A New Paradigm in Metal Surface Preparation for High-Throughput Materials Characterization.
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Measurement of two normal stress differences and of shearing stress of viscoelastic fluids under steady laminar flow conditions and at high rates of deformation
Ultrahigh vacuum system with accurate tensile test capability for material and lubricant tests
Organometallic sources are available for all the III-V elements and a variety of dopants; thus it is possible to use the technique to grow a wide variety of semiconductor compounds. AlGaAsSb and AlGaInAs alloys for multijunction monolithic solar cells were grown by OM-VPE. While the effort concentrated on terrestrial applications, the success of OM-VPE grown GaAs/AlGaAs concentrator solar cells (23% at 400 suns) demonstrates that OM-VPE is suitable for growing high efficiency solar cells in large quantities for space applications. In addition, OM-VPE offers the potential for substantial cost reduction of photovoltaic devices with scale up and automation and due to high process yield from reproducible, uniform epitaxial growths with excellent surface morphology.
A computerized system was established and the electrochemical fluorination of trichloroethylene, polyacrylic acid and polyvinyl alcohol in anhydrous hydrogen fluoride was attempted. Both solid substrates as well as membranes were used. Some difficulties were found in handling and analyzing the solid substrates and membranes. Further studies are needed in this area. A microprocessor aided electrochemical fluorination system capable of obtaining highly reproducible experimental results was established.
The performance improvements obtainable from extending the traditionally thin back-surface-field (BSF) layer deep into the base of silicon solar cells under terrestrial solar illumination (AM1) are analyzed. This extended BSF cell is also known as the back-drift-field cell. About 100 silicon cells were analyzed, each with a different emitter or base dopant impurity distribution whose selection was based on physically anticipated improvements. The four principal performance parameters (the open-circuit voltage, the short-circuit current, the fill factor, and the maximum efficiency) are computed using a FORTRAN program, called Circuit Technique for Semiconductor-device Analysis, CTSA, which numerically solves the six Shockley Equations under AM1 solar illumination at 88.92 mW/cm, at an optimum cell thickness of 50 um. The results show that very significant performance improvements can be realized by extending the BSF layer thickness from 2 um (18% efficiency) to 40 um (20% efficiency).
The following subject areas are covered: general issues (unique operating/storage environments, adapt existing materials/develop rocket materials, long lead time for new materials, high cost, integration of materials development and manufacturing technology, and availability of materials data); technical issues (materials characterization for operating and storage environments, advanced materials development, availability and dissemination of materials properties, advanced materials tests facilities, fire hazards, and propellants); major objectives (materials characterization, advanced materials development, and materials data base development/maintenance); and candidate programs (materials characterization, advanced materials development, and aerospace materials data base).
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Industry partners and the MSFC have entered into a joint program for characterization studies of various materials which may be viable candidates for future optical systems. We will present the current status of this program. The two phase testing scenario will be discussed including the various tests to be done in each of the test phases. Phase one of the test program has all partners involved while phase two may involve a down-selection of partners based on phase one results.
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Material response modeling of heatshields for planetary entry vehicles has remained largely unchanged since Aerotherm Corp. introduced the CMA program in 1967. Modern models, like FIAT, have tread the same path, introducing efficiencies and better material property data along the way, but otherwise following the same underlying model paradigm. The CMA approach has worked well for heatshield design up to this point. However, there are three motivations for the material response community to pursue higher fidelity beyond simplified, CMA-derived models. The first motivation is that missions are becoming increasingly demanding and complex and, as they do, confidence in simplified models naturally decreases. Second, reliability of materials is now as much or more of a driving concern for mission designers than thermal response. Third, NASA and other agencies are increasingly interested in flight instrumentation for engineering science. This latter motivation places far stricter requirements on model accuracy in order to meet requirements for flight environment reconstruction.
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