Microscopic optical potentials derived from ab initio translationally invariant nonlocal one-body densities
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The design of a near-field scanning optical microscope (NSOM) is described. Applications to the study of magneto-optic media and domain detection are discussed.
In this work, we present an alternative optical method to determine the probe-sample separation distance in a scanning near-field optical microscope. The experimental method is based in a Lloyd’s mirror interferometer and offers a measurement precision deviation of ∼100 nm using digital image processing and numerical analysis. The technique can also be strategically combined with the characterization of piezoelectric actuators and stability evaluation of the optical system. It also opens the possibility for the development of an automatic approximation control system valid for probe-sample distances from 5 to 500 μm.
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The first microscopic sedimentological studies of the Martian surface will commence with the landing of the Mars Polar Lander (MPL) December 3, 1999. The Robotic Arm Camera (RAC) has a resolution of 25 um/p which will permit detailed micromorphological analysis of surface and subsurface materials. The Robotic Ann will be able to dig up to 50 cm below the surface. The walls of the trench will also be inspected by RAC to look for evidence of stratigraphic and / or sedimentological relationships. The 2001 Mars Lander will build upon and expand the sedimentological research begun by the RAC on MPL. This will be accomplished by: (1) Macroscopic (dm to cm): Descent Imager, Pancam, RAC; (2) Microscopic (mm to um RAC, MECA Optical Microscope (Figure 2), AFM This paper will focus on investigations that can be conducted by the RAC and MECA Optical Microscope.
We present a method that uses conventional optical microscopes to determine the number of nanoparticles in a cluster, which is typically not possible using traditional image-based optical methods due to the diffraction limit. The method, called through-focus scanning optical microscopy (TSOM), uses a series of optical images taken at varying focus levels to achieve this. The optical images cannot directly resolve the individual nanoparticles, but contain information related to the number of particles. The TSOM method makes use of this information to determine the number of nanoparticles in a cluster. Initial good agreement between the simulations and the measurements is also presented. The TSOM method can be applied to fluorescent and non-fluorescent as well as metallic and non-metallic nano-scale materials, including soft materials, making it attractive for tag-less, high-speed, optical analysis of nanoparticles down to 45 nm diameter.
Microscopic optical model potentials, based on density-dependent effective interactions, involve multidimensional integrals to account for the full Fermi motion of the target struck nucleon throughout the nucleus. If a spherical matter distribution is assumed, then each matrix element of the optical potential requires the evaluation of seven-dimensional integrals. In this work we provide a full account of these integrals, retaining the genuine off-shell structure of the nucleon-nucleon effective interaction. The evaluation is based on the asymptotic separation of the optical model potential for nucleon-nucleus scattering in momentum space, where the potential is split into a free t-matrix contribution and another which depends exclusively on the gradient of the density-dependent g matrix. The calculated potentials, based on the Paris nucleon-nucleon (NN) potential, are applied to proton elastic scattering from {sup 16}O and {sup 90}Zr at beam energies between 30 and 65 MeV. The results were compared with two approximations to the unabridged expression, revealing moderate differences among their scattering observables. When comparing with results based on the Argonne v{sub 18} NNpotential, these differences appear smaller than those attainable by the choice of the internucleon potential.
We construct nucleonic microscopic optical potentials by combining the Green's function approach with the coupled-cluster method for 40 Ca and 48 Ca. For the computation of the ground states of 40 Ca and 48 Ca, we use the coupled-cluster method in the singles-and-doubles approximation, while for the A = ±1 nuclei we use particle-attached and particle-removed equation-of-motion method truncated at two-particle–one-hole and one-particle–two-hole excitations, respectively. Our calculations are based on the chiral nucleon-nucleon and three-nucleon interaction NNLO sat , which reproduces the charge radii of 40 Ca and 48 Ca, and the chiral nucleon-nucleon interaction NNLO opt . In all cases considered here, we observe that the overall form of the neutron scattering cross section is reproduced for both interactions, but the imaginary part of the potential, which reflects the loss of flux in the elastic channel, is negligible. Furthermore, the latter points to neglected many-body correlations that would appear beyond the coupled-cluster truncation level considered in this work. We show that, by artificially increasing the parameter η in the Green's function, practical results can be further improved.
We experimentally demonstrate that the three-dimensional (3-D) shape variations of nanometer-scale objects can be resolved and measured with sub-nanometer scale sensitivity using conventional optical microscopes by analyzing 4-D optical data using the through-focus scanning optical microscopy (TSOM) method. These initial results show that TSOM-determined cross-sectional (3-D) shape differences of 30 nm–40 nm wide lines agree well with critical-dimension atomic force microscope measurements. The TSOM method showed a linewidth uncertainty of 1.22 nm (k = 2). Complex optical simulations are not needed for analysis using the TSOM method, making the process simple, economical, fast, and ideally suited for high volume nanomanufacturing process monitoring.
