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At least 145 records · Page 8

Fabrication of Compact Superconducting Lowpass Filters for Ultrasensitive Detectors

It is extremely important for current and future far-infrared and sub-millimeter ultrasensitive detectors, which include transition edge sensors (TES) and microwave kinetic inductance detectors, to be adequately filtered from stray electromagnetic radiation in order to achieve their optimal performance. One means of filtering stray radiation is to block leakage associated with electrical connections in the detector environment. Here we discuss a fabrication methodology for realizing non-dissipative planar filters imbedded in the wall of the detector enclosure to limit wave propagation modes up to far-infrared frequencies. Our methodology consists of fabricating a boxed stripline transmission line, in which a superconducting (Nb, Mo, or Al) transmission line is encased in a silicon dioxide dielectric insulator coated with a metallic shell. We report on achieved attenuation and return loss and find that it replicates the simulated data to a high degree.

Brown, Ari↗

Micro-Spec: A High Performance Compact Spectrometer for Submillimeter Astronomy

We describe the micro-Spec, an extremely compact high performance spectrometer for the submillimeter and millimeter spectral ranges. We have designed a fully integrated submillimeter spectrometer based on superconducting microstrip technology and fabricated its critical elements. Using low loss transmission lines, we can produce a fully integrated high resolution submillimeter spectrometer on a single four inch Si wafer. A resolution of 500 can readily be achieved with standard fabrication tolerance, higher with phase trimming. All functions of the spectrometer are integrated - light is coupled to the micro strip circuit with a planar antenna, the spectra discrimination is achieved using a synthetic grating, orders are separated using a built-in planar filter, and the light is detected using photon counting Microwave Kinetic Inductance Detectors (MKID). We will discus the design principle of the instrument, describe its technical advantages, and report the progress on the development of the instrument.

Hsieh, Wen-Ting↗

NASA Tech Briefs, December 2013

Topics include: Microwave Kinetic Inductance Detector With; Selective Polarization Coupling; Flexible Microstrip Circuits for; Superconducting Electronics; CFD Extraction Tool for TecPlot From DPLR Solutions; RECOVIR Software for Identifying Viruses; Enhanced Contact Graph Routing (ECGR) MACHETE Simulation Model; Orbital Debris Engineering Model (ORDEM) v.3; Scatter-Reducing Sounding Filtration Using a Genetic Algorithm and Mean Monthly Standard Deviation; Thermo-Mechanical Methodology for Stabilizing Shape Memory Alloy Response; Hermetic Seal Designs for Sample Return Sample Tubes; Silicon Alignment Pins: An Easy Way To Realize a Wafer-to-Wafer Alignment; Positive-Buoyancy Rover for Under Ice Mobility; Electric Machine With Boosted Inductance to Stabilize Current Control; International Space Station-Based Electromagnetic Launcher for Space Science Payloads; Advanced Hybrid Spacesuit Concept Featuring Integrated Open Loop and Closed Loop Ventilation Systems; Data Quality Screening Service.

Source record↗

Fabrication of an Absorber-Coupled MKID Detector and Readout for Sub-Millimeter and Far-Infrared Astronomy

We have fabricated absorber-coupled microwave kinetic inductance detector (MKID) arrays for sub-millimeter and farinfrared astronomy. Each detector array is comprised of lambda/2 stepped impedance resonators, a 1.5μm thick silicon membrane, and 380μm thick silicon walls. The resonators consist of parallel plate aluminum transmission lines coupled to low impedance Nb microstrip traces of variable length, which set the resonant frequency of each resonator. This allows for multiplexed microwave readout and, consequently, good spatial discrimination between pixels in the array. The Al transmission lines simultaneously act to absorb optical power and are designed to have a surface impedance and filling fraction so as to match the impedance of free space. Our novel fabrication techniques demonstrate high fabrication yield of MKID arrays on large single crystal membranes and sub-micron front-to-back alignment of the microstrip circuit.

far-infrared↗

Micro-spec: an Integrated Direct-detection Spectrometer for Far-infrared Space Telescopes

