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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 19 records

Graded Buffer Bragg Reflectors with High Reflectivity and Transparency for Metamorphic Optoelectronics

A graded buffer Bragg reflector (GBBR) is a bifunctional device component that provides the reflection of a distributed Bragg reflector and the adjustable lattice constant of a compositionally graded buffer. Prior work showed that these properties can be combined with low threading dislocation density and high reflectivity. Here, we design and demonstrate complex GBBRs for specific metamorphic solar cell applications. We design buffers that provide (1) high reflectivity over a narrow bandwidth, for quantum well solar cells, (2) reflectivity over a wide bandwidth, for optically thin solar cells, and (3) low sidelobe reflection, for multijunction devices that demand low out-of-band reflection. Apodized and triple GBBRs are demonstrated, and transparency is always considered, requiring designs with carefully engineered material combinations. A GBBR with a reflection of 99% is demonstrated, as well as a triple GBBR that has over 80% reflection for 100?nm of the spectrum around 800?nm. We also analyze potential deviations in a baseline GBBR from that of a perfect DBR using transmission electron microscopy to analyze imperfections in the material and modeling to analyze the impact of imperfect refractive index data for lattice-mismatched AlGaInAs. Minimal crosshatch roughness and unintentional thickness variation occur throughout the buffer, which likely influences reflection slightly. Small deviations between the calculated AlGaInAs and utilized AlGaAs refractive index exist, giving methods for future GBBR improvement. While the GBBR designs are intended for metamorphic solar cells, the broad and high reflection may also be useful for other optoelectronic devices such as light-emitting diodes or lasers.

41 EE - Solar Energy Technologies Office (EE-4S)↗

Impact of pellet preparation on reflectance measurements of ammonium sulfate by single-angle reflectance spectroscopy

The optical constants, n and k, are required to model the reflection, refraction and transmission of light at the first surface interface of a material, as well as its propagation through the material; here n corresponds to the real component and k the imaginary component of the refractive index. Several different spectroscopic methods have been used to determine the n and k values for different materials, including single angle reflectance spectroscopy and ellipsometry. The single-angle reflectance method quantitatively records the specular reflectance R(v) from a plane parallel face of the material and uses the Kramers-Kronig transform to extract the n and k values. For most compounds, however, it is difficult to obtain a single crystal or high-quality window of sufficient planarity and of the appropriate dimensions (several mm) to make the measurement. For this reason, we further investigate the use of pressed pellets of neat powdered substances to measure optical constants of these substances using the single-angle reflectance method. We have found that surface roughness can significantly influence the measured quantitative reflectance spectrum R(v) and, consequently, the derived n and k parameters. A collaborative study between Defence Research and Development Canada (DRDC) - Valcartier Research Center and Pacific Northwest National Laboratory (PNNL) has been carried out using different pellets of neat ammonium sulfate [(NH4)2SO4] to show how parameters such as the relative fraction of particle sizes for the component powder along with the grinding process of the pure compound all can affect the reflectance spectrum used to derive the optical constants. All pressed pellets were characterized by single-angle reflectance spectroscopy.

Diaz, Emmanuela↗

Estimating SHmax azimuth with P sources and vertical geophones: Use P-P reflection amplitudes or use SV-P reflection times?

We compared two methods for extracting the azimuth of maximum horizontal stress (SHmax) from 3D land-based seismic data generated by a P source and recorded with vertical geophones. In the first method, we used the direct-SV mode that is produced by all land-based P sources. P sources generate SV illumination that radiates in all azimuth directions from a source station and creates SV-P reflections that are recorded by vertical geophones. Unless stratigraphy has steep dip, SV-P raypaths recorded by vertical geophones are the reverse of P-SV raypaths recorded by horizontal geophones. Thus, SV-P data provide the same S-wave sensitivity to stress fields as popular P-SV data do. In the second method, we retrieved P-P reflections and then performed an amplitude-variation-with-azimuth (AVA) analysis of the amplitude-gradient behavior of P-P reflection wavelets. We did this analysis in narrow azimuth corridors to determine the gradient of reflection-wavelet amplitudes as a function of azimuth. This P-P AVA amplitude-gradient method has been of great interest in the reflection seismology community since it was introduced in the late 1990s. Each of these methods, AVA analysis of the gradient of P-P reflection amplitudes and azimuth-dependent arrival times of SV-P reflections, can be used to determine the azimuth of SHmax stress. We compare the results of the two methods with ground truth measurements of SHmax azimuth at a CO 2 sequestration site in the Michigan Basin. SHmax azimuths were determined from P-P and SV-P data at three major boundaries at depths of approximately 3500 ft (1067 m), 5500 ft (1676 m), and 7500 ft (2286 m). Two estimates of SHmax azimuth (one using SV-P data and one using P-P data) were made at each stacking bin inside a 24 mi 2 (62 km 2 ) image space. The result was approximately 98,000 estimates of SHmax azimuth across each of these three boundaries for each of these two prediction strategies. Histogram displays of PP AVA gradient estimates had peaks at correct azimuths of SHmax at all three depths, but the spread of the distributions widened with depth and split into two peaks at the deepest boundary. In contrast, each histogram of SHmax azimuth predicted by azimuth-dependent SV-P traveltimes had a single, definitive peak that was positioned at the correct SHmax azimuth at all three boundary depths.

