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At least 163 records · Page 9

Development of a position–velocity–time-modulated two-dimensional ion beam figuring system for synchrotron x-ray mirror fabrication

With the rapid evolution of synchrotron x-ray sources, the demand for high-quality precision x-ray mirrors has greatly increased. Single nanometer shape accuracy is required to keep imaging capabilities at the diffraction limit. Ion beam figuring (IBF) has been used frequently for ultra-precision finishing of mirrors, but achieving the ultimate accuracy depends on three important points: careful alignment, accurate dwell time calculation and implementation, and accurate optical metrology. The Optical Metrology Group at National Synchrotron Light Source II has designed and built a position–velocity–time-modulated two-dimensional IBF system (PVT-IBF) with three novel characteristics: (1) a beam footprint on the mirror was used as a reference to align the coordinate systems between the metrology and the IBF hardware; (2) the robust iterative Fourier transform-based dwell time algorithm proposed by our group was applied to obtain an accurate dwell time map; and (3) the dwell time was then transformed to velocities and implemented with the PVT motion scheme. In this study, the technical aspects of the PVT-IBF systems are described in detail, followed by an experimental demonstration of the figuring results. In our first experiment, the 2D RMS in a 50mm×5mm clear aperture was reduced from 3.4 to 1.1 nm after one IBF run. In our second experiment, due to a 5 mm pinhole installed in front of the source, the 2D RMS in a 50mm×5mm clear aperture was reduced from 39.1 to 1.9 nm after three IBF runs, demonstrating that our PVT-IBF solution is an effective and deterministic figuring process.

47 OTHER INSTRUMENTATION↗

Long-lived Bell states in an array of optical clock qubits

The generation of long-lived entanglement on an optical clock transition is a key requirement to unlocking the promise of quantum metrology. Arrays of neutral atoms constitute a capable quantum platform for accessing such physics, where Rydberg-based interactions may generate entanglement between individually controlled and resolved atoms. To this end, we leverage the programmable state preparation afforded by optical tweezers along with the efficient strong confinement of a 3d optical lattice to prepare an ensemble of strontium atom pairs in their motional ground state. We engineer global single-qubit gates on the optical clock transition and two-qubit entangling gates via adiabatic Rydberg dressing, enabling the generation of Bell states, $|\psi{\rangle}$ $= \frac{1}{\sqrt{2}}(|gg\rangle$ $+ i|ee\rangle{)}$, with a fidelity of $\mathcal{F}$ = 92.8(2:0)%. For use in quantum metrology, it is furthermore critical that the resulting entanglement be long lived; we find that the coherence of the Bell state has a lifetime of $τ_{bc}$ = 4:2(6) s via parity correlations and simultaneous comparisons between entangled and unentangled ensembles. Such Bell states can be useful for enhancing metrological stability and bandwidth. Further rearrangement of hundreds of atoms into arbitrary configurations using optical tweezers will enable implementation of many-qubit gates and cluster state generation, as well as explorations of the transverse field Ising model and Hubbard models with entangled or finite-range-interacting tunnellers.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗

Ion Beam Figuring System for Synchrotron X-Ray Mirrors Achieving Sub-0.2-µrad and Sub-0.5-nm Root Mean Square

Abstract Optics with high-precision height and slope are increasingly desired in numerous industrial fields. For instance, Kirkpatrick–Baez (KB) mirrors play an important role in synchrotron X-ray applications. A KB system is composed of two aspherical, grazing-incidence mirrors used to focus an X-ray beam. The fabrication of KB mirrors is challenging due to the aspherical departure of the mirror surfaces from base geometries and the high-quality requirements for slope and height residuals. In this paper, we present the process of manufacturing an elliptical cylinder KB mirror using our in-house-developed ion beam figuring (IBF) and metrology technologies. First, the key aspects of figuring and finishing processes with IBF are illustrated in detail. The effect of positioning error on the convergence of the residual slope error is highlighted and compensated. Finally, inspection and cross-validation using different metrology instruments are performed and used as the final validation of the mirror. Results confirm that relative to the requested off-axis ellipse, the mirror has achieved 0.15-µrad root mean square (RMS) and 0.36-nm RMS residual slope and height errors, respectively, while maintaining the initial 0.3-nm RMS microroughness.

