Multipactor effects - Secondary electron emission
Secondary electron emission from copper surfaces in multipactor effects study
SECONDARY EMISSION↗
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Secondary electron emission
Secondary electron emission from porous tungsten surfaces to determine mechanisms of beam enhancement in ion rocket thrust augmentor
ION BEAM↗
Secondary electron emission from lithium and lithium compounds
In this work, measurements of electron-induced secondary electron emission ( SEE) yields of lithium as a function of composition are presented. The results are particularly relevant for magnetic fusion devices such as tokamaks, field-reversed configurations, and stellarators that consider Li as a plasma-facing material for improved plasma confinement. SEE can reduce the sheath potential at the wall and cool electrons at the plasma edge, resulting in large power losses. These effects become significant as the SEE coefficient, γ e , approaches one, making it imperative to maintain a low yield surface. This work demonstrates that the yield from Li strongly depends on chemical composition and substantially increases after exposure to oxygen and water vapor. The total yield was measured using a retarding field analyzer in ultrahigh vacuum for primary electron energies of 20-600 eV. The effect of Li composition was determined by introducing controlled amounts of O 2 and H 2 O vapor while monitoring film composition with Auger electron spectroscopy and temperature programmed desorption. The results show that the energy at which γ e = 1 decreases with oxygen content and is 145 eV for a Li film that is 17% oxidized and drops to less than 25 eV for a fully oxidized film. This work has important implications for laboratory plasmas operating under realistic vacuum conditions in which oxidation significantly alters the electron emission properties of Li walls. Published by AIP Publishing.
70 PLASMA PHYSICS AND FUSION TECHNOLOGY↗
Effects of Surface Treatments on Secondary Electron Emission from CVD Diamond Films
Secondary electron emission (SEE) properties of polycrystalline diamond films grown by chemical vapor deposition (CVD) were measured. The total secondary yield (sigma) from as-grown samples was observed to be as high as 20 at room temperature and 48 while heating at 700 K in vacuum. Electron-beam-activated, alkali-terminated diamond films have shown stable values of sigma as high as 60 when coated with CsI and similarly high values when coated with other alkali halides. Diamond coated with BaF2 had a stable sigma of 6, but no enhancement of the SEE properties was observed with coatings of Ti or Au. Hydrogen was identified to give rise to this effect in as-grown films. However, electron beam exposure led to a reduction in sigma values as low as 2. Exposure to a molecular hydrogen environment restored sigma to its original value after degradation, and enabled stable secondary emission during electron beam exposure. Atomic hydrogen and hydrogen plasma treatments were performed on diamond/Mo samples in an attempt to increase the near-surface hydrogen concentration which might lead to increased stability in the secondary emission. Raman scattering analysis, scanning electron microscopy, and Auger electron spectroscopy (AES) confirmed that hydrogen plasma and atomic hydrogen treatments improved the quality of the CVD diamond significantly. Elastic recoil detection (ERD) showed that heating as-grown diamond targets to 7OO K, which was correlated with an increase in sigma, removed contaminants from the surface but did not drive hydrogen from the diamond bulk. ERD showed that the hydrogen plasma treatment produced an increase in the hydrogen concentration in the near-surface region which did not decrease while heating in vacuum at 700 K, but no improvement in the SEE properties was observed.
Mearini, G. T.↗
Secondary Electron Emission Yields
The secondary electron emission (SEE) characteristics for a variety of spacecraft materials were determined under UHV conditions using a commercial double pass CMA which permits sequential Auger electron electron spectroscopic analysis of the surface. The transparent conductive coating indium tin oxide (ITO) was examined on Kapton and borosilicate glass and indium oxide on FED Teflon. The total SEE coefficient ranges from 2.5 to 2.6 on as-received surfaces and from 1.5 to 1.6 on Ar(+) sputtered surfaces with 5 nm removed. A cylindrical sample carousel provides normal incidence of the primary beam as well as a multiple Faraday cup measurement of the approximately nA beam currents. Total and true secondary yields are obtained from target current measurements with biasing of the carousel. A primary beam pulsed mode to reduce electron beam dosage and minimize charging of insulating coatings was applied to Mg/F2 coated solar cell covers. Electron beam effects on ITO were found quite important at the current densities necessary to do Auger studies.
