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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 19 records
All sourcesNASA NTRSDOE OSTI
DOE OSTI2020

IRDFF-II: A New Neutron Metrology Library

High quality nuclear data is the most fundamental underpinning for all neutron metrology applications. This paper describes the release of version II of the International Reactor Dosimetry and Fusion File (IRDFF-II) that contains a consistent set of nuclear data for fission and fusion neutron metrology applications up to 60 MeV neutron energy. The library is intended to support: a) applications in research reactors; b) safety and regulatory applications in the nuclear power generation in commercial fission reactors; and c) material damage studies in support of the research and development of advanced fusion concepts. The paper describes the contents of the library, documents the thorough verification process used in its preparation, and provides an extensive set of validation data gathered from a wide range of neutron benchmark fields. The new IRDFF-II library includes 119 metrology reactions, four cover material reactions to support self-shielding corrections, five metrology metrics used by the dosimetry community, and cumulative fission products yields for seven fission products in three different neutron energy regions. In support of characterizing the measurement of the residual nuclei from the dosimetry reactions and the fission product decay modes, the present document lists the recommended decay data, particle emission energies and probabilities for 68 activation products. It also includes neutron spectral characterization data for 29 neutron benchmark fields for the validation of the library contents. Additional six reference fields were assessed (four from plutonium critical assemblies, two measured fields for thermal-neutron induced fission on 233U and 239Pu targets) but not used for validation due to systematic discrepancies in C/E reaction rate values or lack of reaction-rate experimental data. Another ten analytical functions are included that can be useful for calculating average cross sections, average energy, thermal spectrum average cross sections and resonance integrals. The IRDFF-II library and comprehensive documentation is available online at www-nds.iaea.org/IRDFF/. Evaluated cross sections can be compared with experimental data and other evaluations at www-nds.iaea.org/exfor/endf.htm. The new library is expected to become the international reference in neutron metrology for multiple applications.

IAEA IRDFF↗
DOE OSTI2024

Static metrology of the meter-scale deformable heliostat

This paper describes a heliostat metrology system which is developed based on deflectometry, utilizing a static perforated panel instead of conventional dynamic monitor displays to provide incident rays. The developed method is named static screen deflectometry (SSD). This robust and scalable method is especially valuable for outdoor tests of large reflectors used in concentrating solar-thermal power (CSP) systems. The developed method has been successfully demonstrated on a 2.4 𝑚 × 3.3 𝑚 float glass deformable reflector bent to focus sunlight at 113 𝑚 distance throughout a day. From images obtained from a camera at 50𝑚 distance, the reflector surface was measured to an accuracy of less than 1 𝑚𝑟𝑎𝑑 rms slope error in the full test scope.

14 SOLAR ENERGY↗
DOE OSTI2022

America’s Cutting Edge CNC machining and metrology training

This paper describes the workforce development activities supported by America’s Cutting Edge (ACE), a national initiative for machine tool technology development and advancement. ACE is supported by the Department of Defense Industrial Base Analysis and Sustainment (IBAS) program from the Office of Industrial Policy. Both the online and in-person components of the computer numerically controlled (CNC) machining and metrology training programs are summarized and participation information is provided.

99 GENERAL AND MISCELLANEOUS↗
DOE OSTI2021

High Throughput In-Line Coating Metrology Development for Solid Oxide Fuel Cell Manufacturing