36 MATERIALS SCIENCE↗

Spin squeezing in an ensemble of nitrogen–vacancy centres in diamond

Spin-squeezed states provide a seminal example of how the structure of quantum mechanical correlations can be controlled to produce metrologically useful entanglement. These squeezed states have been demonstrated in a wide variety of quantum systems ranging from atoms in optical cavities to trapped ion crystals. By contrast, despite their numerous advantages as practical sensors, spin ensembles in solid-state materials have yet to be controlled with sufficient precision to generate targeted entanglement such as spin squeezing. Here we report the experimental demonstration of spin squeezing in a solid-state spin system. Our experiments are performed on a strongly interacting ensemble of nitrogen–vacancy colour centres in diamond at room temperature, and squeezing (−0.50 ± 0.13 dB) below the noise of uncorrelated spins is generated by the native magnetic dipole–dipole interaction between nitrogen–vacancy centres. To generate and detect squeezing in a solid-state spin system, we overcome several challenges. First, we develop an approach, using interaction-enabled noise spectroscopy, to characterize the quantum projection noise in our system without directly resolving the spin probability distribution. Second, noting that the random positioning of spin defects severely limits the generation of spin squeezing, we implement a pair of strategies aimed at isolating the dynamics of a relatively ordered sub-ensemble of nitrogen–vacancy centres. Furthermore, our results open the door to entanglement-enhanced metrology using macroscopic ensembles of optically active spins in solids.

Atomic and molecular physics↗

Toward the fabrication of a 5- μm -resolution Wolter microscope for the National Ignition Facility (invited)

Advancements in computer-controlled polishing, metrology, and replication have led to an x-ray mirror fabrication process that is capable of producing high-resolution Wolter microscopes. Here, we present the fabrication and test of a nickel–cobalt replicated full-shell x-ray mirror that was electroformed from a finely figured and polished mandrel. This mandrel was designed for an 8-m source-to-detector-distance microscope, with 10× magnification, and was optimized to reduce shell distortions that occur within 20 mm of the shell ends. This, in combination with an improved replication tooling design and refined bath parameters informed by a detailed COMSOL Multiphysics® model, has led to reductions in replication errors in the mirrors. Mandrel surface fabrication was improved by implementing a computer-controlled polishing process that corrected the low-frequency mandrel figure error and achieved <2.0 nm RMS convergence error. X-ray tests performed on a pair of mirror shells replicated from the mandrel have demonstrated <10 μm full-width at half-maximum (FWHM) spatial resolution. Here, we discuss the development process, highlight results from metrology and x-ray testing, and define a path for achieving a program goal of 5 μm FWHM resolution.

47 OTHER INSTRUMENTATION↗

Sub-quantum Fisher information

We report the quantum Fisher information (QFI) plays a crucial role in quantum information theory and in many practical applications such as quantum metrology. However, computing the QFI is generally a computationally demanding task. In this work we analyze a lower bound on the QFI which we call the sub-quantum Fisher information (sub-QFI). The bound can be efficiently estimated on a quantum computer for an n-qubit state using 2n qubits. The sub-QFI is based on the super-fidelity, an upper bound on Uhlmann's fidelity. We analyze the sub-QFI in the context of unitary families, where we derive several crucial properties including its geometrical interpretation. In particular, we prove that the QFI and the sub-QFI are maximized for the same optimal state, which implies that the sub-QFI is faithful to the QFI in the sense that both quantities share the same global extrema. Based on this faithfulness, the sub-QFI acts as an efficiently computable surrogate for the QFI for quantum sensing and quantum metrology applications. Finally, we provide additional meaning to the sub-QFI as a measure of coherence, asymmetry, and purity loss.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗

Enhancing quantum clocks and sensors with randomization and decoherence

This letter shows how incoherent dynamics can lead to metrological advantages in quantum sensing. The results rely on the fact that incoherent dynamics lead to an additive contribution to the quantum Fisher information about time. Such an additive contribution can reduce the error of optimal estimation protocols, as implied by the quantum Cramér–Rao bound. I characterize regimes in which the estimation of a time interval or a frequency is enhanced by decoherence, thereby identifying cases in which incoherent dynamics serve as a metrological resource. The decoherence processes that yield enhanced precision of quantum sensors can be engineered by randomized Hamiltonian dynamics. I illustrate the results with protocols that display improved sensing of time intervals or global fields by qubit and photonic sensors. Enhanced precision of time intervals is achieved with Hamiltonians that include randomized global parameters. Enhanced precision in field estimation is obtained by randomized sensing times.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗

