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At least 19 records

Total cross sections for positrons scattered elastically from helium based on new measurements of total ionization cross sections

An improved technique is presented for employing the 2.3m spectrometer to measure total ionization cross sections, Q sub ion, for positrons incident on He. The new ionization cross section agree with the values reported earlier. Estimates are also presented of total elastic scattering cross section, Q sub el, obtained by subtracting from total scattering cross sections, Q sub tot, reported in the literature, the Q sub ion and Q sub Ps (total positronium formation cross sections) and total excitation cross sections, Q sub ex, published by another researcher. The Q sub ion and Q sub el measured with the 3m high resolution time-of-flight spectrometer for 54.9eV positrons are in accord with the results from the 2.3m spectrometer. The ionization cross sections are in fair agreement with theory tending for the most part to be higher, especially at 76.3 and 88.5eV. The elastic cross section agree quite well with theory to the vicinity of 50eV, but at 60eV and above the experimental elastic cross sections climb to and remain at about 0.30 pi a sub o sq while the theoretical values steadily decrease.

Diana, L. M.

Electron-impact total ionization cross sections of DNA sugar-phosphate backbone and an additivity principle

The improved binary-encounter dipole (iBED) model [W.M. Huo, Phys. Rev. A64, 042719-1 (2001)l is used to study the total ionization cross sections of the DNA sugar-phosphate backbone by electron impact. Calculations using neutral fragments found that the total ionization cross sections of C3' - and C5', -deoxyribose-phospate, two conformers of the sugar-phosphate backbone, are close to each other. Furthermore, the sum of the ionization cross sections of the separate deoxyribose and phosphate fragments is in close agreement with the C3' - and C5" -deoxyribose-phospate cross sections, differing by less than 10%. The result implies that certain properties of the-DNA, like the total singly ionization cross section, are localized properties and a building-up or additivity principle may apply. This allows us to obtain accurate properties of larger molecular systems built up from the results of smaller subsystem fragments. Calculations are underway using a negatively charged sugar-phosphate backbone with a metal counter-ion.

Huo, Winifred M.

Parametrization of electron impact ionization cross sections for CO, CO2, NH3 and SO2

The electron impact ionization and dissociative ionization cross section data of CO, CO2, CH4, NH3, and SO2, measured in the laboratory, were parameterized utilizing an empirical formula based on the Born approximation. For this purpose an chi squared minimization technique was employed which provided an excellent fit to the experimental data.

Srivastava, Santosh K.

Mass spectrometric determination of partial and total electron impact ionization cross sections of SO2 from threshold up to 200 eV

The partial and total ionization cross section for the formation of O(+), S(+), SO(+) and SO2(+) from the impact ionization of SO2 are reported, extending the electron impact energies to 200 eV. The relative flow technique is used to determine the cross section values. The threshold potentials for the products are 23.5 eV for O(+), 16.5 eV for S(+), 16.5 eV for SO(+), and 12.5 eV for SO2(+). Good agreement with the literature is found for SO(+) and SO2(+).

Orient, O. J.

Analytical ionization cross sections for atomic collisions

General analytical expressions for cross sections for direct ionization in atom-atom collisions are evaluated using the classical impulse approximation. The approach is also applied to ion-atom and molecule-molecule interactions. The overall accuracy of the obtained cross sections in a broad range of energy is better, when compared with existing measurements for many collision systems, than accuracy of other analytical predictions available in literature.

Kunc, J. A.

Ionization Cross Sections and Dissociation Channels of DNA Bases by Electron Collisions

Free secondary electrons are the most abundant secondary species in ionizing radiation. Their role in DNA damage, both direct and indirect, is an active area of research. While indirect damage by free radicals, particularly by the hydroxyl radical generated by electron collision with water. is relatively well studied, damage by direct electron collision with DNA is less well understood. Only recently Boudaiffa et al. demonstrated that electrons at energies well below ionization thresholds can induce substantial yields of single- and double-strand breaks in DNA by a resonant, dissociative attachment process. This study attracted renewed interest in electron collisions with DNA, especially in the low energy region. At higher energies ionization becomes important. While Monte Carlo track simulations of radiation damage always include ionization, the probability of dissociative ionization, i.e., simultaneous ionization and dissociation, is ignored. Just like dissociative attachment, dissociative ionization may be an important contributor to double-strand breaks since the radicals and ions produced by dissociative ionization, located in the vicinity of the DNA coil, can readily interact with other parts of the DNA. Using the improved binary-encounter dipole (iBED) formulation, we calculated the ionization cross sections of the four DNA bases, adenine, cytosine, guanine, and thymine, by electrons at energies from threshold to 1 KeV. The present calculation gives cross sections approximately 20% lower than the results by Bemhardt and Paretzke using the Deutsch-Mark and Binary-Encounter-Bethe (BEB) formalisms. The difference is most likely due to the lack of a shielding term in the dipole potential used in the Deutsch-Mark and BEB formalisms. The dissociation channels of ionization for the bases are currently being studied.

Huo, Winifred M.

Ionization Cross Sections and Dissociation Channels of the DNA Sugar-Phosphate Backbone by Electron Collisions

It has been suggested that the genotoxic effects of ionizing radiation in living cells are not caused by the highly energetic incident radiation, but rather are induced by less energetic secondary species generated, the most abundant of which are free electrons.' The secondary electrons will further react to cause DNA damage via indirect and direct mechanisms. Detailed knowledge of these mechanisms is ultimately important for the development of global models of cellular radiation damage. We are studying one possible mechanism for the formation cf DNA strand breaks involving dissociative ionization of the DNA sugar-phosphate backbone induced by secondary electron co!lisions. We will present ionization cross sections at electron collision energies between threshold and 10 KeV using the improved binary encounter dipole (iBED) formulation' Preliminary results of the possible dissociative ionization pathways will be presented. It is speculated that radical fragments produced from the dissociative ionization can further react, providing a possible mechanism for double strand breaks and base damage.

Dateo, Christopher