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At least 19 records

RBS and PIXE analysis of chlorine contamination in ALD-Grown TiN films on silicon

The performance, strengths and limitations of RBS and PIXE for the characterization of trace amounts of Cl in TiN thin films are critically compared. The chlorine atomic concentration in ALD grown TiN thin films on Si is determined for samples grown at temperatures ranging from 350 Degree-Sign C to 550 Degree-Sign C. We show that routine Rutherford backscattering spectrometry measurements (1.5 MeV He{sup +}) and PIXE measurements (1.5 MeV H{sup +}) on 20 nm thick TiN films allow one to determine the Cl content down to 0.3 at% with an absolute statistical accuracy reaching 0.03 at%. Possible improvements to push the sensitivity limit for both approaches are proposed.

36 MATERIALS SCIENCE↗

Need for portable accelerators in cultural heritage

Ion Beam Accelerators (IBA) centres have provided researchers with powerful techniques to analyse objects of cultural significance in a non-destructive and non-invasive manner. However, in some cases it is not feasible to remove an object from the field or museum and transport it to the laboratory. In this contributed talk, we present as a manner of a short review, examples of the benefits provided from these techniques in the study of material culture and discuss the initial steps to consider when investigating the feasibility of a compact accelerator that can be taken to sites of cultural significance for PIXE analysis. In particular, we consider the application of a compact, robust 2 MeV proton accelerator that can be taken into the field to perform PIXE measurements on rock art. We detail the main challenges and considerations for such a device.

Charles, T. K.↗

Elemental Analysis of Beryllium Samples Using a Microzond-EGP-10 Unit

Results concerning the structural and elemental analysis of beryllium samples obtained via different technologies using a Microzond-EGP-10 unit with the help of the PIXE and RBS methods are presented. As a result, the overall chemical composition and the nature of inclusions were determined. The mapping method made it possible to reveal the structural features of beryllium samples: to select the grains of the main substance having different size and chemical composition, to visualize the interfaces between the regions of different composition, and to describe the features of the distribution of impurities in the samples.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗

Evaluating the presence of porosity in Brazilian archaeological pottery associating x-radiography and PIXE

X-Radiography technique has been used effectively for decades to evaluate and identify differences in homogeneities in samples. It is a simple, fast and non-destructive technique that provides a view of internal structure helping investigating manufacturing details of archaeological ceramics. Characteristics of the paste used in the matrix composition can be derived using PIXE technique through the determination of the major elemental composition allowing the calculation of its expected density. Combining this information with x-ray images is possible to check for differences in the average density of material indicating the presence of homogeneously distributed porosity or temper. The present work evaluates the porosity in a set of native Brazilian pottery sherds that were collected in the Aldeia Lalima archaeological site, located at Mato Grosso do Sul State.

36 MATERIALS SCIENCE↗

Defects, stoichiometry, and electronic transport in SrTiO{sub 3-δ} epilayers: A high pressure oxygen sputter deposition study

SrTiO{sub 3} is not only of enduring interest due to its unique dielectric, structural, and lattice dynamical properties, but is also the archetypal perovskite oxide semiconductor and a foundational material in oxide heterostructures and electronics. This has naturally focused attention on growth, stoichiometry, and defects in SrTiO{sub 3}, one exciting recent development being such precisely stoichiometric defect-managed thin films that electron mobilities have finally exceeded bulk crystals. This has been achieved only by molecular beam epitaxy, however (and to a somewhat lesser extent pulsed laser deposition (PLD)), and numerous open questions remain. Here, we present a study of the stoichiometry, defects, and structure in SrTiO{sub 3} synthesized by a different method, high pressure oxygen sputtering, relating the results to electronic transport. We find that this form of sputter deposition is also capable of homoepitaxy of precisely stoichiometric SrTiO{sub 3}, but only provided that substrate and target preparation, temperature, pressure, and deposition rate are carefully controlled. Even under these conditions, oxygen-vacancy-doped heteroepitaxial SrTiO{sub 3} films are found to have carrier density, mobility, and conductivity significantly lower than bulk. While surface depletion plays a role, it is argued from particle-induced X-ray emission (PIXE) measurements of trace impurities in commercial sputtering targets that this is also due to deep acceptors such as Fe at 100's of parts-per-million levels. Comparisons of PIXE from SrTiO{sub 3} crystals and polycrystalline targets are shown to be of general interest, with clear implications for sputter and PLD deposition of this important material.

