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Results for “SECONDARY EMISSION”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 19 records
All sourcesNASA NTRSDOE OSTI
DOE OSTI2015

Effect of secondary emission on the argon plasma afterglow with large dust density

A zero-dimensional, space-averaged model for argon plasma afterglow with large dust density is developed. In the model, three groups of electrons in the plasma afterglow are assumed: (i) thermal electrons with Maxwellian distribution, (ii) energetic electrons generated by metastable-metastable collisions (metastable pooling), and (iii) secondary electrons generated at collisions of ions with the electrodes, which have sufficiently large negative voltages in the afterglow. The model calculates the time-dependencies for electron densities in plasma afterglow based on experimental decay times for metastable density and electrode bias. The effect of secondary emission on electron density in the afterglow is estimated by varying secondary emission yields. It is found that this effect is less important than metastable pooling. The case of dust-free plasma afterglow is considered also, and it is found that in the afterglow the effect of secondary emission may be more important than metastable pooling. The secondary emission may increase thermal electron density n{sub e} in dust-free and dusty plasma afterglows on a few ten percentages. The calculated time dependencies for n{sub e} in dust-free and dusty plasma afterglows describe well the experimental results.

70 PLASMA PHYSICS AND FUSION TECHNOLOGY↗
NASA NTRS1979

Electric fields and secondary emission near a dielectric-metal interface

Dielectric surface-charge distributions near a metal-dielectric interface in vacuum depend upon secondary emission processes in the presence of normal and tangential components of electric field. From measured charge distributions created by exposing a specimen of fluorinated ethylene-propylene to monoenergetic electron fluxes, it has been possible to calculate potentials and fields on and near the dielectric surface. The effect of the normal electric field upon secondary emission is measured directly, and the effect of the tangential field is inferred from the charge-distribution data. The critical point (unity crossover) for secondary emission is shifted by the application of fields, so that it occurs at much higher primary energies than normally. Primary beams having energies up to 20 keV are used, and surface fields are as high as 20 kV/mm.

Robinson, J. W.↗
NASA NTRS1966

Secondary electron emission

Secondary electron emission from porous tungsten surfaces to determine mechanisms of beam enhancement in ion rocket thrust augmentor

ION BEAM↗
NASA NTRS1980

Oblique-incidence secondary emission from charged dielectrics

Secondary electron emission coefficients were measured on FEP-Teflon for normal and oblique incidence in the presence of a normal electric field. Such measurements require knowledge of the electrostatic environment surrounding the specimen, and they require calculation of particle trajectories such that particle impact parameters can be known. A simulation using a conformal mapping, a Green's integral, and a trajectory generator provides the necessary mathematical support for the measurements, which were made with normal fields of 1.5 and 2.7 kV/mm. When incidence is normal and energy exceeds the critical energy, the coefficient is given by (V sub 0/V) to the .58 power, and for oblique incidence this expression may be divided by the cosine of the angle. The parameter V sub 0 is a function of normal field.

Robinson, J. W.↗
DOE OSTI2015

Simulation investigation of multipactor in metal components for space application with an improved secondary emission model

Effects of the secondary electron emission (SEE) phenomenon of metal surface on the multipactor analysis of microwave components are investigated numerically and experimentally in this paper. Both the secondary electron yield (SEY) and the emitted energy spectrum measurements are performed on silver plated samples for accurate description of the SEE phenomenon. A phenomenological probabilistic model based on SEE physics is utilized and fitted accurately to the measured SEY and emitted energy spectrum of the conditioned surface material of microwave components. Specially, the phenomenological probabilistic model is extended to the low primary energy end lower than 20 eV mathematically, since no accurate measurement data can be obtained. Embedding the phenomenological probabilistic model into the Electromagnetic Particle-In-Cell (EM-PIC) method, the electronic resonant multipacting in microwave components can be tracked and hence the multipactor threshold can be predicted. The threshold prediction error of the transformer and the coaxial filter is 0.12 dB and 1.5 dB, respectively. Simulation results demonstrate that the discharge threshold is strongly dependent on the SEYs and its energy spectrum in the low energy end (lower than 50 eV). Multipacting simulation results agree quite well with experiments in practical components, while the phenomenological probabilistic model fit both the SEY and the emission energy spectrum better than the traditionally used model and distribution. The EM-PIC simulation method with the phenomenological probabilistic model for the surface collision simulation has been demonstrated for predicting the multipactor threshold in metal components for space application.

70 PLASMA PHYSICS AND FUSION TECHNOLOGY↗
DOE OSTI2012

SECONDARY EMISSION FROM NON-SPHERICAL DUST GRAINS WITH ROUGH SURFACES: APPLICATION TO LUNAR DUST

Electrons impinging on a target can release secondary electrons and/or they can be scattered out of the target. It is well established that the number of escaping electrons per primary electron depends on the target composition and dimensions, the energy, and incidence angle of the primary electrons, but there are suggestions that the target's shape and surface roughness also influence the secondary emission. We present a further modification of the model of secondary electron emission from dust grains which is applied to non-spherical grains and grains with defined surface roughness. It is shown that the non-spherical grains give rise to a larger secondary electron yield, whereas the surface roughness leads to a decrease in the yield. Moreover, these effects can be distinguished: the shape effect is prominent for high primary energies, whereas the surface roughness predominantly affects the yield at the low-energy range. The calculations use the Lunar Highlands Type NU-LHT-2M simulant as a grain material and the results are compared with previously published laboratory and in situ measurements.

