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Results for “ELECTRON ATTACHMENT”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 19 records
All sourcesNASA NTRSDOE OSTI
DOE OSTI2019

Electron Attachment and Electron Ionization of Formic Acid Clusters Embedded in Helium Nanodroplets

We report the results of an experimental study of electron ionization of large helium nanodroplets doped with formic acid (FA). Several homologous series of cluster anions are observed, including [FA{sub n}-H]{sup −}, undissociated FA{sub n}{sup −}, and these ions complexed with one or more H{sub 2}O. Some major features resemble those observed upon sputtering of frozen FA films but they differ significantly from results obtained by electron attachment to bare FA clusters in the gas phase. The FA{sub n}{sup −} and (H{sub 2}O)[FA{sub n}-H]{sup −} series show abrupt onsets above n = 2 and 5, respectively. A prominent resonance in the anion yield occurs at 22.5 eV due to the formation of an intermediate He{sup −*}. Also observed are homologous series of [FA-H]{sup −} or [FA{sub 2}-H]{sup −} complexed with helium. The cation chemistry is dominated by the production of protonated formic acid clusters, [FA{sub n}H]{sup +}, but various other homologous cluster ion series are observed as well. .

77 NANOSCIENCE AND NANOTECHNOLOGY↗
DOE OSTI2021

Modeling the Ultrafast Electron Attachment Dynamics of Solvated Uracil

Electron attachment to DNA by low energy electrons can lead to DNA damage, so a fundamental understanding of how electrons interact with the components of nucleic acids in solution is an open challenge. In solution, low energy electrons can generate presolvated electrons, e pre – , which are efficiently scavanged by pyrimidine nucleobases to form transient negative ions, able to relax to either stable valence bound anions or undergo dissociative electron detachment or transfer to other parts of DNA/RNA leading to strand breakages. In order to understand the initial electron attachment dynamics, this paper presents a joint molecular dynamics and high-level electronic structure study into the behavior of the electronic states of the solvated uracil anion. Both the valence π* and nonvalence e pre – states of the solvated uracil system are studied, and the effect of the solvent environment and the geometric structure of the uracil core are uncoupled to gain insight into the physical origin of the stabilization of the solvated uracil anion. As a result, solvent reorganization is found to play a dominant role followed by relaxation of the uracil core.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗
NASA NTRS1990

Application of reversal electron attachment for ultrasensitive detection of thermal electron-attaching molecules - CCl4 and C6H5O2

A standard gas-dilution method was used to determine the selective response of the reversal electron attachment detector to carbon tetrachloride concentrations in nitrogen. Data are provided that determine the lowest concentration of sample detectable with the present instrumental configuration as being below 1.0 part per trillion by volume. The incorporation of a 90-deg electrostatic deflector with the quadrupole mass spectrometer is shown to be vital, and with it, negative-ion quadrupole mass spectrometry is used to characterize the ionization process. Observations are also made of the reversal electron attachment response to nitrobenzene. The analytical potential of reversal electron capture negative-ion mass spectrometry is examined, and areas for future development are discussed.

Bernius, Mark T.↗
DOE OSTI2015

Dissociative electron attachment to the gas-phase nucleobase hypoxanthine

We present high-resolution measurements of the dissociative electron attachment (DEA) to isolated gas-phase hypoxanthine (C{sub 5}H{sub 4}N{sub 4}O, Hyp), a tRNA purine base. The anion mass spectra and individual ion efficiency curves from Hyp were measured as a function of electron energy below 9 eV. The mass spectra at 1 and 6 eV exhibit the highest anion yields, indicating possible common precursor ions that decay into the detectable anionic fragments. The (Hyp − H) anion (C{sub 5}H{sub 3}N{sub 4}O{sup −}) exhibits a sharp resonant peak at 1 eV, which we tentatively assign to a dipole-bound state of the keto-N1H,N9H tautomer in which dehydrogenation occurs at either the N1 or N9 position based upon our quantum chemical computations (B3LYP/6-311+G(d,p) and U(MP2-aug-cc-pVDZ+)) and prior studies with adenine. This closed-shell dehydrogenated anion is the dominant fragment formed upon electron attachment, as with other nucleobases. Seven other anions were also observed including (Hyp − NH){sup −}, C{sub 4}H{sub 3}N{sub 4}{sup −}/C{sub 4}HN{sub 3}O{sup −}, C{sub 4}H{sub 2}N{sub 3}{sup −}, C{sub 3}NO{sup −}/HC(HCN)CN{sup −}, OCN{sup −}, CN{sup −}, and O{sup −}. Most of these anions exhibit broad but weak resonances between 4 and 8 eV similar to many analogous anions from adenine. The DEA to Hyp involves significant fragmentation, which is relevant to understanding radiation damage of biomolecules.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗
NASA NTRS1983

