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This presentation will cover NASA Electrical, Electronic and Electromechanical (EEE) Parts Assurance Structure, NASA Electronic Parts and Packaging (NEPP) Program, NASA Electronic Parts Assurance Group (NEPAG), examples of assurance challenges, and future challenges.
This talk will provide insights into new options for parts assurance that are being introduced into NASA policy, which build on the results of the NASA Engineering and Safety Center (NESC) COTS Phase 2 study. It will provide some of the highlights and drivers for the use of COTS and brief recommendations for how to successfully select and use COTS parts.
This talk will provide insights into new options for parts assurance that are being introduced into NASA policy, which build on the results of the NASA Engineering and Safety Center (NESC) COTS Phase 2 study. It will provide some of the highlights and drivers for the use of COTS and brief recommendations for how to successfully select and use COTS parts. It will also briefly address common concerns about radiation and COTS.
This presentation will discuss in detail NASA Government Working Group government topics from NASA Electronic Parts Assurance Group (NEPAG) which require additional in-depth technical solutions.
No abstract provided
FY23 Highlights Standards & Guidelines: Parts Selection COTS Utilization Effort: 1) Industry Leading Parts Manufacturers (ILPM) 2) Parts Evaluation & Assessment Laboratory (PEAL) FY24 Plans Topics in NEPP Five Focus Areas: 1) Parts Assurance 2) Parts Reliability 3) Radiation Assurance 4) Radiation Reliability 5) Packaging
In order to advance the approach for parts assurance in the space community to the current decade and to remain nimble for the future, NASA GSFC, in collaboration with the Aerospace Corporation’s Mission Success Improvement Workshop and broad space community participation, has been reviewing and categorizing 40 years’ worth of on-orbit anomaly data to support broad assessments of radiation-related risk and the development of tools to rigorously assess risk in general project situations. Part of the changing approach in parts assurance involves phasing in the use of COTS parts (or as preferred, alternate grade parts). This talk will convey some of the early findings of the effort, including the fact that expanded use of COTS parts does not increase radiation-related risk, while also pointing out that a very small percentage of parts in a typical parts list are actives and thus require radiation assessment. These are important because they remove radiation as a factor in broad consideration in the use of COTS, without diminishing the importance of addressing the effects of radiation in space.
Part 23 aircraft operation, and in particular general aviation, is relatively unsafe when compared to other common forms of vehicle travel. Currently, there exists technologies that could increase safety statistics for these aircraft; however, the high burden and cost of performing the requisite safety critical certification processes for these systems limits their proliferation. For this reason, many entities, including the Federal Aviation Administration, NASA, and the US Air Force, are considering new options for certification for technologies that will improve aircraft safety. Of particular interest, are low cost autopilot systems for general aviation aircraft, as these systems have the potential to positively and significantly affect safety statistics. This paper proposes new systems and techniques, leveraging run-time verification, for the assurance of general aviation autopilot systems, which would be used to supplement the current certification process and provide a viable path for near-term low-cost implementation. In addition, discussions on preliminary experimentation and building the assurance case for a system, based on these principles, is provided.
Commercial-Off-The-Shelf (COTS) multilayer ceramic chip capacitors (MLCCs) are continually evolving to reduce physical size and increase volumetric efficiency. Designers of high reliability aerospace and military systems are attracted to these attributes of COTS MLCCs and would like to take advantage of them while maintaining the high standards for long-term reliable operation they are accustomed io when selecting military qualified established reliability (MIL-ER) MLCCs. However, MIL-ER MLCCs are not available in the full range of small chip sizes with high capacitance as found in today's COTS MLCCs. The objectives for this evaluation were to assess the long-term performance of small case size COTS MLCCs and to identify effective, lower-cost product assurance methodologies. Fifteen (15) lots of COTS X7R dielectric MLCCs from four (4) different manufacturers and two (2) MIL-ER BX dielectric MLCCs from two (2) of the same manufacturers were evaluated. Both 0805 and 0402 chip sizes were included. Several voltage ratings were tested ranging from a high of 50 volts to a low of 6.3 volts. The evaluation consisted of a comprehensive screening and qualification test program based upon MIL-PRF-55681 (i.e., voltage conditioning, thermal shock, moisture resistance, 2000-hour life test, etc.). In addition, several lot characterization tests were performed including Destructive Physical Analysis (DPA), Highly Accelerated Life Test (HALT) and Dielectric Voltage Breakdown Strength. The data analysis included a comparison of the 2000-hour life test results (used as a metric for long-term performance) relative to the screening and characterization test results. Results of this analysis indicate that the long-term life performance of COTS MLCCs is variable -- some lots perform well, some lots perform poorly. DPA and HALT were found to be promising lot characterization tests to identify substandard COTS MLCC lots prior to conducting more expensive screening and qualification tests. The results indicate that lot- specific screening and qualification are still recommended for high reliability applications. One significant and concerning observation is that MIL- type voltage conditioning (100 hours at twice rated voltage, 125 C) was not an effective screen in removing infant mortality parts for the particular lots of COTS MLCCs evaluated.
