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DOE OSTI2023

Broadband Photoconductive Sampling in Gallium Phosphide

Abstract Direct measurements of the electric field of light enable new observations of light–matter interactions. In the near‐infrared and visible spectral ranges, this typically relies on techniques that exploit nonlinearities in gases or solids, which limits their sensitivity. Here, a method for the detection of broadband near‐infrared fields spanning more than one octave from 110 to 220 THz based on linear absorption in a semiconductor is demonstrated. This technique, which avoids complex vacuum setups and works under ambient conditions, employs linear photoconductive sampling (LPS) in gallium phosphide. Simulations reveal that the response function of LPS is concerned with the intensity envelope of the gate field, in contrast to electro‐optic sampling, relaxing the stringent temporal requirements on the gate pulse.

36 MATERIALS SCIENCE↗

DOE OSTI2024

Sensitivity Enhancement in Photoconductive Light Field Sampling

Abstract The emerging field of lightwave electronics is driving optoelectronic information processing beyond current classical limitations and has the potential to eventually reach petahertz frequencies. One of the major obstacles in reaching not only higher switching frequencies but also higher repetition rates with low‐power light sources is the efficiency of related devices. A device is presented based on a multilayered material that shows a 13‐fold enhancement in terms of converting light to electric current compared to bulk solids. Furthermore, the device exhibits an almost flat intensity response within its working range. The outstanding properties of engineered multilayered devices promise to push technology for lightwave electronics applications.

47 OTHER INSTRUMENTATION↗

DOE OSTI2022

speckle-tracking: a software suite for ptychographic X-ray speckle tracking

Explore the source record for details and available documents.

99 GENERAL AND MISCELLANEOUS↗

DOE OSTI2020

Binary pseudorandom array test standard optimized for characterization of large field-of-view optical interferometers

Recently, a technique for calibrating the modulation transfer function (MTF) of a broad variety of metrology instrumentation has been demonstrated. This technique is based on test samples structured as one-dimensional binary pseudo-random (BPR) sequences and two-dimensional BPR arrays (BPRAs). The inherent power spectral density of BPR gratings (sequences) and arrays has a deterministic white-noise-like character that allows direct determination of the MTF with uniform sensitivity over the entire spatial frequency range and field-of-view of an instrument. As such, the BPR samples satisfy the characteristics of a test standard: functionality, ease of specification and fabrication, reproducibility, and low sensitivity to manufacturing error. Here we discuss our recent developments directed to the optimization of the sample design, fabrication, application, and data processing procedures, suitable for thorough characterization of large aperture optical interferometers. Compared with the previous coded-aperture based design, the improved, 'highly randomized' BPRA pattern of the new test standard provides better accuracy and reliability of instrument MTF and aberration characterization, and enables operation optimization of large aperture optical interferometers. We describe the pattern generation algorithm and tests to verify the compliance to desired BPRA topography. The data acquisition and analysis procedures for different applications of the technique are also discussed.

Yashchuk, Valeriy V.↗

NASA NTRSDate not supplied

A Markov Random Field Model for Texture-based Segmentation of Small Cracks in Thin InconelTubes

Markov random fields have been used for image segmentation since their introduction in the1980s. This work applies a method from Principal Component Thermography to enhance thecontrast in damage regions in 3D images derived from X-ray computed tomography (CT)inspections. The developed method is applied to sizing of small cracks in thin Inconel tubes designed as probability of detection (POD) samples for radiographic inspection.Misclassification errors arising from artifacts due to beam-hardening are reduced by fitting the boundary of the segmented damage region with the arc of an ellipse. Results are comparedagainst those obtained through manual inspection.