Krainsky, I.↗
Backscattering and secondary-electron emission from metal targets of various thicknesses
Backscattering and secondary electron emission from metal targets of various thicknesses
TARGET THICKNESS↗
Electron impact secondary electron emissions from elemental and compound solids
Not Available
Haque, A. K. Fazlul↗
Textured carbon on copper: A novel surface with extremely low secondary electron emission characteristics
Experimentally determined values of true secondary electron emission and relative values of reflected primary electron yield for a range of primary electron beam energies and beam impingement angles are presented for a series of novel textured carbon surfaces on copper substrates. (All copper surfaces used in this study were oxygen-free, high-conductivity grade). The purpose of this investigation is to provide information necessary to develop high-efficiency multistage depressed collectors (MDC's) for microwave amplifier traveling-wave tubes (TWT's) for communications and aircraft applications. To attain the highest TWT signal quality and overall efficiency, the MDC electrode surface must have low secondary electron emission characteristics. While copper is the material most commonly used for MDC electrodes, it exhibits relatively high levels of secondary electron emission unless its surface is treated for emission control. The textured carbon surface on copper substrate described in this report is a particularly promising candidate for the MDC electrode application. Samples of textured carbon surfaces on copper substrates typical of three different levels of treatment are prepared and tested for this study. The materials are tested at primary electron beam energies of 200 to 2000 eV and at direct (0 deg) to near-grazing (85 deg) beam impingement angles. True secondary electron emission and relative reflected primary electron yield characteristics of the textured surfaces are compared with each other and with those of untreated copper. All the textured carbon surfaces on copper substrate tested exhibited sharply lower secondary electron emission characteristics than those of an untreated copper surface.
Curren, A. N.↗
Secondary electron emission characteristics of untreated and ion-textured titanium
Experimentally determined values of true secondary electron emission and relative values of reflected primary electron yield are presented for untreated (simply machined) and ion-textured, high-purity titanium over ranges of primary electron beam energies and beam impingement angles. The purpose of the investigation was to explore the feasibility of using titanium as electrode material in the multistage depressed collectors (MDC's) used in microwave amplifier traveling wave tubes (TWT's) for space communications and aircraft applications. Because of its relatively low density and thermal expansion characteristics and relatively high strength, thermal emissivity, and melting temperature, titanium presents itself as a possible candidate for the MDC electrode application. A detailed description of the method of ion texturing the titanium is included. Although the ion-treated surface considered in this study is not presented as being optimum from the standpoint of secondary electron emission suppression, it nevertheless serves to demonstrate that the surface can be modified by this procedure to significantly reduce these emission characteristics relative to those of the untreated surface. Further studies can reasonably be expected to produce surfaces with even lower secondary emission characteristics. The titanium surface were tested at primary electron beam energies of 200 to 2000 eV and at direct (0 deg) to near-grazing (85 deg) beam impingement angles. True secondary electron emission and relative reflected primary electron yield characteristics of the surfaces were compared with each other and with textured titanium surface exhibited secondary electron emission characteristics sharply lower than those exhibited by untreated titanium or copper. Clearly, then, in consideration of the secondary electron emission suppression of ion-textured titanium along with its other favorable physical properties, it must be included as a potential candidate for use as MDC electrode material in some applications.
