Search NASA⌕ Search

SEARCH · Search NASA

Results for “Proton testing”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.

At least 145 records · Page 8
All sourcesNASA NTRSDOE OSTI
NASA NTRS1985

Photon radiation effects on CdS/CuInSe2 thin film solar cells

The unknown tolerance of CuInSe2 cells to proton irradiation, was tested. It was shown that CdS/CuInSe2 solar cells have an inherent tolerance to irradiation by 1 MeV electrons up to at least 2 x 10 to the 16th power electrons/sq cm. Eleven, unencapsulated, 1 sq cm cells deposited on alumina substrates were irradiated with 1 MeV protons at normal incidence. The cells were exposed to six fluences ranging from 2.5 x 10 to the 10th power protons/sq cm to 5.0 x 10 to the 13th power protons/sq cm. After each interval of exposure, the cells were removed from the radiation chamber to undergo current/voltage characterization. It is shown that none of the cells electrical characteristics exhibited any degradation up to and including a fluence of 1 x 10 to the 11th power protons/sq cm. At fluences greater than this, the damage to the CuInSe2 cells V sub oc and fill factor (FF) was more severe than that exhibited by the Isc. The CuInSe2 cells proved to be approximately a factor of 50 more resistant to 1 MeV proton irradiation than silicon or gallium arsenide cells. Annealing of a CuInSe2 cell at 225 deg C for 6 minutes restored it to within 95% of its initial efficiency.

Dursch, H.↗
NASA NTRS1999

Spaceflight Validation of Hzetrn Code

HZETRN is being developed as a fast deterministic radiation transport code applicable to neutrons, protons, and multiply charged ions in the space environment. It was recently applied to 50 hours of IMP8 data measured during the August 4, 1972 solar event to map the hourly exposures within the human body under several shield configurations. This calculation required only 18 hours on a VAX 4000 machine. A similar calculation using the Monte Carlo method would have required two years of dedicated computer time. The code has been benchmarked against well documented and tested Monte Carlo proton transport codes with good success. The code will allow important trade studies to be made with relative ease due to the computational speed and will be useful in assessing design alternatives in an integrated system software environment. Since there are no well tested Monte Carlo codes for HZE particles, we have been engaged in flight validation of the HZETRN results. To date we have made comparison with TEPC, CR-39, charge particle telescopes, and Bonner spheres. This broad range of detectors allows us to test a number of functions related to differing physical processes which add to the complicated radiation fields within a spacecraft or the human body, which functions can be calculated by the HZETRN code system. In the present report we will review these results.

Wilson, J. W.↗
NASA NTRS1991

Burst annealing of high temperature GaAs solar cells

One of the major limitations of solar cells in space power systems is their vulnerability to radiation damage. One solution to this problem is to periodically heat the cells to anneal the radiation damage. Annealing was demonstrated with silicon cells. The obstacle to annealing of GaAs cells was their susceptibility to thermal damage at the temperatures required to completely anneal the radiation damage. GaAs cells with high temperature contacts and encapsulation were developed. The cells tested are designed for concentrator use at 30 suns AMO. The circular active area is 2.5 mm in diameter for an area of 0.05 sq cm. Typical one sun AMO efficiency of these cells is over 18 percent. The cells were demonstrated to be resistant to damage after thermal excursions in excess of 600 C. This high temperature tolerance should allow these cells to survive the annealing of radiation damage. A limited set of experiments were devised to investigate the feasibility of annealing these high temperature cells. The effect of repeated cycles of electron and proton irradiation was tested. The damage mechanisms were analyzed. Limitations in annealing recovery suggested improvements in cell design for more complete recovery. These preliminary experiments also indicate the need for further study to isolate damage mechanisms. The primary objective of the experiments was to demonstrate and quantify the annealing behavior of high temperature GaAs cells. Secondary objectives were to measure the radiation degradation and to determine the effect of repeated irradiation and anneal cycles.

Brothers, P. R.↗
NASA NTRS1984

Solar cell degradation in proton radiation orbits

Significant discrepancies have been observed between predicted and actual in-orbit silicon solar array degradation in orbits other than LEO (low Earth orbits) and GEO (geosynchronous orbit). These discrepancies have been diagnosed to arise probably from a combination of a lack of appropriate solar cell test data and from inadequacies in the models that relate the unidirectional and mono-energetic proton test data to the omnidirectional flux-energy spectra actually found in orbit. Relative damage coefficients and solar cell power outputs were discussed, and also were presented in graph form. Silicon and gallium arsenide solar cells were considered.