Saturating the one-axis twisting quantum Cramér-Rao bound with a total spin readout

We show that the lowest quantum Cramér-Rao bound achievable in interferometry with a one-axis twisted spin coherent state is saturated by the asymptotic method of moments error of a protocol that uses one call to the one-axis twisting, one call to time-reversed one-axis twisting, and a final total spin measurement (i.e., a twist-untwist protocol). The result is derived by first showing that the metrological phase diagram for one-axis twisting is asymptotically characterized by a single quantum Fisher information value N(N + 1)/2 for all times, then constructing a twist-untwist protocol having a method of moments error that saturates this value. The case of finite-range one-axis twisting is similarly analyzed, and a simple functional form for the metrological phase diagram is found in both the short-range and long-range interaction regimes. Numerical evidence suggests that the finite-range analogues of twist-untwist protocols can exhibit a method of moments error that asymptotically saturates the lowest quantum Cramér-Rao bound achievable in interferometry with finite-range one-axis twisted spin coherent states for all interaction times.

36 MATERIALS SCIENCE↗

Dressed-State Hamiltonian Engineering in a Strongly Interacting Solid-State Spin Ensemble

In quantum science applications, ranging from many-body physics to quantum metrology, dipolar interactions in spin ensembles are often controlled via Floquet engineering. However, this technique typically reduces the interaction strength between spins and effectively weakens the coupling to a target sensing field, limiting the metrological sensitivity. In this Letter, we develop and demonstrate an alternative method that directly tunes the native dipolar interaction in an ensemble of nitrogen-vacancy (NV) centers in diamond, thereby overcoming these limitations inherent to Floquet engineering. Our approach utilizes dressed-state qubit encoding under a bias magnetic field applied perpendicular to the crystal lattice orientation. This method leads to a 3.2× enhancement of the dimensionless coherence parameter JT 2 compared to state-of-the-art Floquet engineering and a 2.6× (8.3 dB) enhanced sensitivity in ac magnetometry. Furthermore, our results provide a powerful Hamiltonian engineering tool for future studies with NV ensembles and other interacting higher-spin (S > $\frac{1}{2}$) systems.

Quantum control↗

Asymptotic optimality of twist-untwist protocols for Heisenberg scaling in atom-based sensing

Twist-untwist protocols for quantum metrology consist of a serial application of (1) unitary nonlinear dynamics (e.g., spin squeezing or Kerr nonlinearity), (2) parameterized dynamics U ( φ ) (e.g., a collective rotation or phase space displacement), and (3) time reversed application of step 1. Such protocols are known to produce states that allow Heisenberg scaling for experimentally accessible estimators of φ even when the nonlinearities are applied for times much shorter than required to produce Schrödinger cat states. In this work, we prove that, asymptotically in the number of particles, twist-untwist protocols provide the lowest estimation error among quantum metrology protocols that utilize two calls to a weakly nonlinear evolution and a readout involving only first and second moments of a total spin operator n → · J → . We consider the following physical settings: all-to-all interactions generated by one-axis twisting J z 2 (e.g., interacting Bose gases), constant finite range spin-spin interactions of distinguishable or bosonic atoms (e.g., trapped ions or Rydberg atoms, or lattice bosons). In these settings, we further show that the optimal twist-untwist protocols asymptotically achieve 85% and 92% of the respective quantum Cramér-Rao bounds. We show that the error of a twist-untwist protocol can be decreased by a factor of L without an increase in the noise of the spin measurement if the twist-untwist protocol can be noiselessly iterated as an L layer quantum alternating operator ansatz.

74 ATOMIC AND MOLECULAR PHYSICS↗

Correlated Noise Estimation with Quantum Sensor Networks

We address the metrological problem of estimating collective stochastic properties imprinted on a network of quantum sensors. Canonical examples include center-of-mass quadrature fluctuations in a system of bosonic modes and correlated dephasing in an ensemble of qubits (e.g., spins), bosons, or fermions. We develop a theoretical framework to determine the limits of correlated (weak) noise estimation with quantum sensor networks and reveal the requirements for entanglement advantage. Notably, an advantage emerges from the synergistic interplay between quantum correlations of the sensors and “classical” correlations of the noises. Here, we determine optimal entangled probe states and identify a sensing protocol—reminiscent of a many-body echo—that achieves the fundamental limits of measurement sensitivity for a broad class of problems, unveiling a route toward entanglement-enhanced metrology of correlated many-body phenomena.

