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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 163 records · Page 9
All sourcesNASA NTRSDOE OSTI
NASA NTRS1949

On the Motions of an Oscillating System Under the Influence of Flip-Flop Controls

So-called flip-flop controls (also called "on-off-course controls") are frequently preferred to continuous controls because of their simple construction. Thus they are used also for the steering control of airplanes. Such a body possesses-even if one thinks, for instance, only of the symmetric longitudinal motion - three degrees of freedom so that a study of its motions under the influence of an intermittent control is at least lengthy. Thus, it is suggested that an investigation of the basic effect of such a control first be made on a system with one degree of freedom. Furthermore, we limit ourselves in the resent report to the investigation of an "ideal" control where the control surface immediately obeys the command given by the "steering control function". Thus the oscillation properties of the control surface and the defects in linkage, sensing element, and mixing device are, at first, neglected. As long as the deviations from the "ideal" control may be neglected in practice, also the motion of the control surface takes place at the heat of the motion of the principal system. The aim of our investigation is to obtain a survey of the influence of the system and control coefficients on the damping behavior which is to be attained.

Fluegge-Lotz, I.↗
NASA NTRS1986

Nondestructive Evaluation (NDE) of structural ceramics by photoacoustic microscopy

Photoacoustic microscopy (PAM) was utilized to detect surface and subsurface defects in structural ceramic materials. A computerized PAM data acquisition, color imaging and analysis system was developed and used. Subsurface simulated cylindrical holes can be detected to about 1 mm below the interrograting surface. Simulated tight surface cracks of 96 microns length and 48 microns depth can be detected in these materials under optimum conditions.

Khandelwal, P. K.↗
NASA NTRS1991

The magnitude of the magnetic field near the surface of a high-T(sub c) superconductor with a trapped flux

In 1986, much excitement was caused by the discovery of a class of materials that conducted electricity with zero resistance at temperatures above the boiling temperature of liquid nitrogen. This excitement was checked by the difficulties of manufacturing ceramics and the usefulness of high temperature superconductors that were restricted by their becoming high resistive conductors at small current densities. A lack of pinning of the magnetic field flux caused the return of high resistance as the current was increased in these materials. A study of the magnetic field near the surface of a high temperature superconductor is the first step in the search for a means of pinning the flux lines and increasing their critical current densities. The author found that a comparison between the defects in the surface of the superconductor and the magnetic field showed only a change in the field near the notch and the edge. No correlation was found between the surface grain or structure and the oscillations in the magnetic field. The observed changes in the magnetic field show resonances which may give an indication of the non-flux pinning in these superconductors. A flux pinning mechanism will increase the critical current densities; therefore, other methods of determining this field should be tried. The author proposes using a flux gate magnetometer with a detector wound on a ferrite core to measure the magnitude and direction of the magnetic field.

Overcash, Dan R.↗
NASA NTRS1992

Mach 6 electroformed nickel nozzle refurbishment: FNAS investigation of ultra-smooth surfaces

The task objective has been to apply a coating of nickel-phosphorous alloy to a laminar flow wind tunnel nozzle by catalytic deposition and then polish and inspect the inside surface using optical device processes. The surface of the nozzle was coated with a nickel-phosphorous alloy of sufficient hardness and corrosion resistance to improve the durability. Due to plating defects that were clearly process related and not inherent, the final polished part was less than the desired quality. Surface finishing processes and lapping media were identified which produced a submicron surface finish on the interior plated surface. Defects apparently manifested by the first plating attempt were repaired using a small brush plating process demonstrating that individual small defects can be repaired. Measurement and analysis by profilometry demonstrated that quantitative control of the surface can be achieved.

