Search NASA⌕ Search

SEARCH · Search NASA

Results for “IV-curve”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.

3 records
All sourcesNASA NTRSDOE OSTI
DOE OSTI2026

Modeling the PV System Level Economic Impact of PV Connector Failure Modes

Photovoltaic (PV) connectors must maintain mechanical integrity for over 25 years while operating under UV exposure, elevated temperature, and mechanical loading. Connector degradation increases with electrical resistance, leading to energy losses, unplanned downtime, and higher operation and maintenance (O&M) costs and in severe cases, safety risks from overhearing or arcing. Connector related failures remain among the most frequent causes of disruption in utility-scale PV (UPV) systems, yet their lifetime economic impacts are poorly quantified. This work presents a techno-economic analysis (TEA) framework that links identified connector failure modes to system level energy losses and lifetime cost impacts using identified resistance measurements and failure rates from 6,2761 PV connectors inspected. Connector failures increase system level O&M costs, raising LCOE by roughly 5%. Downtime driven availability losses dominate economic impact. Resistance-driven I2R and IV-curve losses are secondary, but remain non-negligible. Thermal damage, bend-radius violations, and loose connections drive the majority of LCOE uplift Improving connector reliability through better installation quality, inspection, and design can meaningfully reduce lost energy, O&M costs, and LCOE.

14 SOLAR ENERGY↗
DOE OSTI2024

Bifacial Photovoltaic Module Degradation Dynamics

In a comprehensive study conducted at NREL's 75 kW bifacial single-axis-tracked field, accelerated degradation was observed in four out of five bifacial silicon photovoltaic (PV) module technologies when compared to their monofacial counterparts. Root cause analysis of accelerated bifacial degradation involved various analytical tools and techniques. This included employing RdTools to identify rates of power loss, conducting measurements on fielded and control modules using infrared imaging, electroluminescence (EL) and photoluminescence (PL), quantum efficiency (QE) analysis, IV-curves assessment, as well as utilizing handheld Raman and reflectance measurement targeted at anti-reflective coating. Most cases pointed to carrier lifetime degradation causing Voc loss and simultaneous Isc loss. In some cases, Isc further decreases likely due to optical effects from encapsulant degradation. The outcomes and methodologies employed in this investigation are documented in this publication. This study's significance is further emphasized by placing the findings within the broader context of the performance and degradation of various bifacial systems, as identified in the PV Fleets data.

bifacial↗
DOE OSTI2021

Methods for Evaluating DC Arc Incident Energy in PV Systems: Preprint

Renewable energy systems continue to be one of the fastest growing segments of the energy industry. This paper focuses on the understanding of how photovoltaic (PV) technology behaves under dc arc conditions. Emphasis is placed on the electrical safety aspect of DC arc flash incident energy evaluation. Because of the fast proliferation of PV systems and the lack of formal equivalent calculation guidelines such as IEEE 1584 for AC systems, it has been necessary to rely on different equations and models presented by various researchers over the last few years. This paper discusses the behavior of PV systems under arc conditions and presents the results of available methods to estimate the dc arc flash incident energy. This paper provides a comparative analysis of a proposed arc-flash incident energy calculation method against different laboratory tests including those performed by NREL. Detailed explanations are provided regarding the effect of PV module I-V and P-V curves under arcing conditions. Examples of the application of the proposed calculation method to the test measurements are included.

70 PLASMA PHYSICS AND FUSION TECHNOLOGY↗