-level single event upset (SEU) response prediction. Most sections within the guidelines manual provide information regarding best practices for test structure and test system development. The scope of this manual addresses academic versus mission specific device evaluation and visibility enhancement in IP Core testing.

Test guidelines↗
NASA NTRS1988

Diffraction-Coupled, Phase-Locked Semiconductor Laser Array

Stable, narrow far field produced. Array of lasers fabricated on single chip. Individual laser waveguides isolated from each other except in end portions, where diffraction coupling takes place. Radiation pattern far from laser array has single, sharp central lobe when all lasers operate in phase with each other. Shape of lobe does not vary appreciably with array current. Applications include recording, printing, and range finding.

Katz, Joseph↗
DOE OSTI2022

A field programmable gate array-based timing and control system for the dynamic compression sector

A field programmable gate array (FPGA)-based timing and trigger control system has been developed for the Dynamic Compression Sector (DCS) user facility located at the Advanced Photon Source (APS) at Argonne National Laboratory. The DCS is a first-of-its-kind capability dedicated to dynamic compression science. All components of the DCS laser shock station—x-ray choppers, single-shot shutter, internal laser triggers, and shot diagnostics—must be synchronized with respect to the arrival of x rays in the hutch. An FPGA synchronized to the APS storage ring radio frequency clock (352 MHz) generates trigger signals for each stage of the laser and x-ray shutter system with low jitter. The developed FPGA-based control system was the first system used to control the laser and the shutter system since its commissioning, and it has been developing since then to improve the timing jitter. The system is composed of a Zynq FPGA, a debug card, line drivers, and a power supply. The delay and offsets of the trigger signals can be adjusted by using a user-friendly graphical user interface with high precision. Here, the details of the system architecture, timing requirements, firmware, and software implementation along with the performance evaluation are presented in this paper. The system offers low timing jitter (15.5 ps rms) with respect to the APS 352 MHz clock, suitable for the 100 ps (FWHM) x-ray bunch duration at the APS.

47 OTHER INSTRUMENTATION↗
NASA NTRS1997

Remote Sensing of Aircraft Contrails Using a Field Portable Digital Array Scanned Interferometer

With a Digital Array Scanned Interferometer (DASI), we have obtained proof-of-concept observations with which we demonstrate DASI capabilities for the determination of contrail properties. These include the measurement of the cloud and soot microphysical parameters, as well, the abundances of specific pollutant species such as SO(sub x) or NO(sub x). From high quality hyperspectral data and using radiative transfer methods and atmospheric chemistry analysis in the data reduction and interpretation, powerful inferences concerning cloud formation, evolution and dissipation can be made. Under this sub-topic, we will integrate DASI with computer controlled scanning of the field-of-view to direct the sensor towards contrails and exhaust plumes for tracking the emitting vehicles. The optimum DASI wavelength sensitivity range for sensing contrails is 0.35 - 2.5 micron. DASI deploys on the ground or from aircraft to observe contrails in the vicinity. This enables rapid, accurate measurement of the temporal, spatial, and chemical evolution of contrails (or other plumes or exhaust sources) with a low cost, efficient sensor.

Smith, William Hayden↗
NASA NTRS2006

Uplink Array Calibration via Far-Field Power Maximization

Uplink antenna arrays have the potential to greatly increase the Deep Space Network s high-data-rate uplink capabilities as well as useful range, and to provide additional uplink signal power during critical spacecraft emergencies. While techniques for calibrating an array of receive antennas have been addressed previously, proven concepts for uplink array calibration have yet to be demonstrated. This article describes a method of utilizing the Moon as a natural far-field reflector for calibrating a phased array of uplink antennas. Using this calibration technique, the radio frequency carriers transmitted by each antenna of the array are optimally phased to ensure that the uplink power received by the spacecraft is maximized.

Vilnrotter, V.↗
DOE OSTI2025

Radio Frequency Field Programable Gate Array Implementation of Reflectometry Cable Monitoring

PNNL has developed an innovative cable testing system that leverages the Xilinx RF System-on-Chip (RFSoC) technology to create a more flexible and capable measurement tool than traditional approaches. The architecture is designed on the ZCU111 development board and takes advantage of the high-speed digital to analog converters (DAC) and analog to digital converters (ADC) to generate and capture digitally synthesized waveforms. The platform allows engineers to easily adjust power, frequency, duration and modulation on the fly rather than being locked into fixed hardware configurations

Tedeschi, Jonathan [Pacific Northwest National Lab↗