Image segmentation↗

DOE OSTI2024

Binary pseudo-random array standards for calibration of 3D optical surface profilers used for metrology with significantly curved x-ray optics

High-accuracy metrology is vitally important in manufacturing ultra-high-quality free-form mirrors designed to manipulate X-ray light with nanometer-scale wavelengths. The current capabilities and possibility for improvements in X-ray mirror manufacturing are limited by inherent imperfections of the integrated metrology tools. In the case of Fizeau interferometry, metrology tools are currently calibrated with super-polished flat test-standard/reference mirrors. This is acceptable for measuring slightly curved X-ray optics. However, for even moderately curved aspherical X-ray mirrors the flat-reference calibration is not sufficiently accurate and stitching Fizeau interferometer-based surface metrology is used to mitigate the problem. But still, the retrace and aberration errors, as well as the limited spatial resolution, described with the instrument transfer function (ITF), can be transferred into the optical surface topography of X-ray mirrors obtained in stitching metrology. For ITF calibration, we have developed an original technique, based on test standards structured as two-dimensional (2D) highly-randomized (HR) binary pseudo-random arrays (BPRAs). The technique employs the unique properties of the HR BPRA patterns in the spatial frequency domain., i.e. the inherent 2D power spectral density of the HR BPRA pattern has a deterministic white-noise-like character that allows direct determination of the ITF with uniform sensitivity over the entire spatial frequency range and field-of-view of an instrument. Here, we explore technological, metrological, and analytical aspects essential for calibration of the retrace and aberration errors of Fizeau interferometers using different types of tilted test samples, including a super-polished reference mirror for the re-trace calibration and the uniformly redundant array (URA) BPRA standards for the geometrical distortion (aberration) calibration. While the first method was previously demonstrated by researchers at DIAMOND Light Source, a method based on the URA BPRA is described and demonstrated here for the first time. We outline the design and fabrication process used in fabrication of URA BPRA test standards, and present the results of application of the URA BPRA standards demonstrating the high efficacy of our approach to geometrical distortion calibration of Fizeau interferometers. We also discuss the possible sources of unexpected peculiarities of the systematic errors, including an astigmatic character of the retrace error, observed with Fizeau interferometers at the Advanced Light Source X-Ray Optics Laboratory.

Munechika, Keiko↗

NASA NTRS2003

New Methods of Sample Preparation for Atom Probe Specimens

Magnetite is a common conductive mineral found on Earth and Mars. Disk-shaped precipitates approximately 40 nm in diameter have been shown to have manganese and aluminum concentrations. Atom-probe field-ion microscopy (APFIM) is the only technique that can potentially quantify the composition of these precipitates. APFIM will be used to characterize geological and planetary materials, analyze samples of interest for geomicrobiology; and, for the metrology of nanoscale instrumentation. Prior to APFIM sample preparation was conducted by electropolishing, the method of sharp shards (MSS), or Bosch process (deep reactive ion etching) with focused ion beam (FIB) milling as a final step. However, new methods are required for difficult samples. Many materials are not easily fabricated using electropolishing, MSS, or the Bosch process, FIB milling is slow and expensive, and wet chemistry and the reactive ion etching are typically limited to Si and other semiconductors. APFIM sample preparation using the dicing saw is commonly used to section semiconductor wafers into individual devices following manufacture. The dicing saw is a time-effective method for preparing high aspect ratio posts of poorly conducting materials. Femtosecond laser micromachining is also suitable for preparation of posts. FIB time required is reduced by about a factor of 10 and multi-tip specimens can easily be fabricated using the dicing saw.

rock varnish↗

NASA NTRS2004

Wide angle astrometric demonstration on the micro-arcsecond metrology testbed for the space interferometry mission

metrology↗

NASA NTRS2004

SIM Narrow and wide angle astrometric demonstration on the MAM testbed.

The Space Interferometry Mission (SIM) requires fringe measurements to the level of picometers in order to produce astrometric data at the micro-arc-second level. To be more specific, it is necessary to measure both the position of the starlight central fringe and the change in the internal optical path of the interferometer to tens of picometers. The internal path is measured with a small heterodyne metrology beam, whereas the starlight fringe position is estimated with a CCD sampling a large concentric annular beam. One major challenge for SIM is to align the metrology beam with the starlight beam to keep the consistency between these two sensors at the system level while articulating the instrument optics over the field of regard. The Micro-Arcsecond Metrology testbed (MAM), developed at the Jet Propulsion Laboratory, features an optical interferometer with a white light source, all major optical components of a stellar interferometer and heterodyne metrology sensors. The setup is installed inside a large vacuum chamber in order to mitigate the atmospheric and thermal disturbances. Astrometric observations are simulated by articulating the optics over the 15 degrees field of regard to generate multiple artificial stars. Recent data show agreement between the metrology and starlight paths to 20pm in the narrow angle field and to 350pm in the full wide angle field of regard of SIM. This paper describes the MAM optical setup, the observation process, the current data and how the performance relates to SIM.

