Walsh functions in image processing, feature selection and pattern recognition
Walsh functions in image processing, rotational feature selection and pattern recognition, defining set of orthogonal transformations
Andrews, H. C.↗
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Data management in pattern recognition and image processing systems
Data management considerations are important to any system which handles large volumes of data or where the manipulation of data is technically sophisticated. A particular problem is the introduction of image-formatted files into the mainstream of data processing application. This report describes a comprehensive system for the manipulation of image, tabular, and graphical data sets which involve conversions between the various data types. A key characteristic is the use of image processing technology to accomplish data management tasks. Because of this, the term 'image-based information system' has been adopted.
Zobrist, A. L.↗
Optical Processing of Speckle Images with Bacteriorhodopsin for Pattern Recognition
Logarithmic processing of images with multiplicative noise characteristics can be utilized to transform the image into one with an additive noise distribution. This simplifies subsequent image processing steps for applications such as image restoration or correlation for pattern recognition. One particularly common form of multiplicative noise is speckle, for which the logarithmic operation not only produces additive noise, but also makes it of constant variance (signal-independent). We examine the optical transmission properties of some bacteriorhodopsin films here and find them well suited to implement such a pointwise logarithmic transformation optically in a parallel fashion. We present experimental results of the optical conversion of speckle images into transformed images with additive, signal-independent noise statistics using the real-time photochromic properties of bacteriorhodopsin. We provide an example of improved correlation performance in terms of correlation peak signal-to-noise for such a transformed speckle image.
Downie, John D.↗
Improvements for Image Compression Using Adaptive Principal Component Extraction (APEX)
The issues of image compression and pattern classification have been a primary focus of researchers among a variety of fields including signal and image processing, pattern recognition, data classification, etc. These issues depend on finding an efficient representation of the source data. In this paper we collate our earlier results where we introduced the application of the. Hilbe.rt scan to a principal component algorithm (PCA) with Adaptive Principal Component Extraction (APEX) neural network model. We apply these technique to medical imaging, particularly image representation and compression. We apply the Hilbert scan to the APEX algorithm to improve results
Ziyad, Nigel A.↗
Data compression in digitized lines
The problem of data compression is very important in digital photogrammetry, computer assisted cartography, and GIS/LIS. In addition, it is also applicable in many other fields such as computer vision, image processing, pattern recognition, and artificial intelligence. Consequently, there are many algorithms available to solve this problem but none of them are considered to be satisfactory. In this paper, a new method of finding critical points in a digitized curve is explained. This technique, based on the normalized symmetric scattered matrix, is good for both critical points detection and data compression. In addition, the critical points detected by this algorithm are compared with those by zero-crossings.
Thapa, Khagendra↗
NASA-HBCU Space Science and Engineering Research Forum Proceedings
The proceedings of the Historically Black Colleges and Universities (HBCU) forum are presented. A wide range of research topics from plant science to space science and related academic areas was covered. The sessions were divided into the following subject areas: Life science; Mathematical modeling, image processing, pattern recognition, and algorithms; Microgravity processing, space utilization and application; Physical science and chemistry; Research and training programs; Space science (astronomy, planetary science, asteroids, moon); Space technology (engineering, structures and systems for application in space); Space technology (physics of materials and systems for space applications); and Technology (materials, techniques, measurements).
Sanders, Yvonne D.↗
Multiscale vector fields for image pattern recognition
A uniform processing framework for low-level vision computing in which a bank of spatial filters maps the image intensity structure at each pixel into an abstract feature space is proposed. Some properties of the filters and the feature space are described. Local orientation is measured by a vector sum in the feature space as follows: each filter's preferred orientation along with the strength of the filter's output determine the orientation and the length of a vector in the feature space; the vectors for all filters are summed to yield a resultant vector for a particular pixel and scale. The orientation of the resultant vector indicates the local orientation, and the magnitude of the vector indicates the strength of the local orientation preference. Limitations of the vector sum method are discussed. Investigations show that the processing framework provides a useful, redundant representation of image structure across orientation and scale.
Low, Kah-Chan↗
A neural network prototyping package within IRAF
We outline our plans for incorporating a Neural Network Prototyping Package into the IRAF environment. The package we are developing will allow the user to choose between different types of networks and to specify the details of the particular architecture chosen. Neural networks consist of a highly interconnected set of simple processing units. The strengths of the connections between units are determined by weights which are adaptively set as the network 'learns'. In some cases, learning can be a separate phase of the user cycle of the network while in other cases the network learns continuously. Neural networks have been found to be very useful in pattern recognition and image processing applications. They can form very general 'decision boundaries' to differentiate between objects in pattern space and they can be used for associative recall of patterns based on partial cures and for adaptive filtering. We discuss the different architectures we plan to use and give examples of what they can do.
