Graphene as a protective coating and superior lubricant for electrical contacts
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Nanoscale electrical contacts, especially those between materials of dissimilar electronic properties, often represent one of the main causes of drops in energy transfer efficiency. They are also among the sources of above-threshold noise, and their performance often decreases over the lifetime of the nanodevices. Scale-down limitations from mesoscopic to nanoscale devices, and likewise, of nanoscale to quantum-scale devices are also impeded by contacts’ quality. Making more reliable, energy-efficient electrical contacts is among the goals of the nanoelectronics research within the framework of energy-efficient electronic systems. This report focuses on the design, nanofabrication, and testing of novel shapes of electrical contacts. Lithography and nanofabrication were utilized to mimic the approximate shape of insect setae for mesoscale contacts design. The contacts are tested for elementary charge transport via I–V curves and for the broadband, 1/f noise. Tests show that contacts design leads to a measurable decrease in the energy necessary to operate a contact as a switch by at least 12–20%, depending on temperature, while broadband noise shows measurably lower power spectra, for bio-inspired contacts. The proposed method is open to modifications and improvements as required by various on-chip applications.
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The electrical contact is an important phenomenon that should be given into consideration to achieve better performance and long term reliability for the design of devices. Based upon this importance, the electrical contact interface has been visualized as a “3D Contact Map” and used in order to investigate the contact asperities. The contact asperities describe the structures above and below the contact spots (the contact spots define the 3D contact map) to the two conductors which make the contact system. The contact asperities require the discretization of the 3D microstructures of the contact system into voxels. A contact analysis approach has been developed and introduced in this paper which shows the way to the 3D visualization of the contact asperities of a given contact system. For the discretization of 3D microstructure of contact system into voxels, X-ray Computed Tomography (CT) method is used in order to collect the data of a 250 V, 16 A rated AC single pole rocker switch which is used as a contact system for investigation.
Dependence of electric contact reliability on operating conditions of circuit and load parameters
Prediction of electrical and thermal contact resistance for pressed, nominally flat contacts is complicated by the large number of variables which influence contact formation. This is reflected in experimental results as a wide variation in contact resistances, spanning up to six orders of magnitude. A series of experiments were performed to observe the effects of oxidation and surface roughness on contact resistance. Electrical contact resistance and thermal contact conductance from 4 to 290 K on OFHC Cu contacts are reported. Electrical contact resistance was measured with a 4-wire DC technique. Thermal contact conductance was determined by steady-state longitudinal heat flow. Corrections for the bulk contribution ot the overall measured resistance were made, with the remaining resistance due solely to the presence of the contact.
Technologies pertaining to a rotary electrical contact device are described herein. A rotary electrical contact device comprises a first sheave that is disposed about a first axis and a second sheave that rotates about the first axis or a second axis that is parallel to the first axis. The device further includes two planetary sheaves that revolve around the first and second sheaves, and a belt that makes contact with each of the sheaves, the belt having an aspect ratio great than 1:1. As the first sheave rotates, the planetary sheaves revolve about the first and second sheaves and cause the belt to deform and roll along the second sheave. The belt makes rolling contact with the four sheaves. The belt comprises electrically conductive components arranged such that as the belt rolls along the sheaves, the belt maintains electrical contact between the first sheave and the second sheave.
Technologies pertaining to a rotary electrical contact device are described herein. A rotary electrical contact device comprises a first sheave that is disposed about a first axis and a second sheave that rotates about the first axis or a second axis that is parallel to the first axis. The device further includes two planetary sheaves that revolve around the first and second sheaves, and a belt that makes contact with each of the sheaves, the belt comprising a co-wound inner helical coil and outer helical coil. As the first sheave rotates, the planetary sheaves revolve about the first and second sheaves and cause the belt to deform and roll along the second sheave. The belt makes rolling contact with the four sheaves. The belt is electrically conductive such that as the belt rolls along the sheaves, the belt maintains electrical contact between the first sheave and the second sheave.
The parts of an electrical contact device are treated by sputter etching to remove the parent metal oxide. Prior to exposure of the electrodes to any oxygen, a sacrificial metal is sputter deposited on the parts. Preferably this sacrificial metal is one that oxidizes slowly and is readily dissolved by the liquid metal. The sacrificial metal may then be removed from unwanted areas. The remainder of the ring and the probe to be wet by the liquid metal are submerged in the liquid metal or the liquid metal is flushed over these areas, preferably while they are being slightly abraded, unitl all the sacrificial material on these portions is wet by the liquid metal. In doing so the liquid metal dissolves the sacrificial metal and permanently wets the parent metal. Preferred materials used in the process and for the electrodes of electrical contact devices are high purity (99.0%) nickel or AISI type 304 stainless steel for the electrical contact devices, gallium as the liquid metal, and gold as the sacrificial material.
