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Impurities and electrothermal instabilities effect on conductivity of two temperature nonequilibrium plasma
We have constructed a nonhydrodynamic coronal model for calculating radiation from impurity atoms in a heated plasma. Some recent developments in the calculation of dielectronic recombination rate coefficients and collisional excitation rate coefficients are included. The model is applied to oxygen impurity radiation during the first few milliseconds of a TFR Tokamak plasma discharge, and good agreement with experimental results is obtained. Estimates of total line and continuum radiation from the oxygen impurity are given. It is shown that impurity radiation represents a considerable energy loss.
The degree of toroidal symmetry of the plasma, the number of midplane electrode rings, the configuration of electrode rings, and the location of the diagnostic instruments with respect to the electrode rings used to generate the plasma are discussed. Impurities were deliberately introduced into the plasma, and the effects of the impurity fraction on ion kinetic temperature and electron number density were observed. It is concluded that, if necessary precautions are taken, the plasma communicates extremely well along the magnetic field lines and displays a high degree of symmetry from sector to sector for a wide range of electrode ring configurations and operating conditions. Finally, some characteristic data taken under nonoptimized conditions are presented, which include the highest electron number density and the longest particle containment time (1.9 msec) observed. Also, evidence from a paired comparison test is presented which shows that the electric field acting along the minor radius of the toroidal plasma improves the plasma density and the calculated containment time more than an order of magnitude if the electric field points inward, relative to the values observed when it points (and pushes ions) radially outward.
A novel approach for calculating the populations of the excited Li-like ions C IV, N V, O VI, and Ne VIII is presented. The populations of the 2(2P), 3(2S), 3(2P), and 3(2D) electronic levels in these ions in optically thin plasmas with a broad range of electron density, N(e), and temperature, T(e), are determined from the collisional-radiative model by solving the system of rate equations for the production of excited ions; the equations are linear with respect to the excited ion populations, and the N(e) and T(e) are taken as independent variables. These populations are used to determine the ratios of line intensities for dipole allowed transitions between various energy levels. This approach can be applied to impurities other than the lithiumlike ions and is especially useful for diagnostics of systems where nonintrusive spectroscopic techniques must be used.
The introduction of a small percentage of an impurity gas containing a desired element into a theta-pinch plasma is a standard procedure used to investigate the spectra and atomic processes of the element. This procedure assumes that the mixing ratio of impurity-to-fill gases remains constant during the collapse and heating phase. Spectroscopic investigations of the constant-mixing-ratio assumption for a 2% neon and argon impurity verifies the assumption only for the neon impurity. However, for the 2% argon impurity, only 20 to 25% of the argon is in the high-temperature compressed plasma. It is concluded that the constant-mixing-ratio assumption is not applicable to the argon impurity.
Variable polarity plasma arc (VPPA) welding has been used with considerable success by NASA for the welds on the Space Shuttle External Tank as well as by others concerned with high quality welded structures. The effects of gaseous contaminants on the appearance of VPPA welds on 2219 aluminum are examined so that a welder can recognize that such contamination is present and take corrective measures. There are many possible sources of such contamination including, contaminated gas bottles, leaks in the gas plumbing, inadequate shield gas flow, condensed moisture in the gas lines or torch body, or excessive contaminants on the workpiece. The gasses chosen for study in the program were nitrogen, oxygen, methane, and hydrogen. Welds were made in a carefully controlled environment and comparisons were made between welds with various levels of these contaminants and welds made with research purity (99.9999 percent) gasses. Photographs of the weld front and backside as well as polished and etched cross sections are presented.
The second generation miniature Arc Jet (mARC II) is a subscale arc jet at NASA Ames Research Center that is undergoing initial characterization. During its operation, the electrodes used to produce continuous plasma flows deteriorate and the flow purity decreases. The present work reports the use of optical emission spectroscopy as a characterization tool for impurities in the plasma flow. The discussion is focused on the interpretation of spectroscopic measurements and their evolution under different testing conditions. Special emphasis is given to copper and silver, the main atomic elements of the electrodes. The highest rate of anode deterioration is found to occur during the arc jet ignition, while cathode deterioration is constant throughout the entire run. Based on the experimental spectra, a preliminary numerical characterization of the plasma temperature, enthalpy and number density is conducted.
Systems and methods for producing high quantum efficiency silicon devices. A silicon MBE has a preparation chamber that provides for cleaning silicon surfaces using an oxygen plasma to remove impurities and a gaseous (dry) NH3 + NF3 room temperature oxide removal process that leaves the silicon surface hydrogen terminated. Silicon wafers up to 8 inches in diameter have devices that can be fabricated using the cleaning procedures and MBE processing, including delta doping.
The feasibility of a process for the reduction of low impurity silica (SiO2) with carbon in a plasma heat source was investigated. An RF induction plasma reactor was fabricated and used to optimize process variables. Maximum silicon content of the product was 33% by weight. Emission spectrographic analysis of this product showed a reduction in some impurity levels of one to two orders of magnitude. While the plasma approach proved technically feasible, poor heat transfer from the plasma to the reactant and low yield make the process economically unattractive for large-scale use.
