A simple wire-coil resistive heater for high temperature radial x-ray diffraction in a diamond anvil cell
Diamond anvil cells are commonly used at synchrotron x-ray diffraction beamlines to study structural and thermoelastic properties of materials at high pressures. In a radial geometry, where the x-ray probe is oriented perpendicular to the axis of force, the deformation and strength of materials can be measured in situ. Because the anelastic and failure properties of materials depend strongly on temperature, many applications would benefit from the ability to measure high pressure radial diffraction in elevated and accurately controlled thermal environments. Previous work to introduce high temperature to radial diamond anvil cells has been largely limited to laser heating, with relatively scant efforts to resistively heat the sample. Here, we report a relatively straightforward adaptation of a simple wire coil heater, with in situ high-temperature radial diffraction performed on tungsten carbide up to 573 K at beamline 12.2.2 of the Advanced Light Source. In conclusion, the results demonstrate that the differential stress supported by WC decreases with increasing temperature: the differential stress on the basal (001) and pyramidal (101) planes decreased 6.6% and 5.5%, respectively, while the (100) plane only saw a 2.7% decrease, in agreement with previous studies.