Production of O(-) from CO2 by dissociative electron attachment

Dissociative electron attachment cross-section measurements for the production of O(-) from CO2 are performed using a crossed target-beam - electron-beam collision geometry and a quadrupole mass spectrometer. The relative flow technique is used in determining the absolute values of the cross sections. The attachment energies corresponding to the five cross-section maxima are given. They are 4.4 + or - 0.1, 8.2 + or - 0.1, 13.0 + or - 0.2, 16.9 + or - 0.2, and 19.4 + or 0.2 eV. Also given are the cross sections at these maxima: 1.43 x 10 to the -19th sq cm, 4.48 x 10 to the -19th sq cm, 8.1 x 10 to the -21st sq cm, 8.1 x 10 to the -21st sq cm, and 1.2 x 10 to the -20th sq cm, respectively.

Orient, O. J.↗
NASA NTRS1994

Electron Attachment to Molecules at Low Electron Energies

One of the most efficient ways of producing negative ions is by the process of dissociative electron attachment to molecules. Here, a diatomic or polyatomic molecule dissociates, by the impact of a low energy electron, into component atoms (or smaller molecular species) while the incident electron attaches itself to one of the dissociating fragments.

Fadeev Equation↗
NASA NTRS2000

Detection of explosives, nerve agents, and illicit substances by zero-energy electron attachment

The Reversal Electron Attachment Detection (READ) method, developed at JPL/Caltech, has been used to detect a variety of substances which have electron-attachment resonances at low and intermediate electron energies. In the case of zero-energy resonances, the cross section (hence attachment probability and instrument sensitivity) is mediated by the so-called s-wave phenomenon, in which the cross sections vary as the inverse of the electron velocity. Hence this is, in the limit of zero electron energy or velocity, one of the rare cases in atomic and molecular physics where one carries out detection via infinite cross sections.

vapor detection explosives electron detachment↗
DOE OSTI2015

Equation of motion coupled cluster methods for electron attachment and ionization potential in polyacenes

Polyacenes have attracted considerable attention due to their use in organic based optoelectronic materials. Polyacenes are polycyclic aromatic hydrocarbons composed of fused benzene rings. Key to understanding and design of new functional materials is an understanding of their excited state properties starting with their electron affinity (EA) and ionization potential (IP). We have developed a highly accurate and com- putationally e*fficient EA/IP equation of motion coupled cluster singles and doubles (EA/IP-EOMCCSD) method that is capable of treating large systems and large basis set. In this study we employ the EA/IP-EOMCCSD method to calculate the electron affinity and ionization potential of naphthalene, anthracene, tetracene, pentacene, hex- acene and heptacene. We have compared our results with other previous theoretical studies and experimental data. Our EA/IP results are in very good agreement with experiment and when compared with the other theoretical investigations our results represent the most accurate calculations as compared to experiment.

benzene↗
NASA NTRS1995

Measuring Traces Of Oxygen By Resonant Electron Attachment

Method of detecting trace amounts of oxygen based on dissociative attachment of electrons to oxygen molecules followed by measurement of resulting flux of negative oxygen ions in mass spectrometer. High sensitivity achieved in method by exploiting resonance in dissociative attachment of electrons to oxygen molecules: electron-attachment cross section rises to high peak at incident electron kinetic energy of 6.2 eV. Relative concentrations below 1 ppb detected. Devised to increase sensitivity of detection of oxygen in processing chambers in which oxygen regarded as contaminant; for example, chambers used in making semiconductor devices and in growing high-purity crystals.

Man, Kin Fung↗
NASA NTRS1992

Electron attachment to molecules at ultralow electron energies

Experimental techniques, both single-collision and multiple-collision, for studying electron attachment to molecules at energies below 0.1 eV are reviewed. Recent attachment results in HI, DI, F2, SF6, CCl4, and CFCl3 are examined from the point of view of threshold behavior (s- or p-wave), threshold energetics, and the temperature dependence of the attachment rate constant. An interesting application of the s-wave phenomenon to trace-species detection is given.