Coatings play key roles in solid oxide fuel cell (SOFC) stack durability. For example, diffusion barrier coatings on Cr-containing interconnect and balance of plant (BOP) components protect electrodes from Cr poisoning over the long operational lifetimes (>10,000 hours) of the fuel cell stack. Common defects in coatings, such as cracks, pinholes, and porosity, result in a failure to protect the electrodes, resulting in shorter operational lifetime and thus higher cost. It is very unlikely, even in the best coating process, that all these defects can be mitigated, hence identifying critical defects in parts, and removing defective parts from production before they can damage the stack, becomes paramount. Furthermore, these quality control techniques must be operational in the production/assembly line (in-line), i.e., high throughput and non-destructive, and cost effective. Redox Power Systems, LLC (Redox) together with the National Renewable Energy Laboratory (NREL) developed much needed high throughput, in-line metrology techniques for protective coatings. The overall goal of the project is to lower cost while increasing robustness, reliability, and endurance of SOFC stacks. To accomplish this, we had several objectives, including: to identify key coating and substrate defects that lead to coating failure through the use of detailed characterization methods (e.g., microscopy, XRD, EDS, electrochemistry); to assess capabilities of in-line metrology techniques, e.g., optical profilometry (Redox) and thermography (NREL), to probe these defects, or evidence thereof; demonstrate long-term performance of “defect-free” protective coatings, as identified by in-line metrology, in solid oxide fuel cell (SOFC) stack operation. In the first part of this project, the ability to identify key defects expected to lead to coating and SOFC degradation using in-line metrology tools were evaluated. Coated interconnect samples with controlled defect types and populations were tested under conditions similar to SOFC operation, followed by detailed post-test analysis to reveal the defects responsible for observed degradation. In the second part of the project, the optimal in-line metrology techniques and methodologies were used to map the defect distribution in full-size interconnects with critical defects intentionally allowed to exist in some cases. These interconnects underwent SOFC testing for extended periods (up to ~3,000 hours) followed by post-test analysis to evaluate the effectiveness of in-line metrology techniques in mitigating MCO coating related degradation. Key accomplishments in this project included the following: Demonstrated ASR of < 0.05 ohm-cm 2 at 650 °C for 1,000 hours with low defect (determined by in-line metrology) interconnect samples (average ASR=37 milliohms-cm 2 after over 1,000 hours). Demonstrated that low defect coatings on interconnects (as screened using in-line metrology) have low volatilization of chromium at ~650 °C for 1,000 hours as detected using Cr-getter material (< 5 at% increase above baseline); 1022 hour duration tests under humidified, elevated temperature (750 °C rather than 650 °C) compared a base case against different coating thicknesses. Demonstrated capability to identify initial key defects of interest with in-line metrology techniques using up to 8 cm by 10 cm having coatings with and without intentional defects of interest using thermal imaging and optical profilometry. Correlated key defects identified using metrology techniques with observed coating performance (e.g., ASR and Cr volatility). Conducted several 4 cm by 4 cm cell tests using MCO-interconnects that were pre-screened using some of the metrology techniques developed in the project (e.g., optical profilometry). An analysis of ASR measurements were able to show that defect-free coatings resulted in the anticipated performance in the cell tests.

01 COAL, LIGNITE, AND PEAT↗
DOE OSTI2021

Three-Dimensional Network Adjustment of Laser Tracker Measurements for Large-Scale Metrology Applications

The adjustment of laser tracker network measurements for large-scale metrology applications has unique considerations not commonly encountered in the network adjustment approaches generally used in either standard metrology or in traditional geodetic surveying. Many applications that require the measurement accuracy of a laser tracker are confined to small working areas to measure the dimensional quality of manufactured parts. Large-scale metrology applications require the same high measurement accuracy, but over a comparatively larger working area. This paper describes a unified least-squares approach to adjust three-dimensional survey network measurements that takes into account the unique considerations of large-scale metrology networks. The impetus for these unique considerations arises from an application that falls neatly between the disciplines of metrology and geodesy—resembling a mixture of the conditions and requirements from both. In conclusion, this paper will also describe a case study of a large-scale metrology survey network used to align the particle accelerator at Michigan State University’s Facility for Rare Isotope Beams (FRIB).

42 ENGINEERING↗
DOE OSTI2022

Binary pseudo-random array standards for calibration of 3D optical surface profilers used for metrology with aspheric x-ray optics

