Extraterrestrial optical microscopy.
Extraterrestrial optical microscopy, discussing experiment, telemetry, data interpretation and instrument characteristics concerning biological, cytochemical and petrographic microscopes
Soffen, G. A.↗
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Potential Challenges in Near-Field Scanning Optical Microscopy for Space Applications
Near-field scanning optical microscopy (NSOM) also called scanning near-field optical microscopy (SNOM) is now well accepted as a powerful tool for sub-wavelength (nanoscale in the optical region) spatial resolution microscopy and a large number of related tasks. The importance lies in the fact of strategic advantages of standard microscopy but with significantly enhanced resolution. Since many modern optical diagnostic techniques have found useful applications in space, it is logical to consider the future role of NSOM in such situations. For example, protein crystal growth study under microgravity conditions is a valid candidate. If applied successfully, processes at molecular level can be studied during the growth. NSOM has already been demonstrated to be useful for the study of such crystals here on earth. The basic principle of NSOM can be illustrated. The illumination-collection mode is shown although several other possible approaches exist. In this, the sample is illuminated and the light from the sample is collected through the same tiny aperture opening. A tapered optical fiber is scanned near the sample surface. The tip is coated generally with a metal with a sub-wavelength aperture opening. The tip-sample distance is maintained constant while scanning. Thus, the optical signal available for collection is generally a function of the optical properties of the sample surface. Since the aperture is sub-wavelength in diameter and the tip is held very close (again in the sub-wavelength domain) to the surface, the lateral resolution in the sub-wavelength domain is obtained. Thus, the typical wavelength- order resolution of ordinary microscopy can be significantly enhanced while maintaining the strategic advantages (no need of sample in vacuum chamber, electron beams, etc). Commercial NSOM systems play a key role in the success and widespread acceptance of the tool. These commercial systems work fairly well in laboratory conditions on earth. However, they may not be deployed on a space mission as such with comparable outcome. In this communication we discuss several potential problems and some possible solutions.
Vikram, Chandra S.↗
Multiparallel Three-Dimensional Optical Microscopy
Multiparallel three-dimensional optical microscopy is a method of forming an approximate three-dimensional image of a microscope sample as a collection of images from different depths through the sample. The imaging apparatus includes a single microscope plus an assembly of beam splitters and mirrors that divide the output of the microscope into multiple channels. An imaging array of photodetectors in each channel is located at a different distance along the optical path from the microscope, corresponding to a focal plane at a different depth within the sample. The optical path leading to each photodetector array also includes lenses to compensate for the variation of magnification with distance so that the images ultimately formed on all the photodetector arrays are of the same magnification. The use of optical components common to multiple channels in a simple geometry makes it possible to obtain high light-transmission efficiency with an optically and mechanically simple assembly. In addition, because images can be read out simultaneously from all the photodetector arrays, the apparatus can support three-dimensional imaging at a high scanning rate.
Nguyen, Lam K.↗
Potential Challenges in Near-Field Scanning Optical Microscopy for Space Applications
Near-field scanning optical microscopy is a relatively new but very powerful technique for obtaining several metrological parameters at nanometer range spatial resolution. It is logical to think deploying it into space applications like diagnostics of protein crystal growth under microgravity conditions. One may attempt to deploy existing instrumentation and expect some results. However, the existing technology and commercial instrumentation is tailored to ground based laboratory situations. Even in those laboratory conditions, the role of fluids (common in crystal growth), rough objects (such as a crystal under growth), etc. on the instrumentation is only recently being investigated. These aspects combined with effects of reduced gravity environment are going to make the problem more complex. These technological challenges must be tackled for meaningful system operation in space. Since the microscopy concept has not been attempted so far in space, all of the actual problems are unknown. Nevertheless, based on current literature, some possible problems and potential solutions are described here. One may use the discussion for system modification/optimization during initial use of this kind of microscopy in space.
Vikram, C. S.↗
Near-Field Scanning Optical Microscopy of Soft, Biological, or Rough Objects in Aqueous Environment: Challenges and some Remedies to Circumvent
Near-field scanning optical microscopy is an established technique for sub-wavelength spatial resolution in imaging, spectroscopy, material science, surface chemistry, polarimetry, etc. A significant amount of confidence has been established for thin hard specimens in air. However when soft, biological, rough, in aqueous environment object, or a combination is involved, the progress has been slow. The tip-sample mechanical interaction, heat effects to sample, drag effects to the probe, difficulty in controlling tip-sample separation in case of rough objects, light scattering from sample thickness, etc. create problems. Although these problems are not even fully understood, there have been attempts to study them with the aim of performing reliable operations. In this review we describe these attempts. Starting with general problems encountered, various effects like polarization, thermal, and media are covered. The roles of independent tip-sample distance control tools in the relevant situations are then described. Finally progress in fluid cell aspect has been summarized.