Chutjian, Ara↗
NASA NTRS1994

Miniature Reversal Electron-Attachment Detector

Miniature reversal electron-attachment detector (miniREAD) enables direct injection of air or vapor at atmospheric pressure from monitored area into mass-spectrometric instrument to detect explosives, narcotics, or other substances, vapors of which suspected of being present in low concentrations. In comparison with older reversal electron-attachment detector, miniREAD simpler in design; more rugged; and easier to build, repair, and maintain. In addition, probably more sensitive.

Chutjian, Ara↗
NASA NTRS1986

Measurements of electron attachment lineshapes and cross sections at ultralow electron energies for c-C6F10, c-C6F12, C8F16 and 1,1,2-C2Cl3F3

Electron attachment cross sections are reported in the electron energy range 0-160 meV and at energy resolutions of 4.5-7.5 meV (FWHM) for the molecules c-C6F10 (perfluorocyclohexene), c-C6F12 (perfluoro-1,2-dimethylcyclobutane), C8F16 (perfluoro-1,3-dimethylcyclohexane) and 1,1,2-C2Cl3F3 (1,1,2-trichlorotrifluoroethane). Use is made of the Kr photoionization technique, and measured attachment lineshapes are converted to cross sections by normalization through attachment rate constants. Comparisons are made with attachment cross sections derived from swarm-measured rate constants. Similar to previous results in eight other molecules, the present four molecules exhibit resolution-limited onsets at a threshold consistent with an s-wave attachment behavior and with a neutral-negative-ion curve crossing at zero energy.

Alajajian, S. H.↗
NASA NTRS1983

Production of negative ions by dissociative electron attachment to SO2

Dissociative electron attachment cross section measurements for the production of O(-), S(-), and SO(-) have been performed utilizing a crossed target SO2 molecule beam-electron beam geometry. The relative flow technique is employed to determine the absolute values of cross sections. The attachment energies corresponding to various cross section maxima are: 4.30 and 7.1 eV for O(-)/SO2; 4.0, 7.5, and 8.9 eV for S(-)/SO2, and 4.7 and 7.5 eV for SO(-)/SO2.

Orient, O. J.↗
NASA NTRS1985

s-wave threshold in electron attachment - Observations and cross sections in CCl4 and SF6 at ultralow electron energies

The threshold photoionization method was used to study low-energy electron attachment phenomena in and cross sections of CCl4 and SF6 compounds, which have applications in the design of gaseous dielectrics and diffuse discharge opening switches. Measurements were made at electron energies from below threshold to 140 meV at resolutions of 6 and 8 meV. A narrow resolution-limited structure was observed in electron attachment to CCl4 and SF6 at electron energies below 10 meV, which is attributed to the divergence of the attachment cross section in the limit epsilon, l approaches zero. The results are compared with experimental collisional-ionization results, electron-swarm unfolded cross sections, and earlier threshold photoionization data.

Chutjian, A.↗
DOE OSTI2015

Electron attachment to the SF{sub 6} molecule

Various models for transition between electron and nuclear subsystems are compared in the case of electron attachment to the SF{sub 6} molecule. Experimental data, including the cross section of electron attachment to this molecule as a function of the electron energy and vibrational temperature, the rate constants of this process in swarm experiments, and the rates of the chemionization process involving Rydberg atoms and the SF{sub 6} molecule, are collected and treated. Based on the data and on the resonant character of electron capture into an autodetachment ion state in accordance with the Breit–Wigner formula, we find that intersection of the molecule and negative ion electron terms proceeds above the potential well bottom of the molecule with the barrier height 0.05–0.1 eV, and the transition between these electron terms has both the tunnel and abovebarrier character. The limit of small electron energies e for the electron attachment cross section at room vibrational temperature takes place at ε ≪ 2 meV, while in the range 2 meV ≪ ε ≪ 80 meV, the cross section is inversely proportional to ε. In considering the attachment process as a result of the interaction between the electron and vibrational degrees of freedom, we find the coupling factor f between them to be f = aT at low vibrational temperatures T with a ≈ 3 × 10{sup −4} K{sup −1}. The coupling factor is independent of the temperature at T > 400 K.

74 ATOMIC AND MOLECULAR PHYSICS↗