High-accuracy surface metrology is vitally important in manufacturing ultra-high-quality free-form mirrors designed to manipulate x-ray light with nanometer-scale wavelengths. The current and potential capabilities of x˗ray mirror manufacturing are limited by inherent imperfections of the integrated metrology tools. Metrology tools are currently calibrated with super-polished flat test-standard/reference mirrors. This is acceptable for fabrication of slightly curved x-ray optics. However, for even moderately curved aspherical x-ray mirrors the flat-reference calibration is not sufficiently accurate. For micro-stitching interferometry developed for surface measurements with curved x-ray mirrors, the tool aberration errors are known to be transferred into the optical surface topography of x-ray mirrors. Our approach to improving metrology is to thoroughly calibrate the measuring tool and apply the results of the calibration to deconvolution of the measured data. Here we explore the application of a recently developed technique for calibrating the instrument transfer function (ITF) of 3D optical surface profilers to metrology with significantly curved x-ray optics. The technique, based on test standards patterned with two-dimensional (2D) binary pseudo-random arrays (BPRAs), employs the unique properties of the BPRA patterns in the spatial frequency domain. The inherent 2D power spectral density of the pattern has a deterministic white-noise-like character that allows direct determination of the ITF with uniform sensitivity over the entire spatial frequency range and field of view of an instrument. The high efficacy of the technique has been previously demonstrated in application to metrology with flat and slightly curved optics. Here, we concentrate on development of an efficient fabrication process for production of highly randomized (HR) BPRA test standards on flat and 500-mm spherical optical substrates. We also compare and discuss the results of the ITF calibration of an interferometric microscope when using the HR BPRA standards on flat and curved substrates.

Munechika, Keiko↗
DOE OSTI2024

Binary pseudo-random array standards for calibration of 3D optical surface profilers used for metrology with significantly curved x-ray optics

High-accuracy metrology is vitally important in manufacturing ultra-high-quality free-form mirrors designed to manipulate X-ray light with nanometer-scale wavelengths. The current capabilities and possibility for improvements in X-ray mirror manufacturing are limited by inherent imperfections of the integrated metrology tools. In the case of Fizeau interferometry, metrology tools are currently calibrated with super-polished flat test-standard/reference mirrors. This is acceptable for measuring slightly curved X-ray optics. However, for even moderately curved aspherical X-ray mirrors the flat-reference calibration is not sufficiently accurate and stitching Fizeau interferometer-based surface metrology is used to mitigate the problem. But still, the retrace and aberration errors, as well as the limited spatial resolution, described with the instrument transfer function (ITF), can be transferred into the optical surface topography of X-ray mirrors obtained in stitching metrology. For ITF calibration, we have developed an original technique, based on test standards structured as two-dimensional (2D) highly-randomized (HR) binary pseudo-random arrays (BPRAs). The technique employs the unique properties of the HR BPRA patterns in the spatial frequency domain., i.e. the inherent 2D power spectral density of the HR BPRA pattern has a deterministic white-noise-like character that allows direct determination of the ITF with uniform sensitivity over the entire spatial frequency range and field-of-view of an instrument. Here, we explore technological, metrological, and analytical aspects essential for calibration of the retrace and aberration errors of Fizeau interferometers using different types of tilted test samples, including a super-polished reference mirror for the re-trace calibration and the uniformly redundant array (URA) BPRA standards for the geometrical distortion (aberration) calibration. While the first method was previously demonstrated by researchers at DIAMOND Light Source, a method based on the URA BPRA is described and demonstrated here for the first time. We outline the design and fabrication process used in fabrication of URA BPRA test standards, and present the results of application of the URA BPRA standards demonstrating the high efficacy of our approach to geometrical distortion calibration of Fizeau interferometers. We also discuss the possible sources of unexpected peculiarities of the systematic errors, including an astigmatic character of the retrace error, observed with Fizeau interferometers at the Advanced Light Source X-Ray Optics Laboratory.

