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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 19 records

Methods for Conducting Electron Backscattered Diffraction (EBSD) on Polycrystalline Organic Molecular Thin Films

Electron backscattered diffraction (EBSD) is a technique regularly used to obtain crystallographic information from inorganic samples. When EBSD is acquired simultaneously with emitting diodes data, a sample can be thoroughly characterized both structurally and compositionally. For organic materials, coherent Kikuchi patterns do form when the electron beam interacts with crystalline material. However, such patterns tend to be weak due to the low average atomic number of organic materials. This is compounded by the fact that the patterns fade quickly and disappear completely once a critical electron dose is exceeded, inhibiting successful collection of EBSD maps from them. In this paper, a new approach is presented that allows successful collection of EBSD maps from organic materials, here the extreme example of a hydrocarbon organic molecular thin film, and opens new avenues of characterization for crystalline organic materials.

42 ENGINEERING↗

Preparing Magnesium Alloys for Electron Backscatter Diffraction

Electron Backscatter Diffraction (EBSD) is a powerful characterization tool that is commonly employed to study grain size, grain morphology, crystallographic texture and other important microstructure parameters. However, its relatively low atomic number and propensity to corrode can make it difficult to get high quality EBSD patterns from magnesium specimens. This work will cover some common issues encountered during sample prep and suggestions for avoiding them. Microscope and EBSD detector settings will also be covered, as well as methods for optimizing instrument time. Lastly, comments will be made on how to “clean” and present EBSD data.

36 MATERIALS SCIENCE↗

Imaging and Segmenting Grains and Subgrains Using Backscattered Electron Techniques

We present two new methods of processing data from backscattered electron signals in a scanning electron microscope to image grains and subgrains. The first combines data from multiple backscattered electron images acquired at different specimen geometries to (1) better reveal grain boundaries in recrystallized microstructures and (2) distinguish between recrystallized and unrecrystallized regions in partially recrystallized microstructures. The second utilizes spherical harmonic transform indexing of electron backscatter diffraction patterns to produce high angular resolution orientation data that enable the characterization of subgrains. Subgrains are produced during high-temperature plastic deformation and have boundary misorientation angles ranging from a few degrees down to a few hundredths of a degree. Here, we also present an algorithm to automatically segment grains from combined backscattered electron image data or grains and subgrains from high angular resolution electron backscatter diffraction data. Together, these new techniques enable rapid measurements of individual grains and subgrains from large populations.

36 MATERIALS SCIENCE↗

Validation of electron backscattering in the MCNP6.3 code

A new electron backscattering validation suite has been developed for the MCNP® code. The calculations in this suite cover both condensed history and single-event transport methods, seven different elemental materials ranging from beryllium to uranium, and incident electron energies from 200 eV to 14.1 MeV. In general, the accuracy of the MCNP code for electron backscattering calculations is energy-dependent. For incident electron energies below 2 keV, the condensed history method is not applied while the single-event method shows poor agreement with experimental measurements due to poor accuracy of the underlying atomic data. For incident energies between 2 keV and 256 keV, the single-event method typically shows better agreement with experiments, while for incident energies above 256 keV the condensed history method gives better accuracy. Additionally, agreement with experimental data is generally worse for low- Z materials such as beryllium and carbon, which may reflect deficiencies in the data or physics underlying electron transport through light elements in the MCNP code. The new electron backscattering validation suite, along with the previously introduced electron stopping power and Lockwood energy deposition validation suites, provide MCNP users with a quantified understanding of the uncertainties in electron transport calculations. Future improvements to electron transport in the MCNP code are necessary for low energies (≤ 2 keV) and for low- Z materials.

36 MATERIALS SCIENCE↗

Modeling and Characterizing the electron backscatter in a cylindrical anode-based distributed X-ray source

Upcoming advancements in computed tomography architectures warrants the investigation of new X-ray source designs and the impacts that electron backscatter can have on these designs. One such design being investigated is a distributed, cylindrical anode-based X-ray source. For such a distributed X-ray source, we developed a modeling pipeline for simulating electron optics and transport to characterize the quality of the primary X-ray beam and the electron backscatter behavior. We report our results on the energy distributions of the bremsstrahlung spectra; electron backscatter ratio; and spatial, temporal, and energy distributions of backscattered electrons that return to the anode.