74 ATOMIC AND MOLECULAR PHYSICS↗
DOE OSTI2015

Secondary Emission Calorimetry

This report describes R&D on a new type of calorimeter using secondary emission to measure the energy of radiation, particularly high energy particles.

72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS↗
NASA NTRS1981

Electron reflection and secondary emission characteristics of sputter-textured pyrolytic graphite surfaces

Measurements are presented of secondary electron emission and reflected primary electron characteristics of sputter-textured pyrolitic graphite surfaces with microstructures of various sizes and densities, made with an Auger cylindrical mirror analyzer in a high-vacuum chamber at pressures below 1.33 x 10 to the -7th N/sq m (10 to the -9th torr). A dense, tall, thin, spire-like microstructure, obtained at ion energies of 1000 eV and ion current densities of 5 mA/sq cm, is the most effective. The secondary electron emission from such a surface is lower than that of soot, whose secondary emission is among the lowest of any material. At a primary electron energy of 1000 eV, the secondary electron emission yield of smooth CU is about 350% greater than the lowest value obtained for sputter-textured pyrolitic graphite. The reflected primary electron index of smooth Cu is a factor of 80 greater. If the secondary electron emission yield is reduced to 0.3, which is possible with sputter-textured pyrolitic graphite, the traveling wave tube collector efficiency could be improved by as much as 4% over that for smooth copper.

Wintucky, E. G.↗
DOE OSTI2012

Secondary Emission Chamber Calibration with Scintillator (V.1.0)

We report on a study of the behavior of a secondary emission chamber (SEC) when placed in a beam of high energy charged particles. We show the dependence of the SEC signal on the charge and velocity of the primary beam particles when using protons, and Iron ions. We calibrate the response of the SEC to ions by first using a plastic scintillator to count particles traversing the SEC, and transfer the calibration to an ion chamber that can operate at a high enough rate to characterize the SEC. The calibration is determined for the two different ion species and two different energies

43 PARTICLE ACCELERATORS↗
NASA NTRS1995

Texturing Copper To Reduce Secondary Emission Of Electrons

Ion-beam process produces clean, deeply textured surfaces on copper substrates with reduced secondary electron emission. In process, molybdenum ring target positioned above and around copper substrate. Target potential repeatedly switched on and off. Switching module described in "High-Voltage MOSFET Switching Circuit" (LEW-15986). Useful for making collector electrodes for traveling-wave-tube and klystron microwave amplifiers, in which secondary emission of electrons undesirable because of reducing efficiency.

Jensen, Kenneth A.↗
DOE OSTI2014

Role of secondary emission on discharge dynamics in an atmospheric pressure dielectric barrier discharge

The discharge dynamics in an atmospheric pressure dielectric barrier discharge (DBD) is studied in a DBD reactor consisting of a pair of stainless steel parallel plate electrodes. The DBD discharge has been generated by a 50 Hz ac high voltage power source. The high-speed intensified charge coupled device camera is used to capture the images of filaments occurring in the discharge gap. It is observed that frequent synchronous breakdown of micro discharges occurs across the discharge gap in the case of negative current pulse. The experimental results reveal that secondary emissions from the dielectric surface play a key role in the synchronous breakdown of plasma filaments.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗
NASA NTRS1977

Secondary emission conductivity of high purity silica fabric

High purity silica fabrics were proposed for use as a material to control the effects of electrostatic charging of satellites at synchronous altitudes. These materials exhibited very quiet behavior when placed in simulated charging environments as opposed to other dielectrics used for passive thermal control which exhibit varying degrees of electrical arcing. Secondary emission conductivity is proposed as a mechanism for this superior behavior. Design of experiments to measure this phenomena and data taken on silica fabrics are discussed as they relate to electrostatic discharge (ESD) control on geosynchronous orbit spacecraft. Studies include the apparent change in resistivity of the material as a function of the electron beam energy, flux intensity, and the effect of varying electric fields impressed across the material under test.

Belanger, V. J.↗
NASA NTRS1981

Oblique-incidence secondary emission from charged dielectronics

Experimental measurements and computer simulation of secondary electron emission coefficients for FEP-Teflon, for normal and oblique incidence in the presence of a normal electric field are reported. Knowledge of the electrostatic environment surrounding the specimen calculation of particle trajectories are considered. A simulation using a conformal mapping, a Green's integral, and a trajectory generator provides the necessary mathematical support for the measurements which have been made with normal fields of 1.5 and 2.7 kV/mm. When incidence is normal and energy exceeds the critical energy, the coefficient is given by V.58 and for oblique incidence this expression may be divided by the cosine of the angle. The parameter V sub 0 is a function of normal field. Measurements for values of V sub f are presented.

Robinson, J. W.↗