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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 145 records · Page 8
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NASA NTRS2026

Thermal Inspection for the Assessment of Adhesively Bonded Metal Adherents

Certification of adhesively bonded structures is currently a challenge for aircraft manufacturers. The ability to certify bonds in primary structure can reduce dependence on fasteners and this will enable more efficient manufacturing. For example, drilling holes and installing fasteners in bonded joints can be a potentially significant bottleneck in airframe manufacturing. In addition, fasteners increase the airframe weight and can add stress concentration areas. Reducing fastener count can accelerate manufacturing and improve aircraft performance. NASA is currently investigating nondestructive evaluation (NDE) techniques to assess bond integrity. For example, bond thickness influences bond strength and therefore NDE techniques are being investigated to determine bond thickness. For bonded metal structures, there is a large difference in the thermal diffusivity between the 7075 aluminum alloy metal adherends and aircraft grade adhesive. Multi-layered thermal models show a large variation in the thermal response for bondline adhesive thicknesses that vary from 100 to 300 microns for adherend thicknesses of 0.163 cm. Experimental through-transmission thermal measurements reveal promise to quantitatively characterize the bondline thickness. Results were validated with X-ray computed tomography and optical microscopy measurements, and influence of porosity on the thermal model and measurements are investigated.

bondline thickness↗
NASA NTRS1983

Friction and wear of some ferrous-base metallic glasses

Sliding friction experiments, X-ray photoelectron spectroscopy (XPS) analysis, and electron microscopy and diffraction studies were conducted with ferrous base metallic glasses (amorphous alloys) in contact with aluminum oxide at temperatures to 750 C in a vacuum. Sliding friction experiments were also conducted in argon and air atmospheres. The results of the investigation indicate that the coefficient of friction increases with increasing temperature to 350 C in vacuum. The increase in friction is due to an increase in adhesion resulting from surface segregation of boric oxide and/or silicon oxide to the surface of the foil. Above 500 C the coefficient of friction decreased rapidly. The decrease correlates with the segregation of boron nitride to the surface. Contaminants can come from the bulk of the material to the surface upon heating and impart boric oxide and/or silicon oxide at 350 C and boron nitride above 500 C. The segregation of contaminants is responsible for the friction behavior. The amorphous alloys have superior wear resistance to crystalline 304 stainless steel. The relative concentrations of the various constituents at the surfaces of the amorphous alloys are very different from the nominal bulk compositions.

Miyoshi, K.↗
NASA NTRS1984

Friction and wear of some ferrous-base metallic glasses

Sliding friction experiments, X-ray photoelectron spectroscopy (XPS) analysis, and electron microscopy and diffraction studies were conducted with ferrous base metallic glasses (amorphous alloys) in contact with aluminium oxide at temperatures to 750 C in a vacuum. Sliding friction experiments were also conducted in argon and air atmospheres. The results of the investigation indicate that the coefficient of friction increases with increasing temperature to 350 C in vacuum. The increase in friction is due to an increase in adhesion resulting from surface segregation of boric oxide and/or silicon oxide to the surface of the foil. Above 500 C the coefficient of friction decreased rapidly. The decrease correlates with the segregation of boron nitride to the surface. Contaminants can come from the bulk of the material to the surface upon heating and impart boric oxide and/or silicon oxide at 350 C and boron nitride above 500 C. The segregation of contaminants is responsible for the friction behavior. The amorphous alloys have superior wear resistance to crystalline 304 stainless steel. The relative concentrations of the various constituents at the surfaces of the amorphous alloys are very different from the nominal bulk compositions.

Miyoshi, K.↗
NASA NTRS1981

Surface chemistry and friction behavior of the silicon carbide (0001) surface at temperatures to 1500 deg C

