Efficient computation of the complex error function
Complex error function computation using approximation method with single algorithm
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Complex error function computation using approximation method with single algorithm
Integrals of products of error functions with other functions are presented, taking into account a combination of the error function with powers, a combination of the error function with exponentials and powers, a combination of the error function with exponentials of more complicated arguments, definite integrals from Laplace transforms, and a combination of the error function with trigonometric functions. Other integrals considered include a combination of the error function with logarithms and powers, a combination of two error functions, and a combination of the error function with other special functions.
Computation of complex error function
Tabulation of definite and indefinite integrals of products of error function with elementary and transcendental functions
The Off-plane Grating Rocket Experiment (OGRE) is a soft X-ray grating spectrometer to be flown on a suborbital rocket. The payload is designed to obtain the highest-resolution soft X-ray spectrum of Capella to date with a resolution goal of R(lambda/delta lambda) > 2000 at select wavelengths in its 10 - 55 A bandpass of interest. The optical design of the spectrometer realizes a maximum resolution of R 5000 with all components performing optimally, in perfect alignment, and not considering in-flight pointing errors; however, performance errors, misalignments, and in-flight pointing errors work to degrade this performance. A comprehensive line spread function (LSF) error budget has been constructed for the spectrometer to identify errors contributing to the LSF, to determine how each affects the LSF, and to inform performance requirements and alignment tolerances for the spectrometer. In this document, the comprehensive LSF error budget for the OGRE spectrometer is presented and its implications are discussed.
The author considers the problem of detecting failures in SISO systems using analytic redundancy concepts. Since the models used are subject to error, a method of determining the detection thresholds that account for these errors is sought. The methodology presented utilizes a straightforward application of Parseval's relation to develop a threshold computation that is performed online as a function of the input signal. The threshold is set at a quiescent value to account for sensor noise and is adjusted (upward) according to the activity of the input signal. An application to detection of actuator failures is presented.
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Rational fractions of the form 0.5/(a + bx +
Distributed-effect sensors, which respond to spatially distributed inputs over a significant gauge length, encompass piezoelectric laminate films, modal-domain optical fiber sensors, and holographic sensors; they can be fabricated with spatially varying sensitivity to a distributed measurand for spatial filtering. Such spatial filters are configurable to extract various structural parameters from distributed measurements that cannot be directly measured by sensors. A modeling is presently conducted for distributed-effect sensors' integration into state-space structural models, noting the effects of fabrication errors on sensor operation.
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We consider a posteriori error estimates for finite volume and finite element methods on arbitrary meshes subject to prescribed error functionals. Error estimates of this type are useful in a number of computational settings: (1) quantitative prediction of the numerical solution error, (2) adaptive meshing, and (3) load balancing of work on parallel computing architectures. Our analysis recasts the class of Godunov finite volumes schemes as a particular form of discontinuous Galerkin method utilizing broken space approximation obtained via reconstruction of cell-averaged data. In this general framework, weighted residual error bounds are readily obtained using duality arguments and Galerkin orthogonality. Additional consideration is given to issues such as nonlinearity, efficiency, and the relationship to other existing methods. Numerical examples are given throughout the talk to demonstrate the sharpness of the estimates and efficiency of the techniques. Additional information is contained in the original.
This paper discusses single-event upset (SEU) in memories and microprocessors that are the "drivers" of highly scaled commercial integrated circuits. Despite the decrease in critical charge that occurs for highly scaled CMOS devices, recent test data has shown that SEU rates are actually somewhat lower for scaled devices compared to older devices with larger feature size. Hard errors, which are increasingly important for memories, are discussed along with conventional soft errors. Functional errors in memories and microprocessors are particularly significant, and tend to dominate the response of highly scaled devices from an application standpoint. Predictions for future devices are made using the Semiconductor Industry Roadmap along with recent modeling and radiation test results.