36 MATERIALS SCIENCE↗

SU-E-J-247: A Simulation of X-Ray Emission with Gold Nanoparticle Irradiated by Energetic Proton Beam

Purpose: To investigate the proton induced X-ray emissions in gold-water mixture materials. Methods: In this study a Monte Carlo simulation was created using the GEANT4 toolkit (version 4.9.6). The geometry in this setup includes a 2 cm × 2 cm × 2 cm target, a scoring sphere (radius = 10 cm) and a 65 MeV planar proton source (2 cm × 2 cm). Four concentrations of a gold-water solution were irradiated with 5×10{sup 5} incident protons at a distance of 0.5 cm perpendicular to the surface of the target. The solutions of gold-water mixture had 10%, 5%, 1% and 0.5% of gold by mass, respectively. The number of photon emitting for the target was counted in the scoring sphere for the energy range of 0-86.0 keV in 0.1 keV bins. For this study the reference physics list PhysListEmStandard was used together with the x-ray fluorescence, Auger electron and PIXE (particle induced xray emission) options enabled. The range cuts for photons and electrons were set at 0.5 mm and 1.0 mm, respectively. Results: In the energy spectra of emitting X-ray fluorescence, peaks from gold K shell characteristic x-rays (68.8 and 66.9 keV) were observed. The number of counts under the peaks of Ka1 and Ka2 was found to increase with the increasing of the gold concentrations in the mixture materials. The X-ray yields (for both Ka1 and Ka2) when fitted with least-square method as a function of gold concentration demonstrate a linear dependency with R{sup 2} > 0.96. The Ka1yield per incident proton was found to be 0.0016 for 10% gold-water mixture solutions. Conclusion: This preliminary study with PIXE technique with gold nanoparticle has demonstrated potentials for its utilization in the development of range and dose verification methodology that is currently of great interest in the field of proton radiation therapy.

07 ISOTOPE AND RADIATION SOURCES↗

A new set-up for in-situ probing of radiation effects in materials and electronic devices

The micro-probe facility installed at the Van de Graff accelerator at CTN/IST permits simultaneous measurements of Rutherford Backscattering Spectrometry (RBS), Particle Induced X-ray Emission (PIXE) and Iono-Luminescence (IL). Here we present a recent up-grade of the measurement chamber allowing improved optical sensitivity in IL measurements and opening the possibility to perform simultaneously electrical measurements. Combinations of all these characterization techniques make this setup a powerful tool to characterize and modify different materials with spatial resolution. In particular, it can be used to study radiation effects in different materials and electronic devices in-situ. IL is a luminescence technique that uses the ion beam as the excitation source. Compared with other luminescence techniques with spatial resolution like Cathodoluminescence, this technique has the advantage to probe deeper regions of the sample, several microns below the surface. The same ion beam used to produce luminescence, can create a high density of defects, in a controllable way and the new set-up allows monitoring optical and electrical properties in realtime. In this work we combine IL with I-V curve measurements to assess the response of Ga{sub 2}O{sub 3} and GaN to proton irradiation. Ga{sub 2}O{sub 3} and GaN are emerging materials for applications in high power electronics and are considered for radiation resistant electronics. We will present a systematic study of the changes in IL and conductivity in Ga{sub 2}O{sub 3} and GaN samples with the energy of the ion beam and with the time of exposure. In particular, it was observed that during the irradiation some luminescence bands related with intrinsic point defects decrease while other new bands appear. Simulations using the SRIM code were used to determine the depth profiles of ionization and displacement events, helping to correlate the optical and electrical response of the materials with certain radiation effects. These studies show the potentialities of measuring simultaneously IL and electrical conductivity and how these two characterization techniques can work as a sensitive tool to detect and quantify radiation effects. (authors)

