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Results for “HEMISPHERICAL-DIRECTIONAL REFLECTANCE FACTOR”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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NASA NTRS1987

Multiple-angle observations of reflectance anisotropy from an airborne linear array sensor

An airborne pointable imaging multispectral linear array sensor has been developed for the multidirectional observation of surface reflectance anisotropy. The sensor design permits observations up to 45 deg off-nadir in three spectral bands (green, red, and near-infrared). Calibration permits the conversion of sensor data to radiance units with an absolute uncertainty of 6 percent. Observations of five field plots from seven view directions are discussed. Calibration and atmospheric corrections are used to derive hemispherical-directional reflectance factors. A three-term reflectance model is fit to the reflectance factors for each plot to represent the continuous distribution of reflectance factors with view direction. The reflectance model is integrated over all view directions to calculate bihemispherical reflectance factors. The calculated bihemispherical factors differed by 1 to 25 percent from values based on an assumption of isotropic reflectance depending on spectral band and field plot. These calculations demonstrate the technologic and scientific capabilities required for the remote characterization of surface reflectance anisotropy. Remote multidirectional observations are both feasible and needed to fully evaluate land reflectance characteristics.

Irons, James R.↗
NASA NTRS1997

Determination of Aerosol Optical Depth and Land Surface Directional Reflectances Using Multiangle Imagery

Spectral aerosol optical depths, surface hemispherical-directional reflectance factors, and bihemispherical reflectances (albedos) are retrieved for an area of Glacier National Park using spectral, multiangle imagery obtained with the airborne advanced solid state array spectroradiometer (ASAS). The retrieval algorithms are described and are identical in principle to those being devised for use by the multiangle imaging spectroradiometer (MISR) which will fly on the EOS-AMI spacecraft in 1998. As part of its science mission, MISR will produce global coverage of both aerosol amounts an an surface reflection properties. The results in this paper represent the initial effort in applying the MISR algorithms to real data. These algorithms will undergo additional testing and validation as more multiangle data become available.

Martonchik, John V.↗
NASA NTRSDate not supplied

MISR Level 2 Surface parameters (MIL2ASLS_V1)

The Land Surface data include bihemispherical and directional-hemispherical reflectances (albedo), hemispherical directional and bidirectional reflectance factors (BRF), BRF model parameters, leaf-area index (LAI), fraction of photosynthetically active radiation (FPAR), and normalized difference vegetation index (NDVI) on a 1.1 km grid. The land surface data include hemispherical directional reflectance factor, bihemispherical reflectance (i.e., albedo), bidirectional reflectance factor, directional hemispherical reflectance, BRF model parameters, FPAR, and terrain-referenced view and illumination angles. [Location=GLOBAL LAND] [Temporal_Coverage: Start_Date=2000-02-24; Stop_Date=] [Spatial_Coverage: Southernmost_Latitude=-90; Northernmost_Latitude=90; Westernmost_Longitude=-180; Easternmost_Longitude=180] [Data_Resolution: Latitude_Resolution=1.1 km - 17.6 km; Longitude_Resolution=1.1 km - 17.6 km; Horizontal_Resolution_Range=1 km - < 10 km or approximately .01 degree - < .09 degree; Temporal_Resolution=about 15 orbits/day].

DIRECTIONAL HEMISPHERICAL REFLECTANCE↗
NASA NTRSDate not supplied

MISR Level 2 Surface parameters (MIL2ASLS_V2)

The Land Surface data include bihemispherical and directional-hemispherical reflectances (albedo), hemispherical directional and bidirectional reflectance factors (BRF), BRF model parameters, leaf-area index (LAI), fraction of photosynthetically active radiation (FPAR), and normalized difference vegetation index (NDVI) on a 1.1 km grid. The land surface data include hemispherical directional reflectance factor, bihemispherical reflectance (i.e., albedo), bidirectional reflectance factor, directional hemispherical reflectance, BRF model parameters, FPAR, and terrain-referenced view and illumination angles. [Location=GLOBAL LAND] [Temporal_Coverage: Start_Date=2000-02-24; Stop_Date=] [Spatial_Coverage: Southernmost_Latitude=-90; Northernmost_Latitude=90; Westernmost_Longitude=-180; Easternmost_Longitude=180] [Data_Resolution: Latitude_Resolution=1.1 km - 17.6 km; Longitude_Resolution=1.1 km - 17.6 km; Horizontal_Resolution_Range=1 km - < 10 km or approximately .01 degree - < .09 degree; Temporal_Resolution=about 15 orbits/day; Temporal_Resolution_Range=Daily - < Weekly, Daily - < Weekly].

BIDIRECTIONAL REFLECTANCE FACTOR↗
NASA NTRSDate not supplied

Goniometric and Polarized Imaging Spectroscopic Lab Measurements of Spacecraft Materials

To better characterize the spectral response of common spacecraft materials, the following laboratory measurements are presented to support the Space Situational Awareness community in the analysis of remotely sensed observational data. Of interest is classifying material reflective properties using directional reflectance spectroscopy and spatially resolved polarized imaging spectroscopy, allowing laboratory data to be applicable to ground-based optical telescope observations. The team acquired a typical CubeSat solar panel and a sample of multi-layer insulation (MLI) commonly used on spacecraft for initial measurements. The directional spectral data were collected at the Goniometer of the Rochester Institute of Technology (GRIT) laboratory with a lab and field goniometer incorporating two AnalyticalSpectral Device (ASD) spectrometers, a small Lab sphere integrating sphere also paired with an ASD spectrometer, and a Headwall micro-Hyperspec E-Series imaging spectrometer with an adjustable linear polarizer. The goniometer measures spectral bi-directional reflectance factor (BRF) data over a broad range from 350−2500 nm at 1 nm spacing with 3 nm spectral resolution in the visible and near infrared and 8 nm in the shortwave infrared. With the same spectral capabilities, the integrating sphere measures hemispherical-directional reflectance (HDR) in a 45◦-nadir configuration. The Headwall imager covers a spectral range from 400−1000 nm with 1.6 nm spectral resolution.Our initial BRF measurements show interference effects for both materials typically observed with thin films and high infrared reflectivity. In contrast, the interference effects are not present in the HDR measurements of the MLI likely due to the interference effects being averaged out over the reflecting hemisphere. Spatially resolved polarization ratio maps show variability across the materials due to the varying surface structure. We outline a plan for expanding our analysis to a broader range of materials to characterize their directional reflectance spectroscopy.

Chris H. Lee↗