Rood, Robert↗
NASA NTRSDate not supplied

Simulation of Oxidative Etch Pit Formation and Growth on FiberForm

Erosion of carbon surfaces due to oxidation does not occur uniformly but through the formation of localized etch pits because of active surface sites. These active sites are formed due to the presence of atomic defects on the carbon surface and have much higher reactivity compared to average non-defective sites. Thus, these active sites are the first to react during ablation, resulting in their removal. This causes all the neighboring atoms to be defective, and increasing their reactivity, thus leading to localized carbon removal around these “active” sites. In this manner, these highly reactive defects serve as nucleation sites for the formation and growth of etch pits, with detrimental effects on the structural integrity. In order to understand the influence of these etch pits on the material properties of carbon fiber microstructures, we have developed a new capability within direct simulation Monte Carlo (DSMC) to capture the etch pit formation process. This capability is developed within the DSMC code SPARTA (Stochastic PArallel Rarefied-gas Time-accurate Analyzer) and can model the material removal in the presence of active sites leading to the formation of etch pits. The focus of the current work will be to study the effect of etch pits on the material properties of FiberForm, the precursor substrate of the PICA Thermal Protection System (TPS) material. The microstructure of virgin FiberForm obtained directly from X-ray microtomography scans is used within SPARTA to obtain the ablated geometries with etch pits. These pitted microstructures are then imported into the Porous Microstructure Analysis (PuMA) software and various material properties such as thermal conductivity, elasticity, and permeability are computed. The variation of these properties because of the complex evolution of the surface topology due to the formation of etch pits is studied and analyzed. Furthermore, the effect of pitting is compared to the case of uniform radial shrinking of fibers, which has been the standard for modelling ablation of carbon structures, and significant differences are observed. Thus, a physically realistic model of material removal through the formation of etch pits will be helpful in predicting the degradation of carbon-based TPS more accurately during oxidation; as well as other mechanisms such as spallation, which involves the removal of chunks of material into the flow due to the growth of etch pits. This will ultimately improve our understanding of the failure modes in these materials due to ablation.

DSMC↗
NASA NTRSDate not supplied

Simulation of Oxidative Etch Pit Formation and Growth on FiberForm

Erosion of carbon surfaces due to oxidation does not occur uniformly but through the formation of localized etch pits because of active surface sites. These active sites are formed due to the presence of atomic defects on the carbon surface and have much higher reactivity compared to average non-defective sites. Thus, these active sites are the first to react during ablation, resulting in their removal. This causes all the neighboring atoms to be defective, and increasing their reactivity, thus leading to localized carbon removal around these “active” sites. In this manner, these highly reactive defects serve as nucleation sites for the formation and growth of etch pits, with detrimental effects on the structural integrity. In order to understand the influence of these etch pits on the material properties of carbon fiber microstructures, we have developed a new capability within direct simulation Monte Carlo (DSMC) to capture the etch pit formation process. This capability is developed within the DSMC code SPARTA (Stochastic PArallel Rarefied-gas Time-accurate Analyzer) and can model the material removal in the presence of active sites leading to the formation of etch pits. The focus of the current work will be to study the effect of etch pits on the material properties of FiberForm, the precursor substrate of the PICA Thermal Protection System (TPS) material. The microstructure of virgin FiberForm obtained directly from X-ray microtomography scans is used within SPARTA to obtain the ablated geometries with etch pits. These pitted microstructures are then imported into the Porous Microstructure Analysis (PuMA) software and various material properties such as thermal conductivity, elasticity, and permeability are computed. The variation of these properties because of the complex evolution of the surface topology due to the formation of etch pits is studied and analyzed. Furthermore, the effect of pitting is compared to the case of uniform radial shrinking of fibers, which has been the standard for modelling ablation of carbon structures, and significant differences are observed. Thus, a physically realistic model of material removal through the formation of etch pits will be helpful in predicting the degradation of carbon-based TPS more accurately during oxidation; as well as other mechanisms such as spallation, which involves the removal of chunks of material into the flow due to the growth of etch pits. This will ultimately improve our understanding of the failure modes in these materials due to ablation.