Remote sensing of light-absorbing particles (LAPs), or dark colored impurities, such as black carbon (BC) and dust on snow, is a key remaining challenge in cryospheric surface characterization and application to snow, ice, and climate models. We present a quantitative data set of in situ snow reflectance, measured and modeled albedo, and BC and trace element concentrations from clean to heavily fossil fuel emission contaminated snow near South Pole, Antarctica. Over 380 snow reflectance spectra (350-2500 nm) and 28 surface snow samples were collected at seven distinct sites in the austral summer season of 2014-2015. Snow samples were analyzed for BC concentration via a single particle soot photometer and for trace element concentration via an inductively coupled plasma mass spectrometer. Snow impurity concentrations ranged from 0.14 to 7000 part per billion (ppb) BC, 9.5 to 1200 ppb sulfur, 0.19 to 660 ppb iron, 0.013 to 1.9 ppb chromium, 0.13 to 120 ppb copper, 0.63 to 6.3 ppb zinc, 0.45 to 82 parts per trillion (ppt) arsenic, 0.0028 to 6.1 ppb cadmium, 0.062 to 22 ppb barium, and 0.0044 to 6.2 ppb lead. Broadband visible to shortwave infrared albedo ranged from 0.85 in pristine snow to 0.62 in contaminated snow. LAP radiative forcing, the enhanced surface absorption due to BC and trace elements, spanned from less than 1 W m(exp. -2) for clean snow to approximately 70 W m(exp. -2) for snow with high BC and trace element content. Measured snow reflectance differed from modeled snow albedo due to specific impurity-dependent absorption features, which we recommend be further studied and improved in snow albedo models.
The feasibility of a process for carbon reduction of low impurity silica in a plasma heat source was investigated to produce low-cost solar-grade silicon. Theoretical aspects of the reaction chemistry were studied with the aid of a computer program using iterative free energy minimization. These calculations indicate a threshold temperature exists at 2400 K below which no silicon is formed. The computer simulation technique of molecular dynamics was used to study the quenching of product species.
Post-luminescence of hydrogen impurity in helium or neon plasma excited in pulses
Two-layer thermal barrier coating, consisting of metal-CrA1Y bond coating and calcium silicate ceramic outer layer, greatly improves resistance of turbine parts to hot corrosion from fuel and air impurities. Both layers can be plasma sprayed, and ceramic layer may be polished to reduce frictional losses. Ceramic provides thermal barrier, so parts operate cooler metal temperatures, coolant flow can be reduced, or gas temperatures increased. Lower grade fuels also can be used.
We have heated polished doped single-crystal silicon wafers in a single mode microwave cavity to temperatures where surface to surface bonding occurred. The absorption of microwaves and heating of the wafers is attributed to the inclusion of n-type or p-type impurities into these substrates. A cylindrical cavity TM (sub 010) standing wave mode was used to irradiate samples of various geometry's at positions of high magnetic field. This process was conducted in vacuum to exclude plasma effects. This initial study suggests that the inclusion of impurities in single crystal silicon significantly improved its microwave absorption (loss factor) to a point where heating silicon wafers directly can be accomplished in minimal time. Bonding of these substrates, however, occurs only at points of intimate surface to surface contact. The inclusion of a thin metallic layer on the surfaces enhances the bonding process.
Ionization relaxation in impure shock-heated argon studied by magnetic mass spectrometer
Microwave plasma depositions of diamond films have been investigated under low pressures of 10 mTorr to 10 Torr, at low substrate temperatures of 400 to 750 C, using high methane concentrations of 5 to 15 percent and oxygen concentrations of 5 to 10 percent in hydrogen plasmas. The deposition system consists of a microwave plasma chamber, a downstream deposition chamber, and a RF induction-heated sample stage. The deposition system can be operated in either high-pressure microwave or electron cyclotron resonance (ECR) modes by varying the sample stage position. Cathodoluminescence (CL) studies on diamond films deposited at 10 Torr pressure show that CL emissions at 430, 480, 510, 530, 560, 570 and 740 nm can be employed to characterize the quality of diamond films. High-quality, well-faceted diamond films have been deposited at 10 Torr and 600 C using 5 percent CH4 and 5 percent O2 in H2 plasmas; CL measurements on these films show very low N impurities and no detectable Si impurities. Diamond nucleation on SiC has been demonstrated by depositing well-faceted diamond crystallites on SiC-coated Si substrates.
Previous work has demonstrated that TBC delamination can be monitored by incorporating a thin luminescent sublayer that produces greatly increased luminescence intensity from delaminated regions of the TBC. Initial efforts utilized visible-wavelength luminescence from either europium or erbium doped sublayers. This approach exhibited good sensitivity to delamination of electron-beam physical-vapor-deposited (EB-PVD) TBCs, but limited sensitivity to delamination of the more highly scattering plasma-sprayed TBCs due to stronger optical scattering and to interference by luminescence from rare-earth impurities. These difficulties have now been overcome by new strategies employing near-infrared (NIR) and upconversion luminescence imaging. NIR luminescence at 1550 nm was produced in an erbium plus ytterbium co-doped yttria-stabilized zirconia (YSZ) luminescent sublayer using 980-nm excitation. Compared to visible-wavelength luminescence, these NIR emission and excitation wavelengths are much more weakly scattered by the TBC and therefore show much improved depth-probing capabilities. In addition, two-photon upconversion luminescence excitation at 980 nm wavelength produces luminescence emission at 562 nm with near-zero fluorescence background and exceptional contrast for delamination indication. The ability to detect TBC delamination produced by Rockwell indentation and by furnace cycling is demonstrated for both EB-PVD and plasma-sprayed TBCs. The relative strengths of the NIR and upconversion luminescence methods for monitoring TBC delamination are discussed.