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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.
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This study is to characterize the destructive single-event latchup (SEL) susceptibility of the LTC1604AIG#90117 (LTC1604) analog/digital converter (ADC). The device was monitored for SEL current events on the power supplies during exposure to a heavy ion beam at Lawrence Berkeley National Laboratory (LBNL) 88-inch Cyclotron. Testing was performed on September 11, 2021.
This study was undertaken to determine the single event transient distribution of a transimpedance amplifier configuration of the AD8041 Operational Amplifier. The AD8041 is made in a bipolar technology and the application of interest has a bipolar supply of ±5 V. The device was monitored for transient events on the output voltage during exposure to a heavy ion beam at Lawrence Berkeley National Laboratory’s (LBNL) 88-inch Cyclotron.
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The AMD Radeon Embedded e9170 Graphics Processing Unit (GPU), notably the e9173 Peripheral Component Interconnect Express (PCIE) variant, is of interest to Artemis generation programs with requirements for graphics rendering, compute, artificial intelligence (Ai) with a constraints-requiring piece-part procurement and power consumption of less than 50W. In addition to collecting heavy ion data on this device, a secondary purpose of this test campaign was to validate video capture hardware and software workflows used with GPU, microprocessor and system-on-chip device testing. Five (5) test patterns from the NEPP Processor Enclave (NPE) test suite were used with the e9173. The test patterns covered the operating system’s (OS) idle contribution towards the cross section, matrix math using tensorflow-rocm, two artificial intelligence models developed at NASA GSFC, and an industry standard GPU benchmarking application called Mesa GLXGears.
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This study was undertaken to determine the single-event functional interrupt (SEFI) susceptibility on different Linux operating system configurations. The device-under-test (DUT) was the Xilinx Zynq-7020 SoC on the TUL PYNQ-Z2 board. The device was monitored for kernel panics or hangs, classified as SEFIs, to observe any differences in the SEFI cross sections between operating system configurations. The primary purpose of this experiment was to observe if the number of drivers installed in a Linux system affects its overall execution reliability.
The NASA Lunar Orbital Platform-Gateway (LOP-G), a vital component of NASA’s Artemis program, will serve as a multi-purpose outpost orbiting the Moon. A foundational component of LOP-G is the Power and Propulsion Element (PPE). The PPE is a high-power, +60-kilowatt solar electric propulsion spacecraft that will provide power, high-rate communications, attitude control, and orbital transfer capabilities for the Gateway. The solar array system will utilize 4-junction photovoltaic cell technology on a flexible substrate (roll-out solar array or ROSA) in combination with multiple diode assemblies to combine the power of the solar array strings. NASA’s Marshall Space Flight Center, together with the PPE developer, Maxar, are in the midst of completing a rigorous combined environments test campaign of 3 solar array coupons and 1 array blocking diode board coupon. The campaign includes Ultra-Violet Radiation, Charged Particle Radiation, Ion Erosion, Thermal Cycles, and Electrostatic Discharge tests. The environments are applied in 3 separate incremental stages reflecting the various mission phases: 460 days of Earth-to-Lunar Transit, with much of that time through the Van Allen Belts, 5-years in Lunar Near-Rectilinear Halo Orbit (NRHO) at the Moon, and finally 15-years in Lunar NRHO, which represents the end of the design life. This paper will report on the state of the testing for each coupon, and brief look at the array performance, including some unexpected sensitivities of array blocking diodes.
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The effects of test system misalignment are analyzed for dynamic tension tests using sheet type rectangular 1100-0 aluminum specimens. The strain rate is assumed constant only on the natural axis of the specimen even though the specimen is subjected to a constant strain rate test. The results include: (1) the lower the strain rate, the more significant the misalignment errors become; (2) misalignment errors of 50% are found at the extreme fibers of the specimen; (3) the strain rate variation in the cross section decreases with increasing plastic strain and vanishes at plastic strain equal to 0.8% at the midspan of the specimen; and (4) the neutral axis shifts toward the centerline of the specimen as the plastic strain increases, but it reaches a limit and does not completely move back to the centerline.
NASA's Code QE Test Effectiveness Program is funding a series of applied research activities focused on utilizing the principles of physics and engineering of failure along with those of engineering economics to assess and improve the value added by various validation and verification activities, with the primary emphasis being on testing.
Tests of the gravitational redshift effect provide a way to check the validity of the Einstein Equivalence Principle (EEP) and, more specifically, of general relativity. If the EEP is valid, then the redshift should be the same for different clocks. Also, according to general relativity, the redshift should depend upon only the total mass of a gravitating body without reference to its detailed composition. These predictions have been tested mainly in the gravitational field of the earth. It is now possible to measure, with space probes, the redshift effect to good accuracy in the vicinity of other bodies in the solar system, in particular at the massive outer planets. The present and future status of these experiments is discussed.
Test techniques for evaluation of how well electrical and electronic equipment withstands the indirect effects of lightning were studied. The existing test techniques, and the philosophy behind some of the existing or evolving standards are discussed. Possible avenues of improvement in test techniques are suggested.
Effects of experimental imprecision on the stress intensity factors calculated for various practical specimen types are shown. A general form equation for the stress intensity factor is presented and a general error equation is derived. The expected error in the stress intensity factor is given in terms of the precision levels of the basic experimental measurements and derivatives of the stress intensity calibration factor. Nine common fracture specimen types are considered, and the sensitivity of the various types to experimental error is illustrated. Some implications for fracture toughness testing and crack growth rate testing are discussed and methods of analysis are proposed to compensate for the effects of experimental error.
Angular grid spacing resolution near poles effect tests in global prediction model for geophysical fluid dynamics, investigating forecast height and wind fields