Rauschenbach, H. S.↗
NASA NTRS1991

Space environmental effects on coated optics

Several multilayer coated mirror designs developed for potential space applications were tested on the Long Duration Exposure Facility (LDEF) along with single layer witness coatings deposited on fused silica and a coated CaF2 window. Performance requirements included high mirror reflectivity, low absorption, low scatter, environmental durability, and radiation hardness. The designs were selected in screening tests using combined electron, proton, and simulated solar UV radiation. The purpose of the space test was to validate the above test results and determine the effects of atomic oxygen and contamination on mirror performance.

Donovan, T. M.↗
NASA NTRS1986

Space environmental effects on adhesives for the Galileo spacecraft

Requirements for the adhesives used on the Galileo Jovian probe are discussed, and the results of mechanical and radiation experiments for their qualification are presented. The five types of adhesives used for the Wide Field Camera, SXA Antenna, temperature control louvers, and structural bonds all passed the proton and electron tests and the low temperature radiation tests. Possible bond improvements through techniques including gamma ray radiation exposure and ion implantation are also considered.

Bouquet, F. L.↗
NASA NTRS2018

Evaluation of Space Radiation Effects on HgCdTe Avalanche Photodiode Arrays for Lidar Applications

We report the results from proton and gamma ray radiation testing of HgCdTe avalanche photodiode (APD) arrays developed by Leonardo DRS for space lidar detectors. We tested these devices with both approximately 60 MeV protons and gamma rays, with and without the read out integrated circuit (ROIC). We also measured the transient responses with the device fully powered and with the APD gain from unity to greater than 1000. The detectors produced a large current impulse in response to each proton hit but the response completely recovered within 1 microsecond. The devices started to have persistent damage at a proton fluence of 7e10 protons/cm2, equivalent to 10 krad(Si) total ionization dose. The dark current became much higher after the device was warmed to room temperature and cooled to 80K again, but it completely annealed after baking at 85 C for several hours. These results showed the HgCdTe APD arrays are suitable for use in space lidar for typical Earth orbiting and planetary missions provided that provisions are made to heat the detector chip to 85 C for several hours after radiation damage becomes evident that system performance is impacted.

Sun, Xiaoli↗
NASA NTRS1989

Proton radiation damage in optical filter glass

Samples of Schott BG-39 and Hoya CM-500 blue-green filter glass were subjected to proton radiation to determine their acceptability for spaceflight. Initial testing done with 2.7 MeV protons showed negligible change in optical transmittance with doses as high as 5.2 x 10 to the 14th protons per sq cm. Irradiation with protons of energy up to 63 MeV caused a significant reduction in transmittance in the Schott samples at doses of 5.3 x 10 to the 12th protons per sq cm, while negligible change occurred in the Hoya samples.

Grillot, Patrick N.↗
NASA NTRS2005

Hybrid Power Management Program Evaluated Ultracapacitors for the Next Generation Launch Transportation Project

The NASA Glenn Research Center initiated baseline testing of ultracapacitors to obtain empirical data in determining the feasibility of using ultracapacitors for the Next Generation Launch Transportation (NGLT) Project. There are large transient loads associated with NGLT that require a very large primary energy source or an energy storage system. The primary power source used for this test was a proton-exchange-membrane (PEM) fuel cell. The energy storage system can consist of batteries, flywheels, or ultracapacitors. Ultracapacitors were used for these tests. NASA Glenn has a wealth of experience in ultracapacitor technology through the Hybrid Power Management (HPM) Program, which the Avionics, Power and Communications Branch of Glenn s Engineering Development Division initiated for the Technology Transfer and Partnership Office. HPM is the innovative integration of diverse, state-ofthe- art power devices in optimal configurations for space and terrestrial applications. The appropriate application and control of the various advanced power devices (such as ultracapacitors and fuel cells) significantly improves overall system performance and efficiency. HPM has extremely wide potential. Applications include power generation, transportation systems, biotechnology systems, and space power systems. HPM has the potential to significantly alleviate global energy concerns, improve the environment, and stimulate the economy.

Eichenberg, Dennis J.↗
NASA NTRS2017

Proton Irradiation of the 16GB Intel Optane SSD

The purpose of this test is to assess the single event effects (SEE) and radiation susceptibility of the Intel Optane Memory device (SSD) containing the 3D Xpoint phase change memory (PCM) technology. This test is supported by the NASA Electronics Parts and Packaging Program (NEPP).

Single-Event Effects (SEE)↗
NASA NTRS2011

Radiation Characterization of Commercial GaN Devices

Radiative feedback from primordial protostars and final mass of the first star Commercially available devices fabricated from GaN are beginning to appear from a number of different suppliers. Based on previous materials and prototype device studies, it is expected that these commercial devices will be quite tolerant to the types of radiation encountered in space. This expectation needs to be verified and the study described herein was undertaken for that purpose. All of the parts discussed in this report are readily available commercially. The parts chosen for study are all targeted for RF applications. Three different studies were performed: 1) a preliminary DDD/TID test of a variety of part types was performed by irradiating with 50 MeV protons, 2) a detailed DDD/TID study of one particular part type was performed by irradiating with 50 MeV protons, and 3) a SEB/SEGR test was performed on a variety of part types by irradiating with heavy ions. No significant degradation was observed in the tests performed in this study.

