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At least 19 records

The beta-SiC(100) surface studied by low energy electron diffraction, Auger electron spectroscopy, and electron energy loss spectra

The beta-SiC(100) surface has been studied by low energy electron diffraction, Auger electron spectroscopy, high resolution electron energy loss spectra (HREELS), and core level excitation EELS. Two new Si-terminated phases have been discovered, one with (3 x 2) symmetry, and the other with (2 x 1) symmetry. Models are presented to describe these phases. New results, for the C-rich surface, are presented and discussed. In addition, core level excitation EELS results are given and compared with theory.

Dayan, M.

s-wave threshold in electron attachment - Results in 2-C4F6 and CFCl3 at ultra-low electron energies

Electron attachment lineshapes and cross sections are reported for the processes 2-C4F6(-)/2-C4F6 and Cl(-)/CFCl3 at electron energies of 0-120 and 0-140 meV, and at resolutions of 6 and 7 meV (FWHM), respectively. As in previous measurements in CCl4 and SF6, the results show resolution-limited narrow structure in the cross section at electron energies below 15 meV. This structure arises from the divergence of the s-wave cross section in the limit of zero electron energy. Comparisons are given with swarm-measured results, and with collisional ionization (high-Rydberg attachment) data in this energy range.

Chutjian, A.

s-wave threshold in electron attachment - Observations and cross sections in CCl4 and SF6 at ultralow electron energies

The threshold photoionization method was used to study low-energy electron attachment phenomena in and cross sections of CCl4 and SF6 compounds, which have applications in the design of gaseous dielectrics and diffuse discharge opening switches. Measurements were made at electron energies from below threshold to 140 meV at resolutions of 6 and 8 meV. A narrow resolution-limited structure was observed in electron attachment to CCl4 and SF6 at electron energies below 10 meV, which is attributed to the divergence of the attachment cross section in the limit epsilon, l approaches zero. The results are compared with experimental collisional-ionization results, electron-swarm unfolded cross sections, and earlier threshold photoionization data.

Chutjian, A.

Detection of explosives, nerve agents, and illicit substances by zero-energy electron attachment

The Reversal Electron Attachment Detection (READ) method, developed at JPL/Caltech, has been used to detect a variety of substances which have electron-attachment resonances at low and intermediate electron energies. In the case of zero-energy resonances, the cross section (hence attachment probability and instrument sensitivity) is mediated by the so-called s-wave phenomenon, in which the cross sections vary as the inverse of the electron velocity. Hence this is, in the limit of zero electron energy or velocity, one of the rare cases in atomic and molecular physics where one carries out detection via infinite cross sections.

vapor detection explosives electron detachment

Thermal electron energy distribution measurements in the ionosphere.

A recoverable payload instrumented for twilight airglow studies was launched by an Aerobee 150 from the White Sands Test Range on Feb. 8, 1971 at 13.56 UT. The payload included a low energy electron spectrometer (HARP) and a cylindrical Langmuir probe. The HARP electron spectrometer is a new device designed to make high resolution differential electron flux measurements. Measurements of ionospheric electron energy distribution in the range from about 0.2 to 4.0 eV are presented.

Hays, P. B.

Measurements of low energy electrons and ions during long-lived solar particle events

The stream of ions and electrons which appeared in planetary space for about eight days after an April 1979 solar flare exhibited a classic energetic storm particle (ESP) event ion pattern. Distinct populations of these electrons can be identified in association with IMF filaments, and the electron energy spectrum is well fit by a power law exponent of -2.7 during most of the event. The pitch angle distributions of the low energy electrons are found to be complex and to undergo many changes, with weak pitch angle scattering and adiabatic effects playing a role in the shaping of these distributions.

Anderson, K. A.

Low-energy electron driven reactions in 2-bromo-5-nitrothiazole

Thiazole derivatives are biologically relevant molecules, used also in pharmaceutical applications. Herein, we report results for electron attachment to 2-bromo-5-nitrothiazole (BNT) in the gas phase. Employing two crossed electron–molecule beam experiments, we determined the efficiency curves of various fragment anions as a function of the initial electron energy between about 0 and 10 eV as well as the emission angle and kinetic energy distributions of Br− and NO2− ions formed from a resonance near 4 eV. The experiments were supported by quantum chemical calculations, exploring possible dissociation pathways along with their reaction energies. We also compared the electron attachment characteristics of BNT with those of the native thiazole molecule by performing electron attachment experiments and calculations for this molecule as well. Compared to thiazole, which is primarily degraded only by electrons with kinetic energies between about 5 and 10 eV, BNT is susceptible to low-energy electrons near 0 eV with enhanced cross section for (dissociative) electron attachment. However, although BNT offers two localization sites with high electron affinity (Br and NO2 moieties), we do not find the corresponding anions as the dominant negatively charged species formed upon electron attachment. Instead, the reaction channels with an abstraction of Br and NO2 as neutral radicals prevail, accompanied by the opening of the thiazole ring due to the relatively weak C–S bond.

