Search NASA⌕ Search

SEARCH · Search NASA

Results for “Sputtering”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.

At least 1,459 records · Page 81
All sourcesNASA NTRSDOE OSTI
DOE OSTI2016

IBEX OBSERVATIONS OF SECONDARY INTERSTELLAR HELIUM AND OXYGEN DISTRIBUTIONS

In this study, we investigate the directional distributions of the secondary interstellar neutral (ISN) He and O populations at Earth's orbit. The secondary populations are created by charge exchange between ISN atoms and interstellar ions in the outer heliosheath. Using the IBEX -Lo He and O observations during the winter–spring seasons (early December to early June) in 2009–2011, we produced all-sky maps for He and O atoms with sputtering corrections. These sky maps include the directional distributions of the primary ISN gas and secondary populations. Our investigations reveal that the secondary He and O populations are observed in the ecliptic longitude range 160°–210°. The peak longitudes of the secondary He and O appear to be 14°–34° and 38°–43° away from the peak longitude of the primary interstellar gas flow, respectively. These results indicate that the secondary populations have lower bulk speeds relative to the Sun and their flow directions deviate from the primary gas flow. These results may indicate that one side of the outer heliosheath is thicker than the other side relative to the flow direction of the primary interstellar gas flow.

79 ASTRONOMY AND ASTROPHYSICS↗
NASA NTRS1994

(abstract) Optical Scattering and Surface Microroughness of Ion Beam Deposited Au and Pt Thin Films

Thin films of gold and platinum have been deposited onto superpolished fused silica substrates using thermal evaporation, ion assisted deposition (IAD), and ion assisted sputtering. The influence of ion beam flux, thin film material, and deposition rate on the films microroughness have been investigated. Short range surface microroughness of the films has been examined using scanning tunneling microscopy (STM) and atomic force microscopy (AFM). Long range surface microroughness has been characterized using an angle resolved optical scatterometer. Results indicate that ion beam deposited coatings have improved microstructure over thermally evaporated films.

assisted sputtering fused silica ion beam microrou↗
NASA NTRS2016

High-Density Superconducting Cables for Advanced ACTPol

Advanced ACTPol (AdvACT) is an upcoming Atacama Cosmology Telescope (ACT) receiver upgrade, scheduled to deploy in 2016, that will allow measure- ment of the cosmic microwave background polarization and temperature to the highest precision yet with ACT. The AdvACT increase in sensitivity is partly provided by an increase in the number of transition-edge sensors (TESes) per array by up to a factor of two over the current ACTPol receiver detector arrays. The high-density AdvACT TES arrays require 70 μ m pitch superconducting flexible cables (flex) to connect the detec- tor wafer to the first-stage readout electronics. Here, we present the flex fabrication process and test results. For the flex wiring layer, we use a 400-nm-thick sputtered alu- minum film. In the center of the cable, the wiring is supported by a polyimide substrate, which smoothly transitions to a bare (uncoated with polyimide) silicon substrate at the ends of the cable for a robust wedge wire-bonding interface. Tests on the first batch of flex made for the first AdvACT array show that the flex will meet the requirements for AdvACT, with a superconducting critical current above 1 mA at 500 mK, resilience to mechanical and cryogenic stress, and a room temperature yield of 97%.

transition-edge sensors (TESes)↗
NASA NTRSDate not supplied

Characterization of NiC Multilayer Coating Stress for X-Ray Optic Applications

NiC multilayers have been identified as a promising coating design for hard X-ray astrophysical imaging applications enabling bandpass extension beyond the Pt K-edge of approximately 78 keV. However, these coatings are difficult to deposit with low interfacial roughness below a bilayer thickness of about 35 ˚A. Utilizing a DC magnetron sputtering system, NiC multilayer of varying d-spacings are deposited on flat Si wafers and characterized using 8.048 keV X-ray reflectometry measurements. The residual coating stress is also measured using interferometry. We investigate how deposition parameters affect both the coating quality (i.e. surface/interfacial roughness, density, etc.) and the residual coating stress. From these experimental results conducted on flat substrates, we employ FEM and ray trace simulations to determine how NiC multilayer stress could impact the figure, and therefore performance, of full shell X-ray optics.