This viewgraph presentation profiles an experiment to evaluate the suitability of commercial off-the-shelf (COTS) ceramic chip capacitors for NASA spaceflight applications. The experiment included: 1) Voltage Conditioning ('Burn-In'); 2) Highly Accelerated Life Test (HALT); 3) Destructive Physical Analysis (DPA); 4) Ultimate Voltage Breakdown Strength. The presentation includes results for each of the capacitors used in the experiment.
NASA Electronic Parts and Packaging (NEPP) Program and NASA Electronic Parts Assurance Group (NEPAG) are NASAs point-of-contacts for reliability and radiation tolerance of EEE parts and their packages. This presentation includes an FY18 program overview.
A number of activities within NASA and the space community, as well as growing technology needs and supply chain changes have accelerated the need to expand the use of COTS parts within NASA. While the use of COTS has been formally institutionalized and deemed acceptable for Class D space missions and those with greater tolerance for risk, there is still a lack of understanding of how to most effectively use COTS in such high risk-tolerance missions, and no apparent path towards broad use in missions with much less tolerance for risk. However, the reality is that the fundamental limitations of technology associated with the military specification system combined with the need to fly newer technologies in upcoming flagship robotic missions and human space flight missions will ultimately demand a more expansive use of COTS. The infinite nature of COTS gives rise to numerous challenges in the selection, acceptance, testing, and usage of COTS when reliable operation is essential. This presentation will highlight some of the results of a NASA Engineering and Safety Center (NESC) study on the use of COTS parts, as well as many of the historical through current facts about parts assurance within Agency to provide a path forward for reliable use of COTS for a range of space applications and risk postures. In addition this presentation will dispel the myth that expanded use of COTS parts causes a new set of radiation threats to missions.
A number of activities within NASA and the space community, as well as growing technology needs and supply chain changes have accelerated the need to expand the use of COTS parts within NASA. While the use of COTS has been formally institutionalized and deemed acceptable for Class D space missions and those with greater tolerance for risk, there is still a lack of understanding of how to most effectively use COTS in such high risk-tolerance missions, and no apparent path towards broad use in missions with much less tolerance for risk. However, the reality is that the fundamental limitations of technology associated with the military specification system combined with the need to fly newer technologies in upcoming flagship robotic missions and human space flight missions will ultimately demand a more expansive use of COTS. The infinite nature of COTS gives rise to numerous challenges in the selection, acceptance, testing, and usage of COTS when reliable operation is essential. This presentation will highlight some of the results of a NASA Engineering and Safety Center (NESC) study on the use of COTS parts, as well as many of the historical through current facts about parts assurance within Agency to provide a path forward for reliable use of COTS for a range of space applications and risk postures. In addition this presentation will dispel the myth that expanded use of COTS parts causes a new set of radiation threats to missions.
The NASA Electronic Parts and Packaging (NEPP) program, and its subset the NASA Electronic Parts Assurance Group (NEPAG), are NASA's point-of-contacts for reliability and radiation tolerance of electrical, electronic, and electromechanical (EEE) parts and their packages. This presentation includes a Fiscal Year 2015 program overview.
NASA Electronic Parts and Packaging (NEPP) Program Overview Mission Statement: Provide NASA's leadership for developing and maintaining guidance for the screening, qualification, test, and reliable use of EEE parts by NASA, in collaboration with other government agencies and industry. The NASA Electronic Parts Assurance Group (NEPAG) is a core portion of NEPP.