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗

In-air RBS measurements at the LAMFI external beam setup

This work describes new developments in the external beam setup of the Laboratory of Material Analysis with Ion Beams of the University of São Paulo (LAMFI-USP). This setup was designed to be a versatile analytical station to analyze a broad range of samples. In recent developments, we seek the external beam Rutherford Backscattering Spectroscopy (RBS) analysis to complement the Particle Induced X-ray Emission (PIXE) measurements. This work presents the initial results of the external beam RBS analysis as well as recent developments to improve the energy resolution RBS measurements, in particular tests to seek for sources of resolution degradation. These aspects are discussed and preliminary results of in-air RBS analysis of some test samples are presented.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗

Ion beam analyses of radionuclide migration in heterogeneous rocks

The migration of radionuclides (RN) in the environment is a topic of general interest, for its implications on public health, and it is an issue for the long-term safety studies of deep geological repositories (DGR) for high-level radioactive waste. The role played by colloids on RN migration is also of great concern. Diffusion and sorption are fundamental mechanisms controlling RN migration in rocks and many experimental approaches are applied to determine transport parameters for low sorbing RN in homogeneous rocks. However, it is difficult to obtain relevant data for high sorbing RN or colloids, for which diffusion lengths are extremely short, or within heterogeneous rocks, where transport might be different in different minerals. The ion beam techniques Rutherford Backscattering Spectrometry (RBS) and micro-Particle Induced X-Ray Emission ({mu}PIXE), rarely applied in the field, were selected for their micro-analytical potential to study RN diffusion and surface retention within heterogeneous rocks. Main achievements obtained during last 12 years are highlighted.

12 MANAGEMENT OF RADIOACTIVE AND NON-RADIOACTIVE W↗

Deciphering a removed text on a 16th c. centrepiece: The benefits of using AGLAEMap and AXSIA to process PIXE maps.

In the field of archaeometry, it is not uncommon to be presented with art objects that contain inscriptions, signatures and other writings that are nearly impossible to read. Scanned microbeam PIXE offers an attractive approach to attack this problem, but even then the distribution of characteristic X-rays of the element(s) used in these writings can remain illegible. We show in this paper that two methods were used to reveal the inscription: first the use of a GUPIXWin, TRAUPIXE and AGLAEMap software suite enables to make quantitative analysis of each pixel, to visualize the results and to select X-ray peaks that could enable to distinguish letters. Then, the Automated eXpert Spectral Image Analysis (AXSIA) program developed at Sandia, which analyzes the x-ray intensity vs. Energy and (X, Y) position “datacubes”, was used to factor the datacube into 1) principle component spectral shapes and 2) the weighting images of these components. The specimen selected for this study was a silver plaque representing a scroll from the so-called “MerkelscheTafelaufsatz,” a centrepiece made by the Nuremberg goldsmith Wenzel Jamnitzer in 1549. X-ray radiography of the plaque shows lines of different silver thicknesses, meaning that a text has been removed. The PIXE analysis used a 3-MeV proton beam focused to 50μm and scanned across the sample on different areas of interest of several cm². This analysis showed major elements of Cu and Ag, and minor elements such as Pb, Au, Hg. X-ray intensity maps were then made by setting windows on the various x-ray peaks but the writing on the centrepiece was not revealed even if the map of Cu after data treatment at AGLAE enabled to distinguish some letters. The AXSIA program enabled to factor two main spectral shapes from the datacube that were quite similar and involved virtually all of the X-rays being generated. Nevertheless, small differences between these factors were observed for the Cu K X-rays, Pb, Bi and Au L X-rays. The plot of the factor with the highest Au signal gave also information on the shape of some letters. The comparison of the results obtained by the two methods shows that they both drastically improve the resolution and contrast of such writings and that each of the method can also bring different information on the composition and thus the techniques used for the writing.