X-ray photoelectron and Auger electron spectroscopy analyses and friction studies were conducted with a silicon carbide (0001) surface in contact with iron at various temperatures to 1200 or 1500 C in a vacuum of 10 to the minus 8th power Pa. The results indicate that there is a significant temperature influence on both the surface chemistry and friction properties of silicon carbide. The principal contaminant of adsorbed amorphous carbon on the silicon carbide surface in the as received state is removed by simply heating to 400 C. Above 400 C, graphite and carbide type carbine are the primary species on the silicon carbide surface, in addition to silicon. The coefficients of friction of polycrystalline iron sliding against a single crystal silicon carbide (0001) surface were high at temperatures to 800 C. Similar coefficients of friction were obtained at room temperature after the silicon carbide was preheated at various temperatures up 800 C. When the friction experiments were conducted above 800 C or when the specimens were preheated to above 800 C, the coefficients of friction were dramatically lower. At 800 C the silicon and carbide type carbon are at a maximum intensity in the XPS spectra. With increasing temperature above 800 C, the concentration of the graphite increases rapidly on the surface, whereas those of the carbide type carbon and silicon decrease rapidly.

Miyoshi, K.↗
NASA NTRS1964

On the x-ray emission in the aurora zones

The X-radiation, occurring in the aurora zone, was first revealed in the summer of 1952 [1,2] rockets above 50 km. This radiation is mainly concentrated between the 62 and 77° geomagnetic latitude, with a maximum near 67.5°. It is generated at fast electron collisions with upper atmosphere particles.

PLANET↗
NASA NTRS1973

Hard cosmic X-ray sources.

A review of the observational status of X-ray sources detected in the 20 to 500 keV range is presented. Of the approximately 115 sources listed in the March 1972 edition of the UHURU 2-6 keV sky survey catalog, about 15 sources have been studied in hard X rays. Most of the data have been obtained from balloons, although the OSO-3, and more recently the OSO-7, have contributed. With the exception of CEN A, the SMC, and possibly M-87, all the sources detected at higher energies are galactic and heavily concentrated in the galactic plane. The Crab Nebula has been measured to about 500 keV in continuous emission and a component at the 33-msec pulsar period comprising about 20% of the total emission has been detected to 10 MeV. Objects such as SCO-1 and CYG-2 are characterized by an exponential spectrum, which varies over a 10-min time scale about a factor of two, and a flatter spectrum extending to above 40 keV which exhibits independent variability.

Peterson, L. E.↗
NASA NTRS1975

Recent perspectives in solar physics - Elemental composition, coronal structure and magnetic fields, solar activity

Elemental abundances in the solar corona are studied. Abundances in the corona, solar wind and solar cosmic rays are compared to those in the photosphere. The variation in silicon and iron abundance in the solar wind as compared to helium is studied. The coronal small and large scale structure is investigated, emphasizing magnetic field activity and examining cosmic ray generation mechanisms. The corona is observed in the X-ray and EUV regions. The nature of coronal transients is discussed with emphasis on solar-wind modulation of galactic cosmic rays. A schematic plan view of the interplanetary magnetic field during sunspot minimum is given showing the presence of magnetic bubbles and their concentration in the region around 4-5 AU by a fast solar wind stream.

Newkirk, G., Jr.↗
NASA NTRS1978

Alinement tool for X-ray image intensifiers

Gage consists of upper plate and lower plate connected by aluminum post marked with metric scale. Upper plate is identical to calibration plate except for post flange. Lower plate is made of aluminum and is grooved for x-y coordinates and pattern of concentric rings that aid in recognition and measurement of nonlinearity. X-y coordinates on upper and lower plates match exactly. Gage indicates amount and direction of skew in images.

Rasmussen, D.↗
NASA NTRS1977

Orbital chemistry - Lunar surface analysis from the X-ray and gamma ray remote sensing experiments

The X-ray and gamma-ray lunar surface remote sensing experiments conducted by the Apollo 15 and 16 are discussed. The data indicate mare basins that are extensively basaltic and highlands of aluminum-rich anorthositic-type feldspar. An east-west asymmetry involving higher Al/Si ratios toward the east is noted; high concentrations of a KREEP-type component along the Imbrium-Procellarum edges and throughout the basin are also observed. Lunar K/Th ratios, lowest in areas of the Imbrium and higher in the surrounding mare and highlands, may lend support to the picture of the moon as a high-temperature condensate.