DSMC↗
NASA NTRSDate not supplied

Computational Study of Oxidative Etch Pitting in FiberForm and the Effect on Its Material Properties

Erosion of carbon due to oxidation does not occur uniformly but through the formation of localized etch pits because of active surface sites. These active sites are formed due to the presence of atomic defects on the carbon surface, and have much higher reactivity compared to average non-defective sites. Thus, these active sites are first to react during ablation, resulting in their removal. This causes all the neighboring atoms to be defective and increase their reactivity, thus leading to the localized carbon removal around these “active” sites. In this manner, these highly reactive defective sites serve as nucleation sites for the formation and growth of etch pits with potentially detrimental effects on the structural integrity. In order to understand the influence of these etch pits on the material properties of carbon fiber microstructures, we have developed a new capability within direct simulation Monte Carlo (DSMC) to capture the etch pit formation process. This capability is developed within the DSMC code SPARTA (Stochastic PArallel Rarefied-gas Time-accurate Analyzer) and can model the material removal in presence of active sites leading to the formation of etch pits. The focus of the current work will be to study the effect of etch pits on the material properties of FiberForm, a commonly used base material within many thermal protection system materials (TPS). The microstructure of virgin FiberForm obtained directly from X-ray microtomography experiments is used within SPARTA to obtain the ablated geometries with etch pits. These pitted microstructures are then imported within the Porous Microstructure Analysis (PuMA) software and various material properties such as elasticity, thermal conductivity, and permeability are computed. The variation of these properties as a result of the complex evolution of the surface topology due to etch pit formation is studied and analyzed. Furthermore, the effect of pitting is compared to the case of shrinking fibers, which has been the standard for modelling ablation of carbon structures; and significant differences are observed. Thus, such a physically realistic modeling of material removal through the formation of etch pits will be helpful in predicting the degradation of carbon-based TPS more accurately during oxidation; as well as other mechanisms such as spallation, which involves the removal of chunks of material into the flow due to etch pit growth. This will ultimately improve our understanding of the failure modes in these materials due to ablation.

Carbon Ablators↗
NASA NTRSDate not supplied

Computational Study of Oxidative Etch Pitting in FiberForm and the Effect on Its Material Properties

Erosion of carbon due to oxidation does not occur uniformly but through the formation of localized etch pits because of active surface sites. These active sites are formed due to the presence of atomic defects on the carbon surface, and have much higher reactivity compared to average non-defective sites. Thus, these active sites are first to react during ablation, resulting in their removal. This causes all the neighboring atoms to be defective and increase their reactivity, thus leading to the localized carbon removal around these “active” sites. In this manner, these highly reactive defective sites serve as nucleation sites for the formation and growth of etch pits with potentially detrimental effects on the structural integrity. In order to understand the influence of these etch pits on the material properties of carbon fiber microstructures, we have developed a new capability within direct simulation Monte Carlo (DSMC) to capture the etch pit formation process. This capability is developed within the DSMC code SPARTA (Stochastic PArallel Rarefied-gas Time-accurate Analyzer) and can model the material removal in presence of active sites leading to the formation of etch pits. The focus of the current work will be to study the effect of etch pits on the material properties of FiberForm, a commonly used base material within many thermal protection system materials (TPS). The microstructure of virgin FiberForm obtained directly from X-ray microtomography experiments is used within SPARTA to obtain the ablated geometries with etch pits. These pitted microstructures are then imported within the Porous Microstructure Analysis (PuMA) software and various material properties such as elasticity, thermal conductivity, and permeability are computed. The variation of these properties as a result of the complex evolution of the surface topology due to etch pit formation is studied and analyzed. Furthermore, the effect of pitting is compared to the case of shrinking fibers, which has been the standard for modelling ablation of carbon structures; and significant differences are observed. Thus, such a physically realistic modeling of material removal through the formation of etch pits will be helpful in predicting the degradation of carbon-based TPS more accurately during oxidation; as well as other mechanisms such as spallation, which involves the removal of chunks of material into the flow due to etch pit growth. This will ultimately improve our understanding of the failure modes in these materials due to ablation.

Carbon Ablators↗
NASA NTRS1999

Mechanical Properties of Friction Stir Welds in A12195-T8

An extensive study of the mechanical properties of friction stir welded Al-Li 2195 has been conducted by Lockheed Martin Michoud Space Systems under contract to NASA. The study was part of a development program in which weld parameters were defined for using FSW to assemble large-scale aluminum cryogenic tanks. In excess of 300 feet of 0.320 in. gage plate material was welded and tested. The tests include room temperature and cryogenic temperature tensile tests and surface crack tension (SCT) tests, nondestructive evaluation, metallurgical studies, and photostress analysis. The results of the testing demonstrated improved mechanical properties with FSW as compared to typical fusion welding processes. Increases in ultimate tensile strength, cryogenic enhancement and elongation were observed with the tensile test results. Increased fracture toughness was observed with the SCT results. Nondestructive evaluations were conducted on all welded Joints. No volumetric defects were indicated. Surface indications on the root side of the welds did not significantly affect weld strength. The results of the nondestructive evaluations were confirmed via metallurgical studies. Photostress analysis revealed strain concentrations in multi-pass and heat-repaired FSW's. Details of the tests and results are presented.