Geochemistry & Geophysics↗

The impact of contamination and aging effects on the long-term laser-damage resistance of SiO 2 /HfO 2 /TiO 2 high-reflection coatings for 1054nm

The laser damage thresholds of optical coatings can degrade over time due to a variety of factors, including contamination and aging. Optical coatings deposited using electron beam evaporation are particularly susceptible to degradation due to their porous structure. In a previous study, the laser damage thresholds of optical coatings were reduced by roughly a factor of two from 2013 to 2017. The coatings in question were high reflectors for 1054 nm that contained SiO 2 and HfO 2 and/or TiO 2 layers, and they were stored in sealed PETG containers in a class 100 cleanroom with temperature control. At the time, it was not certain whether contamination or thin film aging effects were responsible for the reduced laser damage thresholds. Therefore, to better understand the role of contamination, the coatings were recleaned and the laser damage thresholds were measured again in 2018. Here, the results indicate that contamination played the most dominant role in reducing the laser damage thresholds of these optical coatings, even though they were stored in an environment that was presumed to be clean.

42 ENGINEERING↗

Ultra-low reflectance broadband omni-directional anti-reflection coating

An anti-reflection coating has an average total reflectance of less than 10%, for example less than 5.9% such as from 4.9% to 5.9%, over a spectrum of wavelengths of 400-1100 nm and a range of angles of incidence of 0-90 degrees with respect to a surface normal of the anti-reflection coating. An anti-reflection coating has a total reflectance of less than 10%, for example less than 6% such as less than 4%, over an entire spectrum of wavelengths of 400-1600 nm and an entire range of angles of incidence of 0-70 degrees with respect to a surface normal of the anti-reflection coating.

Chhajed, Sameer↗

Two-Layer Anti-Reflection Coatings with Optimized Sub-Bandgap Reflection for Solar Modules

The efficiency of a crystalline silicon solar module decreases as its operating temperature rises. Module cooling is possible via selective reflection of sub-bandgap photons so that they are not parasitically absorbed. Selecting from a library of common dielectrics, we numerically optimize the design of two-layer mirrors at the outer glass surface of a crystalline Si solar cell module. The mirrors are designed to maximize the annual energy yield of a module by both reflecting light below the bandgap and enhancing the transmission of light above the bandgap. Combined ray-tracing and finite element simulations determine the power output and temperature of the module over time. Since any two-layer mirror would replace a conventional single-layer glass anti-reflection coating on the module glass, we study the ability of a two-layer structure to improve on a single-layer coating. The best two-layer designs improve the annual energy yield over a module with a glass anti-reflection coating and reduce the module operating temperature.

14 SOLAR ENERGY↗

Experimental study of high-order reflections on volume reflection holographic gratings

Samples of volume reflection gratings with a wide range of periods are obtained using a holographic setup with prism coupling of radiation into the recording layer of a photopolymer material. High-order reflections on these gratings are experimentally detected. The dependence of the characteristics of observed reflections on the grating parameters and recording conditions are discussed, and the experimental and calculated wavelengths of the reflections are compared. (paper)

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗

Modeling Spectrally-Selective Reflection for Thermal Management in Monofacial and Bifacial Modules

Parasitic absorption in photovoltaic modules is a major source of waste heat, which drives operating temperatures 20-30K above ambient. Spectrally-selective sub-bandgap reflection can reduce parasitic absorption, thereby improving module efficiency and power output. Here, we investigate the performance of 1-D spectrally-selective mirrors in monofacial Al BSF and PERC modules, and bifacial PERC modules. In monofacial modules, these mirrors offer >1.2% increase in energy yield compared to single-layer anti-reflection coatings, while cooling by over 1K on average. Mirrors reduced bifacial module parasitic absorption by up to 34 W/m2 out of 1240 W/m2 incident.