Adler, I.↗
NASA NTRS1977

Imaging of lunar surface chemistry from orbital X-ray data

Color images of the lunar surface from 20 deg W to 120 deg E were prepared which map the variations in the distribution of Al, Mg, and Si as expressed by the ratios of the Al/Si and the Mg/Al fluorescent X-ray intensities. Through the use of image enhancement techniques developed for the La Jolla Consortium on remote sensing of the moon, detailed information previously unobserved has been made available. The frequency distribution of the Apollo 15 and 16 intensity ratios for individual 0.25 x 0.25 deg surface units is clearly bimodal, peaking at 0.81 for mare material and 1.12 for nearside highland material, which values correspond to concentration ratios of 0.39 and 0.54, respectively, for Al/Si.

Bielefeld, M. J.↗
NASA NTRS1980

Observation of the core of the Perseus cluster with the Einstein solid state spectrometer: Cooling gas and elemental abundances

Solid State Spectrometer observations of the core of the Perseus cluster have resulted in the detection of X-ray emission lines due to Si, S, and Fe. Analysis of the spectrum indicates that the X-ray emission has at least two characteristic temperatures. This is interpreted in the framework of radiative accretion in the core of the cluster. The derived parameters are a cooling time tc less than 2 x 109 yrs for the low temperature gas, a mass accretion rate of approximately 300 Mo/yr and a characteristic size of 10 to 20 Kpc for the cool gas. The Fe abundance in the core, approximately 0.4, is similar to the Fe abundance averaged over the whole cluster indicating that Fe emission is not strongly concentrated about NGC 1275. The Si and S abundances are consistent with solar values.

Mushotzky, R. F.↗
NASA NTRS1981

Observation of the core of the Perseus cluster with the Einstein solid state spectrometer - Cooling gas and elemental abundances

Solid State Spectrometer observations of the core of the Perseus cluster have resulted in the detection of X-ray emission lines due to Si, S, and Fe. Analysis of the spectrum indicates that the X-ray emission has at least two characteristic temperatures. This is interpreted in the framework of radiative accretion in the core of the cluster. The derived parameters are a cooling time less than or approximately equal to 2 x 10 to the ninth years for the low-temperature gas, a mass accretion rate of approximately 300 solar masses per year, and a characteristic size of 10-20 kpc for the cool gas. The Fe abundance in the core (approximately 0.4) is similar to the Fe abundance averaged over the whole cluster, indicating that Fe emission is not strongly concentrated about NGC 1275. The Si and S abundances are consistent with solar values.

Mushotzky, R. F.↗
NASA NTRS1981

Discovery of X-ray emission lines from the RS CVn binary sigma CrB

X-ray observations of the RS CVn binary sigma CrB were carried out with a solid state spectrometer on board the Einstein Observatory in 1979. X-ray emission lines due to Mg XI, Si XIII, S XV and a blend of L-transition lines due to Fe XVII and Fe XVIII were detected in the sigma CrB spectrum. The observed X-ray spectrum is described by a two-temperature coronal X-ray emission model: the dominant low temperature component originates in a plasma at a temperature of 5.9 + or 0.5 x 10 to the 6th K; the weaker higher temperature arises from a plasma of not less than 35 x 10 to the 6th K. Intensity variations over a period of a few hours are also recorded and thought to be due to a variation in the number of loops concentrated around active regions on the star surface. Implications of the results are discussed in terms of the constant-pressure coronal loop model (Rosner, Tucker, Vaiana, 1978).

Agrawal, P. C.↗
NASA NTRS1983

HEAO A-2 soft X-ray source catalog

The HEAO A-2 low energy X-ray detectors have surveyed over 95% of the sky in the spectral bands 0.18-0.44 and 0.44-2.8 keV, down to a typical limiting sensitivity of 1 x 10 to the -11th and 3 x 10 to the -11th ergs per sq cm per sec in each band, respectively. Using a significance criterion of 6 sigma for existence, 114 sources are cataloged, of which 54 were previously undiscovered and 32 remain unidentified. The catalog contains a listing of all counterpart identifications and a cross-reference to all HEAO 1 A-2 low energy detector team publications on the catalog sources complete through the end of 1981. Supplementary material allows the estimation of spectral parameters for the spectral models from the observed intensities. Simple graphs allow the extraction of energy fluxes at the earth, both with and without the effects of interstellar absorption. The angular distribution of the cataloged sources in the 0.44-2.8 keV band is concentrated toward the galactic plane and resembles that seen at higher energy. The distribution in the 0.18-0.44 keV band is more uniform and contains many more newly discovered and unidentified sources.