Quantum metrology↗

Ptychographic X-ray speckle tracking with multi-layer Laue lens systems

The ever-increasing brightness of synchrotron radiation sources demands improved X-ray optics to utilize their capability for imaging and probing biological cells, nano-devices and functional matter on the nanometre scale with chemical sensitivity. Hard X-rays are ideal for high-resolution imaging and spectroscopic applications owing to their short wavelength, high penetrating power and chemical sensitivity. The penetrating power that makes X-rays useful for imaging also makes focusing them technologically challenging. Recent developments in layer deposition techniques have enabled the fabrication of a series of highly focusing X-ray lenses, known as wedged multi-layer Laue lenses. Improvements to the lens design and fabrication technique demand an accurate, robust, in situ and at-wavelength characterization method. To this end, a modified form of the speckle tracking wavefront metrology method has been developed. The ptychographic X-ray speckle tracking method is capable of operating with highly divergent wavefields. A useful by-product of this method is that it also provides high-resolution and aberration-free projection images of extended specimens. Three separate experiments using this method are reported, where the ray path angles have been resolved to within 4 nrad with an imaging resolution of 45 nm (full period). This method does not require a high degree of coherence, making it suitable for laboratory-based X-ray sources. Likewise, it is robust to errors in the registered sample positions, making it suitable for X-ray free-electron laser facilities, where beam-pointing fluctuations can be problematic for wavefront metrology.

36 MATERIALS SCIENCE↗

Large‐Area, High‐Numerical‐Aperture, Freeform Metasurfaces

Abstract Nanophotonic devices are optical platforms capable of unprecedented wavefront control. To push the limits of experimental device performance, scalable design methodologies that combine the simplicity and fabricability of conventional design paradigms with the extended capabilities of freeform optimization are required. A novel gradient‐based design framework for large‐area freeform metasurfaces is introduced in which nonlocal interactions between simply shaped nanostructures, placed on an irregular lattice, are tailored to produce high‐order hybridized modes that support customizable large‐angle scattering profiles. Utilizing this approach, multifunctional super‐dispersive metalenses are designed and experimentally demonstrated. The approach to high‐numerical‐aperture radial metalenses capable of diffraction limited focusing and the generation of donut‐shaped point spread functions is also extended. It is anticipated that these concepts will have utility in super‐resolution microscopy, particle trapping, additive manufacturing, and metrology applications that require ultra‐high numerical apertures.

Optics↗

Collimated phase measuring deflectometry

Phase measuring deflectometry has been applied for free-form specular surface metrology, but its measured slope results are sensitive to the depth of sample positioning, which is also called the height-slope ambiguity. The objective of this work is to tackle this height-slope ambiguity problem. The main idea is to introduce collimated camera rays using a telecentric imaging lens and collimated structured-light illumination with a Fourier lens. This setup makes the fringe phases become only sensitive to the surface slopes and insensitive to the depth of the sample positioning. In this way, the slope calculation is theoretically independent of the sample depth. We call this new deflectometry technique Collimated Phase Measuring Deflectometry (CPMD). With our developed CPMD experimental setup, the measurement is insensitive to the depth of sample positioning, e.g., the measured height dispersion is less than 30 nm RMS within a 10 mm depth range when measuring a 50-mm-diameter spherical mirror with a 200 mm radius of curvature. In conclusion, the merits and limitations of the proposed CPMD technique are discussed, revealing its prospects in practical metrology applications and potential future investigations.

36 MATERIALS SCIENCE↗

Assessing laser powder bed fusion system geometric errors through artifact-based methods

Additive manufacturing (AM) machines have developed more rapidly than standardized frameworks needed for the qualification of their geometric capabilities. While some manufacturer-specific methods exist to test capabilities and perform some calibration tasks, standardization efforts have only recently been undertaken in the form of ISO/ASTM 52902. In this study, the recommended methodology prescribed by the standard was implemented by building geometric artifacts with a laser powder bed fusion (LPBF) system and performing dimensional inspection with a coordinate measurement machine (CMM), amongst other methods. Typical dimensional capabilities of the LPBF system are identified and commentary is made on applying metrology methods, detecting geometric error, and diagnosing base causes in the LPBF system. In doing so, favored metrology practices and measurement analysis methods auxiliary to the standard are proposed. Artifact measurements were used to characterize beam positioning error and beam offset error. Methods for decoupling the effects of error sources are proposed. Difficulties in the inspection of AM components are identified, and the effects of various CMM measurement strategies are evaluated. Insights on the application of the new standard are presented, along with commentary as to its fitness for the LPBF process.