Vikram, C. S.↗
Comparison of In-situ Near Infrared Melt Pool Imagery to Optical Microscopy Measurements
Additive manufacturing (AM) is a rapidly growing technology. An area of major importance is the integrity and repeatability of AM parts. The goal is to reduce obstacles to certify AM built parts to allow for use in critical aerospace applications. In-situ nondestructive evaluation sensors can be used for build assessment and can potentially play a key role in certifying AM parts. For example, melt pool features are understood to have a strong correlation to microstructural defects and the use of a near infrared (NIR) camera can be used to record the melt pool, cooling areas, and temperature gradients during the build. This work explores the use of a low cost NIR camera to obtain single line track imagery of the Ti-6Al-4V melt pools for various processing parameters. The NIR camera is radiometrically calibrated and configured in-line with the laser source to obtain high resolution imagery of the melt pool shape and dynamics. The challenge to measure melt pool shapes is to identify the transition points between the metal solid to liquid phase. Factors for melt pool measurements such as thermal camera pixel resolution, surface emissivity, and blurring due to the laser beam movement are discussed. Lastly, the melt pool imagery are compared to optical microscopy measurements for validation.
additive manufacturing↗
Chemical Silver Coating of Fiber Tips in Near-Field Scanning Optical Microscopy
We report what is believed to be the first experimental demonstration of silver coating by a wet chemical process on tapered fiber tips used in near-field scanning optical microscopy. The process is at room temperature and pressure and takes only a few minutes to complete. Many tips can be simultaneously coated.
Vikram, Chandra S.↗
Gold Coating of Fiber Tips in Near-Field Scanning Optical Microscopy
We report what is believed to be the first experimental demonstration of gold coating by a chemical baking process on tapered fiber tips used in near-field scanning optical microscopy. Many tips can be simultaneously coated.
Vikram, Chandra S.↗
Comparison of In-situ Near Infrared Melt Pool Imagery to Optical Microscopy Measurements
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additive manufacturing↗
Dynamics of solid lubrication as observed by optical microscopy
A bench metallograph was converted into a micro contact imager by the addition of a tribometer employing a steel ball in sliding contact with a glass disk. The sliding contact was viewed in real time by means of projection microscope optics. The dynamics of abrasive particles and of solid lubricant particles within the contact were observed in detail. The contact was characterized by a constantly changing pattern of elastic strain with the passage of surface discontinuities and solid particles. Abrasive particles fragmented upon entering the contact, embedded in one surface and scratched the other; in contrast, the solid lubricant particles flowed plastically into thin films. The rheological behavior of the lubricating solids gave every appearance of a paste-like consistency within the Hertzian contact.
Sliney, H. E.↗
Dynamics of solid lubrication as observed by optical microscopy
A bench metallograph was converted into a 'micro contact imager' by the addition of a tribometer employing a steel ball in sliding contact with a glass disk. The sliding contact was viewed in real time by means of projection microscope optics. The dynamics of abrasive particles and of solid lubricant particles within the contact were observed in detail. The contact was characterized by a constantly changing pattern of elastic strain with the passage of surface discontinuities and solid particles. Abrasive particles fragmented upon entering the contact, embedded in one surface and scratched the other; in contrast, the solid lubricant particles flowed plastically into thin films. The rheological behavior of the lubricating solids gave every appearance of a paste-like consistency within the Hertzian contact.
Sliney, H. E.↗
Optical Microscopy Techniques to Inspect for Metallic Whiskers
Metal surface finishes of tin, zinc and cadmium are often applied to electronic components, mechanical hardware and other structures. These finishes sometimes unpredictably may form metal whiskers over periods that can take from hours to months or even many years. The metal whiskers are crystalline structures commonly having uniform cross sectional area along their entire length. Typical whisker dimensions are nominally on the order of only a few microns (um) across while their lengths can extend from a few microns to several millimeters. Metal whiskers pose a reliability hazard to electronic systems primarily as an electrical shorting hazard. The extremely narrow dimensions of metal whiskers can make observation with optical techniques very challenging. The videos herein were compiled to demonstrate the complexities associated with optical microscope inspection of electronic and mechanical components and assemblies for the presence or absence of metal whiskers. The importance of magnification, light source and angle of illumination play critical roles in being able to detect metal whiskers when present. Furthermore, it is demonstrated how improper techniques can easily obscure detection. It is hoped that these videos will improve the probability of detecting metal whiskers with optical inspection techniques.
Brusse, Jay A.↗
Chargeability of nickel electrodes studied by optical microscopy
Some of the operational characteristics of some nickel hydrogen cells are explained. Some strange capacity excursions with cycling were seen.