Bazell, D.↗
Proceedings of the NASA/MPRIA Workshop: Pattern Recognition
Outlines of talks presented at the workshop conducted at Texas A & M University on February 3 and 4, 1983 are presented. Emphasis was given to the application of Mathematics to image processing and pattern recognition.
Guseman, L. F., Jr.↗
Image databases: Problems and perspectives
With the increasing number of computer graphics, image processing, and pattern recognition applications, economical storage, efficient representation and manipulation, and powerful and flexible query languages for retrieval of image data are of paramount importance. These and related issues pertinent to image data bases are examined.
Gudivada, V. Naidu↗
Fuzzy logic applications to expert systems and control
A considerable amount of work on the development of fuzzy logic algorithms and application to space related control problems has been done at the Johnson Space Center (JSC) over the past few years. Particularly, guidance control systems for space vehicles during proximity operations, learning systems utilizing neural networks, control of data processing during rendezvous navigation, collision avoidance algorithms, camera tracking controllers, and tether controllers have been developed utilizing fuzzy logic technology. Several other areas in which fuzzy sets and related concepts are being considered at JSC are diagnostic systems, control of robot arms, pattern recognition, and image processing. It has become evident, based on the commercial applications of fuzzy technology in Japan and China during the last few years, that this technology should be exploited by the government as well as private industry for energy savings.
Lea, Robert N.↗
Antenna analysis using neural networks
Conventional computing schemes have long been used to analyze problems in electromagnetics (EM). The vast majority of EM applications require computationally intensive algorithms involving numerical integration and solutions to large systems of equations. The feasibility of using neural network computing algorithms for antenna analysis is investigated. The ultimate goal is to use a trained neural network algorithm to reduce the computational demands of existing reflector surface error compensation techniques. Neural networks are computational algorithms based on neurobiological systems. Neural nets consist of massively parallel interconnected nonlinear computational elements. They are often employed in pattern recognition and image processing problems. Recently, neural network analysis has been applied in the electromagnetics area for the design of frequency selective surfaces and beam forming networks. The backpropagation training algorithm was employed to simulate classical antenna array synthesis techniques. The Woodward-Lawson (W-L) and Dolph-Chebyshev (D-C) array pattern synthesis techniques were used to train the neural network. The inputs to the network were samples of the desired synthesis pattern. The outputs are the array element excitations required to synthesize the desired pattern. Once trained, the network is used to simulate the W-L or D-C techniques. Various sector patterns and cosecant-type patterns (27 total) generated using W-L synthesis were used to train the network. Desired pattern samples were then fed to the neural network. The outputs of the network were the simulated W-L excitations. A 20 element linear array was used. There were 41 input pattern samples with 40 output excitations (20 real parts, 20 imaginary). A comparison between the simulated and actual W-L techniques is shown for a triangular-shaped pattern. Dolph-Chebyshev is a different class of synthesis technique in that D-C is used for side lobe control as opposed to pattern shaping. The interesting thing about D-C synthesis is that the side lobes have the same amplitude. Five-element arrays were used. Again, 41 pattern samples were used for the input. Nine actual D-C patterns ranging from -10 dB to -30 dB side lobe levels were used to train the network. A comparison between simulated and actual D-C techniques for a pattern with -22 dB side lobe level is shown. The goal for this research was to evaluate the performance of neural network computing with antennas. Future applications will employ the backpropagation training algorithm to drastically reduce the computational complexity involved in performing EM compensation for surface errors in large space reflector antennas.
Smith, William T.↗
Introduction to Remote Sensing Image Registration
For many applications, accurate and fast image registration of large amounts of multi-source data is the first necessary step before subsequent processing and integration. Image registration is defined by several steps and each step can be approached by various methods which all present diverse advantages and drawbacks depending on the type of data, the type of applications, the a prior information known about the data and the type of accuracy that is required. This paper will first present a general overview of remote sensing image registration and then will go over a few specific methods and their applications
Pattern Recognition↗
Introduction to Remote Sensing Image Registration
For many applications, accurate and fast image registration of large amounts of multi-source data is the first necessary step before subsequent processing and integration. Image registration is defined by several steps and each step can be approached by various methods which all present diverse advantages and drawbacks depending on the type of data, the type of applications, the a priori information known about the data and the type of accuracy that is required. This paper will first present a general overview of remote sensing image registration and then will go over a few specific methods and their applications.
