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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 19 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS1987

Recent achievements in module reliability research

After 10 years of extensive research on crystalline-silicon flat-plate photovoltaic modules, the emphasis of recent reliability research has shifted to the emerging first-generation thin-film amorphous-silicon modules. These modules share much in common with their crystalline precursors, but also include many materials and processes that demand the development of reliability technologies. Key research thrusts include light-induced effects, cell corrosion, thermal diffusion, hot-spot heating, and electrical isolation of the cells from the module exterior. Research goals and recent achievements are described in each of these areas.

Ross, R. G., Jr.↗
NASA NTRS1982

Photovoltaic module reliability improvement through application testing and failure analysis

During the first four years of the U.S. Department of Energy (DOE) National Photovoltatic Program, the Jet Propulsion Laboratory Low-Cost Solar Array (LSA) Project purchased about 400 kW of photovoltaic modules for test and experiments. In order to identify, report, and analyze test and operational problems with the Block Procurement modules, a problem/failure reporting and analysis system was implemented by the LSA Project with the main purpose of providing manufacturers with feedback from test and field experience needed for the improvement of product performance and reliability. A description of the more significant types of failures is presented, taking into account interconnects, cracked cells, dielectric breakdown, delamination, and corrosion. Current design practices and reliability evaluations are also discussed. The conducted evaluation indicates that current module designs incorporate damage-resistant and fault-tolerant features which address field failure mechanisms observed to date.

Dumas, L. N.↗
NASA NTRS2007

High-Reliability Pump Module for Non-Planar Ring Oscillator Laser

We propose and have demonstrated a prototype high-reliability pump module for pumping a Non-Planar Ring Oscillator (NPRO) laser suitable for space missions. The pump module consists of multiple fiber-coupled single-mode laser diodes and a fiber array micro-lens array based fiber combiner. The reported Single-Mode laser diode combiner laser pump module (LPM) provides a higher normalized brightness at the combined beam than multimode laser diode based LPMs. A higher brightness from the pump source is essential for efficient NPRO laser pumping and leads to higher reliability because higher efficiency requires a lower operating power for the laser diodes, which in turn increases the reliability and lifetime of the laser diodes. Single-mode laser diodes with Fiber Bragg Grating (FBG) stabilized wavelength permit the pump module to be operated without a thermal electric cooler (TEC) and this further improves the overall reliability of the pump module. The single-mode laser diode LPM is scalable in terms of the number of pump diodes and is capable of combining hundreds of fiber-coupled laser diodes. In the proof-of-concept demonstration, an e-beam written diffractive micro lens array, a custom fiber array, commercial 808nm single mode laser diodes, and a custom NPRO laser head are used. The reliability of the proposed LPM is discussed.

micro lens array↗
NASA NTRS1985

Crystalline-silicon reliability lessons for thin-film modules

Key reliability and engineering lessons learned from the 10-year history of the Jet Propulsion Laboratory's Flat-Plate Solar Array Project are presented and analyzed. Particular emphasis is placed on lessons applicable to the evolving new thin-film cell and module technologies and the organizations involved with these technologies. The user-specific demand for reliability is a strong function of the application, its location, and its expected duration. Lessons relative to effective means of specifying reliability are described, and commonly used test requirements are assessed from the standpoint of which are the most troublesome to pass, and which correlate best with field experience. Module design lessons are also summarized, including the significance of the most frequently encountered failure mechanisms and the role of encapsulant and cell reliability in determining module reliability. Lessons pertaining to research, design, and test approaches include the historical role and usefulness of qualification tests and field tests.