The far-infrared and submillimeter portions of the electromagnetic spectrum provide a unique view of the astrophysical processes present in the early universe. Our ability to fully explore this rich spectral region has been limited, however, by the size and cost of the cryogenic spectrometers required to carry out such measurements.Micro-Spec (μ-Spec) is a high-sensitivity, direct-detection spectrometer concept working in the 450-1000 (micrometers) wavelength range which will enable a wide range of flight missions that would otherwise be challenging due tothe large size of current instruments with the required spectral resolution and sensitivity. The spectrometer design utilizes two internal antenna arrays, one for transmitting and one for receiving, superconducting microstrip transmission lines for power division and phase delay, and an array of microwave kinetic inductance detectors (MKIDs) to achieve these goals. The instrument will be integrated on a approximately 10 sq cm silicon chip and can therefore become an important capability under the low background conditions accessible via space and high-altitude borne platforms. In this paper, an optical design methodology for micro-Spec is presented, with particular attention given to its two-dimensional diffractive region, where the light of different wavelengths is focused on the different detectors. The method is based on the maximization of the instrument resolving power and minimization of the RMS phase error on the instrument focal plane. This two-step optimization can generate geometrical configurations given specific requirements on spectrometer size, operating spectral range and performance.Two point designs with resolving power of 260 and 520 and an RMS phase error less than approximately 0.004 radians were developed for initial demonstration and will be the basis of future instruments with resolving power up to about 1200.

Far-infrared↗

Overview of the Design, Fabrication and Performance Requirements of Micro-Spec, an Integrated Submillimeter Spectrometer

Micro-Spec is a compact submillimeter (350-700 GHz) spectrometer which uses low loss superconducting niobium microstrip transmission lines and a single-crystal silicon dielectric to integrate all of the components of a grating-analog spectrometer onto a single chip. Here we present details of the fabrication and design of a prototype Micro-Spec spectrometer with resolution, R64, where we use a high-yield single-flip wafer bonding process to realize instrument components on a 0.45 m single-crystal silicon dielectric. We discuss some of the electromagnetic design concerns (such as loss, stray-light, cross-talk, and fabrication tolerances) for each of the spectrometer components and their integration into the instrument as a whole. These components include a slot antenna with a silicon lens for optical coupling, a phase delay transmission line network, parallel plate waveguide interference region, and aluminum microstrip transmission line kinetic inductance detectors with extremely low cross-talk and immunity to stray light. We have demonstrated this prototype spectrometer with design resolution of R64. Given the optical performance of this prototype, we will also discuss the extension of this design to higher resolutions suitable for balloon-flight.

spectrometer↗

Heat Capacity and Thermal Conductance Measurements of a Superconducting-Normal Mixed State by Detection of Single 3 eV Photons in a Magnetic Penetration Thermometer

We report on measurements of the detected signal pulses in a molybdenum-gold Magnetic Penetration Thermometer (MPT) in response to absorption of one or more 3 eV photons. We designed and used this MPT sensor for x-ray microcalorimetry. In this device, the diamagnetic response of a superconducting MoAu bilayer is used to sense temperature changes in response to absorbed photons, and responsivity is enhanced by a Meissner transition in which the magnetic flux penetrating the sensor changes rapidly to minimize free energy in a mixed superconducting normal state. We have previously reported on use of our MPT to study a thermal phonon energy loss to the substrate when absorbing x-rays. We now describe results of extracting heat capacity C and thermal conductance G values from pulse height and decay time of MPT pulses generated by 3 eV photons. The variation in C and G at temperatures near the Meissner transition temperature (set by an internal magnetic bias field) allow us to probe the behavior in superconducting normal mixed state of the condensation energy and the electron cooling power resulting from quasi-particle recombination and phonon emission. The information gained on electron cooling power is also relevant to the operation of other superconducting detectors, such as Microwave Kinetic Inductance Detectors.

superconductivity↗

Optical Probe of the Superconducting Normal Mixed State in a Magnetic Penetration Thermometer

