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At least 145 records · Page 8

Construction of prototypes of a new class of infrared detectors

A class of infrared detectors is proposed and experimental results are presented for a prototype device. The material used is LaF3, an ionic conductor with a capacitance that varies exponentially with temperature. The detectivity of a prototype detector is estimated from measured signal voltages and incident power, and a Johnson noise voltage calculated from the measured resistance. For the parameters characterizing this device the estimated detectivity is consistent with a theoretical prediction. The theory further predicts an optimum detectivity for much thinner devices than the prototypes.

Sher, A.↗

The effect of electrode temperature on the sparking voltage of short spark gaps

This report presents the results of an investigation to determine what effect the temperature of spark plug electrodes might have on the voltage at which a spark occurred. A spark gap was set up so that one electrode could be heated to temperatures up to 700 degrees C., while the other electrode and the air in the gap were maintained at room temperature. The sparking voltages were measured both with direct voltage and with voltage impulse from ignition coil. It was found that the sparking voltage of the gap decreased materially with increase of temperature. This change was more marked when the hot electrode was of negative polarity. The phenomena observed can be explained by the ionic theory of gaseous conduction, and serve to account for certain hitherto unexplained actions in the operation of internal combustion engines. These results indicate that the ignition spark will pass more readily when the spark-plug design is such as to make the electrodes run hot. This possible gain is, however, very closely limited by the danger of producing preignition. These experiments also show that sparking is somewhat easier when the hot electrode (which is almost always the central electrode) is negative than when the polarity is reversed.

Silsbee, F B↗

Measurement and analysis of solar cell current-voltage characteristics

Approaches to measurement and analysis of solar cell current-voltage characteristics under dark and illuminated conditions are discussed. Measurements are taken with a computer based data acquisition system for temperatures in the range of -100 to +100 C. In the fitting procedure, the various I(oi) and C(i) as well as R(S) and R(SH) are determined. Application to current-voltage analyses of high efficiency silicon cells and Boeing CdS/CuInSe2 are discussed. In silicon MINP cells, it is found that at low voltages a tunneling mechanism is dominant, while at larger voltages the I-V characteristics are usually dominated by emitter recombination. In the case of Boeing cells, a current transport model based on a tunneling mechanism and interface recombination acting in series has been developed as a result of I-V analyses.

Olsen, Larry C.↗

The influence of a voltage ramp on the measurement of I-V characteristics of a solar cell

For efficiency and convenience the voltage applied to a Si solar cell is often fairly rapidly driven from zero to the open circuit value typically at a common rate of 1 V per millisecond. During this time the values of current are determined as a function of the instantaneous voltage thus producing an I-V characteristic. The present paper shows that the customary expressions for the current as a function of cell parameters still remain valid provided that the diffusion length in the expression for the dark current is changed from its steady state value L to the effective diffusion length L1 given by L1 = L(1 + qV/kT.tau) to the -1/2, where V is the ramp rate considered constant and tau is the lifetime of minority carriers. This result is true to a very good approximation provided that low level injection prevails.

Von Roos, O.↗

MIS capacitor studies on silicon carbide single crystals

Cubic SIC metal-insulator-semiconductor (MIS) capacitors with thermally grown or chemical-vapor-deposited (CVD) insulators were characterized by capacitance-voltage (C-V), conductance-voltage (G-V), and current-voltage (I-V) measurements. The purpose of these measurements was to determine the four charge densities commonly present in an MIS capacitor (oxide fixed charge, N(f); interface trap level density, D(it); oxide trapped charge, N(ot); and mobile ionic charge, N(m)) and to determine the stability of the device properties with electric-field stress and temperature. The section headings in the report include the following: Capacitance-voltage and conductance-voltage measurements; Current-voltage measurements; Deep-level transient spectroscopy; and Conclusions (Electrical characteristics of SiC MIS capacitors).

Kopanski, J. J.↗

Electro-Optical High-Voltage Sensors

Electro-optical sensors for measuring high voltages developed for use in automatically controlled power-distribution systems. Sensors connected to optoelectronic interrogating equipment by optical fibers. Because sensitive material and optical fibers are all dielectric, no problem in electrically isolating interrogating circuitry from high voltage, and no need for voltage dividers. Sensor signals transmitted along fibers immune to electromagnetic noise at radio and lower frequencies.

Gottsche, Allan↗

LaF3 infrared detector

A class of infrared detectors is proposed, and experimental results are presented for a prototype device. The material used is LaF3, an ionic conductor with a capacitance that varies exponentially with temperature. The detectivity of a prototype detector is estimated from measured signal voltages and incident power, and a Johnson noise voltage is calculated from the measured resistance. At a modulation frequency of 20 Hz, the estimated detectivity is about 2 million cm/sq root Hz/W. For the parameters characterizing this device, the estimated detectivity is consistent with a theoretical prediction. The theory further predicts an optimum detectivity of about 1 billion cm/sq root Hz/W for much thinner devices than the prototypes.

Sher, A.↗

Thin-Film Resistance Heat-Flux Sensors

Thin-film heat-flux sensors of a proposed type would offer advantages over currently available thin-film heat flux sensors. Like a currently available thin-film heat-flux sensor, a sensor according to the proposal would be based on measurement of voltages related to the temperatures of thin metal films on the hotter and colder faces of a layer of an electrically insulating and moderately thermally conductive material. The heat flux through such a device is proportional to the difference between the temperatures and to the thermal conductivity of the layer. The advantages of the proposed sensors over the commercial ones would arise from the manner in which the temperature-related voltages would be generated and measured.