Berez, J.↗

Predicting Trends in VOC Through Rapid, Multimodal Characterization of State-of-the-Art p-i-n Perovskite Devices

Perovskite photovoltaic technologies are approaching commercial deployment, yet single junction and tandem architectures both still have significant room to improve power conversion efficiency and stability. The ability to perform rapid screening of material quality after altering processing conditions is critical to accelerating the optimization and commercialization of perovskite-based technologies. Currently, researchers utilize a wide range of stand-alone metrology tools to isolate sources of power loss throughout a device stack, which can be slow and labor intensive. Here, we demonstrate the use of a multimodal metrology approach to rapidly determine the maximum achievable and predicted open circuit voltages of >100 perovskite devices during fabrication. Acquisition of these different data is facilitated by combining them into a single integrated measurement platform. We show that these data and automated analysis can be used to rapidly understand and ultimately predict quantitative trends in open circuit voltages of state-of-the-art device architectures. The data and automated analysis workflow presented provides a reliable approach to quickly identify absorber and charge transport layer combinations that can lead to improved open circuit voltages.

14 SOLAR ENERGY↗

Atomic Precision Processing of Two-Dimensional Materials for Next-Generation Microelectronics

The growth of the information era economy is driving the pursuit of advanced materials for microelectronics, spurred by exploration into “Beyond CMOS” and “More than Moore” paradigms. Atomically thin 2D materials, such as transition metal dichalcogenides (TMDCs), show great potential for next-generation microelectronics due to their properties and defect engineering capabilities. This perspective delves into atomic precision processing (APP) techniques like atomic layer deposition (ALD), epitaxy, atomic layer etching (ALE), and atomic precision advanced manufacturing (APAM) for the fabrication and modification of 2D materials, essential for future semiconductor devices. Additive APP methods like ALD and epitaxy provide precise control over composition, crystallinity, and thickness at the atomic scale, facilitating high-performance device integration. Subtractive APP techniques, such as ALE, focus on atomic-scale etching control for 2D material functionality and manufacturing. In APAM, modification techniques aim at atomic-scale defect control, offering tailored device functions and improved performance. Achieving optimal performance and energy efficiency in 2D material-based microelectronics requires a comprehensive approach encompassing fundamental understanding, process modeling, and high-throughput metrology. Finally, the outlook for APP in 2D materials is promising, with ongoing developments poised to impact manufacturing and fundamental materials science. Integration with advanced metrology and codesign frameworks will accelerate the realization of next-generation microelectronics enabled by 2D materials.

36 MATERIALS SCIENCE↗

Coherent terahertz radiation with 2.8-octave tunability through chip-scale photomixed microresonator optical parametric oscillation

High-spectral-purity frequency-agile room-temperature sources in the terahertz spectrum are foundational elements for imaging, sensing, metrology, and communications. Here we present a chip-scale optical parametric oscillator based on an integrated nonlinear microresonator that provides broadly tunable single-frequency and multi-frequency oscillators in the terahertz regime. Through optical-to-terahertz down-conversion using a plasmonic nanoantenna array, coherent terahertz radiation spanning 2.8-octaves is achieved from 330 GHz to 2.3 THz, with ≈20 GHz cavity-mode-limited frequency tuning step and ≈10 MHz intracavity-mode continuous frequency tuning range at each step. By controlling the microresonator intracavity power and pump-resonance detuning, tunable multi-frequency terahertz oscillators are also realized. Furthermore, by stabilizing the microresonator pump power and wavelength, sub-100 Hz linewidth of the terahertz radiation with 10 –15 residual frequency instability is demonstrated. The room-temperature generation of both single-frequency, frequency-agile terahertz radiation and multi-frequency terahertz oscillators in the chip-scale platform offers unique capabilities in metrology, sensing, imaging and communications.

42 ENGINEERING↗