HEMT↗
NASA NTRS2000

CLUST - EVAP Monte Carlo Simulation Applications for Determining Effective Energy Deposition in Silicon by High Energy Protons

The CLUST-EVAP is a Monte Carlo simulation of the interaction of high energy (25 - 400 MeV) protons with silicon nuclei. The initial nuclear cascade stage is modeled using the CLUST model developed by Indiana University over 30 years ago. The second stage, in which the excited nucleus evaporates particles in random directions, is modeled according to the evaporation algorithm provided by H. H. K. Tang of IBM. Using the CLUST-EVAP code to model fragment produ6tion and the Vavilov-Landau theory to model fluctuations in direct ionization in thin silicon layers, we have predicted energy deposition in silicon components for various geometrical configurations. We have compared actual measurements with model predictions for geometry's such as single, thin silicon particle detectors, telescopic particle detectors flown in space to measure the environment, and thin sensitive volumes of modern micro-electronic components. We have recently compared the model predictions with actual measurements made by the DOSTEL spectrometer flown in the Shuttle payload bay on STS-84. The model faithfully reproduces the features and aids in interpretation of flight results of this instrument. We have also applied the CLUST-EVAP model to determine energy deposition in the thin sensitive volumes of modern micro-electronic components. We have accessed the ability of high energy (200 MeV) protons to induce latch-up in certain devices that are known to latch up in heavy ion environments. However, some devices are not nearly as susceptible to proton induced latch-up as expected according to their measured heavy ion latch-up cross sections. The discrepancy is believed to be caused by the limited range of the proton-silicon interaction fragments. The CLUST-EV AP model was used to determine a distribution of these fragments and their range and this is compared to knowledge of the ranges required based on the known device structure. This information is especially useful in accessing the risk to on-orbit perfonnance in a heavy ion environment based on testing performed with only protons.

ONeill, Pat M.↗
NASA NTRS1982

The damage equivalence of electrons, protons, and gamma rays in MOS devices

The results of laboratory tests to determine the radiation damage effects induced on MOS devices from Co-60, electron, and proton radiation are reported. The tests are performed to establish the relationship between the Co-60 gamma rays and the level of damage to the MOS devices in regards to different damages which can be expected with the electron and particle bombardments experienced in space applications. CMOS devices were exposed to the Co-60 gamma rays, 1 MeV electrons, and 1 MeV protons while operating at 3, 10, and 15 V. The test data indicated that the Co-60 source was reliable for an initial evaluation of the electron damages up to 2 MeV charge. A correction factor was devised for transferring the Co-60 measurements to proton damages, independent of bias and transistor types, for any orbit or environment.

Brucker, G. J.↗
NASA NTRS2018

NASA Electronic Parts and Packaging (NEPP) Field Programmable Gate Array (FPGA) Single Event Effects (SEE) Test Guideline Update

The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic versus mission specific device evaluation, single event latch-up (SEL) test and analysis, SEE response visibility enhancement during radiation testing, mitigation evaluation (embedded and user-implemented), unreliable design and its affects to SEE Data, testing flushable architectures versus non-flushable architectures, intellectual property core (IP Core) test and evaluation (addresses embedded and user-inserted), heavy-ion energy and linear energy transfer (LET) selection, proton versus heavy-ion testing, fault injection, mean fluence to failure analysis, and mission specific system-level single event upset (SEU) response prediction. Most sections within the guidelines manual provide information regarding best practices for test structure and test system development. The scope of this manual addresses academic versus mission specific device evaluation and visibility enhancement in IP Core testing.

Test guidelines↗
NASA NTRS2018

NASA Electronic Parts and Packaging Field Programmable Gate Array Single Event Effects Test Guideline Update

The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic versus mission specific device evaluation, single event latch-up (SEL) test and analysis, SEE response visibility enhancement during radiation testing, mitigation evaluation (embedded and user-implemented), unreliable design and its affects to SEE Data, testing flushable architectures versus non-flushable architectures, intellectual property core (IP Core) test and evaluation (addresses embedded and user-inserted), heavy-ion energy and linear energy transfer (LET) selection, proton versus heavy-ion testing, fault injection, mean fluence to failure analysis, and mission specific system-level single event upset (SEU) response prediction. Most sections within the guidelines manual provide information regarding best practices for test structure and test system development. The scope of this manual addresses academic versus mission specific device evaluation and visibility enhancement in IP Core testing.

Field Programmable Gate Array (FPGA)↗