Kinchen, David G.↗
NASA NTRS1996

Silicon Carbide Epitaxial Films Studied by Atomic Force Microscopy

Silicon carbide (SiC) holds great potential as an electronic material because of its wide band gap energy, high breakdown electric field, thermal stability, and resistance to radiation damage. Possible aerospace applications of high-temperature, high-power, or high-radiation SiC electronic devices include sensors, control electronics, and power electronics that can operate at temperatures up to 600 C and beyond. Commercially available SiC devices now include blue light-emitting diodes (LED's) and high-voltage diodes for operation up to 350 C, with other devices under development. At present, morphological defects in epitaxially grown SiC films limit their use in device applications. Research geared toward reducing the number of structural inhomogeneities can benefit from an understanding of the type and nature of problems that cause defects. The Atomic Force Microscope (AFM) has proven to be a useful tool in characterizing defects present on the surface of SiC epitaxial films. The in-house High-Temperature Integrated Electronics and Sensors (HTIES) Program at the NASA Lewis Research Center not only extended the dopant concentration range achievable in epitaxial SiC films, but it reduced the concentration of some types of defects. Advanced structural characterization using the AFM was warranted to identify the type and structure of the remaining film defects and morphological inhomogeneities. The AFM can give quantitative information on surface topography down to molecular scales. Acquired, in part, in support of the Advanced High Temperature Engine Materials Technology Program (HITEMP), the AFM had been used previously to detect partial fiber debonding in composite material cross sections. Atomic force microscopy examination of epitaxial SiC film surfaces revealed molecular-scale details of some unwanted surface features. Growth pits propagating from defects in the substrate, and hillocks due, presumably, to existing screw dislocations in the substrates, were imaged. Away from local defects, step bunching was observed to yield step heights of hundreds of angstroms, with possible implications for the uniformity of dopants incorporated in SiC devices during fabrication. The quantitative topographic data from the AFM allow the relevant defect information to be extracted, such as the size and distribution of step bunching and the Burgers vector of screw dislocations. These atomic force microscopy results have furthered the understanding of the dynamic epitaxial SiC growth process. A model describing the observed hillock step bunching has been proposed. This cooperation between researchers involved in crystal growth, electronic device fabrication, and surface structural characterization is likely to continue as atomic force microscopy is used to improve SiC films for high-temperature electronic devices for NASA's advanced turbine engines and space power devices, as well as for future applications in the automotive industry.

Source record↗
NASA NTRS1974

Microcircuit failure analysis using the SEM

The scanning electron microscope adds a new dimension to the knowledge that can be obtained from a failed microcircuit. When used with conventional techniques, SEM assists and clarifies the analysis, but it does not replace light microscopy. The most advantageous features for microcircuit analysis are long working distances and great depth of field. Manufacturer related failure modes of microcircuits are metallization defects, poor bonding, surface and particle contamination, and design and fabrication faults. User related failure modes are caused by abuse, such as overstress. The Physics of Failure Procedure followed by the Astrionics Laboratory in failure analysis is described, which is designed to obtain maximum information available from each step.

Nicolas, D. P.↗
NASA NTRS1980

Status of JPL'S experience with thin 7809 glass for solar energy applications

A shipment of advanced, high transmittance glass for solar thermal power applications is assessed. Results of both mirror and glass inspection are reported. Surface and bulk defects are identified as well as the number broken or chipped during shipment and handling. Of the panels received, the thicker 1.5 mm (0.060 in.) glass exhibited a smaller breakage rate than the thin 1.0 mm (0.040 in.) panels.