The tunneling current through an atomic force microscopy (AFM) tip is used to evaluate the effective electrical contact area, which exists between tip and sample in contact-AFM electrical measurements. A simple procedure for the evaluation of the effective electrical contact area is described using conductive atomic force microscopy (C-AFM) in combination with a thin dielectric. We characterize the electrical contact area for coated metal and doped-diamond tips operated at low force (<200 nN) in contact mode. In both cases, we observe that only a small fraction (<10 nm{sup 2}) of the physical contact (∼100 nm{sup 2}) is effectively contributing to the transport phenomena. Assuming this reduced area is confined to the central area of the physical contact, these results explain the sub-10 nm electrical resolution observed in C-AFM measurements.
Ion beam modification of noble metal electrical contact coatings can achieve suitable friction and wear behavior with inherently stable low ECR. For example, this method of producing Au electrical contact coatings can produce wear properties similar to electroplated hard Au, but without the environmental concerns due to stringent OSHA regulations on the use and disposal of toxic chemicals associated with Au electroplating baths. Integration of physical vapor deposition techniques with ion implantation can produce noble metal coatings with surfaces modified to achieve the desired balance between adhesion/friction/wear and electrical contact resistance on a commercial scale.
Low speed Ga lubricated sliding electrical contacts of Be in vacuum, discussing Ga film role in friction and contact resistance
Electrical contact to low-dimensional (low-D) materials is a key to their electronic applications. Traditional metal contacts to low-D semiconductors typically create gap states that can pin the Fermi level (E F ). Yet, low-D metals possessing a limited density of states at E F can enable gate-tunable work functions and contact barriers. Furthermore, a seamless contact with native bonds at the interface, without localized interfacial states, can serve as an optimal electrode. To realize such a seamless contact, one needs to develop atomically precise heterojunctions from the atom up. In this work, we demonstrate an all-carbon staircase contact to ultranarrow armchair graphene nanoribbons (aGNRs). The coherent heterostructures of width-variable aGNRs, consisting of 7, 14, 21, and up to 56 carbon atoms across the width, are synthesized by a surface-assisted self-assembly process with a single molecular precursor. The aGNRs exhibit characteristic vibrational modes in Raman spectroscopy. A combined scanning tunneling microscopy and density functional theory study reveals the native covalent-bond nature and quasi-metallic contact characteristics of the interfaces. Our electronic measurements of such seamless GNR staircase constitute a promising first step toward making low resistance contacts.
The present invention relates to monolithic structures for use as an electrical contact. In particular, these structures are formed from a laminate alloy, which in turn is composed of a M.sub.n+1AX.sub.n compound. Electrical contact assemblies and electrical components having such contacts are also described herein. In some example, such monolithic structures display increased wear resistance, which is useful for sliding electrical contacts.
In a planar solid oxide fuel cell (SOFC) stack, a number of individual cells are stacked together to increase the voltage and power output. At both the cathode– and anode–interconnect interfaces, electrical contact layers are applied between the interconnect and electrodes during cell fabrication process or stack assembly to increase the electrode-interconnect contact area and to compensate for dimensional tolerance variation of the contacting components, thus minimizing ohmic contact resistance throughout the stack. As such, electrical contact is an essential component in SOFC stacks. In this paper, we review the cathode-side electrical contact design and contact materials for application in SOFC stacks. Following an introduction of the function and working principles of electrical contact, the material requirements for cathode-side contact layer in SOFC stacks are outlined. Additionally, the current materials for the cathode–interconnect contact are thoroughly reviewed, including noble metals, conductive ceramics (e.g. perovskites and spinels), composites, and other more complex structures. Several potential directions for cathode–interconnect contact material research and development are also highlighted.
Reducing friction and contact resistance of sliding electrical contacts of beryllium by gallium lubrication in vacuum
Fretting of mated electronic connectors may be due to extreme increase in contact resistance. We present a detailed analysis of contact resistance by fretting experiments using brass alloys/copper contact pairs. The relationship between wear mechanisms and contact resistance was determined. The influence of fundamental factors such as normal load, displacement amplitude, and current on contact resistance change was also evaluated. It was found out that displacement amplitude, normal load, and current are important parameters for infinite lifetime or stable electrical resistance during fretting condition. Influence of displacement amplitude on the electrical contact performance might be affected by wear debris in the contact area. Electric contact performance could be improved by increasing the power current, which could break down the thick oxide film formed. The predicted working lifetime and reliability requirements of the connector were determined to optimize and extend the service life under the working condition.
Welding of electric contacts at high currents - selection of electrode materials for erosion resistance