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Acceleration stress-induced changes in fat metabolism, level of circulating glucose and corticosterone level in rats
The results of accelerated stress testing of four different types of silicon terrestrial solar cells are discussed. The accelerated stress tests used included bias-temperature tests, bias-temperature-humidity tests, thermal cycle and thermal shock tests, and power cycle tests. Characterization of the cells was performed before stress testing and at periodic down-times, using electrical measurement, visual inspection, and metal adherence pull tests. Electrical parameters measured included short-circuit current, open circuit voltage, and output power, voltage, and current at the maximum power point. Incorporated in the report are the distributions of the prestress electrical data for all cell types. Data were also obtained on cell series and shunt resistance.
Hematological criteria of chronic acceleration stress and adaptation
Acceleration stress effects on pilot performance and dynamic response
Acceleration stress effects on pilot performance and dynamic response
Age effect on liver glycogenesis in rats exposed to acceleration stress
A TIME-HONORED system of recording medical histories and the data obtained on physical and laboratory examination has been that of writing the information on record sheets that go into a folder for each patient. In order to have information which would be more readily retrieved, 'a program was initiated in 1952 by the U. S. Naval School of Aviation Medicine in connection with their "Care of the Flyer" study to place this information on machine record cards. In 1958, a machine record card method was developed for recording medical data in connection with the astronaut selection program. Machine record cards were also developed by the Aero Medical Laboratory, Wright-Patterson AFB, Ohio, and the Aviation Medical Acceleration Laboratory, Naval Air Development Center, Johnsville, Pennsylvania, for use in connection with a variety of tests including acceleration stress.1 Therefore, a variety of systems resulted in which data of a medical nature could easily be recalled. During the NASA, Ames Research Center centrifuge studies/'S the pilot subjects were interviewed after each centrifuge run, or series of runs, and subjective information was recorded in a log book by the usual history taking methods referred to above. After the methods Were reviewed, it' was recognized that a card system would be very useful in recording data from our pilots after they had been exposed to acceleration stress. Since the acceleration stress cards already developed did not meet our requirements, it was decided a different card was needed.
The accelerated stress test results obtained on all terrestrial solar cells since the inception of the program are summarized. Tested cells were grouped according to the method used to form the conductive metallization layer: solder dipped, vacuum deposited, screen printed, and copper plated. Although metallization systems within each group were quite similar, they differed in numerous details according to the procedures employed by each manufacturer. Test results were summarized for all cells according to both electrical degradation and catastrophic mechanical changes. These results indicated a variability within each metallization category which was dependent on the manufacturer. Only one manufacturer was represented in the copper plated category and, although these showed no signs of detrimental copper diffusion during high temperature testing, their metallization was removed easily during high humidity pressure cooker testing. Preliminary testing of encapsulated cells showed no major differences between encapsulated and unencapsulated cells when subjected to accelerated testing.
Gust induced and maneuvering acceleration stress effect on pilot-vehicle performance during extended periods of low level high speed flight
Hematological criteria of chronic acceleration stress and adaptation
A program to investigate the reliability characteristics of unencapsulated low-cost terrestrial solar cells using accelerated stress testing is described. Reliability (or parametric degradation) factors appropriate to the cell technologies and use conditions were studied and a series of accelerated stress tests was synthesized. An electrical measurement procedure and a data analysis and management system was derived, and stress test fixturing and material flow procedures were set up after consideration was given to the number of cells to be stress tested and measured and the nature of the information to be obtained from the process. Selected results and conclusions are presented.
Acetate conversion to lipids and carbon dioxide by exposure of rat liver to acceleration stress
Piloted motion simulator study of gust induced and maneuvering acceleration stress on pilot performance in low level mission
Three tasks were undertaken to investigate reliability attributes of terrestrial solar cells: (1) a study of the electrical behavior of cells in the second (reverse) quadrant; (2) the accelerated stress testing of three new state-of-the-art cells; and (3) the continued bias-temperature testing of four block 2 type silicon cells at 78 C and 135 C. Electrical characteristics measured in the second quadrant were determined to be a function of the cell's thermal behavior with breakdown depending on the initiation of localized heating. This implied that high breakdown cells may be more fault tolerant when forced to operate in the second quadrant, a result contrary to conventional thinking. The accelerated stress tests used in the first (power) quadrant were bias-temperature, bias-temperature-humidity, temperature-humidity, thermal shock, and thermal cycle. The new type cells measured included an EFG cell, a polycrystalline cell, and a Czochralski cell. Significant differences in the response to the various tests were observed between cell types. A microprocessed controlled, short interval solar cell tester was designed and construction initiated on a prototype.
Mark sense record cards for recording medical data on pilots subjected to acceleration stress
A technique for performing accelerated stress tests of large-area thin a-Si solar cells is presented. A computer-controlled short-interval test system employing low-cost ac-powered ELH illumination and a simulated a-Si reference cell (seven individually bandpass-filtered zero-biased crystalline PIN photodiodes) calibrated to the response of an a-Si control cell is described and illustrated with flow diagrams, drawings, and graphs. Preliminary results indicate that while most tests of a program developed for c-Si cells are applicable to a-Si cells, spurious degradation may appear in a-Si cells tested at temperatures above 130 C.
Results obtained include the definition of a simplified stress test schedule for terrestrial solar cells based on the work performed during the first program year, and the design and fabrication of improved jigs and fixtures for electrical measurement and stress testing. Implementation of these advanced techniques for accelerated stress testing is underway on three solar cell types. In addition, review of the literature on second quadrant phenomena was begun and some preliminary second-quadrant electrical measurements were performed. Results obtained at the first down time for 75 C B-T testing and biased and unbiased T-H pressure cooker testing of type F cells showed little or no degradation in electrical parameters. Significant physical effects (large solder bubbles) were noted for type F cells subjected to the pressure cooker stress test.
Abdominal blood flow changes in anesthetized dogs during acceleration stress measured by hydrogen electrode technique