Nugent, J. J.↗
NASA NTRS1983

The centre of the Galaxy

X-ray, gamma-ray and IR observations of the Galaxy's nucleus show that it contains the densest concentration of stars in the Galaxy, as well as a quantity of ionized gas and warm dust, which is clumped into a small number of rapidly expanding individual clouds whose velocities approach + or - 300 km/sec. The detection of electron-positron anihilation radiation, and a peculiar radio point source very close to the galactic center, add to the belief that the nucleus may contain some unusual object, such as a black hole, which is responsible for the cloud velocities and dust-heating radiation observed. Attention is given to IR intensity contours of the region, as well as a review of the observational evidence for the presence of a black hole. It is noted that a massive black hole fails to account for the unusual ionizing radiation field detected.

Townes, C. H.↗
NASA NTRS1983

The mass of Tycho's supernova remnant as determined from a high-resolution X-ray map

High resolution Einstein Observatory X ray images of Tycho's supernova remnant (SNR) are discussed. The object has features of a shock heated shell in the interstellar medium, accompanied by an inner shell with clumped ejecta. The measurements were made for 22 hr on Feb. 8, 1979, revealing a circular SNR, a thin emission shelf at the outer edge of the remnant, no emission in the central object, and most emissions concentrated in small, clumpy objects within a spherical shell. Three components of the X ray emission were identified, and calculations of the swept-up mass, the diffuse component of the ejecta shell, and the clumpy ejecta are reported to be 2.2, 1.2, and 0.7 solar mass, respectively. The SNR is concluded to be at an evolutionary stage between uniform expansion and adiabatic changes.

Seward, F.↗
NASA NTRS1984

X-ray photoelectron spectroscopy study of the chemical structure of thermally nitrided SiO2

X-ray photoelectron spectroscopy has been used to study the composition of 100-A thermally grown SiO2 films that have been thermally nitrided in ammonia. The SiO(x)N(y)/Si interface was studied both by chemical depth profiling of the oxynitride and by removal of the Si substrate with XeF2. It is found that N is distributed throughout the film, but with the concentration higher at the surface and in a region centered 25 A from the film/substrate interface. The interface region itself is found to be oxygen-rich relative to the rest of the film. Possible models which can explain these results are discussed.

Vasquez, R. P.↗
NASA NTRS1985

Investigation of superlattice device structures

This report describes the investigation of growth properties, and the structure of epitaxial multilayer Si(Si(1x)Ge(x)) films grown on bulk Silicon Substrates. It also describes the fabrication and characterization of MOSFET and MESFET devices made on these epitaxial films. Films were grown in a CVD reactor using hydrides of Si and Ge with H2 and He as carrier gases. Growth temperatures were between 900 C and 1050 C with most films grown at 1000 C. Layer thickness was between 300A and 2000A and total film thickness was between 0.25 micro m and 7 micro m. The Ge content (X) in the alloy layers was between .05 and 0.2. N-type multilayer films grown on (100) p-type Si showed Hall mobility in the range 1000 to 1500 sq cm/v for an average carrier concentration of approx. 10 to the 16th power/cu cm. This is up to 50% higher than the Hall mobility observed in epitaxial Si films grown under the same conditions and with the same average carrier concentration. The mobility enhancement occurred in films with average carrier concentration (n) from 0.7 x 10 to the 16th power to 2 x 10 to the 17th power/cu cm, and total film thickness greater than 1.0 micro m. No mobility enhancement was seen in n-type multilayer films grown on (111) Si or in p-type multilayer films. The structure of the films was investigated was using SEM, TEM, AES, SIMS, and X-ray double crystal diffraction techniques. The film composition profile (AES, SIMS) showed that the transition region between layers is of the order of about 100A. The TEM examination revealed a well defined layered structure with fairly sharp interfaces and good crystalline quality. It also showed that the first few layers of the film (closest to the substrate) are uneven, most probably due to the initial growth pattern of the epitaxial film where growth occurs first in isolated islands that eventually growth and coalesce. The X-ray diffraction measurement determined the elastic strain and strain relief in the alloy layers of the film and the elastic strain in the intervening Si layers.

Gergis, I. S.↗