Discrimination of poorly exposed lithologies in AVIRIS data
One of the advantages afforded by imaging spectrometers such as AVIRIS is the capability to detect target materials at a sub-pixel scale. This paper presents several examples of the identification of poorly exposed geologic materials - materials which are either subpixel in scale or which, while having some surface expression over several pixels, are partially covered by vegetation or other materials. Sabol et al. (1992) noted that a primary factor in the ability to distinguish sub-pixel targets is the spectral contrast between the target and its surroundings. In most cases, this contrast is best expressed as an absorption feature or features present in the target but absent in the surroundings. Under such circumstances, techniques such as band depth mapping (Clark et al., 1992) are feasible. However, the only difference between a target material and its surroundings is often expressed solely in the continuum. We define the 'continuum' as the reflectance or radiance spanning spectral space between spectral features. Differences in continuum slope and shape can only be determined by reduction techniques which considers the entire spectral range; i.e., techniques such as spectral mixture analysis (Adams et al., 1989) and recently developed techniques which utilize an orthogonal subspace projection operator (Harsanyi, 1993). Two of the three examples considered herein deal with cases where the target material differs from its surroundings only by such a subtle continuum change.