Catanzarite, Joseph H.↗

NASA NTRS2019

Global Ecosystem Dynamics Investigation (GEDI) Instrument Alignment and Test

NASA's Global Ecosystem Dynamics Investigation (GEDI) instrument was launched Dec. 5, 2018, and installed on the International Space Station 419 km from Earth. The GEDI is a Light Detection and Ranging (LIDAR) instrument; measuring the time of flight of transmitted laser beams to the Earth and back to determine altitude for geospatial mapping of forest canopy heights. The need for very dense cross track sampling for slope measurements of canopy height is accomplished by using three individual laser transmitter systems, where each beam is split into two beams by a birefringent crystal. Furthermore, one transmitter is equipped with a diffractive optical element splitting the two beams into four, for a total of 8 beams. The beams are reflected off of the features and imaged by an 800 mm diameter Receiver Telescope Assembly, composed of a Ritchey-Chretien telescope, a refractive aft optics assembly and focal plane array which collects and focuses the light from the 8 probe beams into the 8 science fibers, each with a field of view on the Earth subtending 300 mu rad. The dense cross-track sampling mandated a custom designed dual-fiber interface. The science fibers had to be aligned to the nominal, projected laser spots. The alignment was highly dependent on optimization and co-positioning of the fibers pair-wise due to mechanical constraints. This paper presents the end-to-end alignment and metrology of the full optical system from transmitter elements through receiver telescope, aft-optics, focal plane and receiver fibers performed at NASA Goddard Space Flight Center.[GRAPHICS]

Bente Eegholm↗

NASA NTRSDate not supplied

Remotely-Sensed Aerosol Optical Properties Retrieved from a High Spectral Resolution Lidar (HSRL) During the FIREX-AQ Field Campaign

The NASA Langley Research Center’s High Spectral Resolution Lidar with Differential Absorption Lidar (HSRL-DIAL) instrument was flown on the NASA DC-8 aircraft during the Fire Influence on Region to Global Environments and Air Quality (FIREX-AQ; https://www.esrl.noaa.gov/csl/projects/firex-aq/) field campaign. The airborne HSRL-DIAL system retrieves aerosol backscatter and depolarization at 3 wavelengths (355, 532, and 1064 nm), aerosol extinction at 532 nm, and ozone concentration (differential at 290 and 300 nm). Additionally, the HSRL-DIAL system incorporates both a zenith and nadir telescope allowing for retrievals from in-smoke sampling to be integrated through the plume. During the first portion of the FIREX-AQ campaign, the DC8 aircraft sampled more than ten large-scale fires with varying fuels, combustion stages, and metrological conditions, with some fires being sampled multiple times across separate days. This presentation focuses on the retrievals of aerosol backscatter (at 532 and 1064 nm), aerosol depolarization (at 532 nm and 1064 nm), aerosol optical thickness (at 532 nm), lidar ratio, and color ratio to examine the changes in these properties in the smoke plume as they are advected downwind.

Taylor Shingler↗

DOE OSTI2021

Scalable multiphoton quantum metrology with neither pre- nor post-selected measurements

The quantum statistical fluctuations of electromagnetic fields establish a limit, known as the shot-noise limit, on the sensitivity of optical measurements performed with classical technologies. However, quantum technologies are not constrained by this shot-noise limit. In this regard, the possibility of using every photon produced by quantum sources of light to estimate small physical parameters, beyond the shot-noise limit, constitutes one of the main goals of quantum optics. Here, we experimentally demonstrate a scalable protocol for quantum-enhanced optical phase estimation across a broad range of phases, with neither pre- nor post-selected measurements. This is achieved through the efficient design of a source of spontaneous parametric downconversion in combination with photon-number-resolving detection. The robustness of two-mode squeezed vacuum states against loss allows us to outperform schemes based on N00N states, in which the loss of a single photon is enough to remove all phase information from a quantum state. In contrast to other schemes that rely on N00N states or conditional measurements, the sensitivity of our technique could be improved through the generation and detection of high-order photon pairs. This unique feature of our protocol makes it scalable. Furthermore, our work is important for quantum technologies that rely on multiphoton interference such as quantum imaging, boson sampling, and quantum networks.