Curren, Arthur N.↗
Monte Carlo simulations of secondary electron emission due to ion beam milling
We present a Monte Carlo simulation study of secondary electron emission resulting from focused ion beam milling of a copper target. The basis of this study is a simulation code which simulates ion induced excitation and emission of secondary electrons, in addition to simulating focused ion beam sputtering and milling. This combination of features permits the simulation of the interaction between secondary electron emission, and the evolving target geometry as the ion beam sputters material. Previous ion induced SE Monte Carlo simulation methods have been restricted to predefined target geometries, while the dynamic target in the presented simulations makes this study relevant to image formation in ion microscopy, and chemically assisted ion beam etching, where the relationship between sputtering, and its effects on secondary electron emission, is important. We focus on a copper target, and validate our simulation against experimental data for a range of: noble gas ions, ion energies, ion/substrate angles and the energy distribution of the secondary electrons. We then provide a detailed account of the emission of secondary electrons resulting from ion beam milling; we quantify both the evolution of the yield as high aspect ratio valleys are milled, as well as the emission of electrons within these valleys that do not escape the target, but which are important to the secondary electron contribution to chemically assisted ion induced etching.
72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS↗
Energy-dependent implementation of secondary electron emission models in continuum kinetic sheath simulations
The plasma-material interactions present in multiple fusion and propulsion concepts between the flow of plasma through a channel and a material wall drive the emission of secondary electrons. This emission is capable of altering the fundamental structure of the sheath region, significantly changing the expected particle fluxes to the wall. The emission spectrum is separated into two major energy regimes, a peak of elastically backscattered primary electrons at the incoming energy, and cold secondary electrons inelastically emitted directly from the material. The ability of continuum kinetic simulations to accurately represent the secondary electron emission is limited by relevant models being formulated in terms of monoenergetic particle interactions which cannot be applied directly to the discrete distribution function. As a result, rigorous implementation of energy-dependent physics is often neglected in favor of simplified, constant models. We present here a novel implementation of semi-empirical models in the boundary of continuum kinetic simulations which allows the full range of this emission to be accurately captured in physically-relevant regimes.
70 PLASMA PHYSICS AND FUSION TECHNOLOGY↗
Study of a high power hydrogen beam diagnostic based on secondary electron emission
In high power neutral beams for fusion, beam uniformity is an important figure of merit. Knowing the transverse power profile is essential during the initial phases of beam source operation, such as those expected for the ITER heating neutral beam (HNB) test facility. To measure it a diagnostic technique is proposed, based on the collection of secondary electrons generated by beam-surface and beam-gas interactions, by an array of positively biased collectors placed behind the calorimeter tubes. This measurement showed in the IREK test stand good proportionality to the primary beam current. To investigate the diagnostic performances in different conditions, we developed a numerical model of secondary electron emission, induced by beam particle impact on the copper tubes, and reproducing the cascade of secondary emission caused by successive electron impacts. The model is first validated against IREK measurements. It is then applied to the HNB case, to assess the locality of the measurement, the proportionality to the beam current density, and the influence of beam plasma.
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗
Beam impingement angle effects on secondary electron emission characteristics of textured pyrolytic graphite
Experimentally determined values of true secondary electron emission and relative values of reflected primary electron yield for untreated and ion-textured pyrolytic graphite over a range of primary electron energy levels and electron beam impingement angles are presented. Information required to develop high efficiency multistage depressed collectors (MDC's) for microwave amplifier traveling-wave tubes for space communication and aircraft applications is provided. To attain the highest possible MDC efficiencies, the electrode surfaces must have low secondary electron emission characteristics. Pyrolytic graphite, a chemically vapor-deposited material, is a particularly promising candidate for this application. The pyrolytic graphite surfaces studied were tested over a range of primary electron beam energies and beam impingement angles from 200 to 2000 eV and direct (0 deg) to near-grazing angles (85 deg), respectively. Surfaces both parallel to and normal to the planes of material deposition were examined. The true secondary electron emission and reflected primary electron yield characteristics of the pyrolytic graphite surfaces are compared to those of sooted control surfaces.
