Fractal nature structure reconstruction method in designing microstructure properties
Highlights: • Structure and material’s properties, within the material’s consolidation triad: Synthesis – Structure – Properties. • The grain prediction methods is based on the measurements of the solid Euclidean geometric fractal characteristics. • The intergranular contacts inside the BaTiO3 -ceramic are responsible for intergranular capacities. • The inner complex geometry of intergrain contacts imposes fractal correction factor for permeability. - Abstract: In the process of predicting materials properties, it is necessary to predict microstructures. This is important for ceramic materials, for the purpose of miniaturization and for a higher level of integration. Although the method of material structure reconstruction is for the first time used on BaTiO{sub 3}-ceramics by these authors, it can also be used for silicate, refractory and other ceramics, and, for any powder-based material. The reconstruction is based on the grain perimeter fractal analysis and the Richardson method. The main contribution of this paper is establishing the relationship between the electronic properties of BaTiO{sub 3}-ceramics and its microstructural fractal nature. Similar relations can be used for any ceramics or even any materials. The samples consolidation includes both powder pressing (cold sintering phase) and sintering in a furnace (hot sintering phase). The fractal nature characterization has a very important role from the powder phase up to the final microstructure, through which structures it directly impacts electro-physical and other ceramics properties. Thereby, the new possibilities in the microstructure characterization applications are directly introduced to an engineering system, providing the new solutions related to computer aided support. This creates new industrial production and application possibilities, especially in the process of ceramics material consolidation, now based on microstructural properties, which is providing a basis for “fractal electronics’’ development.