Munechika, Keiko↗
DOE OSTI2020

Super-resolution surface slope metrology of x-ray mirrors

We present experimental, analytical, and numerical methods developed for reconstruction (deconvolution) of one-dimensional (1D) surface slope profiles over the spatial frequency range where the raw data are significantly perturbed due to the limited resolution of the measurement instrument. We characterize the spatial resolution properties of a profiler with the instrument's transfer function (ITF). To precisely measure the ITF, we apply a recently developed method utilizing test surfaces with 1D linear chirped height profiles of constant slope amplitude. Based on the results of the ITF calibration, we determine parameters of an analytical model for the ITF that is used in the original reconstruction software. Here, we treat surface slope metrology data obtained with the Optical Surface Measuring System (OSMS), using as a sensor an electronic autocollimator (AC) ELCOMAT-3000. The spatial resolution of the OSMS is limited by the size of the AC light-beam-collimating aperture. For the purposes of this investigation, the OSMS is equipped with a circular aperture with a diameter of 2.5 mm. This is a typical arrangement of most AC-based slope profilers developed for surface slope metrology of state-of-the-art x-ray mirrors. Using the example of surface slope metrology of two state-of-the-art elliptically shaped x-ray focusing mirrors, we demonstrate that the developed data reconstruction procedure allows us to significantly improve the accuracy of surface slope metrology with the OSMS over the spatial wavelength range from ~1.6 mm to 7 mm. Thus, the amplitude of the quasi-periodic error characteristic of the deterministic polishing process used appears to be higher by a factor of~2 than is apparent from the rough metrology data. Underestimation of the surface slope errors in this spatial wavelength range can lead to serious errors in the expected performance of x-ray mirrors in synchrotron beamlines, especially at modern light sources utilizing coherent x rays, where the perturbations can lead to increased speckle-like intensity variation.

47 OTHER INSTRUMENTATION↗
DOE OSTI2023

Time-Energy Uncertainty Relation for Noisy Quantum Metrology

Detection of very weak forces and precise measurement of time are two of the many applications of quantum metrology to science and technology. To sense an unknown physical parameter, one prepares an initial state of a probe system, allows the probe to evolve as governed by a Hamiltonian 𝐻 for some time 𝑡, and then measures the probe. If 𝐻 is known, we can estimate 𝑡 by this method; if 𝑡 is known, we can estimate classical parameters on which 𝐻 depends. The accuracy of a quantum sensor can be limited by either intrinsic quantum noise or by noise arising from the interactions of the probe with its environment. In this work, we introduce and study a fundamental trade-off, which relates the amount by which noise reduces the accuracy of a quantum clock to the amount of information about the energy of the clock that leaks to the environment. Specifically, we consider an idealized scenario in which a party Alice prepares an initial pure state of the clock, allows the clock to evolve for a time that is not precisely known, and then transmits the clock through a noisy channel to a party Bob. Meanwhile, the environment (Eve) receives any information about the clock that is lost during transmission. We prove that Bob’s loss of quantum Fisher information about the elapsed time is equal to Eve’s gain of quantum Fisher information about a complementary energy parameter. We also prove a similar, but more general, trade-off that applies when Bob and Eve wish to estimate the values of parameters associated with two noncommuting observables. We derive the necessary and sufficient conditions for the accuracy of the clock to be unaffected by the noise, which form a subset of the Knill-Laflamme error-correction conditions. A state and its local time-evolution direction, if they satisfy these conditions, are said to form a metrological code. We provide a scheme to construct metrological codes in the stabilizer formalism. We show that there are metrological codes that cannot be written as a quantum error-correcting code with similar distance in which the Hamiltonian acts as a logical operator, potentially offering new schemes for constructing states that do not lose any sensitivity upon application of a noisy channel. We discuss applications of the trade-off relation to sensing using a quantum many-body probe subject to erasure or amplitude-damping noise.

metrology↗
DOE OSTI2025

Noise Constraints on Sensitivity Scaling in Quantum Nonlinear Metrology

Quantum-enhanced metrology surpasses classical metrology by improving estimation precision scaling with a resource 𝑁 (e.g., particle number or energy) from 1/√𝑁 to 1/𝑁. Through the use of nonlinear effects, Roy and Braunstein [Exponentially enhanced quantum metrology, Phys. Rev. Lett. 100, 220501 (2008)] derived a 1/𝑁 2 scaling. However, later works argued this exponential improvement is unphysical and that even modest gains, like 1/𝑁 2 , may vanish under noise. We show that, in the presence of small errors, the nonlinear interactions enabling metrological enhancement induce emergent errors. Here, the errors propagate through the sensing protocol and are magnified proportional to any intended nonlinear enhancement. We identify a critical value of the parameter to be estimated, for a fixed error, below which the emergent errors can be avoided.