Pattern Recognition↗
Quantification Of 4H- To 3C-Polymorphism In Silicon Carbide (SiC) Epilayers And An Investigation Of Recombination-Enhanced Dislocation Motion In SiC By Optical Emission Microscopy (Oem) Techniques
Environments that impose operational constraints on conventional silicon-(Si) based semiconductor devices frequently appear in military- and space-grade applications. These constraints include high temperature, high power, and high radiation environments. Silicon carbide (SiC), an alternative type of semiconductor material, has received abundant research attention in the past few years, owing to its radiation-hardened properties as well as its capability to withstand high temperatures and power levels. However, the growth and manufacture of SiC devices is still comparatively immature, and there are severe limitations in present crystal growth and device fabrication processes. Among these limitations is a variety of crystal imperfections known as defects. These imperfections can be point defects (e.g., vacancies and interstitials), line defects (e.g., edge and screw dislocations), or planar defects (e.g., stacking faults and double-positioning boundaries). All of these defects have been experimentally shown to be detrimental to the performance of electron devices made from SiC. As such, it is imperative that these defects are significantly reduced in order for SiC devices to become a viable entity in the electronics world. The NASA Glenn High Temperature Integrated Electronics & Sensors Team (HTIES) is working to identify and eliminate these defects in SiC by implementing improved epitaxial crystal growth procedures. HTIES takes two-inch SiC wafers and etches patterns, producing thousands of mesas into each wafer. Crystal growth is then carried out on top of these mesas in an effort to produce films of improved quality-resulting in electron devices that demonstrate superior performance-as well as fabrication processes that are cost-effective, reliable, and reproducible. In this work, further steps are taken to automate HTIES' SiC wafer inspection system. National Instruments LabVIEW image processing and pattern recognition routines are developed that are capable of quantifying and mapping defects on both the substrate and mesa surfaces, and of quantifying polymorphic changes in the grown materials. In addition, an optical emission microscopy (OEM) system is developed that will facilitate comprehensive study of recombination-enhanced dislocation motion (REDM).
Speer, Kevin M.↗
Planetary Crater Detection and Registration Using Marked Point Processes, Multiple Birth and Death Algorithms, and Region-Based Analysis
Because of the large variety of sensors and spacecraft collecting data, planetary science needs to integrate various multi-sensor and multi-temporal images. These multiple data represent a precious asset, as they allow the study of targets spectral responses and of changes in the surface structure; because of their variety, they also require accurate and robust registration. A new crater detection algorithm, used to extract features that will be integrated in an image registration framework, is presented. A marked point process-based method has been developed to model the spatial distribution of elliptical objects (i.e. the craters) and a birth-death Markov chain Monte Carlo method, coupled with a region-based scheme aiming at computational efficiency, is used to find the optimal configuration fitting the image. The extracted features are exploited, together with a newly defined fitness function based on a modified Hausdorff distance, by an image registration algorithm whose architecture has been designed to minimize the computational time.
Image Processing; Pattern Recognition↗
Registration of Textured Remote Sensing Images Using Directional Gabor Frames
In this paper we propose to utilize a new concept of discrete directional Gabor frames for automatic image registration. The directional Gabor representations have been shown to provide more accurate feature extraction than directional wavelet transforms for images where texture is the dominant feature. Initial experimental results are presented here which indicate that discrete directional Gabor frames exhibit strong correlations, which indicates that they are likely to improve the existing image registration toolbox.
Image Processing; Pattern Recognition↗
Planetary Crater Detection and Registration Using Marked Point Processes, Multiple Birth and Death Algorithms, and Region-Based Analysis
Because of the large variety of sensors and spacecraft collecting data, planetary science needs to integrate various multi-sensor and multi-temporal images. These multiple data represent a precious asset, as they allow the study of targets spectral responses and of changes in the surface structure; because of their variety, they also require accurate and robust registration. A new crater detection algorithm, used to extract features that will be integrated in an image registration framework, is presented. A marked point process-based method has been developed to model the spatial distribution of elliptical objects (i.e. the craters) and a birth-death Markov chain Monte Carlo method, coupled with a region-based scheme aiming at computational efficiency, is used to find the optimal configuration fitting the image. The extracted features are exploited, together with a newly defined fitness function based on a modified Hausdorff distance, by an image registration algorithm whose architecture has been designed to minimize the computational time.
Image Processing:Pattern Recognition↗