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We develop metrics for assessing the effectiveness of proton SEE data for bounding heavy-ion SEE susceptibility. The metrics range from simple geometric criteria requiring no knowledge of the test articles to bounds of SEE rates.
Although heavy-ion single-event effects (SEE) pose serious threats to semiconductor devices in space, many missions face difficulties testing such devices at heavy-ion accelerators. Low-cost missions often find such testing too costly. Even well funded missions face issues testing commercial off the shelf (COTS) due to packaging and integration. Some missions wish to fly COTS systems with little insight into their components. Heavy-ion testing such parts and systems requires access to expensive and hard-to-access ultra-high energy ion accelerators, or significant system modification. To avoid these problems, some have proposed using recoil ions from high-energy protons as a proxy to bound heavy-ion SEE rates.
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Previous testing of the Enhanced Power Conversion (EPC) eGaN FETs showed sensitivity to destructive single-event effects (SEE) effects to heavy ions. The presence of tungsten plugs in the gate area raises concerns that the device may be vulnerable to SEE from protons. Irradiation of biased and unbiased devices with heavy ion has results in some damage suspected of being due to total non-ionizing dose (TNID). Proton irradiation is a better radiation type to study this effect. This study presents the results of testing device with protons for SEE and TNID. No SEE in the EPC2012 device, the most sensitive device to SEE, were seen with 53 MeV protons at several angles. The devices continued to function after 1.5 Mrad (Si) of proton dose with only a slight shift in parameters. These results suggest that gross TNID will not be a factor in using these devices nor suffer from SEE due to protons. However, the device should be tested at with 500 MeV protons to guarantee to immunity proton SEE.
Although proton SEE testing can place constraints on some heavy-ion SEE susceptibilities, it is important to quantify residual risk that protons may not reveal all SEE susceptibilities in a system. We examine the relative strengths and limitations of proton and heavy-ion SEE testing and how these may be affected by technology scaling and high-Z materials in the device.
While we have been utilizing standard fluence levels such as those listed in the JESD57 document, we have begun revisiting what an appropriate test fluence is when it comes to qualifying a device for single events. Instead of a fixed fluence level or until a specific number of events occurs, a different thought process is required.
This poster is a continuation of the ongoing tracking of proton capacity in the U.S. as it relates to radiation testing of electronics. The current state of access is presented.
As part of the Remote Exploration and Experimentation Project (REE), work was performed to do a proton SEE (Single Event Effect) evaluation of the Myricom network protocol system (Myrinet). This testing included the evaluation of the Myrinet crossbar switch and the Network Interface Card (NIC). To this end, two crossbar switch devices and five components in the NIC were exposed to the proton beam at the University of California at Davis Crocker Nuclear Laboratory (CNL).
The intent of this document is to provide guidance on when and what type of SEE tests should be performed on a device under test (DUT) based on orbit, technology, existing data, and application. It is NOT intended to provide a detailed guideline for how to perform proton SEE radiation tests on electronics.
The intent of this document is to provide guidance on when and what type of -SEE tests should be performed on a device under test (OUT) based on orbit, technology, existing data, and application. It is NOT intended to provide a detailed guideline for how to perform proton SEE radiation tests on electronics.
The fact that protons cause single-event effects (SEE) in most devices through production of light-ion recoils has led to attempts to bound heavy-ion SEE susceptibility through use of proton data. Although this may be a viable strategy for some devices and technologies, the data must be analyzed carefully and conservatively to avoid over-optimistic estimates of SEE performance. We examine the constraints that proton test data can impose on heavy-ion SEE susceptibility.
Level density [Formula: see text] is derived for a nuclear system with a given energy [Formula: see text], neutron [Formula: see text], and proton [Formula: see text] particle numbers, within the semiclassical extended Thomas–Fermi and periodic-orbit theory beyond the Fermi-gas saddle-point method. We obtain [Formula: see text], where [Formula: see text] is the modified Bessel function of the entropy [Formula: see text], and [Formula: see text] is related to the number of integrals of motion, except for the energy [Formula: see text]. For small shell structure contribution one obtains within the micro–macroscopic approximation (MMA) the value of [Formula: see text] for [Formula: see text]. In the opposite case of much larger shell structure contributions one finds a larger value of [Formula: see text]. The MMA level density [Formula: see text] reaches the well-known Fermi gas asymptote for large excitation energies, and the finite micro-canonical limit for low excitation energies. Fitting the MMA [Formula: see text] to experimental data on a long isotope chain for low excitation energies, due mainly to the shell effects, one obtains results for the inverse level density parameter [Formula: see text], which differs significantly from that of neutron resonances.
The LANL Isotope Production Facility (IPF) is one of the two high-current proton linear accelerators operated under the auspices of the DOE Office of Nuclear Physics Isotope Development and Production for Research Applications Program. The IPF beamline operates with a fixed 100-MeV energy proton beam, diverted from the LANSCE accelerator and guided towards the isotope production target station. The fixed beam energy limits the number of isotopes that can be produced at IPF, and adversely affects the purity of isotopes produced at non-optimal energies. In particular, the IPF program is receiving increasing numbers of requests for high purity isotopes such as Np-236 (national security applications) and Re-186 (medical therapy). These are typically produced via (p,n) and (p,2n) nuclear reactions, requiring very tight control of the incident energies on the production targets to ensure an end product with a high radionuclidic purity. It is well known that this level of energy control cannot be achieved when a 100 MeV beam of mono-energetic protons is degraded to the required energies, typically below 30 MeV, as too much energy spread is acquired. Operating the IPF beamline at lower, mono-energetic beam energies such as at 40 MeV will allow the required tight energy control in target assemblies to ensure a high purity product. In addition, NP has requested a LANL/BNL/ORNL collaboration focus on establishing a national large-scale production capability for the therapy isotope Ac-225. Recent nuclear cross section measurements done at LANL show that due to a steep rise in production cross section towards higher proton energies (See Figure 2), proton beams at energies substantially greater than 100 MeV will be highly beneficial for Ac-225 production [AC255]. Such higher-energy beams cannot be delivered to IPF at present. Lower-energy beams (70 MeV and 40 MeV) can be delivered but only in sole-use mode; all other LANSCE users must be offline during 70 MeV or 40 MeV operation.
We present results and analysis investigating the effects of radiation on a variety of candidate spacecraft electronics to heavy ion and proton induced single event effects (SEE), proton-induced displacement damage dose (DDD), and total ionizing dose (TID).
Proton-induced fission of high-Z (Atomic Number) materials can produce high fluxes of high-LET (Linear Energy Transfer) ions in microelectronics. We develop methods to evaluate risks for a range of destructive and nondestructive SEE (Single-Event Effects) modes caused by this threat.
We present results and analysis investigating the effects of radiation on a variety of candidate spacecraft electronics to heavy ion and proton induced single-event effects (SEE), proton-induced displacement damage dose (DDD), and total ionizing dose (TID).
We present results and analysis investigating the effects of radiation on a variety of candidate spacecraft electronics to heavy ion and proton induced single-event effects (SEE), proton-induced displacement damage dose (DDD), and total ionizing dose (TID).