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At least 145 records · Page 8

Comparison of the Radiative Two-Flux and Diffusion Approximations

Approximate solutions are sometimes used to determine the heat transfer and temperatures in a semitransparent material in which conduction and thermal radiation are acting. A comparison of the Milne-Eddington two-flux approximation and the diffusion approximation for combined conduction and radiation heat transfer in a ceramic material was preformed to determine the accuracy of the diffusion solution. A plane gray semitransparent layer without a substrate and a non-gray semitransparent plane layer on an opaque substrate were considered. For the plane gray layer the material is semitransparent for all wavelengths and the scattering and absorption coefficients do not vary with wavelength. For the non-gray plane layer the material is semitransparent with constant absorption and scattering coefficients up to a specified wavelength. At higher wavelengths the non-gray plane layer is assumed to be opaque. The layers are heated on one side and cooled on the other by diffuse radiation and convection. The scattering and absorption coefficients were varied. The error in the diffusion approximation compared to the Milne-Eddington two flux approximation was obtained as a function of scattering coefficient and absorption coefficient. The percent difference in interface temperatures and heat flux through the layer obtained using the Milne-Eddington two-flux and diffusion approximations are presented as a function of scattering coefficient and absorption coefficient. The largest errors occur for high scattering and low absorption except for the back surface temperature of the plane gray layer where the error is also larger at low scattering and low absorption. It is shown that the accuracy of the diffusion approximation can be improved for some scattering and absorption conditions if a reflectance obtained from a Kubelka-Munk type two flux theory is used instead of a reflection obtained from the Fresnel equation. The Kubelka-Munk reflectance accounts for surface reflection and radiation scattered back by internal scattering sites while the Fresnel reflection only accounts for surface reflections.

Spuckler, Charles M.↗

Effect of Index of Refraction on Radiation Characteristics in a Heated Absorbing, Emitting, and Scattering Layer

The index of refraction can considerably influence the temperature distribution and radiative heat flow in semitransparent materials such as some ceramics. For external radiant heating, the refractive index influences the amount of energy transmitted into the interior of the material. Emission within a material depends on the square of its refractive index, and hence this emission can be many times that for a biackbody radiating into a vacuum. Since radiation exiting through an interface into a vacuum cannot exceed that of a blackbody, there is extensive reflection at the internal surface of an interface, mostly by total internal reflection. This redistributes energy within the layer and tends to make its temperature distribution more uniform. The purpose of the present analysis is to show that, for radiative equilibrium in a gray layer with diffuse interfaces, the temperature distribution and radiative heat flux for any index of refraction can be obtained very simply from the results for an index of refraction of unity. For the situation studied here, the layer is subjected to external radiative heating incident on each of its surfaces. The material emits, absorbs, and isotropically scatters radiation. For simplicity the index of refraction is unity in the medium surrounding the layer. The surfaces of the layer are assumed diffuse. This is probably a reasonable approximation for a ceramic layer that has not been polished. When transmitted radiation or radiation emitted from the interior reaches the inner surface of an interface, the radiation is diffused and some of it thereby placed into angular directions for which there is total internal reflection. This provides a trapping effect for retaining energy within the layer and tends to equalize its temperature distribution. An analysis of temperature distributions in absorbing-emitting layers, including index of refraction effects, was developed by Gardon (1958) to predict cooling and heat treating of glass plates. The interfaces were optically smooth; the resulting specular reflections were computed from the Fresnel reflection laws. This provides a somewhat different behavior than for diffuse interfaces. A similar application was for heating that occurs in a window of a re-entry vehicle (Fowle et al., 1969). A number of recent papers (Rokhsaz and Dougherty, 1989; Ping and Lallemand, 1989; Crosbie and Shieh, 1990) further examined the effects of Fresnel boundary reflections and nonunity refractive index. Other examples of analyses of both steady and transient heat transfer to single or multiple plane layers (Amlin and Korpela, 1979; Tarshis et al., 1969) have used diffuse assumptions at the interfaces as in the present study

Siegel, R.↗

Method of Modeling and Simulation of Shaped External Occulters

The present invention relates to modeling an external occulter including: providing at least one processor executing program code to implement a simulation system, the program code including: providing an external occulter having a plurality of petals, the occulter being coupled to a telescope; and propagating light from the occulter to a telescope aperture of the telescope by scalar Fresnel propagation, by: obtaining an incident field strength at a predetermined wavelength at an occulter surface; obtaining a field propagation from the occulter to the telescope aperture using a Fresnel integral; modeling a celestial object at differing field angles by shifting a location of a shadow cast by the occulter on the telescope aperture; calculating an intensity of the occulter shadow on the telescope aperture; and applying a telescope aperture mask to a field of the occulter shadow, and propagating the light to a focal plane of the telescope via FFT techniques.

Lyon, Richard G.↗

Beam Wave Considerations for Optical Link Budget Calculations

The bounded beam wave nature of electromagnetic radiation emanating from a finite size aperture is considered for diffraction-based link power budget calculations for an optical communications system. Unlike at radio frequency wavelengths, diffraction effects are very important at optical wavelengths. In the general case, the situation cannot be modeled by supposing isotropic radiating antennas and employing the concept of effective isotropic radiated power. It is shown here, however, that these considerations are no more difficult to treat than spherical-wave isotopic based calculations. From first principles, a general expression governing the power transfer for a collimated beam wave is derived and from this are defined the three regions of near-field, first Fresnel zone, and far-field behavior. Corresponding equations for the power transfer are given for each region. It is shown that although the well-known linear expressions for power transfer in the far-field hold for all distances between source and receiver in the radio frequency case, nonlinear behavior within the first Fresnel zone must be accounted for in the optical case at 1550 nm with typical aperture sizes at source/receiver separations less that 100 km.

Wave Propagation↗

Atmospheric neutral points over water.

Positions of skylight neutral points for model of Rayleigh atmosphere and smooth water surface specularly reflecting light according to Fresnel law

Fraser, R. S.↗

Partial reflections of radio waves from the lower ionosphere

The addition of phase difference measurements to partial reflection experiments is discussed, and some advantages of measuring electron density this way are pointed out. The additional information obtained reduces the requirement for an accurate predetermination of collision frequency. Calculations are also made to estimate the errors expected in partial-reflection experiments due to the assumption of Fresnel reflection and to the neglect of coupling between modes. In both cases, the errors are found to be of the same order as known errors in the measurements due to current instrumental limitations.

Connolly, D. J.↗

Differential phase measurements of D-region partial reflections

Differential phase partial reflection measurements were used to deduce D region electron density profiles. The phase difference was measured by taking sums and differences of amplitudes received on an array of crossed dipoles. The reflection model used was derived from Fresnel reflection theory. Seven profiles obtained over the period from 13 October 1971 to 5 November 1971 are presented, along with the results from simultaneous measurements of differential absorption. Some possible sources of error and error propagation are discussed. A collision frequency profile was deduced from the electron concentration calculated from differential phase and differential absorption.

Wiersma, D. J.↗