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Results for “Radiation Microelectronic Microdose Gate-Rupture”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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NASA NTRS1997

Radiation Effects in Advanced Microelectonic Technologies

Several new radiation phenomena have been observed in laboratory testing of advanced microelectonics that are not yet of sufficient importance for typical space applications, but provide insight into the likely effects of scaling and device design on radiation hardness.

Radiation Microelectronic Microdose Gate-Rupture↗