Error function approximation by least squares method
Various systematic errors of orbital solutions involving range and range rate radar
A method of reducing errors in noisy magnetic-field measurements involves exploitation of redundancy in the readings of multiple magnetometers in a cluster. By "redundancy"is meant that the readings are not entirely independent of each other because the relationships among the magnetic-field components that one seeks to measure are governed by the fundamental laws of electromagnetism as expressed by Maxwell's equations. Assuming that the magnetometers are located outside a magnetic material, that the magnetic field is steady or quasi-steady, and that there are no electric currents flowing in or near the magnetometers, the applicable Maxwell 's equations are delta x B = 0 and delta(raised dot) B = 0, where B is the magnetic-flux-density vector. By suitable algebraic manipulation, these equations can be shown to impose three independent constraints on the values of the components of B at the various magnetometer positions. In general, the problem of reducing the errors in noisy measurements is one of finding a set of corrected values that minimize an error function. In the present method, the error function is formulated as (1) the sum of squares of the differences between the corrected and noisy measurement values plus (2) a sum of three terms, each comprising the product of a Lagrange multiplier and one of the three constraints. The partial derivatives of the error function with respect to the corrected magnetic-field component values and the Lagrange multipliers are set equal to zero, leading to a set of equations that can be put into matrix.vector form. The matrix can be inverted to solve for a vector that comprises the corrected magnetic-field component values and the Lagrange multipliers.
The crystalline silicotitanate, CST, resin manufactured by UOP Honeywell is well-suited for single-use decontamination of caustic liquid wastes at Hanford and Savannah River Sites. There are many measurements of column loading and breakthrough for CST resin decontamination of Cs-137 in various Hanford and SRS waste simulants. Such measurements provide a very good basis for estimating CST resin demand and these more refined predictions make the CST column loading as efficient as possible given the very expensive CST resin. Although there are a variety of tools for predicting chromatographic resin column performance, [1-4], there is a particularly useful method that is suitable as a simple spreadsheet model [4]. This spreadsheet model is an analytical error function for the mass transfer zone (mtz) diffusion width in resin columns and is well-suited for resin breakthrough and column loading. This paper describes just such an error function spreadsheet model and how well the error function agrees with more traditional models and fits the observed small scale breakthrough curves for CST that can then better predict large scale column loading efficiency. The very high sorption of Cs onto CST tends to be slower than that of other lower sorption resins and as a result of the slow CST kinetics, there is also a marked asymmetry in many CST breakthrough curves. The CST breakthrough asymmetry is largely due to the distribution of CST particle sizes because smaller particles sorb much faster than larger particles. It is then the smaller particles that determine the leading mtz at a decontamination factor of 1,000 breakthrough and therefore the decontamination efficiency for a given loading. The larger CST particles correspondingly determine the tailing mtz width and therefore the overall loading efficiency and it is important to model both leading and tailing mtz widths to best optimize CST for a particular Cs-137 decontamination application. (authors)
Abstract Despite its sizable errors, density functional theory (DFT) is extensively used to evaluate thermochemical properties of gases, liquids and their interfaces with solids. As numerous halogen‐containing compounds appear as reactants, products and/or electrolytes in electrochemical reactions, and ionic effects are currently an active area of research, it is important to evaluate the accuracy of DFT for halogen thermochemistry. Herein, we assess the formation energies of interhalogens, hydrogen halides, diatomic and atomic halogens and their ions using six widespread functionals at the GGA, meta‐GGA and hybrid levels. We observe that DFT errors with respect to experiments are correlated with the electronegativity of the species and there are systematic trends across functionals, such that swift corrections were devised. Specifically, the average of the mean absolute errors for the six functionals decreased from 0.19 eV before the corrections to 0.08 eV after them. Besides, the overall maximum absolute error (MAX) decreased from 0.76 to 0.44 eV and the average of the MAXs decreased from 0.51 to 0.24 eV. Finally, we illustrate the qualitative and quantitative impact of gas‐phase errors on the predictions of surface Pourbaix diagrams.