Ross, Ronald G., Jr.↗
NASA NTRS1985

Crystalline-silicon reliability lessons for thin-film modules

The reliability of crystalline silicon modules has been brought to a high level with lifetimes approaching 20 years, and excellent industry credibility and user satisfaction. The transition from crystalline modules to thin film modules is comparable to the transition from discrete transistors to integrated circuits. New cell materials and monolithic structures will require new device processing techniques, but the package function and design will evolve to a lesser extent. Although there will be new encapsulants optimized to take advantage of the mechanical flexibility and low temperature processing features of thin films, the reliability and life degradation stresses and mechanisms will remain mostly unchanged. Key reliability technologies in common between crystalline and thin film modules include hot spot heating, galvanic and electrochemical corrosion, hail impact stresses, glass breakage, mechanical fatigue, photothermal degradation of encapsulants, operating temperature, moisture sorption, circuit design strategies, product safety issues, and the process required to achieve a reliable product from a laboratory prototype.

Ross, R. G., Jr.↗
NASA NTRS2002

A Cryogenic Half-Wave Plate Module to Measure Polarization at Multiple FIR Passbands

One of the key components in a far-infrared polarimeter that is being designed at the University of Chicago is a locally-powered half-wave plate module. This compact, lightweight, and reliable module will operate at cryogenic temperatures, rotating a half-wave plate about its axis within the optical path. By doing so, polarization measurements can be made. Further, by utilizing multiple half-wave plate modules within the polarimeter, multiple wavelengths or passbands can be studied. In this paper, we describe the design and performance of a relatively inexpensive prototype module that was assembled and tested successfully, outline the difficulties that had to be overcome, and recommend improvements to future modules. This effort now lays some of the groundwork for a next-generation polarimeter for far-infrared astronomy.

Rennick, Timothy S.↗
NASA NTRS1986

Crystalline-silicon photovoltaics summary module design and reliability

The evolution of the design and reliability of solar modules was described. Design requirements involved 14 different considerations, including residential building and material electrical codes, wind-loading, hail impact, operating temperature levels, module flammability, and interfaces for both the array structure and the operation of the system. Reliability research involved in diverse investigations including glass-fracture strength, soiling levels, electrochemical corrosion, and bypass-diode qualification tests. Based on these internationally recognized studies, performance assessments, and failure analyses, the Flat-plate Solar Array Project in its 11-year duration served to nuture the development of 45 different solar module designs from 15 PV manufacturers.

Ross, R. G., Jr.↗
NASA NTRS1986

Reliability of photovoltaic modules

In order to assess the reliability of photovoltaic modules, four categories of known array failure and degradation mechanisms are discussed, and target reliability allocations have been developed within each category based on the available technology and the life-cycle-cost requirements of future large-scale terrestrial applications. Cell-level failure mechanisms associated with open-circuiting or short-circuiting of individual solar cells generally arise from cell cracking or the fatigue of cell-to-cell interconnects. Power degradation mechanisms considered include gradual power loss in cells, light-induced effects, and module optical degradation. Module-level failure mechanisms and life-limiting wear-out mechanisms are also explored.

Ross, R. G., Jr.↗
NASA NTRS2013

PV Reliability Development Lessons from JPL's Flat Plate Solar Array Project

Key reliability and engineering lessons learned from the 20-year history of the Jet Propulsion Laboratory's Flat-Plate Solar Array Project and thin film module reliability research activities are presented and analyzed. Particular emphasis is placed on lessons applicable to evolving new module technologies and the organizations involved with these technologies. The user-specific demand for reliability is a strong function of the application, its location, and its expected duration. Lessons relative to effective means of specifying reliability are described, and commonly used test requirements are assessed from the standpoint of which are the most troublesome to pass, and which correlate best with field experience. Module design lessons are also summarized, including the significance of the most frequently encountered failure mechanisms and the role of encapsulate and cell reliability in determining module reliability. Lessons pertaining to research, design, and test approaches include the historical role and usefulness of qualification tests and field tests.

photovoltaics↗
NASA NTRS1981

Photovoltaic module and array reliability

Several statistical reliability studies have been conducted in areas of photovoltaic component design covering cell failure, interconnect fatigue, glass breakage and electrical insulation breakdown. This paper integrates the results from these various studies and draws general conclusions relative to optimal reliability features for future modules. The described analysis is based on designing for specified low levels of component failures and then controlling the degrading effects of the failures through the use of fault tolerant circuitry and module replacement. Means of selecting the cost-optimal level of component failures, circuit redundancy, and module replacement are described.