Dyer, C. K.↗
Degradation of Spacesuit Fabrics in Low Earth Orbit
Six samples of pristine and dust-abraded outer layer spacesuit fabrics were included in the Materials International Space Station Experiment-7, in which they were exposed to the wake-side low Earth orbit environment on the International Space Station (ISS) for 18 months in order to determine whether abrasion by lunar dust increases radiation degradation. The fabric samples were characterized using optical microscopy, optical spectroscopy, field emission scanning electron microscopy, atomic force microscopy, and tensile testing before and after exposure on the ISS. Comparison of pre- and post-flight characterizations showed that the environment darkened and reddened all six fabrics, increasing their integrated solar absorptance by 7 to 38 percent. There was a decrease in the ultimate tensile strength and elongation to failure of lunar dust abraded Apollo spacesuit fibers by a factor of four and an increase in the elastic modulus by a factor of two.
Gaier, James R.↗
Stress corrosion in titanium alloys and other metallic materials
Multiple physical and chemical techniques including mass spectroscopy, atomic absorption spectroscopy, gas chromatography, electron microscopy, optical microscopy, electronic spectroscopy for chemical analysis (ESCA), infrared spectroscopy, nuclear magnetic resonance (NMR), X-ray analysis, conductivity, and isotopic labeling were used in investigating the atomic interactions between organic environments and titanium and titanium oxide surfaces. Key anhydrous environments studied included alcohols, which contain hydrogen; carbon tetrachloride, which does not contain hydrogen; and mixtures of alcohols and halocarbons. Effects of dissolved salts in alcohols were also studied. This program emphasized experiments designed to delineate the conditions necessary rather than sufficient for initiation processes and for propagation processes in Ti SCC.
Harkins, C. G.↗
Chemical vapor deposition growth
A chemical vapor deposition (CVD) reactor system with a vertical deposition chamber was used for the growth of Si films on glass, glass-ceramic, and polycrystalline ceramic substrates. Silicon vapor was produced by pyrolysis of SiH4 in a H2 or He carrier gas. Preliminary deposition experiments with two of the available glasses were not encouraging. Moderately encouraging results, however, were obtained with fired polycrystalline alumina substrates, which were used for Si deposition at temperatures above 1,000 C. The surfaces of both the substrates and the films were characterized by X-ray diffraction, reflection electron diffraction, scanning electron microscopy optical microscopy, and surface profilometric techniques. Several experiments were conducted to establish baseline performance data for the reactor system, including temperature distributions on the sample pedestal, effects of carrier gas flow rate on temperature and film thickness, and Si film growth rate as a function of temperature.
Ruth, R. P.↗
The evaluation of the interfacial behavior of LaRC-TPI/Graphite Composites
Discussed are the results of several approaches recently considered for improving the interfacial adhesion of LaRC-TPI/graphite composites. Two approaches were investigated, namely altering the matrix and altering the fiber. As a result, three types of LaRC-TPI laminates were produced: amorphous/AS-4, amorphous/XAS, and semicrystalline/AS-4. The laminates were characterized using the transverse tensile test, scanning electron microscopy, optical microscopy, and thermal analysis.
Ogden, A. L.↗
Scanning Tunneling Optical Resonance Microscopy
Scanning tunneling optical resonance microscopy (STORM) is a method, now undergoing development, for measuring optoelectronic properties of materials and devices on the nanoscale by means of a combination of (1) traditional scanning tunneling microscopy (STM) with (2) tunable laser spectroscopy. In STORM, an STM tip probing a semiconductor is illuminated with modulated light at a wavelength in the visible-to-near-infrared range and the resulting photoenhancement of the tunneling current is measured as a function of the illuminating wavelength. The photoenhancement of tunneling current occurs when the laser photon energy is sufficient to excite charge carriers into the conduction band of the semiconductor. Figure 1 schematically depicts a proposed STORM apparatus. The light for illuminating the semiconductor specimen at the STM would be generated by a ring laser that would be tunable across the wavelength range of interest. The laser beam would be chopped by an achromatic liquid-crystal modulator. A polarization-maintaining optical fiber would couple the light to the tip/sample junction of a commercial STM. An STM can be operated in one of two modes: constant height or constant current. A STORM apparatus would be operated in the constant-current mode, in which the height of the tip relative to the specimen would be varied in order to keep the tunneling current constant. In this mode, a feedback control circuit adjusts the voltage applied to a piezoelectric actuator in the STM that adjusts the height of the STM tip to keep the tunneling current constant. The exponential relationship between the tunneling current and tip-to-sample distance makes it relatively easy to implement this mode of operation. The choice of method by which the photoenhanced portion of the tunneling current would be measured depends on choice of the frequency at which the input illumination would be modulated (chopped). If the frequency of modulation were low enough (typically < 10 Hz) that the feedback circuit could respond, then the voltage applied to the piezoelectric tip-height actuator could be measured by use of a lock-in amplifier locked to the modulation (chopping) signal. However, at a high modulation frequency (typically in the kilohertz range or higher), the feedback circuit would be unable to respond. In this case, the photoenhanced portion of the tunneling current could be measured directly. For this purpose, the tunneling current would be passed through a precise resistor and the voltage drop would be measured by use of the lock-in amplifier.
Bailey, Sheila↗