AGLAEMap↗

PIXE simulation: Models, methods and technologies

The simulation of PIXE (Particle Induced X-ray Emission) is discussed in the context of general-purpose Monte Carlo systems for particle transport. Dedicated PIXE codes are mainly concerned with the application of the technique to elemental analysis, but they lack the capability of dealing with complex experimental configurations. General-purpose Monte Carlo codes provide powerful tools to model the experimental environment in great detail, but so far they have provided limited functionality for PIXE simulation. This paper reviews recent developments that have endowed the Geant4 simulation toolkit with advanced capabilities for PIXE simulation, and related efforts for quantitative validation of cross sections and other physical parameters relevant to PIXE simulation.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗

Construction of a scattering chamber for ion-beam analysis of environmental materials in undergraduate physics research

We have developed a new scattering chamber for ion-beam analysis of environmental materials with the 1.1-MV Pelletron accelerator at the Union College Ion-Beam Analysis Laboratory. The chamber was constructed from a ten-inch, Conflat, multi-port cross and includes a three-axis target manipulator and target ladder assembly, an eight-inch turbo pump, an Amptek X-ray detector, and multiple charged particle detectors. Recent projects performed by our undergraduate research team include proton induced X-ray emission (PIXE) and Rutherford backscattering (RBS) analyses of atmospheric aerosols collected with a nine-stage cascade impactor in Upstate New York. We will describe the construction of the chamber and discuss the results of some commissioning experiments.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗

Laser-Accelerated Proton Beams as Diagnostics for Cultural Heritage

This paper introduces the first use of laser-generated proton beams as diagnostic for materials of interest in the domain of Cultural Heritage. Using laser-accelerated protons, as generated by interaction of a high-power short-pulse laser with a solid target, we can produce proton-induced X-ray emission spectroscopies (PIXE). By correctly tuning the proton flux on the sample, we are able to perform the PIXE in a single shot without provoking more damage to the sample than conventional methodologies. We verify this by experimentally irradiating materials of interest in the Cultural Heritage with laser-accelerated protons and measuring the PIXE emission. The morphological and chemical analysis of the sample before and after irradiation are compared in order to assess the damage provoked to the artifact. Monte Carlo simulations confirm that the temperature in the sample stays safely below the melting point. Compared to conventional diagnostic methodologies, laser-driven PIXE has the advantage of being potentially quicker and more efficient.

72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS↗

An overview of the facilities, activities, and developments at the University of North Texas Ion Beam Modification and Analysis Laboratory (IBMAL)

The Ion Beam Modification and Analysis Laboratory (IBMAL) at the University of North Texas includes several accelerator facilities with capabilities of producing a variety of ion beams from tens of keV to several MeV in energy. The four accelerators are used for research, graduate and undergraduate education, and industrial applications. The NEC 3MV Pelletron tandem accelerator has three ion sources for negative ions: He Alphatross and two different SNICS-type sputter ion sources. Presently, the tandem accelerator has four high-energy beam transport lines and one low-energy beam transport line directly taken from the negative ion sources for different research experiments. For the low-energy beam line, the ion energy can be varied from {approx}20 to 80 keV for ion implantation/modification of materials. The four post-acceleration beam lines include a heavy-ion nuclear microprobe; multi-purpose PIXE, RBS, ERD, NRA, and broad-beam single-event upset; high-energy ion implantation line; and trace-element accelerator mass spectrometry. The NEC 3MV single-ended Pelletron accelerator has an RF ion source mainly for hydrogen, helium and heavier inert gases. We recently installed a capacitive liner to the terminal potential stabilization system for high terminal voltage stability and high-resolution microprobe analysis. The accelerator serves a beam line for standard RBS and RBS/C. Another beamline for high energy focused ion beam application using a magnetic quadrupole lens system is currently under construction. This beam line will also serve for developmental work on an electrostatic lens system. The third accelerator is a 200 kV Cockcroft-Walton accelerator with an RF ion source. The fourth accelerator is a 2.5 MV Van de Graaff accelerator, which was in operation for last several decades is currently planned to be used mainly for educational purpose. Research projects that will be briefly discussed include materials synthesis/modification for photonic, electronic, and magnetic applications, surface sputtering and micro-fabrication of materials, development of high-energy ion microprobe systems, and educational and outreach activities.