mulitlayer↗
DOE OSTI2017

Tungsten Foils and Composites for Fusion Applications - Mechanical Testing

Tokamak fusion reactors ultimately should deliver safe, clean, and abundant energy provided that materials and plasma challenges continue to be overcome. Materials that can withstand large heat fluxes and mechanical loads while undergoing intense irradiation are needed for the plasma-facing components of these reactors and are still undergoing development. Tungsten composites are candidates for this purpose; they have low sputtering yields, high melting points, and may be more ductile than pure tungsten. However, the mechanical properties of tungsten composites are not yet well characterized. Tungsten foils produced using severe plastic deformation, e.g. cold rolling, have shown considerable promise for these applications as they may be more ductile than tungsten produced using powder metallurgy alone. Changes to the mechanical properties of tungsten foils have been suggested to be correlated with ultra-fine grained or nanocrystalline microstructures created by severe plastic deformation. Tungsten foils with larger amounts of plastic deformation, i.e. thinner foils, have been shown to have smaller grain sizes and a more pronounced texture in (100) <011>. The grain size and structure of foils with differing degrees of plastic deformation are therefore likely to differ significantly and the foils will likely exhibit very different mechanical properties. To fabricate tungsten foils into a useful structural material for high temperature fusion applications, layered composites are currently being examined. These composites integrate the excellent functional characteristics of tungsten foils with an interlayer such as steel that may improve ductility and toughness. To engineer and optimize layered composites, the mechanical properties of tungsten foils with differing thicknesses and degrees of plastic deformation must be characterized, both pre- and post-irradiation.

36 MATERIALS SCIENCE↗
DOE OSTI2018

Irradiation Enhances Strength and Deformability of Nano‐Architected Metallic Glass

The quest for radiation‐damage tolerant materials has found good candidates in nanoporous metals, whose abundance of free surfaces provides ample sinks for radiation‐induced defects, as well as in metallic glasses, whose characteristic failure via shear banding can be alleviated by irradiation. This type of catastrophic failure in metallic glass can also be suppressed by reducing their dimensions to the nanoscale. To combine the beneficial effects of resilience against irradiation in materials containing many free surfaces and nano‐sized metallic glasses, the authors fabricate Zr–Ni–Al metallic glass nano‐architecture and irradiate them with 12 MeV Ni 4+ ions. These 3D nanolattices are composed of hollow beams of sputtered metallic glass with beam wall thicknesses ≈10–100 nm, with a relative density of ≈5%, which renders them to be 20 times lighter than their bulk‐level counterparts. The authors find that the thickest‐walled nanolattices, those with a median wall thickness of ≈88 nm, are able to withstand irradiation without significant contraction; all other substantially shrunk; and collapsed upon irradiation. In situ nanomechanical experiments on the irradiated samples compressed inside a scanning electron microscope (SEM) reveal substantial improvement in mechanical response upon irradiation, with an average increase in yield strength of 35.7% and a significant enhancement in deformability. Enhanced deformability upon irradiation is apparent from the nanolattices' accommodation of larger strains before any kind of failure, as well as the presence of smaller strain bursts and stress drops throughout the stress–strain response. The irradiated nanolattices are largely intact after compression, with in situ SEM videos demonstrating a layer‐by‐layer like collapse in the irradiated nanolattices in contrast to the catastrophic failure with complete destruction of the failed layers observed in equivalent as‐fabricated samples. This work points to nano‐architected metallic glasses being a promising candidate for creating ultra‐lightweight, radiation tolerant materials, and irradiation as a promising technique for improving the mechanical response of metallic glass nanolattices with stiffness on the order of 250 MPa.