46 - INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AN↗

A Denoising Autoencoder for Improved Kikuchi Pattern Quality and Indexing in Electron Backscatter Diffraction

The rapid collection and indexing of electron diffraction patterns as produced via electron backscatter diffraction (EBSD) has enabled crystallographic orientation and structural determination, as well as additional property-determining strain and dislocation density information with increasing speed, resolution, and efficiency. Pattern indexing quality is reliant on the noise of the collected electron diffraction patterns, which is often convoluted by sample preparation and data collection parameters. EBSD acquisition is sensitive to many factors and thus can result in low confidence index (CI), poor image quality (IQ), and improper minimization of fit, which can result in noisy datasets and misrepresent the microstructure. In an attempt to enable both higher speed EBSD data collection and enable greater orientation fit accuracy with noisy datasets, an image denoising autoencoder was implemented to improve pattern quality. Here, we show that EBSD data processed through the autoencoder results in a higher CI, IQ, and a more accurate degree of fit. In addition, using denoised datasets in HR-EBSD cross correlative strain analysis can result in reduced phantom strain from erroneous calculations due to the increased indexing accuracy and improved correspondence between collected and simulated patterns.

36 MATERIALS SCIENCE↗

Implications of gnomonic distortion on electron backscatter diffraction and transmission Kikuchi diffraction

The effect of gnomonic distortion on orientation indexing of electron backscatter diffraction patterns is explored through simulation of electron diffraction patterns for sample-to-detector geometries associated with transmission Kikuchi diffraction (TKD) and electron backscatter diffraction (EBSD). Simulated data were analysed by computing a similarity index for both Hough transformed data and simulated patterns to determine the sensitivity of each method for detecting subtle differences in the effect of gnomonic distortions on electron diffraction patterns. These results indicate that the increased gnomonic distortions in electron diffraction patterns for a TKD geometry enhance the sensitivity for detecting subtle differences in interband angles. Additionally, the utilisation of a Hough transform-based indexing approach further enhances the sensitivity.

36 MATERIALS SCIENCE↗

Reflector Selection for the Indexing of Electron Backscatter Diffraction Patterns

Abstract We propose a new methodology for ranking the reflectors used in traditional Hough-based indexing of electron backscatter diffraction (EBSD) patterns. Instead of kinematic X-ray or electron structure factors ( F hkl ) currently utilized, we propose the integrated Kikuchi band intensity parameter ( β hkl ) based on integrated dynamical electron backscatter intensities. The proposed parameter is compared with the traditional kinematical intensity, $I_{hkl}^{{\rm kin}} $ , as well as the average Hough transform peak intensity, $I_{hkl}^{{\rm HSP}} $ and used to index EBSD patterns for a number of different material systems of varying unit cell complexities including nickel, silicon, rutile, and forsterite. For elemental structures, β hkl closely follows the kinematical ranking. However, significant ranking differences arise for more complex unit cells, with the β hkl parameter showing a better correlation with the integrated Hough intensities. Lastly, Hough-based indexing of a simulated forsterite data set showed an appreciable improvement in the median confidence index (0.15 to 0.35) when β hkl is used instead of $I_{hkl}^{{\rm kin}} $ for ranking the reflectors.

36 MATERIALS SCIENCE↗

Prediction of potential pseudo-symmetry issues in the indexing of electron backscatter diffraction patterns

A new methodology to predict potential pseudo-symmetric or systematically mis-indexed orientations for an arbitrary crystal structure is presented. The method leverages the recently proposed spherical indexing algorithm to index electron backscatter diffraction patterns. Potential pseudo-symmetric orientations are interpreted as secondary peaks in the autocorrelation of the Kikuchi sphere. The generality of the method is illustrated using a number of crystal systems, ranging from nickel, where no significant pseudo-symmetric issues are expected, to SrTiO 3 , with mild occurrence of such issues, to the olivine series, γ-TiAl and U-6%Nb systems, where the traditional Hough method systematically mis-indexes the pseudo-symmetric variants. Here, the method predicts the severity of potential pseudo-symmetric matches and ranks all variants using a normalized autocorrelation coefficient.