43 PARTICLE ACCELERATORS↗

SU-E-T-231: Measurements of Gold Nanoparticle-Mediated Proton Dose Enhancement Due to Particle-Induced X-Ray Emission and Activation Products Using Radiochromic Films and CdTe Detector

Purpose: There have been several reports of enhanced cell-killing and tumor regression when tumor cells and mouse tumors were loaded with gold nanoparticles (GNPs) prior to proton irradiation. While particle-induced xray emission (PIXE), Auger electrons, secondary electrons, free radicals, and biological effects have been suggested as potential mechanisms responsible for the observed GNP-mediated dose enhancement/radiosensitization, there is a lack of quantitative analysis regarding the contribution from each mechanism. Here, we report our experimental effort to quantify some of these effects. Methods: 5-cm-long cylindrical plastic vials were filled with 1.8 mL of either water or water mixed with cylindrical GNPs at the same gold concentration (0.3 mg Au/g) as used in previous animal studies. A piece of EBT2 radiochromic film (30-µm active-layer sandwiched between 80/175-µm outer-layers) was inserted along the long axis of each vial and used to measure dose enhancement due to PIXE from GNPs. Vials were placed at center-of-modulation (COM) and 3-cm up-/down-stream from COM and irradiated with 5 different doses (2–10 Gy) using 10-cm-SOBP 160-MeV protons. After irradiation, films were cleaned and read to determine the delivered dose. A vial containing spherical GNPs (20 mg Au/g) was also irradiated, and gamma-rays from activation products were measured using a cadmium-telluride (CdTe) detector. Results: Film measurements showed no significant dose enhancement beyond the experimental uncertainty (∼2%). There was a detectable activation product from GNPs, but it appeared to contribute to dose enhancement minimally (<0.01%). Conclusion: Considering the composition of EBT2 film, it can be inferred that gold characteristic x-rays from PIXE and their secondary electrons make insignificant contribution to dose enhancement. The current investigation also suggests negligible dose enhancement due to activation products. Thus, previously-reported GNP-mediated proton dose enhancement/radiosensitization needs to be attributed to one or more of the other mechanisms listed earlier. Supported in part by NIH/NCI grant R01CA155446;This investigation was supported in part by NIH/NCI grant R01CA155446.

60 APPLIED LIFE SCIENCES↗

PIXE – State of the Art, Systems, Challenges

Particle-induced X-ray emission (PIXE) is an analytical technique for elemental analysis in which a charged-particle beam (most commonly protons, but also alpha particles or heavier ions) ionizes inner-shell electrons in target atoms. When these vacancies are filled by outer-shell electrons, the atom emits characteristic X-rays (e.g., Kα, Kβ, L-series) whose energies are unique to each element. Measuring the X-ray spectrum therefore enables identification of the elements present and, with appropriate calibration and modeling, their concentration. PIXE provides rapid, simultaneous, quantitative multi-element detection with trace-level sensitivity for many mid- to high-Z elements, often with minimal sample preparation. It is widely used across materials science (thin films, alloys, corrosion), geology (mineral chemistry, provenance) and environmental monitoring (aerosols, particulates, soils); semiconductor contamination analysis (wafer surface/trace metals), cultural heritage (pigments, inks, archaeological artifacts) and forensics (gunshot residue, glass/pain), and biological/medical studies (tissue/biomaterial trace-element mapping).

47 OTHER INSTRUMENTATION↗

Preferential concentration of certain elements in smaller aerosols emitted from aircraft engines

Aerosols from aircraft engines were collected with an eight-stage cascade sampler for a period of 24 h. The aerosol samples from each stage were analyzed for their elemental composition using the proton-induced X-ray emission (PIXE) technique. Seventeen elements (Si, P, S, Cl, K, Ca, Ti, V, Fe, Ni, Cu, Zn, Br, Sr, Nb, Sn, and Pb) were positively identified and quantitated at each stage. Six elements (S, Ca, Fe, Zn, Sn, and Pb) showed a fractional concentration increase with decreasing aerosol size. Similar, but less well-defined, trends were also observed for V and Ni. Silicon and chlorine, on the other hand, showed an opposite trend. Neutron-activation analysis of bulk aerosol samples collected every 2 h over the same period showed a correlation between concentration of Si, Ca, V, Ti, Zn, Br, and Sn and the density of air traffic at the airport. Analysis of the aviation-fuel samples by PIXE indicates that major fractions of Pb, Sn, Br, Zn, Ni, Fe, V, Ca, and S observed in these aerosol studies come from the aircraft engine exhaust.

Jolly, R. K.↗