Thompson, Rachel L.↗
DOE OSTI2026

Thermoreflectance Detection of Point Defects Resulting from Focused Ion Beam Milling

Focused ion beam (FIB) milling is a commonly used tool for nanoscale material processing, such as for transmission electron microscopy (TEM) sample preparation, or the creation of fiducial markers prior to other processes and measurements. During milling, a high energy ion beam is used to remove material via sputtering. The expelled target material may return to the sample surface however, affecting subsequent measurements. Beam spreading or irradiation due to neutral gallium may also irradiate a larger area than intended. Extensive research has explored the effects of FIB milling on the prepared TEM sample, but few have looked at the effects of milling on the properties of the sample surrounding the milled region. We use multiple pump-probe laser-based techniques (time domain thermoreflectance and steady-state thermoreflectance) to measure the spatial extent of FIB-induced surface/subsurface changes on a series of silicon wafers milled at multiple currents and doses. We supplement these measurements with high-resolution scanning transmission electron microscopy, energy dispersive X-ray spectroscopy, stylus profilometry, and time-of-flight secondary ion mass spectroscopy. We find a sample surface affected by the FIB up to 1 mm from where milling occurred, with a notable dependence on the ion beam current. We also note remarkably high sensitivity to surface defects using the thermoreflectance metrologies, including detection where other measurements failed.

defects↗
DOE OSTI2017

High Conduction Hopping Behavior Induced in Transition Metal Dichalcogenides by Percolating Defect Networks: Toward Atomically Thin Circuits

Atomically thin circuits have recently been explored for applications in next‐generation electronics and optoelectronics and have been demonstrated with 2D lateral heterojunctions. In order to form true 2D circuitry from a single material, electronic properties must be spatially tunable. Here, tunable transport behavior is reported which is introduced into single layer tungsten diselenide and tungsten disulfide by focused He + irradiation. Pseudometallic behavior is induced by irradiating the materials with a dose of ≈1 × 10 16 He + cm −2 to introduce defect states, and subsequent temperature‐dependent transport measurements suggest a nearest neighbor hopping mechanism is operative. Scanning transmission electron microscopy and electron energy loss spectroscopy reveal that Se is sputtered preferentially, and extended percolating networks of edge states form within WSe 2 at a critical dose of 1 × 10 16 He + cm −2 . First‐principle calculations confirm the semiconductor‐to‐metallic transition of WSe 2 after pore and edge defects are introduced by He + irradiation. The hopping conduction is utilized to direct‐write resistor loaded logic circuits in WSe 2 and WS 2 with a voltage gain of greater than 5. Edge contacted thin film transistors are also fabricated with a high on/off ratio (>10 6 ), demonstrating potential for the formation of atomically thin circuits.

Stanford, Michael G.↗
DOE OSTI2024

Breaking Barriers in Chalcogenide Perovskite Synthesis: A Generalized Framework for Fabrication of BaMS 3 (M═Ti, Zr, Hf) Materials

Abstract Chalcogenide perovskites have garnered increasing attention as stable, non‐toxic alternatives to lead halide perovskites. However, their conventional synthesis at high temperatures (>1000 °C) has hindered widespread adoption. Recent studies have developed low‐to‐moderate temperature synthesis methods (<600 °C) using reactive precursors, yet a comprehensive understanding of the pivotal factors affecting reproducibility and repeatability remains elusive. This study delineates the critical factors in the low‐temperature synthesis of BaMS 3 (M═Zr, Hf, Ti) compounds and presents a generalized framework. Innovative approaches are developed for synthesizing BaMS 3 compounds using this framework involving organometallics for solution deposition. The molecular precursor routes, employing metal acetylacetonates to generate soluble metal–sulfur bonded complexes and metal–organic compounds to produce soluble metal‐thiolate, metal‐isothiocyanate, and metal‐trithiocarbonate species, are demonstrated to yield carbon‐free BaMS 3 . These methods have achieved the most contiguous films of BaZrS 3 and BaHfS 3 using solution deposition to date. Furthermore, a hybrid solution processing method involving stacking sputter‐deposited Zr and solution‐deposited BaS layers is employed to synthesize a contiguous, oxygen‐free BaZrS 3 film. The diffuse reflectance measurements indicate a direct bandgap of ≈ 1.85 eV for the BaZrS 3 films and ≈ 2.1 eV for the BaHfS 3 film under investigation.

25 ENERGY STORAGE↗