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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 19 records

SOME RECENT RESULTS ON THE BUCKLING MECHANISM OF SPHERICAL CAPS

The curve of pressure versus deformation for a spherical cap subjected to external pressure is frequently assumed to be similar to that of Fig. 1. Here P is a loading parameter and D(P) is a measure of the deformation (e.g. maximum displacement). This curve implies that for P > P(U) and for P < P(L) there is only one equilibrium state. For each P in P(L) < P < P(U) there are three equilibrium states and the cap must buckle at some P in this interval. We call P(L) and P(U), respectively, the upper and lower buckling loads. Points on the branch 0U correspond to unbuckled equilibrium states, those on the branch LN to buckled states and those on UL to unstable states.

BUCKLING↗

Electromagnetic induction in spherical cap current layers under lunar and terrestrial conditions

Attention is given to electromagnetic induction in infinitesimally thin spherical cap current layers of arbitrary size and arbitrary axisymmetric integrated conductivity, taking into account a location at nonzero but otherwise arbitrary depth beneath the surface of observation. The description of a theoretical model is presented and the induced fields computed from the theoretical formulas for several different spherical cap models are discussed.

Schubert, G.↗

Effect of transverse shear and material orthotropy in a cracked spherical cap

The elastostatic problem for a relatively thin-walled spherical cap containing a through crack is considered. The problem is formulated for a specially orthotropic material within the confines of a linearized, shallow shell theory. The theory used is equivalent to Reissner's theory of flat plates and hence permits the consideration of all five physical conditions on the shell boundaries separately. The solution of the problem is reduced to that of a pair of singular integral equations and the asymptotic stress state around the crack tips is investigated. The numerical solution of the problem is given for an isotropic shell and for two specially orthotropic shells. The results indicate that the material orthotropy as well as the shell curvature and thickness may have a considerable effect on the stress intensity factors at the crack tips.

Delale, F.↗

A digital computer study of the buckling of shallow spherical caps and truncated hemispheres

A study of the buckling of thin shells was conducted using a digital computer program for the geometrically nonlinear analysis of arbitrarily loaded shells of revolution. The objective was an evaluation of the program's applicability to bifurcation buckling and imperfection sensitivity analysis. Clamped spherical caps under pressure loading and clamped truncated hemispheres under axial tension were investigated. Buckling loads were determined for axisymmetric and nearly axisymmetric loads and are compared with previously published analytical results based on geometric imperfections.

Stilwell, W. C.↗

Snap-Through Buckling Pressure Prediction of Spherical Caps: A Comparison of Analytical, Implicit, and Explicit Methods

Snap-through buckling is a nonlinear and dynamic instability that occurs in curved shell structures such as domes, pressure vessels, and aerospace panels. Unlike classical linear buckling, it involves a sudden transition between equilibrium states caused by geometric nonlinearity and rapid strain-to-kinetic energy conversion (Timoshenko & Gere, 1961; Budiansky & Roth, 1962). This study investigates the snap-through behavior of thin spherical caps using both implicit and explicit solvers in ANSYS Workbench. While implicit analysis accurately captures quasi-static response, it struggles with convergence near instability. In contrast, explicit LS-DYNA simulation naturally handles the nonlinear dynamic event with minimal tuning and computational cost.

42 ENGINEERING↗

Low-Energy Ion Scattering Intensities from Supported Nanoparticles: The Spherical Cap Model

Supported nanoparticles are of great importance to many technologies like fuel processing and chemical synthesis using catalysts and electrocatalysts, energy storage and generation using fuel cells and batteries, electrochemistry, magnetic information storage, and more. Low-energy ion scattering spectroscopy (LEIS) with noble gas ions like He+ is a powerful tool for the characterization of nanoparticles dispersed across flat support surfaces due to its ability to probe the elemental composition in the topmost atomic layer of a surface, providing quantitative information regarding the size and number density of nanoparticles. In this work, we present a derivation of the LEIS intensities expected from nanoparticles and the support material as a function of the average particle size, their number per unit area, and their contact angle with the support when modeled as spherical caps of the nanoparticle material dispersed over the surface of a flat support. The model assumes that the ion intensities are determined only by the physical blocking of linear ion trajectories and independent of the tilt angle of the local surface relative to the incident and scattered ion directions, an assumption we support by quantitative modeling of published data which tested tilt-angle effects. The model is a generalization to arbitrary contact angles of the hemispherical cap model, which assumes 90° contact angle and has been widely used to model spectroscopic signals in LEIS (and also in Auger and photoelectron spectroscopies) during nanoparticle growth. Here, this new model quantitatively reveals how LEIS signals are sensitive not only to the diameter and number density of the nanoparticle but also to their contact angle (or height/diameter ratio). With the use of additional data (e.g., from microscopy or adsorption microcalorimetry), the model presented here will enable more accurate determination of the average size, shape, and number density of supported nanoparticles based on LEIS intensity measurements.

99 GENERAL AND MISCELLANEOUS↗