Chen, Jiakuan (ORCID:0009000729608641)

Quantitative Modeling of High-Energy Electron Scattering in Thick Samples Using Monte Carlo Techniques

Cryo-electron microscopy (cryo-EM) is a powerful tool for imaging biological samples but is typically limited by sample thickness, which is restricted to a few hundred nanometers depending on the electron energy. However, there is a growing need for imaging techniques capable of studying biological samples up to 10 µm in thickness while maintaining nanoscale resolution. This need motivates the use of mega-electron-volt scanning transmission electron microscopy (MeV-STEM), which leverages the high penetration power of MeV electrons to generate high-resolution images of thicker samples. In this study, we employ Monte Carlo simulations to model electron–sample interactions and explore the signal decay of imaging electrons through thick specimens. By incorporating material properties, interaction cross-sections for energy loss, and experimental parameters, we investigate the relationship between the incident and transmitted beam intensities. Key factors such as detector collection angle, convergence semi-angle, and the material properties of samples were analyzed. Our results demonstrate that the relationship between incident and transmitted beam intensities follows the Beer–Lambert law over thicknesses ranging from a few microns to several tens of microns, depending on material composition, electron energy, and collection angles. The linear depth of silicon dioxide reaches 3.9 µm at 3 MeV, about 6 times higher than that at 300 keV. Meanwhile, the linear depth of amorphous ice reaches 17.9 µm at 3 MeV, approximately 11.5 times higher than that at 300 keV. These findings are crucial for advancing the study of thick biological and semiconductor samples using MeV-STEM.

36 MATERIALS SCIENCE

Ultralow Energy Electron Attachment at Sub-Millielectron Volt Resolution

The technique of rare-gas photoionization has been extended by use of direct laser ionization to electron energies epsilon in the range 0-100 meV, with a resolution Delta(epsilon) of 0.4-0.5 meV (FWHM). Tunable UV light at (Lambda)276 nm is produced using a pulsed Nd:YAG laser and nonlinear mixing techniques. The beam is frequency tripled in a pulsed jet of xenon. The VUV radiation, tunable at (Lambda)92 nm, is then used to photoionize Xe at its 2P(sub 1/2) threshold (single-photon ionization). The photoelectrons produced interact with admixed target gas to generate negative ions through the s-wave capture process. Recent results in electron attachment to SF(sub 6) will be reported which show resonance structure at the opening of the ground-state vibrational channels. This structure corresponds to the process of vibrational excitation + attachment, which is superimposed on the underlying s-wave (direct) capture process. It should be a general phenomenon, present in a wide variety of zero-energy electron attaching molecules.

Chutjian, A.

Precipitating electron energy flux and auroral zone conductances - An empirical model

Data from the low energy electron (LEE) experiments on the Atmosphere Explorer C and D satellites have been used to determine the average global distribution of the energy flux of precipitating auroral electrons and their average energy for different levels of geomagnetic activity. Measurements from the Atmosphere Explorer unified abstract file (15-s resolution) have been binned according to invariant latitude (in the range 50-90 deg), magnetic local time, and geomagnetic activity as measured by the Kp and auroral electrojet (AE) indices, separately. Bin-averaged values of precipitating energy flux and average energy have been calculated, and a smoothing algorithm used to reduce stochastic variations in the raw data. The results indicate that, for the parameters studied, the AE inces does a superior job of ordering the data with regard to geomagnetic activity. The global distribution of the auroral enhancement porition of the Pedersen and Hall conductances were inferred from the data by means of an empirical fit to detailed energy deposition calculations.

Spiro, R. W.

Properties of low-energy electron precipitation in the cleft during periods of unusually high ambient electron temperatures

A recently developed automated fitting procedure for Dynamics Explorer 2 electron energy spectra represents each auroral electron spectrum as a superposition of several Maxwellian and several Gaussian components. The fitting parameters give a digital representation which uniquely describes each spectrum. It is shown that unusually high ambient electron temperatures (of the order of 10,000 K) in the cleft are strongly correlated with the intensity parameters of the lowest-temperature Maxwellian components of the precipitation. The collisional heat input into the ambient electrons by these Maxwellian components of the precipitation fluxes is shown to be more than an order of magnitude higher in the high-temperature storm time cases than it is in a control set of 'normal temperature' quiet time cases. The heating effect of the solar flux is shown to be nearly the same for both sets of cases. As a result it is concluded that electron precipitation is the chief mechanism responsible for those high ambient temperatures.

Fontheim, Ernest G.

Charging and discharging characteristics of dielectric materials exposed to low- and mid-energy electrons

Charging and discharging characteristics of dielectric samples exposed to 1-25 keV and 25-100 keV electrons in a laboratory environment are reported. The materials examined comprised OSR, Mylar, Kapton, perforated Kapton, and Alphaquartz, serving as models for materials employed on spacecraft in geosynchronous orbit. The tests were performed in a vacuum chamber with electron guns whose beams were rastered over the entire surface of the planar samples. The specimens were examined in low-impedance-grounded, high-impedance-grounded, and isolated configurations. The worst-case and average peak discharge currents were observed to be independent of the incident electron energy, the time-dependent changes in the worst case discharge peak current were independent of the energy, and predischarge surface potentials are negligibly dependent on incident monoenergetic electrons.

Coakley, P.

Spatial aspects of low- and medium-energy electron degradation in N2

Spatial (radial and longitudinal) yield spectra for electron energy degradation in molecular nitrogen gas for 25-eV to 10-keV incident electrons have been generated by using a Monte Carlo technique. These spatial yield spectra associated with the electron degradation process can be employed to calculate a 'yield' for any inelastic state at any position in the medium. These have been analytically represented in terms of a model containing three simple 'microplumes'. Five-dimensional yield spectra which contain the information about the polar angle of the electron have also been analytically represented within the framework of the microplume model. Aeronomical and radiological applications of our model are discussed.

Singhal, R. F.