36 MATERIALS SCIENCE↗

Cryogenic Stress-Driven Grain Growth Observed via Microcompression with in situ Electron Backscatter Diffraction

The deformation of materials at cryogenic temperature is of interest for space, arctic, and fundamental science applications. In this work, a custom-built cooling system attached to a commercial picoindenter was used for in situ cryogenic microcompression testing of equal-channel angular-pressed copper with real-time electron backscatter diffraction. Stress-driven grain growth at cryogenic temperatures was observed during a series of elastic and plastic deformations. Finally, these results provide direct evidence for the previously predicted phenomenon, whereas previous ex situ examinations demonstrated coarsening after cryogenic loading when samples were not maintained at cryogenic temperatures between deformation and characterization.

36 MATERIALS SCIENCE↗

Electron backscatter diffraction helps direct calculation of magnetocrystalline anisotropy energy in API 5L steels

Highlights: • Experimental evidence of the capability of EBSD to accurately estimate MAE of API 5L steels. • MAE can be calculated directly from raw EBSD data for reduced sample sizes. • Number of grains sufficient to estimate MAE from EBSD is in the order of several hundreds. • The use of equivalent orientations increases drastically the accuracy of MAE estimations. • EBSD helps explain origin of the observed correlation between MAE and Barkhausen noise. - Abstract: This paper shows evidence of the capability of electron backscatter diffraction (EBSD) to accurately estimate the magnetocrystalline anisotropy energy (MAE) of API 5L steels. The crystallographic texture of five circular steel samples was characterized by X-ray global texture and EBSD microtexture measurements. The average MAE of each one of these samples was estimated from the set of individual grain orientations obtained from orientation maps measured by EBSD. The angular dependence of EBSD-derived MAE was compared with predictions made from X-ray texture and Barkhausen noise (BHN) measurements. The average MAE determined from the EBSD data is in good agreement with the predictions made from X-ray and BHN measurements for all the studied samples. This agreement can be explained by the fact that the number of grains used to predict the average MAE from the EBSD results was statistically sufficient to reproduce the MAE predicted by the other two methods. The EBSD measurement strategy for the accurate MAE estimation was established in terms of parameters such as the number of individual grain orientations to be measured, the sample's texture acuity and grain size, the use of equivalent orientations given by the statistical orthorhombic symmetry of the studied samples, and different measurement planes.

36 MATERIALS SCIENCE↗

Characterization of microtexture of 316L stainless steel fiber after multi-pass drawing by electron backscatter diffraction

Highlights: • Three crystalline phases, γ, α′, and σ, in 316L stainless steel fibers are observed by XRD. • Strain-induced martensite and two types of twin boundaries are formed in drawn fibers. • The twin boundary generation is nucleate at high angle grain boundaries and then bulge into the {112}<111> grain. • A route of the formation mechanism of deformation twins was analyzed by EBSD. - Abstract: The microstructure and microtexture of 316L stainless steel fibers (SSFs) after multi-pass cold drawing with intermediate heat treatment were investigated in this study. The crystalline phases of SSFs were identified and quantified using X-ray diffraction (XRD) analysis. Grain orientation and boundary characterization in the mantle and core regions of drawing direction (DD) were analyzed through electron backscatter diffraction (EBSD). The coincident site lattice approach provides beneficial information for defining twin boundary and analyzing the orientation relationship between neighboring grains on the Σ3 segment. Three crystalline phases, γ, α, and σ, could be seen in XRD profiles. The formation mechanism of deformation twins was found, and two types of twin boundaries were observed in the drawn fibers by EBSD. The twin boundary generated between a {112}<111> grain and a <100>//DD grain is believed to nucleate at a high-angle grain boundary and then bulge into the copper grain.