Bouquet, F.↗
NASA NTRS1986

Physics through the 1990s: Condensed-matter physics

The volume presents the current status of condensed-matter physics from developments since the 1970s to opportunities in the 1990s. Topics include electronic structure, vibrational properties, critical phenomena and phase transitions, magnetism, semiconductors, defects and diffusion, surfaces and interfaces, low-temperature physics, liquid-state physics, polymers, nonlinear dynamics, instabilities, and chaos. Appendices cover the connections between condensed-matter physics and applications of national interest, new experimental techniques and materials, laser spectroscopy, and national facilities for condensed-matter physics research. The needs of the research community regarding support for individual researchers and for national facilities are presented, as are recommendations for improved government-academic-industrial relations.

Source record↗
NASA NTRS1995

Revolving Eddy-Current Probe Detects Cracks Near Rivets

Scanning eddy-current probe in circular pattern increases sensitivity with which probe indicates fatigue cracks and other defects in metal surfaces in vicinity of rivets. Technique devised to facilitate inspection of riveted joints in aircraft. Eddy-current probe in question described in "Electro-magnetic Flaw Detector Is Easier To Use" (LAR-15046).

Namkung, Min↗
NASA NTRS2004

Development of an Optical-Real Time Polarimetric Imaging System for Aerospace Applications

The design of an optical polarimetric imaging system, aimed to detect cracks or structural defects on the surface of rotating aircraft engine shafts, is presented. The experimental results have been processed by a real time wavelet denouncing system implemented by a Filed Programmable Gate Arrays (FPGA), which has been designed for this purpose. The experimental results clearly indicate that high signal-to-noise ratio signals can be obtained.

Giakos, George C.↗
NASA NTRS2008

MISSE Results Used for RF Plasma Ground Testing-To-Space-Exposure Correlation for Coated Kapton

The ability to predict the durability of materials in the low Earth orbit (LEO) environment by exposing them in ground-based facilities is important because one can achieve test results sooner, expose more types of materials, and do it much more cost effectively than to test them in flight. However, flight experiments to determine the durability of groups or classes of materials that behave similarly are needed in order to provide correlations of how much time in ground-based facilities represents certain durations in LEO for the material type of interest. An experiment was designed and flown on the Materials International Space Station Experiment (MISSE) 2 (3.95 yr in LEO) and MISSE 4 (1.04 yr in LEO) in order to develop this type of correlation between ground-based RF plasma exposure and LEO exposure for coated Kapton. The experiment consisted of a sample of Kapton H (DuPont) polyimide coated with 1300 of silicon dioxide by Sheldahl, Inc. The samples were exposed to atomic oxygen in a radio frequency (RF) generated atomic oxygen plasma. Mass change was measured for the samples and then the same samples were exposed in flight on MISSE and the mass change was again recorded post-flight. After documentation, the samples were exposed again in the ground-based RF plasma in order to determine if the erosion would be the same as it had been in the same facility pre-flight which would indicate whether or not the sample had been damaged during flight and if the defects on the surface were those that were there preflight. The slopes of the mass change versus fluence plots were then used to develop a correlation factor that can be used to help predict the durability of coated Kapton in ground-based isotropic atomic oxygen plasma systems. This paper describes the experiment and presents the correlation factor results.

Miller, Sharon K. R.↗
NASA NTRS1989

Deformation and fracture of single-crystal and sintered polycrystalline silicon carbide produced by cavitation

An investigation was conducted to examine the deformation and fracture behavior of single-crystal and sintered polycrystalline SiC surfaces exposed to cavitation. Cavitation erosion experiments were conducted in distilled water at 25 C by using a magnetostrictive oscillator in close proximity (1 mm) to the surface of SiC. The horn frequency was 20 kHz, and the double amplitude of the vibrating disk was 50 microns. The results of the investigation indicate that the SiC (0001) surface could be deformed in a plastic manner during cavitation. Dislocation etch pits were formed when the surface was chemically etched. The number of defects, including dislocations in SiC (0001) surface, increased with increasing exposure time to cavitation. The presence of intrinsic defects such as voids in the surficial layers of the sintered polycrystalline SiC determined the zones at which fractured grains and fracture pits (pores) were generated. Single-crystal SiC had superior erosion resistance to that of sintered polycrystalline SiC.

Miyoshi, Kazuhisa↗