Curren, A. N.↗
Secondary electron emission characteristics of ion-textured copper and high-purity isotropic graphite surfaces
Experimentally determined values of true secondary electron emission and relative values of reflected primary electron yield for untreated and ion textured oxygen free high conductivity copper and untreated and ion textured high purity isotropic graphite surfaces are presented for a range of primary electron beam energies and beam impingement angles. This investigation was conducted to provide information that would improve the efficiency of multistage depressed collectors (MDC's) for microwave amplifier traveling wave tubes in space communications and aircraft applications. For high efficiency, MDC electrode surfaces must have low secondary electron emission characteristics. Although copper is a commonly used material for MDC electrodes, it exhibits relatively high levels of secondary electron emission if its surface is not treated for emission control. Recent studies demonstrated that high purity isotropic graphite is a promising material for MDC electrodes, particularly with ion textured surfaces. The materials were tested at primary electron beam energies of 200 to 2000 eV and at direct (0 deg) to near grazing (85 deg) beam impingement angles. True secondary electron emission and relative reflected primary electron yield characteristics of the ion textured surfaces were compared with each other and with those of untreated surfaces of the same materials. Both the untreated and ion textured graphite surfaces and the ion treated copper surface exhibited sharply reduced secondary electron emission characteristics relative to those of untreated copper. The ion treated graphite surface yielded the lowest emission levels.
Curren, A. N.↗
Secondary electron emission from electrically charged fluorinated-ethylene-propylene Teflon for normal and non-normal electron incidence
The secondary electron emission coefficient was measured for a charged polymer (FEP-Teflon) with normally and obliquely incident primary electrons. Theories of secondary emission are reviewed and the experimental data is compared to these theories. Results were obtained for angles of incidence up to 60 deg in normal electric fields of 1500 V/mm. Additional measurements in the range from 50 to 70 deg were made in regions where the normal and tangential fields were approximately equal. The initial input angles and measured output point of the electron beam could be analyzed with computer simulations in order to determine the field within the chamber. When the field is known, the trajectories can be calculated for impacting electrons having various energies and angles of incidence. There was close agreement between the experimental results and the commonly assumed theoretical model in the presence of normal electric fields for angles of incidence up to 60 deg. High angle results obtained in the presence of tangential electric fields did not agree with the theoretical models.
Budd, P. A.↗
“Feathered” fractal surfaces to minimize secondary electron emission for a wide range of incident angles
Complex structures on a material surface can significantly reduce the total secondary electron emission from that surface. The reduction occurs due to the capture of low-energy, true secondary electrons emitted at one point of the structure and intersecting another. We performed Monte Carlo calculations to demonstrate that fractal surfaces can reduce net secondary electron emission produced by the surface as compared to the flat surface. Specifically, we describe one surface, a “feathered” surface, which reduces the secondary electron emission yield more effectively than other previously considered configurations. Specifically, feathers grown onto a surface suppress secondary electron emission from shallow angles of incidence more effectively than velvet. Here, we find that, for the surface simulated, secondary electron emission yield remains below 20% of its un-suppressed value, even for shallow incident angles, where the velvet-only surface gives reduction factor of only 50%.
36 MATERIALS SCIENCE↗
Secondary Electron Emission and the Exploration of Space
The emission of secondary electrons from surfaces exposed to the space plasma and radiation environment is a process of great importance to space system engineering design and operations. A spacecraft will collect charge until it reaches an equilibrium potential gov,erned by the balance of incoming electron and ion currents from the space environment with outgoing secondary, backscattered, and photoelectron currents. Laboratory measurements of secondary electron yields are an important parameter for use in spacecraft charging analyses because the magnitude and sign of the equilibrium potential depends on both the energy spectrum of electrons and ions in the space environment and the electrical properties of the surface materials (including the energy dependent secondary electron yields). Typical benign equilibrium potentials range &om a few tens of volts positive in interplanetary space to a few volts negative in low Earth orbit. However, spacecraft are known to charge to negative potentials exceeding one to ten kilovolts in some environments and anomalies or system failures due to electrostatic discharges originating from highly charged surfaces becomes a serious concern. This presentation will provide a review of the spacecraft charging process with special emphasis on the role of secondary electrons in controlling the current balance process. Charging examples will include spacecraft in Earth orbit and interplanetary space as well as dust charging on the lunar surface, a phenomenon of importance to future lunar surface operations.
Minow, Joseph I.↗