36 MATERIALS SCIENCE↗

Refinements for Bragg coherent X-ray diffraction imaging: electron backscatter diffraction alignment and strain field computation

Bragg coherent X-ray diffraction imaging (BCDI) allows the 3D measurement of lattice strain along the scattering vector for specific microcrystals. If at least three linearly independent reflections are measured, the 3D variation of the full lattice strain tensor within the microcrystal can be recovered. However, this requires knowledge of the crystal orientation, which is typically attained via estimates based on crystal geometry or synchrotron microbeam Laue diffraction measurements. Presented here is an alternative method to determine the crystal orientation for BCDI measurements using electron backscatter diffraction (EBSD) to align Fe–Ni and Co–Fe alloy microcrystals on three different substrates. The orientation matrix is calculated from EBSD Euler angles and compared with the orientation determined using microbeam Laue diffraction. The average angular mismatch between the orientation matrices is less than ∼6°, which is reasonable for the search for Bragg reflections. The use of an orientation matrix derived from EBSD is demonstrated to align and measure five reflections for a single Fe–Ni microcrystal via multi-reflection BCDI. Using this data set, a refined strain field computation based on the gradient of the complex exponential of the phase is developed. This approach is shown to increase accuracy, especially in the presence of dislocations. The results demonstrate the feasibility of using EBSD to pre-align BCDI samples and the application of more efficient approaches to determine the full lattice strain tensor with greater accuracy.

42 ENGINEERING↗

An Electron Backscatter Diffraction Analysis of Grain Boundary Initiated Discontinuous Precipitation in U-10Mo

The effect of varied thermomechanical processing on discontinuous precipitation (DP) in U-10Mo was investigated, with specific emphasis on understanding the role of grain boundary misorientation in DP. Varied prior homogenization heat treatment and thermomechanical processing resulted in differences in both the fraction of DP and the colony width, and was attributed to variations in the grain boundary misorientation distribution. Regardless of the degree of DP-based transformation, extensive growth of DP colonies was dominant on 30°–45° misorientation boundaries. Interestingly, misorientation histograms of the deformed and annealed specimens suggest the processing steps involved may have inhibited DP colony growth along a small fraction of these high angle boundaries. Large-area electron backscatter diffraction montages coupled with high resolution mapping suggest symmetric {110}-type interfaces may be important considerations for mitigating extensive DP growth in this alloy system.

Discontinuous Precipitation, Uranium, Electron Bac↗

Application of electron backscatter diffraction techniques to quantify effects of aging on sub-grain and spatial heterogeneity in NMC cathodes

Identification and evaluation of structural heterogeneity in spent cathode materials is crucial to developing appropriate remediation strategies for novel recycling processes. Native heterogeneities may be exacerbated during the cell's operational lifetime, as sub-particle-scale variations induce anisotropic expansion and contraction upon cycling. Structural transformations resulting from repeated cycling and calendar aging predominantly occur at the secondary particle surface and at the grain boundaries (GBs) between primary particles. However, the diffusion and stress build up around and across GBs are poorly understood. In this study, electron backscatter diffraction (EBSD) is employed to track sub-grain lattice structure across a statistically relevant number of Li(Ni0.33Mn0.33Co0.33)O2 (NMC-111) particles. Specifically, differences in lattice misorientation – measured as the deviation from the grain's average orientation – are tracked as a function of position within the electrode (near current collector, middle, and near separator) and as a function of electrochemical cycling. Further, a novel method of structural analysis is developed, offering insight into sub-grain diffusion behavior by comparing lattice misorientation near the grain boundary versus in the grain bulk. The present results suggest that electrode-scale spatial heterogeneity in lattice structure is induced by initial manufacturing conditions, and that radial gradients in lattice misorientation evolve at the primary particle scale with repeated electrochemical cycling.

25 ENERGY STORAGE↗

Electron backscatter diffraction of Nb 3 Sn coated niobium: Revealing structure as a function of depth

Over the last two decades, advances in Electron Backscatter Diffraction (EBSD) have moved the technique from a research tool to an essential characterization technique in many fields of material research. EBSD is the best suited technique for determining structure as a function of depth. This characterization is critically important, but has been previously absent from Nb 3 Sn efforts. While EBSD is the technique of choice, obtaining quality data can be difficult. Sample preparation in particular is non-trivial. Here we summarize the general principles of EBSD, discuss specific sample preparation techniques for Nb 3 Sn coated SRF cavity material, and give examples of how EBSD is being used to understand fundamental growth mechanisms for Nb 3 Sn coatings.

36 MATERIALS SCIENCE↗