Ross, R. G., Jr.↗
NASA NTRS1989

Bandwidth efficient coding for error control

One of the dramatic developments in bandwidth-efficient communications over the past few years is the introduction and rapid applications of combined coding and bandwidth efficient modulation, known as coded modulation, for error control. Using coded modulation, reliable data transmission can be attained without compromising bandwidth efficiency. Presented here are the basic concepts of coded modulation. Two simple examples are used to demonstrate how significant coding gains can be achieved without bandwidth expansion.

Lin, Shu↗
NASA NTRS1986

Commerical module test program

The results are presented for a program of qualification testing of commercial crystalline silicon modules from nine manufacturers in five countries. The outcome demonstrated the effective role of the Block 5 Qualification Tests in the development of reliable modules.

Smokier, M. I.↗
NASA NTRS1978

The Automated Array Assembly Task of the Low-cost Silicon Solar Array Project, Phase 2

An advanced process sequence for manufacturing high efficiency solar cells and modules in a cost-effective manner is discussed. Emphasis is on process simplicity and minimizing consumed materials. The process sequence incorporates texture etching, plasma processes for damage removal and patterning, ion implantation, low pressure silicon nitride deposition, and plated metal. A reliable module design is presented. Specific process step developments are given. A detailed cost analysis was performed to indicate future areas of fruitful cost reduction effort. Recommendations for advanced investigations are included.

Coleman, M. G.↗
NASA NTRS1966

LEM electronics reliability.

Lunar Excursion Module /LEM/ reliability program, discussing engineering, manufacturing and techniques of design and qualification testing of electronic components

QUALITY CONTROL↗
NASA NTRS1982

Qualification testing of flat-plate photovoltaic modules

The placement of photovoltaic modules in various applications, in climates and locations throughout the world, results in different degrees and combinations of environmental and electrical stress. Early detection of module reliability deficiencies via laboratory testing is necessary for achieving long, satisfactory field service. This overview paper describes qualification testing techniques being used in the US Department of Energy's flat-plate terrestrial photovoltaic development program in terms of their significance, rationale for specified levels and durations, and test results.

Hoffman, A. R.↗
NASA NTRS1985

Light-induced effects-impacts to module performance measurements and reliability testing: An overview

The stability of solar cells is a key factor in determining the reliability of photovoltaic modules and is of great interest in the case of solar cells having a new technology which has not yet been fully developed. In particular this question arises with hydrogenated amorphous silicon (a-Si) solar cells because a-Si exhibits reversible light induced changes in its electronic properties, commonly referred to as the Staebler-Wronski effect (SWE). Continuous progress is being made in the peak conversion efficiencies of a-Si solar cells and efficiencies in excess of 11% have been achieved. However, stability is still a problem. ARCO Solar reports results on solar cells which, after over a year's exposure to sunlight, under open circuit conditions, still have about 7% conversion efficiency. Other results show a region of fast degradation for about a month, after which the degradation diminishes rapidly.

Wronski, C. R.↗
NASA NTRS1986

Reliability Research for Photovoltaic Modules

Report describes research approach used to improve reliability of photovoltaic modules. Aimed at raising useful module lifetime to 20 to 30 years. Development of cost-effective solutions to module-lifetime problem requires compromises between degradation rates, failure rates, and lifetimes, on one hand, and costs of initial manufacture, maintenance, and lost energy, on other hand. Life-cycle costing integrates disparate economic terms, allowing cost effectiveness to be quantified, allowing comparison of different design alternatives.

Ross, Ronald J., Jr.↗