Using ultraviolet photon pulses, we have probed the internal behavior of a molybdenum-gold Magnetic Penetration Thermometer (MPT) that we designed for x-ray microcalorimetry. In this low-temperature detector, the diamagnetic response of a superconducting MoAu bilayer is used to sense temperature changes in response to absorbed photons. We have previously described an approximate model that explains the high responsivity of the detector to temperature changes as a consequence of a Meissner transition of the molybdenum-gold film in the magnetic field applied by the superconducting circuit used to bias the detector. We compare measurements of MPT heat capacity and thermal conductance, derived from UV photon pulse data, to our model predictions for the thermodynamic properties of the sensor and for the electron cooling obtained by quasiparticle recombination. Our data on electron cooling power is also relevant to the operation of other superconducting detectors, such as Microwave Kinetic Inductance Detectors.

superconductivity↗

The Impact of Standard Semiconductor Fabrication Processes on Polycrystalline Nb Thin Film Surfaces

Polycrystalline superconducting Nb thin films are extensively used for submillimeter and millimeter transmission line applications and, less commonly, used in microwave kinetic inductance detector (MKID) applications. The microwave and mm-wave loss in these films is impacted, in part, by the presence of surface nitrides and oxides. In this study, glancing incidence x-ray diffraction was used to identify the presence of niobium nitride and niobium monoxide surface layers on Nb thin films which had been exposed to chemicals used in standard photolithographic processing. A method of mitigating the presence of ordered niobium monoxide surface layers is presented. Furthermore, we discuss the possibility of using glancing incidence x-ray diffraction as a non-destructive diagnostic tool for evaluating the quality of Nb thin films used in MKIDs and transmission lines. For a given fabrication process, we have both the x-ray diffraction data of the surface chemistry and a measure of the mm-wave and microwave loss, the latter being made in superconducting resonators.

superconducting films↗

The Impact of Standard Semiconductor Fabrication Processes on Polycrystalline Nb Thin Film Surfaces

Polycrystalline Nb thin films are extensively used for microwave kinetic inductance detectors (MKIDs) and superconducting transmission line applications. The microwave and mm-wave loss in these films is impacted, in part, by the presence of surface nitrides and oxides. In this study, glancing incidence x-ray diffraction was used to identify the presence of niobium nitride and niobium monoxide surface layers on Nb thin films which had been exposed to chemicals used in standard photolithographic processing. A method of mitigating the presence of ordered niobium monoxide surface layers is presented. Furthermore, we discuss the possibility of using glancing incidence x-ray diffraction as a non-destructive diagnostic tool for evaluating the quality of Nb thin films used in MKIDs and transmission lines. For a given fabrication process, we have both the X-ray diffraction data of the surface chemistry and a measure of the mm-wave and microwave loss, the latter being made in superconducting resonators.

superconducting films↗

The Impact of Standard Semiconductor Fabrication Processes on Polycrystalline Nb Thin Film Surfaces

Polycrystalline Nb thin films are extensively used for microwave kinetic inductance detectors (MKIDs) and superconducting transmission line applications. The microwave and mm-wave loss in these films is impacted, in part, by the presence of surface nitrides and oxides. In this study, glancing incidence x-ray diffraction was used to identify the presence of niobium nitride and niobium monoxide surface layers on Nb thin films which had been exposed to chemicals used in standard photolithographic processing. A method of mitigating the presence of ordered niobium monoxide surface layers is presented. Furthermore, we discuss the possibility of using glancing incidence x-ray diffraction as a non-destructive diagnostic tool for evaluating the quality of Nb thin films used in MKIDs and transmission lines. For a given fabrication process, we have both the X-ray diffraction data of the surface chemistry and a measure of the mm-wave and microwave loss, the latter being made in superconducting resonators.

superconducting films↗

Superconducting Sensors for Microwave and Optical Photon-Starved Communications (Plenary)