Quantum Fisher information↗
DOE OSTI2023

Improving metrology with quantum scrambling

Quantum scrambling describes the spreading of information into many degrees of freedom in quantum systems, such that the information is no longer accessible locally but becomes distributed throughout the system. This idea can explain how quantum systems become classical and acquire a finite temperature, or how in black holes the information about the matter falling in is seemingly erased. We probe the exponential scrambling of a multiparticle system near a bistable point in phase space and utilize it for entanglement-enhanced metrology. A time-reversal protocol is used to observe a simultaneous exponential growth of both the metrological gain and the out-of-time-order correlator, thereby experimentally verifying the relation between quantum metrology and quantum information scrambling. Our results show that rapid scrambling dynamics capable of exponentially fast entanglement generation are useful for practical metrology, resulting in a 6.8(4)-decibel gain beyond the standard quantum limit.

Science & Technology - Other Topics↗
DOE OSTI2026

Advancing extreme pulsed lasers through measurements: summary of the pulsed laser metrology workshop

In this report we present consensus findings produced during the pulsed laser metrology (PLM) workshop (Boulder, CO, USA, August 2025). The workshop was a meeting of 35 scientists from private industry, academia, and U.S. government to compile a list of the metrology needs to support extreme pulsed laser development and implementation. We define ‘extreme pulsed lasers’ loosely as those with peak powers above 1 TW or multi-Joule pulse energies. Such lasers are being increasingly used and investigated for use in high energy particle acceleration, short wavelength radiation generation, laser-based fusion, etc. The rapid growth of these fields and the proliferation of extreme lasers for these applications, coupled with the extreme electric fields they generate and relative scarcity of such lasers, presents unique challenges to accuracy in their measurement. The PLM workshop was a two-day event designed to hear from users, developers, and researchers on the current state of optical metrology associated with these extreme pulsed lasers. The goal was to identify the most important measurement challenges limiting development and implementation of these lasers in practical applications. We report here the conclusions and recommendations of this workshop. The hope is that this document will become the first of many iterations which track the status of measurement needs supporting extreme pulsed lasers.

Lasers↗
DOE OSTI2026

Comprehensive assessment of metrology techniques for heliostat efficiency and performance evaluation

Concentrating solar power plants, specifically central receiver type systems and their heliostat field, are struggling with negative reputation in the USA, due to perceived underperformance and reliability issues. This is in part due to a lack of standards for performance assessment as well as overly simplified techno-economical models. A better understanding of influences and losses along the solar radiation path from the sun, across the solar collector to the receiver, increases the fidelity of heliostat efficiency assessment as well as solar field performance predictions. Such data are currently scarce and require a complete set of metrology capabilities to evaluate direct solar irradiance, sun shape, atmospheric attenuation, reflectance, collector shape, slope errors and total beam dispersion. In preparation for establishing a 3rd party metrology platform in collaboration with Sandia National Labs, NLR conducted a scoping study on available metrology. We present an extensive overview of techniques and commercial systems for each category. Our work includes an analysis to increase understanding of strengths and limitations of the many techniques used for surface shape and slope measurement. This applies to a controlled, indoor or outdoor laboratory environment assessing a single heliostat.

14 SOLAR ENERGY↗
DOE OSTI2025

Current-based metrology with two-terminal mesoscopic conductors

The traditional approach to quantum parameter estimation focuses on the quantum state, deriving fundamental bounds on precision through the quantum Fisher information. In most experimental settings, however, performing arbitrary quantum measurements is highly unfeasible. In open quantum systems, an alternative approach to metrology involves the measurement of stochastic currents flowing from the system to its environment. However, the present understanding of current-based metrology is mostly limited to Markovian master equations. Considering a parameter estimation problem in a two-terminal mesoscopic conductor, we identify the key elements that determine estimation precision within the Landauer-Büttiker formalism. Crucially, this approach allows us to address arbitrary coupling and temperature regimes. Furthermore, we obtain analytical results for the precision in linear-response and zero-temperature regimes. For the specific parameter estimation task that we consider, we demonstrate that the boxcar transmission function is optimal for current-based metrology in all parameter regimes.

Landauer formula↗