Search NASA⌕ Search

SEARCH · Search NASA

Results for “Radiation testing”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.

At least 19 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS2020

Single Board Computer Radiation Test Results and Radiation Test Software

Single Board Computers (SBCs) are quickly evolving and gaining capability as their cost comes down. As their footprints, cost, and power requirements decrease, their processing power increases. This makes them very attractive for use on space missions and an enabling technology as spacecraft size decreases and computational demand increases. One of the major challenges electronics face in the space environment is radiation. In 2019, the NASA Johnson Space Center (JSC) tested a selection of SBCs to low Earth orbit (LEO) radiation levels and evaluated their susceptibility and survivability. For this test campaign, JSC developed a Python software suite to better characterize the SBCs performance and intends to share the software.

Pedrotty, Samuel M.↗
NASA NTRS2006

A Technical and Cost Perspective on Radiation Testing Challenges

A viewgraph presentation detailing costs and technical perspectives on radiation testing is shown. The topics include: 1) Introduction - a Changing Microelectronics World; 2) Sample Technology Changes and Related Impacts on Radiation Testing; 3) Perspective on the "New" Cost or Doing Business; and 4) Considerations.

LaBel, Kenneth A.↗
NASA NTRS1977

Radiation tests of SEP solar cells

Solar cells specially designed for Solar Electric Propulsion (SEP) were tested with radiation fluences up to 10 to the 12th power protons having energies of 1.5, 1.0, and 0.5 MeV, and with fluences up to 10 to the 16th power electrons having 1.0 MeV energy. Spectrolab cells having a back-surface field were also irradiated with the same particles and fluences. Cell performances are described by curves in which normalized and absolute values of maximum power, maximum-power voltage, short-circuit current, and open-circuit voltage are plotted as a function of fluence.

Oman, H.↗
NASA NTRS1986

Ground radiation tests and flight atomic oxygen tests of ITO protective coatings for Galileo Spacecraft

Radiation simulation tests (protons and electrons) were performed along with atomic oxygen flight tests aboard the Shuttle to space qualify the surface protective coatings. The results, which contributed to the selection of indium-tin-oxide (ITO) coated polyester as the material for the thermal blankets of the Galileo Spacecraft, are given here. Two candidate materials, polyester and Fluorglas, were radiation-tested to determine changes at simulated Jovian radiation levels. The polyester exhibited a smaller weight loss (2.8) than the Fluorglas (8.8 percent). Other changes of polyester are given. During low-earth orbit, prior to transit to Jupiter, the thermal blankets would be exposed to atomic oxygen. Samples of uncoated and ITO-coated polyesters were flown on the Shuttle. Qualitative results are given which indicated that the ITO coating protected the underlying polyester.

Bouquet, Frank L.↗
NASA NTRS2000

A Compendium of Recent Optocoupler Radiation Test Data

We present a compendium of optocoupler radiation test data including neutron, proton and heavy ion Displacement Damage (DD), Single Event Transients (SET) and Total Ionizing Dose (TID). Proton data includes ionizing and non-ionizing damage mechanisms.

Label, K. A.↗
NASA NTRS2008

Guideline for ground radiation testing of microprocessors in the space radiation environment

The goal of this work is to develop a guideline that is applicable to processors that are potentially useful in space. Thus, the guideline does not consider very high performance processors that are intended for server or high-performance applications where very large amounts of power are tolerated to gain performance because it would be impractical to use such high-power devices in typical space applications. This guide is intended to support insertion of these microprocessors into spaceflight applications and to recommend ground test protocols. The first guideline principle that should be followed is a serious concurrent engineering approach for down selecting space-qualified microprocessors. This requires that the design engineer seek the support of a radiation effects expert who understands total ionizing dose (TID) and single-event effects (SEEs) issues for microprocessors as applied to the system in question.

Irom, Farokh↗
NASA NTRS2008

Radiation Testing, Characterization and Qualification Challenges for Modern Microelectronics and Photonics Devices and Technologies

At GOMAC 2007, we discussed a selection of the challenges for radiation testing of modern semiconductor devices focusing on state-of-the-art memory technologies. This included FLASH non-volatile memories (NVMs) and synchronous dynamic random access memories (SDRAMs). In this presentation, we extend this discussion in device packaging and complexity as well as single event upset (SEU) mechanisms using several technology areas as examples including: system-on-a-chip (SOC) devices and photonic or fiber optic systems. The underlying goal is intended to provoke thought for understanding the limitations and interpretation of radiation testing results.

LaBel, Kenneth A.↗
NASA NTRS2008

Radiation Testing, Characterization and Qualification Challenges for Modern Microelectronics and Photonics Devices and Technologies

At an earlier conference we discussed a selection of the challenges for radiation testing of modern semiconductor devices focusing on state-of-the-art CMOS technologies. In this presentation, we extend this discussion focusing on the following areas: (1) Device packaging, (2) Evolving physical single even upset mechanisms, (3) Device complexity, and (4) the goal of understanding the limitations and interpretation of radiation testing results.

LaBel, Kenneth A.↗
NASA NTRS1984

Radiation testing of GaAs on CRRES and LIPS experiment

The radiation damage of solar cells has become a prime concern to the U.S. Air Force due to longer satellite lifetime requirements. Flight experiments were undertaken on the Navy Living Plume Shield (LPS) satellite and the NASA/Air Force Combined Release and Radiation Effects Satellite (CRRES) to complement existing radiation testing. Each experiment, the rationale behind it, and its approach and status are presented. The effect of space radiation on gallium arsenide (GaAs) solar cells was the central parameter investigated. Specifications of the GaAs solar cells are given.

Trumble, T. M.↗
NASA NTRS1989

Standard Method For Radiation Tests Of Liquids

Simple procedure provides standard method for radiation tests of liquids. Assures identical handling and dosage so data from different test laboratories compared reliably. Pair of glass vials, joined by frangible neck and equipped with valves, used. Third vial also used. Filled with control specimen and not irradiated. Developed for measuring properties of liquids for use in radiation-resistant liquid-dielectric capacitors, procedure used for any of variety of liquids proposed for use in high-radiation environment - in x-ray and particle-accelerating machines and nuclear reactors, for example.

Bouquet, Frank L.↗
NASA NTRS2017

Recent Radiation Test Results for Trench Power MOSFETs

Single-event effect (SEE) radiation test results are presented for various trench-gate power MOSFETs. The heavy-ion response of the first (and only) radiation-hardened trench-gate power MOSFET is evaluated: the manufacturer SEE response curve is verified and importantly, no localized dosing effects are measured, distinguishing it from other, non-hardened trench-gate power MOSFETs. Evaluations are made of n-type commercial and both n- and p-type automotive grade trench-gate device using ions comparable to of those on the low linear energy transfer (LET) side of the iron knee of the galactic cosmic ray spectrum, to explore suitability of these parts for missions with higher risk tolerance and shorter duration, such as CubeSats. Part-to-part variability of SEE threshold suggests testing with larger sample sizes and applying more aggressive derating to avoid on-orbit failures. The n-type devices yielded expected localized dosing effects including when irradiated in an unbiased (0-V) configuration, adding to the challenge of inserting these parts into space flight missions.

Schottky Diodes↗
NASA NTRS2020

Status of NEPP Radiation Testing 3D NAND Flash

This work provides a current update of radiation testing activities on 3D NAND flash memories in support of the NEPP program. Single-event effects data from heavy-ion and low-energy proton testing is highlighted on a state of the art memory device.

Flash↗