Fralick, Gustave C.↗

l/f Noise in the Superconducting Transition of a MgB2 Thin Film

The noise voltage spectral density in the superconducting transition of a MgB2 thin film on a SiN-coated Si thick substrate was measured over the frequency range 1 Hz-to-1 KHz. Using established bolometer noise theory the theoretical noise components due to Johnson, 1/f(excess) and phonon noise are modeled to the measured data. It is shown that for the case of a MgB2 thin film in the vicinity of the mid-point of transition, coupled to a heat sink via a fairly high thermal conductance (approximately equal to 10(sup -1) W/K)) that the measured noise voltage spectrum is 1/f limited and exhibits lit dependence with a varying between 0.3 and 0.5 in the measured frequency range. At a video frame rate frequency of 30 Hz the measured noise voltage density in the film is approximately equal to 61 nV /the square root of HZ, using this value an upper limit of electrical NEP approximately equal to 0.67pW / the square root of Hz is implied for a practical MgB2 bolometer operating at 36.1 K.

Lakew, B.↗

Metal-insulator-semi-conductor studies of lead telluride

The capacitance and conductance-voltage characteristics were measured on metal-insulator-semiconductor capacitors fabricated with zirconium dioxide films on single-crystal lead telluride. At 77 K, on both n- and p-type substrates, evidence of surface potential control was obtained. Comparison of the measured capacitance-voltage characteristics with those calculated from the equilibrium solution of the one-dimensional Poisson equation indicated qualitative agreement, although the slope of the measured capacitance in the region near the capacitance minimum was less steep than calculated.

Lilly, D. A.↗

Ambient and cryogenic temperature testing of a 32-channel CMOS multiplexer

A 32 channel CMOS multiplexer was tested at room temperature and at liquid helium temperature (4.9 K). Voltage gain of the FET input stage, leakage current, electrical crosstalk, and noise as a function of clock frequency were measured. The voltage gain measured at 4.9 K was slightly higher than that measured at 300 K and was independent of clock frequency at both operating temperatures. The off channel leakage current was 0.23 pA/channel at 4.9 K. Electrical crosstalk between adjacent channels (one on, one off) was quite low. The spot noise at 10 Hz, of the CMOS multiplexer operating in the static mode did not vary significantly with operating temperature. In the dynamic mode (3.2 kHz clock) at room temperature, the spot noise at 10 Hz was substantially higher than that measured in the static mode.

Lee, J. H.↗

Summary of system state-of-health measurements STRATCOM 8: A balloon experiment

Various measurements were made to determine the temperature and attitude of the gondola and the status of primary power and control equipment. Bead thermistors were used to measure temperatures at selected points throughout the gondola. A two-axis magnetometer and a two-axis pendulum were used to measure gondola attitude. Voltage and current measurements indicated the status of the primary power sources and associated power converters.

Herrington, P. B.↗

Microwave Driven Actuators Power Allocation and Distribution

Design, fabrication and test of a power allocation and distribution (PAD) network for microwave driven actuators is presented in this paper. Development of a circuit that would collect power from a rectenna array amplify and distribute the power to actuators was designed and fabricated for space application in an actuator array driven by a microwave. A P-SPICE model was constructed initially for data reduction purposes, and was followed by a working real-world model. A voltage up - converter (VUC) is used to amplify the voltage from the individual rectenna. The testing yielded a 26:1 voltage amplification ratio with input voltage at 9 volts and a measured output voltage 230VDC. Future work includes the miniaturization of the circuitry, the use of microwave remote control, and voltage amplification technology for each voltage source. The objective of this work is to develop a model system that will collect DC voltage from an array of rectenna and propagate the voltage to an array of actuators.

Forbes, Timothy↗

Analysis of the photo voltage decay /PVD/ method for measuring minority carrier lifetimes in P-N junction solar cells

The photo voltage decay (PVD) method for the measurement of minority carrier lifetimes in P-N junction solar cells with cell thickness comparable to or even less than the minority carrier diffusion length is examined. The method involves the generation of free carriers in the quasi-neutral bulk material by flashes of light and the monitoring of the subsequent decay of the induced open-circuit voltages as the carriers recombine, which is dependent on minority carrier recombination lifetime. It is shown that the voltage versus time curve for an ordinary solar cell (N(+)-P junction) is proportional to the inverse minority carrier lifetime plus a factor expressing the ratio of diffusion length to cell thickness. In the case of an ideal back-surface-field cell (N(+)-P-P(+) junction) however, the slope is directly proportional to the inverse minority carrier lifetime. It is noted that since most BSF cells are not ideal, possessing a sizable back surface recombination velocity, the PVD measurements must be treated with caution and supplemented with other nonstationary methods.

Von Roos, O.↗

Impedance studies of Ni/Cd and Ni/H2 cells using the cell case as a reference electrode

Impedance measurements have been made on several Ni/Cd and Ni/H2 flightweight cells using the case as a reference electrode. For these measurements the voltage of the case with respect to the anode or cathode is unimportant provided that it remains stable during the measurement of the impedance. In the cells measured so far, the voltages of the cell cases with respect to the individual electrodes differ from cell to cell even at the same overall cell voltage, but they remains stable with time. The measurements can thus be used to separate the cell impedance into the contributions of each electrode, allowing improved diagnosis of cell problems.

Reid, Margaret A.↗

Impedance studies of nickel/cadmium and nickel/hydrogen cells using the cell case as a reference electrode

Impedance measurements have been made on several Ni/Cd and Ni/H2 flight-weight cells using the case as a reference electrode. For these measurements, the voltage of the case with respect to the anode or cathode is unimportant provided that it remains stable during the measurement of the impedance. In the cells measured so far, the voltage of the cell cases with respect to the individual electrodes differ from cell to cell, even at the same overall cell voltage, but they remain stable with time. The measurements can thus be used to separate the cell impedance into the contributions of each electrode, allowing improved diagnosis of cell problems.

Reid, Margaret A.↗