41 EE - Solar Energy Technologies Office (EE-4S)↗

Cellulose-Based Reflective Liquid Crystal Films as Optical Filters and Solar Gain Regulators

Many promising approaches for designing interactions of synthetic materials with light involve solid optical monocrystals and nanofabricated photonic crystal structures with spatially periodic variations of refractive index. Although their high costs limit current technological applications, remarkably, such photonic and optically anisotropic materials have also evolved throughout nature and enable narrow or broad-band spectral reflection of light. Here we use self-assembly of biomaterial cellulose nanocrystals to obtain three-layer films with helicoidal and nematic-like organization of the cellulose nanoparticles, which mimics naturally occurring polarization-insensitive reflectors found in the wings of Plusiotis resplendens beetles. These films were characterized with polarized optical microscopy and circular dichroism spectrometry, as well as scanning and transmission electron microscopies. These films exhibit high reflectivity tunable within the visible and near-infrared regions of the optical spectrum and may find applications ranging from color filters to smart cloth designs and in solar-gain-regulating building technologies.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗

Imaging solid–electrolyte interphase dynamics using operando reflection interference microscopy

The quality of the solid–electrolyte interphase is crucial for the performance of most battery chemistries, but its formation dynamics during operation are not well understood due to a lack of reliable operando characterization techniques. Herein, we report a dynamic, non-invasive, operando reflection interference microscope to enable the real-time imaging of the solid–electrolyte interphase during its formation and evolution processes with high sensitivity. The stratified structure of the solid–electrolyte interphase formed during four distinct steps includes the emergence of a permanent inner inorganic layer enriched in LiF, a transient assembly of an interfacial electrified double layer and a consequent emergence of a temporary outer organic-rich layer whose presence is reversible with electrochemical cycling. Reflection interference microscope imaging reveals an inverse correlation between the thicknesses of two interphasial subcomponents, implying that the permanent inorganic-rich inner layer dictates the organic-rich outer layer formation and lithium nucleation. In conclusion, the real-time visualization of solid–electrolyte interphase dynamics provides a powerful tool for the rational design of battery interphases.

77 NANOSCIENCE AND NANOTECHNOLOGY↗

Direct measurement of the static and transient magneto-optical permittivity of cobalt across the entire M -edge in reflection geometry by use of polarization scanning

The microscopic state of a magnetic material is characterized by its resonant magneto-optical response through the off-diagonal dielectric tensor component ε xy . However, the measurement of the full complex ε xy in the extreme ultraviolet spectral region covering the M absorption edges of 3d ferromagnets is challenging due to the need for either a careful polarization analysis, which is complicated by a lack of efficient polarization analyzers, or scanning the angle of incidence in fine steps. Here, we propose and demonstrate a technique to extract the complex resonant permittivity ε xy simply by scanning the polarization angle of linearly polarized high harmonics to measure the magneto-optical asymmetry in reflection geometry. Because this technique is more practical and faster to experimentally implement than previous approaches, we can directly measure the full time evolution of ε xy (t) during laser-induced demagnetization across the entire M 2,3 absorption edge of cobalt with femtosecond time resolution. We find that for polycrystalline Co films on an insulating substrate, the changes in ε xy are uniform throughout the spectrum, to within our experimental precision. This result suggests that, in the regime of strong demagnetization, the ultrafast demagnetization response is primarily dominated by magnon generation. Here, we estimate the contribution of exchange-splitting reduction to the ultrafast demagnetization process to be no more than 25%.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗

Ultrafast Electron Trapping and Defect-Mediated Recombination in NiO Probed by Femtosecond Extreme Ultraviolet Reflection–Absorption Spectroscopy

Understanding the chemical nature of defect sites as well as the mechanism of defect-mediated recombination is critical for the rational design of energy conversion materials with improved efficiency. Using femtosecond extreme ultraviolet (XUV) spectroscopy in conjunction with X-ray photoelectron spectroscopy (XPS), we present results on the ultrafast electron dynamics in NiO prepared with varying concentrations of defect states. We find that oxygen vacancy defects do not serve as the primary recombination center, but rather the recombination rate scales linearly with the density of Ni metal defects. This suggests that grain boundaries between Ni metal and NiO are responsible for fast carrier recombination in partially reduced NiO. Here, our kinetic model shows that the photoexcited electrons self-trap via small polaron formation on the subpicosecond time scale. Additionally, we estimate an absolute measurement of small polaron formation rates, direct versus defect-mediated recombination rates, and the small polaron diffusion coefficient in NiO. This study provides important parameters for engineering NiO based materials for solar energy harvesting applications.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