NASA mission modeling indicates a desire for approximately a tenfold data improvement per decade from the Deep Space Network through the year 2040. Some of this improvement will come from aperture enhancement and antenna arraying, increased use of Ka-band over X-band, and high performance optical terminals (e.g. 12 m ground telescope). The remainder will depend on "disruptive" technologies. Deep-space communications differs from near earth communications. One way light travel times are measured in minutes rather than seconds and distances involved are large enough such that optical signals are photon limited and microwave signals have extremely low flux density. High frequency SQIF receivers and single photon detectors for optical communications will be described. Specifically, progress towards a "noiseless" receiver based on arrays of incommensurate area SQUIDs, and single photon counting detectors based on superconducting nanowires and kinetic inductance effects, will be discussed. Finally, the design of an optimal array of optical telescopes to emulate performance of a monolithic 12 m telescope will be outlined. In this case, optimal means minimizing the initial capital investment and operational cost while maintaining performance requirements of the deep-space link.

Romanofsky, Bob↗

Second-Generation Micro-Spec: A Compact Spectrometer for Far-Infrared and Submillimeter Space Missions

Micro-Spec is a direct-detection spectrometer which integrates all the components of a diffraction-grating spectrometer onto a ≈ 10-sq.cm chip through the use of superconducting microstrip transmission lines on a single- crystal silicon substrate. The second generation of Micro-Spec is being designed to operate with a spectral re- solution of at least 512 in the far-infrared and submillimeter (420–540 GHz, 714–555 μm) wavelength range, a band of interest for NASA's experiment for cryogenic large-aperture intensity mapping called EXCLAIM. EXCLAIM will be a balloon-borne telescope that is being designed to map the emission of redshifted carbon monoxide and singly-ionized carbon lines over a redshift range 0 < z < 3.5 and it will be the first demonstration of the Micro-Spec technology in a space-like environment. This work reviews the status of the Micro-Spec design for the EXCLAIM telescope, with emphasis on the spectrometer's two-dimensional diffractive region, through which light of different wavelengths is focused on kinetic inductance detectors along the instrument focal plane. An optimization process is used to generate a geometrical configuration of the diffractive region that satisfies l range and performance. An initial optical design optimized for n terms of geometric layout, spectral purity and efficiency.

Cataldo, Giuseppe↗

The Experiment for Cryogenic Large-Aperture Intensity Mapping (EXCLAIM)

The EXperiment for Cryogenic Large-Aperture Intensity Mapping (EXCLAIM) is a cryogenic balloon-borne instrument which will survey galaxy and star formation history over cosmological time scales. Rather than identifying individual objects, EXCLAIM will be a pathfinder to demonstrate an intensity mapping approach, which measures the cumulative redshifted line emission. EXCLAIM will operate at 420-540 GHz with a spectral resolution R=512 to measure the integrated CO and [CII] in redshift windows spanning \exclaimz. CO and [CII] line emissions are key tracers of the gas phases in the interstellar medium involved in star-formation processes. EXCLAIM will shed light on questions such as why the star formation rate declines at z < 2, despite continued clustering of the dark matter. The instrument will employ an array of six superconducting integrated grating-analog spectrometers (µ-Spec) coupled to microwave kinetic inductance detectors (MKIDs). Here we present an overview of the EXCLAIM instrument design and status.

Instrumentation and Photography↗

u-Spec Spectrometers for the EXCLAIM Instrument

The EXperiment for Cryogenic Large-aperture Intensity Mapping (EXCLAIM) is a cryogenic balloon-borne instrument that will map carbon monoxide and singly-ionized carbon emission lines across redshifts from 0to 3.5, using an intensity mapping approach. EXCLAIM will broaden our understanding of these elemental and molecular gases, and the role they play in star formation processes across cosmic time scales. The focal plane of EXCLAIM’s cryogenic telescope features sixμ-Spec spectrometers.μ-Spec is a compact, integrated grating-analog spectrometer, which uses meandered superconducting niobium microstrip transmission lines on a single-crystal silicon dielectric to synthesize the grating. It features superconducting aluminum microwave kinetic inductance detectors (MKIDs), also in a microstrip architecture. The spectrometers for EXCLAIM couple to the telescope optics via a hybrid planar antenna coupled to a silicon lenslet. The spectrometers operate from420−540 GHz with a resolving power R=λ/∆λ= 512, and employ an array of 355 MKIDs on each spectrometer. The spectrometer design targets a noise equivalent power (NEP) of 2×10−18W/√Hz (defined at the input to the main lobe of the spectrometer lenslet beam, within a 9◦half width), enabled by the cryogenic telescope environment, the sensitive MKID detectors, and the low dielectric loss of single-crystal silicon. We report on these spectrometers under development for EXCLAIM, providing an overview of the spectrometer and component designs, the spectrometer fabrication process, fabrication developments since previous prototype demonstrations, and the current status of their development for the EXCLAIM mission.

