NERVA control drum actuator irradiation test program
NERVA control drum actuator tests in cryogenic temperature, nuclear radiation, and vacuum environments
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NERVA control drum actuator tests in cryogenic temperature, nuclear radiation, and vacuum environments
The purpose of this test was to determine the heavy ion-induced single-event effect (SEE) susceptibility of the Samsung solid state drive (SSD) containing the Vertical-NAND (VNAND) flash technology. This test was supported by the NASA Electronics Parts and Packaging (NEPP) Program.
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Review of design features and how fabrication will be completed for DRIFT Capsules, Big-BUSTER, and Moderator Assemblies for Big-BUSTER in TREAT.
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