36 MATERIALS SCIENCE↗

DOE OSTI2026

Toward the origins of binding energy shifts and “satellites” formation during plasma-XPS measurements

In-plasma x-ray photoelectron spectroscopy (plasma-XPS) emerges as a powerful platform for real-time, in situ chemical analysis under conditions relevant to semiconductor processing and other plasma-enabled technologies. This study investigates the origins of binding energy (BE) shifts and the formation of “satellite” peaks observed during plasma-XPS measurements across conductive, dielectric, and gas-phase systems. Using a standard laboratory-based ambient pressure XPS apparatus coupled with an alternating current (AC)-driven capacitively coupled plasma source, we demonstrate that metastable surface species, such as transient Au oxides, can be detected during plasma exposure, revealing chemical states that are hardly accessible using conventional ultrahigh vacuum (UHV) XPS. In dielectric samples (e.g., undoped diamond, sapphire), we observe pressure- and plasma-type-dependent BE shifts of more than 50 eV, attributed to x-ray-induced and plasma-mediated surface charging. These shifts are mitigated at higher pressures/plasmas or in electronegative plasmas (e.g., O 2 ), the latter due to enhanced charge compensation mechanisms involving slow negative ions. For gas-phase species, AC-plasma excitation leads to spectral broadening and the emergence of “satellite” peaks with energy separations of a few electron volts, linked to oscillating local plasma potentials in the probing volume. Furthermore, these findings highlight the complex and important interplay between plasma parameters, surface charging, and local electric fields in shaping XPS spectra. Overall, plasma-XPS emerges as a critical metrological tool for probing transient surface chemistry, with implications for semiconductor processing, material synthesis, and plasma diagnostics.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗

NASA NTRSDate not supplied

Metrological and Spectral Characterization of the Aspera Flight Optics

Aspera is a NASA's Astrophysics Pioneers mission, led by the University of Arizona. The aim of this mission is to study the presence of hot gasses (T=10^5-10^6 K) in the circumgalactic medium (CGM) and how the flow of these gasses affects galactic formation. One key enabling technology in the Aspera optical system is the use of more efficient UV-reflective optical coatings particularly at around 103.2 nm where the O VI emission line is located . In order to meet radiometric effective area requirements, the Goddard Space Flight Center (GSFC) code 551 Optics Branch applied Al (aluminum) + eLiF (enhanced lithium fluoride) on these optics, where the Al+LiF is annealed at elevated temperature (~250˚C) after the deposition and thus providing an improved version of the Al+LiF used in FUSE . Furthermore, these optics are encapsulated with a thin film of atomic layer deposited MgF2 at the Jet Propulsion Laboratory for enhanced durability . The efficiency and durability of these coatings depends on the quality of the optical surface in terms of cleanliness and roughness. Roughness increases the scatter off the coating and reduces the specular reflectance, and surface contaminants can accommodate moisture and other contaminants, increase scattering, and are weak points in the coating that may affect adhesion and subsequently the longevity of these coatings. Extensive optical metrology is necessary to minimize and quantify the impact of surface roughness and contaminants on optical surfaces. In this proceeding we report the inspection procedure implemented for Aspera optics at GSFC, from initial receiving of the optics to post-coating. Inspection includes Atomic Force Microscopy (AFM), Scanning White Light Interferometry (SWILI), Dark Field Microscopy (DFM), Phase Shifting Interferometry (PSI), and Vacuum ultraviolet (VUV) spectroscopy. Combinations of these techniques are used to inspect flight optics at each of the following steps: i) as-received, pre-cleaning inspection, ii) pre-coating, post-cleaning inspection, and iii) post-coating inspection. The evolution of roughness and other surface inspections such as contaminants are compared between each step to quantify the effect each step has on the flight optics. The final far ultraviolet (FUV) spectral performance of witness samples coated with the flight optics are presented.