EXCLAIM Instrument↗

Optical Design of the EXperiment for Cryogenic Large-Aperture Intensity Mapping (EXCLAIM)

This work describes the optical design of the EXperiment for Cryogenic Large-Aperture Intensity Mapping(EXCLAIM). EXCLAIM is a balloon-borne telescope that will measure integrated line emission from carbonmonoxide (CO) at redshiftsz <1 and ionized carbon ([CII]) at redshiftsz= 2.5−3.5 to probe star forma-tion over cosmic time in cross-correlation with galaxy redshift surveys. The EXCLAIM instrument will observeat frequencies of 420–540 GHz using six microfabricated silicon integrated spectrometers with spectral resolv-ing powerR= 512 coupled to kinetic inductance detectors (KIDs). A completely cryogenic telescope cooledto a temperature below 5 K provides low-background observations between narrow atmospheric lines in thestratosphere. Off-axis reflective optics use a 90-cm primary mirror to provide 4.2′full-width at half-maximum(FWHM) resolution at the center of the EXCLAIM band over a field of view of 22.5′. Illumination of the 1.7 Kcold stop combined with blackened baffling at multiple places in the optical system ensures low (<−40 dB) edgeillumination of the primary to minimize spill onto warmer elements at the top of the dewar.

Thomas Essinger-Hileman↗

Far-infrared Imager and Polarimeter for the Origins Space Telescope

The far-infrared imager and polarimeter (FIP) for the Origins Space Telescope (Origins) is a basic far-infrared imager and polarimeter. The camera will deliver continuum images and polarization measurements at 50 and 250μm. Currently available detector technologies provide sufficient sensitivity for background limited observations from space, at least on a single pixel basis. FIP incorporates large next-generation superconducting detector arrays and our technology development plan will push the pixel numbers for the arrays to the required size of 8000. Two superconducting detector technologies are currently candidates for the instrument: transition edge sensors or microwave kinetic inductance devices. Using these detectors and taking advantage of the cryogenic telescope that is provided by Origins, FIP will achieve mapping speeds of up to eight orders of magnitude faster than what has been achieved by existing observatories. The science drivers for FIP include observations of solar system objects, dust properties, and magnetic field studies of the nearby interstellar medium, and large scale galaxy surveys to better constrain the star formation history of the universe to address one of the main themes of Origins: “How does the Universe work?” In addition to the science, the FIP instrument plays a critical functional role in aligning the mirrors during on orbit observatory commissioning.

Astronomy↗

EXCLAIM: A New Balloon Mission to Map the Cosmological History of Galaxies

The EXperiment for Cryogenic Large-Aperture Intensity Mapping (EXCLAIM) is a cryogenic balloon-borne instrument that will survey galaxy and star formation history over cosmological time scales. Rather than identifying individual objects, EXCLAIM will be a pathfinder to demonstrate an intensity mapping approach, which measures the cumulative redshifted line emission. EXCLAIM will operate at 420-540 GHz with a spectral resolution R=512 to measure the integrated CO and [CII] in redshift windows spanning 0 < z < 3.5. CO and [CII] line emissions are key tracers of the gas phases in the interstellar medium involved in star-formation processes. EXCLAIM will shed light on questions such as why the star formation rate declines at z < 2, despite continued clustering of the dark matter. The instrument will employ an array of six superconducting integrated grating-analog spectrometers (micro-spec) coupled to microwave kinetic inductance detectors (MKIDs). I will present an overview of the EXCLAIM instrument design and status.

Eric Switzer↗