A tip-enhanced near-field optical microscope with side-on and attenuated total reflectance (ATR) excitation and collection is described and used to demonstrate sub-diffraction-limited (super-resolution) optical and chemical characterization of surfaces. ATR illumination is combined with an Au optical antenna tip to show that (i) the tip can quantitatively transduce the optical near-field (evanescent waves) above the surface by scattering photons into the far-field, (ii) the ATR geometry enables excitation and characterization of surface plasmon polaritons (SPPs), whose associated optical fields are shown to enhance Raman scattering from a thin layer of copper phthalocyanine (CuPc), and (iii) SPPs can be used to plasmonically excite the tip for super-resolution chemical imaging of patterned CuPc via tip-enhanced Raman spectroscopy (TERS). ATR-illumination TERS is also quantitatively compared with the more conventional side-on illumination scheme. In both cases, spatial resolution was better than 40 nm and tip on/tip off Raman enhancement factors were >6500. Furthermore, ATR illumination was shown to provide similar Raman signal levels at lower “effective” pump powers due to additional optical energy delivered by SPPs to the active region in the tip-surface gap.
A high resolution mapping of quantum Hall edge states has been performed by locally creating electrons with small excess energies with a near-field scanning optical microscope in a dilution refrigerator. We have observed fine structures parallel to the edge in photovoltage signals, which appear only at low temperature. The observed fine structures near sample edges have been seen to shift inward with increase in magnetic field in accordance with Chklovskii Shklovskii, and Glazman model.
In this paper, we discuss how state-of-the-art optical microscopic techniques enhance our understanding of the morphological and dynamic properties of synthetic polymers. Microscopic/nanoscopic properties obtained using these techniques can be linked to the macroscopic rheological, mechanical, optical, electrical and/or chemical properties of synthetic polymers that are widely used in scientific research and/or in daily life. Lastly, detailed knowledge of nanoscale polymer properties is thus anticipated to facilitate designing novel polymers for various applications, including surface coating, chemical separations, chemical sensing, bioimaging, and organic electronic devices.
This work reports on the development of a binary pseudo-random test sample optimized to calibrate the MTF of optical microscopes. The sample consists of a number of 1-D and 2-D patterns, with different minimum sizes of spatial artifacts from 300 nm to 2 microns. We describe the mathematical background, fabrication process, data acquisition and analysis procedure to return spatial frequency based instrument calibration. We show that the developed samples satisfy the characteristics of a test standard: functionality, ease of specification and fabrication, reproducibility, and low sensitivity to manufacturing error. © (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Optical potentials are a standard tool in the study of nuclear reactions, as they describe the interaction between a target nucleus and a projectile. The use of phenomenological optical potentials built using experimental data on stable isotopes is widespread. Although successful in their dedicated domain, it is unclear whether these phenomenological potentials can provide reliable predictions for unstable isotopes. To address this problem, optical potentials based on microscopic nuclear structure input calculations prove to be crucial and are an important current line of research. In this work we present an explicit implementation of the Feshbach formalism for the systematic derivation of optical potentials using input from nuclear structure models. Numerical tools for the derivation of Green's functions associated with nonlocal potentials are presented. In conclusion, the new optical potential, based on the valence shell model, is applied to the calculations of 𝑛 + 24 Mg elastic scattering and yields a close agreement with the experimental data.
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Scattering-type scanning near-field optical microscopy (s-SNOM) has been widely used to characterize strongly correlated electronic, two dimensional, and plasmonic materials, and it has enormous potential for biological applications. Many of these materials exhibit anisotropic responses that complicate the extraction of dielectric constants from s-SNOM measurements. Here, we generalize our recently developed approach for retrieving the near-field scattering signal from isotropic systems and apply it to anisotropic dielectrics. Specifically, we compare our theoretical results with experimental measurements on modestly anisotropic sapphire that exhibit strong resonances at the infrared frequency range. Good agreement with the experimental result is found. Finally, our result is important for understanding the near-field response of low damping, anisotropic polaritonic states in dielectric media.
Utilizing eikonal phase shifts determined from a microscopic double-folding optical potential, marked improvement in the agreement between theory and experiment, for elastic carbon-carbon scattering between 200 and 300 MeV, is obtained when only those values for the nucleon-nucleon slope parameter, appropriate for diffractive scattering, are used. The appropriateness of the perturbative eikonal expansion is discussed by comparison with recent results, obtained for the same potentials, using a more exact complex Wentzell-Kramers-Brillouin (WKB) formalism.
This disclosure provides systems, methods, and apparatus related to optical microscopy. In one aspect, an apparatus includes a sample holder, a first objective lens, a plurality of optical components, a second objective lens, and a mirror. The apparatus may directly image a cross-section of a sample oblique to or parallel to the optical axis of the first objective lens, without scanning.