Far Ultraviolet (FUV)↗

DOE OSTI2021

Meissner-London Susceptibility of Superconducting Right Circular Cylinders in an Axial Magnetic Field

Analysis of magnetic susceptibility of nonellipsoidal samples is a long-standing problem in experimental studies of magnetism and superconductivity. Here the quantitative description of the Meissner-London response (no Abrikosov vortices) of right circular cylinders in an axial magnetic field is given. Three-dimensional adaptive finite-element modeling is used to calculate the total magnetic moment ( m ) in a wide range of London penetration depth ( λ ) to sample size ( a ) ratios, λ /a. Furthermore, by fitting numerical solutions, the closed-form empirical magnetic susceptibility is obtained involving only sample dimensions and λ, thus providing a recipe for determining the London penetration depth from the precision measurements of the magnetic susceptibility. Detailed protocols of the experimental data analysis using the developed approach are given. The results can be readily extended to the most frequently used cuboid-shaped samples.

3-dimensional systems↗

NASA NTRS2012

Variable Sampling Mapping

The performance of an optical system (for example, a telescope) is limited by the misalignments and manufacturing imperfections of the optical elements in the system. The impact of these misalignments and imperfections can be quantified by the phase variations imparted on light traveling through the system. Phase retrieval is a methodology for determining these variations. Phase retrieval uses images taken with the optical system and using a light source of known shape and characteristics. Unlike interferometric methods, which require an optical reference for comparison, and unlike Shack-Hartmann wavefront sensors that require special optical hardware at the optical system's exit pupil, phase retrieval is an in situ, image-based method for determining the phase variations of light at the system s exit pupil. Phase retrieval can be used both as an optical metrology tool (during fabrication of optical surfaces and assembly of optical systems) and as a sensor used in active, closed-loop control of an optical system, to optimize performance. One class of phase-retrieval algorithms is the iterative transform algorithm (ITA). ITAs estimate the phase variations by iteratively enforcing known constraints in the exit pupil and at the detector, determined from modeled or measured data. The Variable Sampling Mapping (VSM) technique is a new method for enforcing these constraints in ITAs. VSM is an open framework for addressing a wide range of issues that have previously been considered detrimental to high-accuracy phase retrieval, including undersampled images, broadband illumination, images taken at or near best focus, chromatic aberrations, jitter or vibration of the optical system or detector, and dead or noisy detector pixels. The VSM is a model-to-data mapping procedure. In VSM, fully sampled electric fields at multiple wavelengths are modeled inside the phase-retrieval algorithm, and then these fields are mapped to intensities on the light detector, using the properties of the detector and optical system, for comparison with measured data. Ultimately, this model-to-data mapping procedure enables a more robust and accurate way of incorporating the exit-pupil and image detector constraints, which are fundamental to the general class of ITA phase retrieval algorithms.

Smith, Jeffrey, S.↗

DOE OSTI2020

Absolute Magnetometry with He3

We report development of a highly accurate (parts per billion) absolute magnetometer based on 3He NMR. Optical pumping polarizes the spins, long coherence times provide high sensitivity, and the 3He electron shell effectively isolates the nuclear spin providing accuracy limited only by corrections including materials, sample shape, and magnetization. Our magnetometer was used to confirm calibration, to 32 ppb, of the magnetic-field sensors used in recent measurements of the muon magnetic moment anomaly g-2, which differs from the standard model by 2.4 ppm. With independent determination of the magnetic moment of 3He, this work will lead the way to a new absolute magnetometry standard.

72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS↗

DOE OSTI2022

Realistic simulations of spin squeezing and cooperative coupling effects in large ensembles of interacting two-level systems

We describe an efficient numerical method for simulating the dynamics of interacting spin ensembles in the presence of dephasing and decay. The method builds on the discrete truncated Wigner approximation for isolated systems, which combines the mean-field dynamics of a spin ensemble with a Monte Carlo sampling of discrete initial spin values to account for quantum correlations. Here we show how this approach can be generalized for dissipative spin systems by replacing the deterministic mean-field evolution by a stochastic process, which describes the decay of coherences and populations while preserving the length of each spin. We demonstrate the application of this technique for simulating nonclassical spin-squeezing effects or the dynamics and steady states of cavity QED models with 10 5 interacting two-level systems. This opens up the possibility to perform accurate real-scale simulations of a diverse range of experiments in quantum optics or with solid-state spin ensembles under realistic laboratory conditions.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